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At Cyth, we offer the necessary technology, expertise, & products to help you effectively create ATE, Embedded, Machine Vision, & Industrial Automation Systems Test & Measurement Automation, Embedded Control & Monitoring Cyth Systems is a specialized distributor and experienced system integrator, helping customers make informed decisions when selecting platforms, products, and components for automated test, factory automation, and embedded control systems. With hundreds of systems designed, and thousands deployed, our team offers our customers the products we use coupled with trusted guidance, from system selection and startup support to programming best practices, code architecture, and technical troubleshooting. Customers can lead their own development with confidence, backed by our scalable support model—ranging from purchasing advice, mentoring, partial co-development, through to full turnkey systems when needed. Our goal is to empower innovation through reliable systems, proven expertise, and practical engineering insight. After over 20 years of successfully helping customers as an NI Certified Integration Partner, Cyth was selected by NI as the ONLY Distributor and Integrator in the Americas. Explore Our Site: View our application areas See application success stories What we do for your industry Shop our products Learn more about Cyth ApplicAreas Application & Service Areas Automated Test Equipment Automated Test Equipment for Manufacturing Circuit Board Testing Measurement Automation Life Test & Reliability Equipment LEARN MORE Embedded Systems Industrial Control Systems Embedded Control Systems OEM Solutions & Volume Manufacturing Monitoring Systems LEARN MORE Machine Vision Area Scan & 2D Inspection 3D Inspection Machine Learning - NeuralVision LEARN MORE Industrial Automation Automated Assembly Product Treatment & Handling Verification and Measurement Motion and Robotics LEARN MORE Engineering Consulting Discuss your design requirements Evaluate feasibility for integration LabVIEW or TestStand Programming Service Detailed technical proposal Schedule time with an expert LEARN MORE Questions? Ask an Expert Consultation on systems and modules Custom integrated solutions Troubleshooting advice on software LEARN MORE SuccessStories Success Stories Systems developed with our platforms and technology Automated Test Machine Vision Industrial Automation Real-Time & Embedded Automated Battery QA Ensures Medical Device Reliability CompactRIO Enables Automated Circuit Board Testing PCBA Functional Test and Device Verificational Test Scaled with Cyth PCBACheck 1 2 3 4 Robotic Automation Triples Sample Preparation Throughput Circaflex & NI Single-Board RIO Power Syringe Lubrication Inspection Demo Machine Vision Solution Enables Steel Surface Defect Detection 1 2 3 4 CompactRIO Enables Automated Circuit Board Testing PCBA Functional Test and Device Verificational Test Scaled with Cyth PCBACheck Hyundai Improves Production Test Time using PXI, LabVIEW, and TestStand 1 2 3 4 CompactRIO Enables Undergraduate Power Electronics Education Robotic Automation Triples Sample Preparation Throughput Production Capacity up 350% with Automated Dispensing 1 2 3 4 5 Cyth is a critical supplier for us. They’re involved in the design, building, and supporting automation tools throughout our manufacturing. -J.N., Semiconductor Equipment Manufacturer Industries & Solutions Our hardware, software, and platforms meet your industry's unique needs, and have been universally successful in applications of all kinds. Energy & Power Energy Storage Power Monitoring Solar Energy Natural Gas Oilfield Operations Power Distribution VIEW SOLUTIONS Life Sciences Medical Devices Biotechnology Cell & Genetic Research Pharmaceutical Scientific Instruments Research & Simulation VIEW SOLUTIONS Product Manufacturing Consumer Electronics Consumer Products Food & Beverage Machinery & Equipment Scientific Instruments Sporting Goods VIEW SOLUTIONS Semiconductor Equipment Semiconductor Equipment & Tools Chip Manufacturers Factory Smart Machines VIEW SOLUTIONS Shop Automation & Test Products As an authorized National Instruments Distributor, we stock a number of the devices, components, and accessories that we have successfully used, in order to help you plan and build out your next automation or test project. Cyth provides top-of-the-line modular hardware, software, services, and components that establish the benchmark for automated test and measurement. Data & Acquisition Entry-Level DAQ Industrial Quality DAQ Desktop DAQ (PCI) Compact DAQ (cDAQ) Browse Products Embedded CompactRIO Rugged Controllers Single-Board Computers (SBC, sbRIO) System On Module (SOM) Browse Products PXI Platform Systems Entry-Level DAQ Industrial Quality DAQ Desktop DAQ (PCI) Compact DAQ (cDAQ) Browse Products Accessories HMIs and Touch Panels Cables Power Supplies Connectors Browse Products See All Products About Us Over two decades of providing trusted technology and expertise engineers need to succeed in their projects for Industrial Automation, Test & Measurement, and Control & Monitoring. Our consultants will work alongside your team to design the solution needed to meet your specifications. Through our proven process, our experience, and our passion for problem-solving we develop your solutions with reduced risk, cost, and an efficient schedule. Learn More About Cyth “Working with Cyth is refreshing. Status reports, budget updates, design meetings... they've perfected the way projects should be done.” -R.J., Senior Quality Engineer, Medical Device Manufacturer Technology Partners Cyth Systems provides the best-possible technology and integration services to our customers. We strategically align with the world’s top testing and technology companies. For more info on our partners, please contact us.

The core of all our solutions is the National Instruments (NI) platform, which includes LabVIEW, TestStand, PXI, CompactDAQ, and CompactRIO controllers. COMPANY Technology Platform Home > Company > Technology Platform Our unmatched technology PLATFORM The core of all our solutions is the National Instruments (NI) platform including LabVIEW , TestStand , PXI , CompactDAQ , and RIO controllers . These products deliver flexible, professional, and robust custom solutions optimized for your product. Professional automation and control solutions begin with the NI (National Instruments) platforms. LabVIEW LabVIEW is the key to Automated Test and Embedded Control Systems. One software for multiple applications. PXI The PXI Platform provides an industrial Chassis and numerous Instrument Modules (Oscilloscopes, DMM's, Power Supplies, Switches, Basic DAQ, etc) Our proven successful PROCESS Over the years we have refined our process to help you discover and solve the challenges and that are common with automation and control projects. Our processes promote better requirements gathering, flexible budgeting, detailed communication, and milestone tracking. Well-rounded, trained, experienced PEOPLE The experience and knowledge of the engineering team working on your project is a key component of project success. Our engineers have a broad range of experience and training, and mentoring on projects that span multiple industries and disciplines, including a broad range of instruments, sensors and components and so much more.

Leveraging our experience across many industries, we can bring your project a depth & breadth of design proficiency into applications we’ve never done before. SERVICES Engineering Consulting Home > Services > Engineering Consulting Would it help you to borrow our EXPERT ENGINEERS ? Leveraging our experience in Automation, Control, and Machine Vision across many industries, we can bring your project a depth and breadth of design proficiency into applications you've never done before, or in ways you might not have considered.   Bring us your tricky projects and challenges – we love to join your design team and can offer ideas, technologies, and questions that just might make a project into a reality. Test or Automation Systems Design ATE Systems Automation Systems Reverse Engineering Systems Updating Old Systems Let's Talk About ATE Software Consulting Startup Assistance Project Architecture Code Audits Let's Talk About Software Repair & Troubleshooting Machine down investigations Machine performance audits Debugging Assistance Let's Do Some Research LabVIEW & NI Consulting NI Hardware PXI Configurations CompactRIO Configurations Single-Board RIO Design NI Software LabVIEW TestStand InstrumentStudio Let's Talk About LabVIEW Every CONSULTING PROJECT becomes a great STORY “Our OpEx team asked five companies to consider our challenge – we needed a machine for testing for hospital intravenous tubing, but we do millions of units per day, with 200 assemblers, and we found movement of parts to the test equipment to be an insurmountable challenge. Each team gave us two presentations over the next 6 weeks. Some of the best plans had 30 systems the size of a fridge, or 10 systems the size of an SUV, using overhead conveyors and required hiring 200 more people. All of them used off-the-shelf designs for leak detection. But Cyth’s idea flipped the entire concept: a small custom leak test instrument installed directly on the assemblers table. Small and inexpensive, we could build 1000 of them, and best of all - the parts do not have to be transported around the factory. Cyth then unveiled a working prototype! The demonstration worked right there on the conference room table. We dismissed all the other candidates that day and set up a demo with the executive team.” -J.R. Sr. OpEx Project Manager, Medical Device Manufacturer Our Engineering Consulting PROCESS Schedule Consultation To start, a Cyth Engineer and Architect will meet with you at NO CHARGE to do requirements gathering and review ideas under a Confidential Disclosure Agreement. Engineering brainstorm We will meet internally to review requirements, brainstorm ideas, verify product specs, and check pricing to meet your needs. Design review We present ideas and products that can meet your needs, and we can iterate until all the requirements are met. Let's Schedule a Consultation ENGINEERING CONSULTING Portfolio Automated Battery QA Ensures Medical Device Reliability CompactRIO Enables Undergraduate Power Electronics Education Robotic Automation Triples Sample Preparation Throughput CompactRIO Enables Automated Circuit Board Testing PCBA Functional Test and Device Verificational Test Scaled with Cyth PCBACheck Custom EMF Measurement Solution Doubles End-of-Line Test Throughput Production Capacity up 350% with Automated Dispensing Hardware-Timed Automation Accelerates Gas Meter Testing Micron-Scale Inspection via Precision Vision & Motion 1 2 3 4 5

Control & monitoring instruments & devices for industrial, scientific, medical, & biotech. We offer two powerful tools to deliver success to your project. Thank you for submitting your request Home > Services > Thank You Our industry needs expertise and direction more than ever before! We make it our mission to convert our experience and knowledge into help and assistance for our clients. An Embedded Control Systems Engineer will contact you soon. If you urgently need assistance regarding: Discuss your requirements. Evaluate feasibility. Tailored technical proposal. Please call us at (858)-537-1960. Click to learn more about: Cyth Systems NI Integration Case Studies Cyth Systems LabVIEW Consulting Engineering Consulting Automated Test Equipment Machine Vision Systems Industrial Automation We're Trusted By Automated Test Equipment | Embedded Systems | Machine Vision Systems | Industrial Automation | Engineering Consulting Since 1999

As NI’s only Authorized Distributor & Systems Integration Partner, we are excited to announce that we have dedicated resources to support educators & students Exclusive Academic offers for LabVIEW and NI Products Renew your LabVIEW licenses to access campus-wide discounts, support, and special student opportunities only available from Cyth Systems Get Limited Time Offer As NI’s only Authorized Distributor and Certified Integration Partner, we have dedicated resources working to deliver new and exclusive benefits for academia! Check out the special offers below and sign up now to unlock exclusive benefits! Others Exclusive Academic Offers NEW Cyth Exclusive 2025 LabVIEW Bundle Discounts Free Official LabVIEW Training Included LabVIEW Project Code Assistance Career Services, Factory, and Project Tours Experienced Tech Support Included with Licenses & Hardware Discounts Hardware Bundles for Classroom & Research Projects "Working with Marty... wonderful!" "Working with Marty through the transition to distribution has been wonderful!" M.L., Buyer, Sunnyvale, CA Aircraft Manufacturer, DoD Prime Contactor Oct 2023 Sign up today to receive Cyth's Exclusive "LabVIEW Renew" Bundle Pricing. Reserve Now! NEW LabVIEW License pricing and discounts only available from Cyth Systems! We analyze your license usage and provide exclusive NEW pricing bundles and discounts, plus Technical Support and benefits for Students and Professors. Renewing your licenses later in the year? Sign up now to reserve your pricing!!! Academic Offers Web Form Sign Up today to lock in EXCLUSIVE Special Pricing Analyze your LabVIEW License needs & usage. Lock-in Bundle Discounts. Receive Tech Support with purchases. Other Exciting offers available only from Cyth Systems Cyth's LabVIEW Starter Kit - Curriculum, Intro, and self-paced challenges for learners (COMING SOON). Code Architecture & Mentoring. Student Virtual tours of factories using LabVIEW. Walk-thru of real active LabVIEW industrial projects. Grant Programs for startups and spinoffs. Let us hear your voice! You have a voice and an industry professional in your corner! Let us hear your ideas, wishes, concerns, or complaints. We can be your direct advocate to NI. How can we help? Get Limited Time Offer Register your interest today to reserve your special pricing. Let us know if you want us to reach out! First Name Last Name Email [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup] How can we help you? Get Started

We serve customers in many demanding industries, including aerospace, automotive, biotech, food & beverage, manufacturing, industrial systems, and more! COMPANY Our Customers Home > Company > Our Customers Our CUSTOMERS give us PURPOSE Cyth Systems has over two decades of providing the technology and expertise you need to be successful on Automation, Measurement, and Controls projects. Our engineers will work alongside your team to design the system to meet your specifications. We develop your solutions with reduced risk, cost, and schedule. "Cyth is a critical supplier for us. They're involved in the design, building, and supporting automation tools through our manufacturing." -J.N., Semiconductor Equipment Manufacturer "Working with Cyth Systems is refreshing. Status Reports, Budget updates, design meetings... the way projects should be done" -R.J., Senior Quality Engineer "We knew the biology and chemistry of our concept, but we needed a platform to build on. Cyth had our prototype running in just a few weeks… about the same time it took us to write the SOW" -B.L., Biotech Startup Founder, Geneticist "For years we thought PLC’s were the only option for controlling our freezers, conveyers, printers, processes, and casting machines. But we had so many unmet needs and wishes. Switching to Cyth’s embedded control platforms gave us all the control we had before, but much more in terms of logic, data collection, automation, and monitoring. " -O.M., Supervisor, Mfg Equipment Maintenance "I came to think of Cyth like a sherpa - guiding me to the top of Everest. They had been there before, they navigated me through the planning and every milestone, and they knew what obstacles we would encounter and how to handle them." -J.A., Test Engineer "I came to Cyth with a unique automation request, and while it was new to them it was very similar to other things they had automated." -R.R., Healthcare Product Design Manager Cyth is TRUSTED by Careers at Cyth Contact Cyth Learn our Technology Shop our Store

TestStand is a test executive software that accelerates system development and deployment for engineers in validation and production. NI TESTSTAND NI Authorized Distributor and System Integration Partner Home > Products > What is TestStand? What Is TestStand? TestStand is a test executive software that accelerates system development and deployment for engineers in validation and production. PRODUCT FEATURES Validation & Production Test Automation TestStand automates, accelerates, and standardizes the overall test process across all of your testers with native functionality for: -Calling and executing tests written in LabVIEW, Python, C/C++, or .NET -Complex tasks, such as parallel testing, sweeping, looping, and synchronization -Creating custom operator interfaces and robust tools for deployment and debugging -Unit tracking, creating automated reports, and storing results to local or network databases WHY TESTSTAND What Can I Do With TestStand? Develop test and deploy to your systems. Standardize and streamline your workflows. Learn how TestStand empowers test engineers to outpace time-to-market restrictions through efficiency: Buying TestStand TestStand Development System is available for purchase as a single subscription or as part of the Test Workflow Pro bundle. For scaling and deploying test to multiple test systems, NI offers perpetual licenses for the Deployment Engine and Debug Deployment Environment. TestStand Development System Recommended for engineers developing test sequences for multiple test systems. -Develop and debug test sequences using an interactive development environment.  -Call test code written in common programming languages. -Create deployable test system installers. Test Workflow Pro Recommended for developers that require test sequencing along with tools for hardware automation and data analysis. Includes TestStand Development System, plus: -LabVIEW for acquiring data from NI and third-party hardware as well as communicating using industry protocols. -DIAdem for searching for, viewing, and analyzing data and creating automated reports. -And more NI software! TestStand Saves Time Leveraging an off-the-shelf test executive lowers the total cost of test and improves developer efficiencies. Users save time in development, can reduce maintenance across testers, and increase throughput with native parallel test logic. 75% Development time saved 67% Reduction in maintenance 97% Increase in productivity with parallel testing

FlexLogger is a no-code data acquisition software engineers use to build validation and verification test applications. NI FLEXLOGGER NI Authorized Distributor and System Integration Partner Home > Products > What is Felxlogger? What Is FlexLogger? FlexLogger is a no-code data acquisition software engineers use to build validation and verification test applications. PRODUCT FEATURES Start fast, then scale Build flexible, scalable data-logging systems with NI DAQ hardware, no programming required. -Monitor test during execution with integrated visualization tools Save data according to your test needs—partition files according to size or time specifications -Configure mixed-signal measurements and more than 2000 channels in a single project -Set alarms to be notified of unexpected behavior FLEXLOGGER APPLICATIONS What Can I Do with FlexLogger? Use FlexLogger to get the verification or validation test data you need to make a better product and deliver it on time. Learn more about common applications below. Bu ying FlexLogger FlexLogger is available for purchase as a stand-alone subscription or as part of Test Workflow. Consider the Test Workflow bundle for FlexLogger and more NI Software. Licenses are sold as one-year subscriptions. FlexLogger Software Recommended for engineers looking to build test systems quickly and without any programming. Includes the standard capabilities of FlexLogger: -Interactively configure and monitor test -Save measurement data to a file -Perform basic arithmetic on channels -Configure alarms and events Test Workflow Standard Recommended for applications that require hardware automation, data analysis, automated reporting, and remote access to test. Includes: -LabVIEW Full, with tools for advanced analysis and signal processing -G Web Development Software, for building web applications for test -DIAdem Advanced, for measurement data search, visualization, analysis, and creating automated reports -FlexLogger, for performing data acquisition with NI hardware without needing to do any coding Test Workflow Pro Recommended for building simple test and measurement applications. Includes the standard capabilities of LabVIEW: -Acquire data from NI and third-party hardware and communicate using industry protocols -Create interactive UIs for test monitoring and control. -Utilize standard math, probability, and statistical functions -Integrate code written in Python, C/C++, .NET, and MathWorks MATLAB® software -Save data to .csv, .tdms, or any custom-defined binary file

Cyth Systems supports & stocks NI hardware & platforms. We work with engineers & buyers to design systems and fulfill and verify orders. In-stock Ready-to-ship Welcome to Cyth Systems Your One-Stop-Shop for Everything NI Our Latest Offers Made with you in mind Others Products In Stock Yes No Price Markups 10%-30% Markup No Handling Fees $200-$300 Experienced & Certified Product Advice No Free Tech Support with Orders No Free Project Startup Assistance No Stock Customization & Reservations No Yes Yes Yes Yes Yes Yes Yes Your Concierge Ordering Service No sign-in or setup is required. Submit any format or file: PDF, Excel, text, or even a screenshot and we will do the rest! Upload a Purchase Order or Request For Quote in any format - PDF, Word Document, Excel, even a screenshot or a Text. We'll process your quote or order and confirm by email. First Name Last Name Company Email [attributer-channel] [attributer-channeldrilldown1] How can we help? [attributer-channeldrilldown3] [attributer-landingpagegroup] Upload your order Upload File Upload supported file (Max 15MB) [attributer-channeldrilldown2] [attributer-landingpage] Submit Shop Online Self-Service Quotes, Orders & Purchases Verify Price and Check Stock Status Search by Category or by NI Part Number Shop NI Products Verify Price and Check Stock Purchase Online or by PO We're here to help you "Working with Marty through the transition to distribution has been wonderful!" M.L., Buyer, Sunnyvale, CA Aircraft Manufacturer, DoD Prime Contactor "I was uneasy about working with a distributor, but Melyssa eliminated my fears!" A.C., Supply Chain Manager Biotech Company, Salt Lake City, UT "You helped me get my order right, and then helped me get it faster" B.N., Software Architect, Crete, IL Railroad Products Manufacturer Looking for Support? Presales Support - ensures you select the right hardware for your application Startup Assistance - gets your new hardware up and running Debug & Code Audits - confirms your application runs correctly Get Support We have the experience you need. Book a time with an engineer for support. Meet with Support Integration Assistance Have a project in mind? Speak to an applications engineer for getting your project off the ground. Meet with Engineer

The NI CompactDAQ Chassis controls the timing, synchronization, and data transfer between NI C Series I/O modules and an external host. NI CompactDAQ Chassis NI Authorized Distributor and System Integration Partner Home > Products > CompacDAQ Chassis CompactDAQ Chassis CompactDAQ chassis control the timing, synchronization, and data transfer between C Series I/O modules and an external host. They feature USB, Ethernet, or WiFi connectivity and come in different slot counts for the right amount of I/O. Create customizable and cost-effective solutions for accurate benchtop measurements The CompactDAQ Chassis offers a rugged, flexible foundation for a CompactDAQ system. You can use multiple CompactDAQ chassis as part of a distributed measurement system and choose between time- and signal-based synchronization techniques. High- Accuracy, TSN-Enabled Measurements The CompactDAQ Chassis offers time sensitive networking, or TSN, which provides low-latency, deterministic communication on standard Ethernet. Hardware You Can Deploy in Harsh Environments The chassis’ rugged form factor—with an extended operating temperature range of -40 °C to 70 °C, 50 g shock, and 5 g vibration ratings—helps you deploy closer to your measurement and reduce the length of noise-prone sensor wires. CompactDAQ Voltage Measurement Bundle The CompactDAQ Voltage Measurement Bundle includes a chassis with a C Series Voltage Input Module with up to 32 channels for voltage measurements. CompactDAQ Temperature Measurement Bundle The CompactDAQ Temperature Measurement Bundle includes a chassis with the C Series Temperature Input Module with up to 32 channels for temperature measurement. CompactDAQ Sound and Vibration Measurement Bundle The CompactDAQ Sound and Vibration Measurement Bundle includes the C Series Sound and Vibration Input Module and a CompactDAQ Chassis. NI CompactDAQ Chassis Controls the timing, synchronization, and data transfer between NI C Series I/O modules and an external host. Feature Highlights: Platform: CompactDAQ

NI LabVIEW+ Suite combines powerful test, validation, and data analysis programs together to provide a more complete and cost-effective solution for engineers. What Is The LabVIEW+ Suite? The LabVIEW+ Suite includes LabVIEW plus additional NI software. The collection provides purpose-built tools for automating measurement, analysis, and test. The software works together to save you time. We can help you decide if LabVIEW+ is right for you. Contact us for more information. What's Included in the LabVIEW+ Suite? It’s LabVIEW, plus a whole lot more! The Suite amplifies the benefits of LabVIEW by adding software that provides even more time-saving and scalability resources. And by lowering the combined cost of purchase, bundled savings make it more accessible. Order LabVIEW+ LabVIEW+ Suite Applications The LabVIEW+ Suite is built for test professionals in electronics and electromechanical test. It provides software solutions to reduce development time, increase data usage, and prevent rework. Learn how the LabVIEW+ Suite can benefit you. Create Electronic Validation Test Systems LabVIEW+ helps you configure, visualize, and automate measurements, analyze your data, and share reports. Increase test coverage and decrease development time with LabVIEW+. Build Electronic Production Test Systems LabVIEW+ helps you build measurements and test steps into comprehensive test sequences. Meet challenging test coverage requirements despite shrinking NPI schedules with LabVIEW+. Set Up Electromechanical Validation Test Systems LabVIEW+ helps you set up large data logging systems with custom functionality and share the data you produce. Everyone in your lab is more productive with LabVIEW+. Order LabVIEW+ Add Software, Subtract Inefficiencies The LabVIEW+ Suite brings together the best of NI test software that saves engineers time by optimizing every part of their workflow. Each software includes features and capabilities designed to accelerate test: NI LabVIEW is the industry-leading environment for automated test system development. NI TestStand is used in validation labs and on manufacturing floors across the world to automate and sequence tests. NI DIAdem saves engineers hundreds of hours of manual data analysis and report creation with automation. NI FlexLogger and InstrumentStudio make measurement and instrument configuration a quicker and interactive process. Order LabVIEW+ How LabVIEW+ Complements LabVIEW How LabVIEW+ Suite Software Complements LabVIEW LabVIEW has been at our core for the past thirty years and engineers have relied on it to solve every problem. It accelerates development with graphical programming, makes building a user interface as easy as drag and drop, and can connect to any instrument. It’s powerful Over time, we’ve added other software to our portfolio, like TestStand and FlexLogger. Not everyone wants to or has the time to develop, which these tools help with. The LabVIEW+ Suite brings you more software at an affordable, bundled price. How LabVIEW+ Suite Software Complements LabVIEW NI's Authorized Distributor & Integration Partner We've been named NI's Premier Integration and Distribution Partner for Embedded and Electronics Systems. Contact us today! See the hundreds of LabVIEW systems we've developed We can show you examples of the systems we've deployed that are most similar to your needs. Contact us to schedule a meeting. Meet with our LabVIEW engineers to start planning your system The market won't wait, and neither should you. Contact us to get started. Need LabVIEW+ help or advice? Name Email Message [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] Submit [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup]

Prototype & productize bioprocess equipment on top of a proven reference design. BioFlex is an integrated reference design for biopharmaceutical machine builders. Bioprocess Control & Automation Solutions Explore Our Life Sciences Portfolio Prototype & productize bioprocess equipment on top of a proven reference design Why Design with BioFlex? Deliver your IP faster: Develop on an 80:20 COTS: custom architecture to focus on your differentiation. Validate process and recipe design: Easily modify parameters, test functionality, and measure yield. Maximize recipe control: Integrate any sensor or subsystem into a deterministic bioprocess. Capture and analyze data: Log directly on the machine or connect to a network for data analysis. SCHEDULE A DEMO BioFlex is an integrated reference design for biopharmaceutical machine builders Intended for Bioreactors Fermenters Incubation tanks Commercial biologics Control system architecture Customizable embedded and Windows UI Chemostats Turbidostats Diagnostic machines Cell analysis instrumentation Conditioned I/O for sensors & subsystems Alarming and datalogging engines Startup assistance & add-on engineering services Download Bioflex Brochure Validate biopharmaceutical equipment functionality and recipe design Supported Functionality Sensors: Temperature, pH, flow, strain, vibration, electrical measurements, etc. Communication protocols: Serial, UART, custom. Data formats: SQLite, .csv, TDMS, custom. Subsystems: Pumps, motors, actuators, valves, etc. User interface: Embedded, Windows. REQUEST A LIVE DEMO Reference Design Composition BioFlex native I/O* Architecture-Supported Customizations Third-party provided* *Specific sensors & subsystems included with add-on services Data Connectivity Entry / Exit Valve Control Pump Control Flowmeter Measurement Temperature Measurement & Control pH Measurement & Control Motor / Actuator Drive (Agitator) Industrialized Housing & Vessel Power Entry & Conditioning Vibration Measurement Embedded UI (HMI) System Controller Request Our Data Sheet Build using industry-standard measurement and control technology NI Software Flexibility from firmware to front-end Recipe editor Customizable firmware Sensor scaling and calibration Control algorithm toolkits Read our most recent Bioprocess Case Study High-quality components manufactured by NI and distributed and integrated by Cyth NI & Cyth Hardware Single-Board RIO | CircaFlex Single-Board RIO (sbRIO) is designed for high-volume and OEM embedded control and analysis applications that require high performance and reliability. NI offers a variety of controllers and I/O modules that you can use to build your system. Ready-to-use control architecture Board range of quality I/O Built-in connectivity Reference configurations available CompactRIO Systems CompactRIO hardware provides an industrial control and monitoring solution using sensor- or protocol-specific, conditioned I/O modules with real-time capabilities. Real-time processing needs Industrial monitoring and control applications Long-term testing in the field We are your one-stop-shop for everything NI NI Distribution NI HW & SW Training NI Integration Do More with CYTH'S ENGINEERING AND DEPLOYMENT SERVICES Donwload BioFlex Brochure Startup assistance - inclluded with BioFlex Software consulting and architexture customization Full system prototyping Value-added manufacturing Post-deployment support - repar, calibration, replacement Would you like to see our demo? First Name Last Name Email How can we help you? [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-landingpage] [attributer-channeldrilldown3] [attributer-landingpagegroup] Get Started Join the NI Technology Accelerator Program (NI TAP) Accelerate your innovation journey with the NI Technology Accelerator Program (NI TAP). NI TAP offers access to discounted hardware and software, and expert support to help you bring your products to market faster. Apply

Cyth Systems supports and stocks National Instruments products and platforms. We work with engineers and buyers to design systems and fulfill and verify orders. The only NI DISTRIBUTOR with NI CERTIFIED INTEGRATION Experience Others Products In Stock Price Markups Handling Fees Experienced Pre-Sales Product Assistance Post-Sales Tech Support Included with Orders Project Startup Assistance Yes Yes Yes No $0 $0 Yes Yes Yes 10%-30% Markup $200-$300 Available No No No No Register to reserve these exclusive offers Extended Life & Quantity Discounts Packages Stock Customization & Reservations "Working with Marty... wonderful!" "Working with Marty through the transition to distribution has been wonderful!" M.L., Buyer, Sunnyvale, CA Aircraft Manufacturer, DoD Prime Contactor Oct 2023 Do you already know what you need? Request a Quotation Verify Lead Times Submit your PO below Any format (PDF, Excel, text, email, even a screenshot) Our Operations team will take care of the rest for you. Quotes or Orders Searching for products? View our online Webstore and review platforms, control systems, signal I/O, components, sensors, motors, pumps, and more! Shop our Store Need help selecting hardware? Offering a unique mix of Experience, no markups, personalize stocking, technical support, as well as live agents to help you Product Advice Integration Talk to a NI Products expert for technical specifications, product advice, review your specifications, life cycle status, and system configuration. Meet with Engineer Work with Cyth as your NI DISTRIBUTOR and enjoy special benefits! Personal Service, Technical Support, customizable inventory, and so much more! NI's Authorized Distributor & Integration Partner We've been named NI's Premier Integration and Distribution Partner for Embedded and Electronics Systems. Contact us today! See the hundreds of LabVIEW systems we've developed We can show you examples of the systems we've deployed that are most similar to your needs. Contact us to schedule a meeting. Meet with our LabVIEW engineers to start planning your system The market won't wait, and neither should you. Contact us to get started. Register your interest today to reserve your special pricing. Let us know if you want us to reach out! First Name Last Name Email How can we help you? [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-landingpage] [attributer-channeldrilldown3] [attributer-landingpagegroup] Get Started

NI oscilloscopes and digitizers measure changes in electrical signals over time. Use these products for time‐ and frequency‐domain applications. Home > Products > Oscilloscopes and Digitizers NI Oscilloscopes and Digitizers Oscilloscopes and digitizers measure changes in electrical signals over time. Use these products for time‐ and frequency‐domain applications as well as to build spectrum analyzers, transient recorders, and many-channel phenomena detection systems. NI PLATFORM MODULES Platform modules integrate with modular hardware platforms that allow you to combine different types of modules in a custom system that leverages shared platform features. NI offers three hardware platforms—CompactDAQ , CompactRIO , and PXI —though all platforms may not be represented in this category. PXI Oscilloscope Bundle The PXI Oscilloscope Bundle includes a chassis with a PXI Oscilloscope with support for up 1.5 GHz of analog bandwidth. PXI Oscilloscope Acquires and analyzes time- and frequency‐domain analog signals as part of a PXI system. Feature Highlights: Platform: PXI Bus: PXI, PXI Express PXI IF Digitizer Analyzes intermediate frequency (IF) data for use in communications applications and superheterodyne receiver architectures. Feature Highlights: Platform: PXI Bus: PXI, PXI Express PXI FlexRIO Digitizer Combines A/D converter technologies with Xilinx FPGAs for applications that demand real-time signal processing and high-performance analog input. Feature Highlights: Platform: PXI Bus: PXI Express Digitizer Adapter Module for FlexRIO Provides high‐speed analog I/O to digitize signals from your transducer with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO. Feature Highlights: Bus: FlexRIO C Series Digitizer Module Acquires and analyzes time- and frequency‐domain analog signals as part of a CompactDAQ or CompactRIO system. Feature Highlights: Platform: CompactDAQ, CompactRIO NI STAND-ALONE OR COMPUTER-BASED DEVICES Stand-alone or computer-based devices either integrate with standard desktop and laptop computers or allow you to use them without the need for other modular hardware. NI Oscilloscope Device Acquires and analyzes time‐ and frequency-domain analog waveforms. Feature Highlights: Bus: PCI, PCI Express, USB NI FlexRIO Digitizer Device Combines A/D converter technologies with Xilinx FPGAs for PCI applications that demand real-time signal processing and high-performance analog input. Feature Highlights: Bus: PCI Express NI Oscilloscope Probe Provides connectivity for PXI Oscilloscope, Oscilloscope Devices, and the VirtualBench All-In-One Instrument.

NI’s sound and vibration products acquire acoustic and vibration signals for audio test, condition monitoring, and more. Choose your form factor today. NI Sound & Vibration Measurement Products NI Authorized Distributor and System Integration Partner Home > Products > Sound and Vibration Sound and Vibration Sound and vibration products interface with microphones and accelerometers to acquire acoustic and vibration signals. Use these products for audio test; machine condition monitoring; and noise, vibration, and harshness (NVH) applications. Easily take sound and vibration measurements with NI hardware and software NI’s sound and vibration products integrate with the software of your choice for dynamic signal acquisition (DSA) applications. You can use interactive measurement panels in DAQExpress, create custom applications in development software like LabVIEW, and more. Available in the Form Factors You Need NI offers sound and vibration measurement hardware that works with the system you use: PC-based, PXI, CompactDAQ, or CompactRIO. If you need additional features for extreme environments, consider FieldDAQ™ hardware. Sound and Vibration-Specific Software for Quick Analysis All NI sound and vibration hardware is programmable with NI-DAQmx software and compatible with the LabVIEW Sound and Vibration Toolkit, which includes easy-to-use power spectrum, swept sine, octave analysis, and other functions. PLATFORM MODULES Platform modules integrate with modular hardware platforms that allow you to combine different types of modules in a custom system that leverages shared platform features. NI offers three hardware platforms—CompactDAQ , CompactRIO , and PXI —though all platforms may not be represented in this category. CompactDAQ Sound and Vibration Measurement Bundle The CompactDAQ Sound and Vibration Measurement Bundle includes the C Series Sound and Vibration Input Module and a CompactDAQ Chassis. PXI Sound and Vibration Module Provides dynamic signal generation and acquisition in sound and vibration applications for PXI systems. Feature Highlights: Platform: PXI Bus: PXI, PXI Express C Series Sound and Vibration Input Module Provides dynamic signal acquisition in sound and vibration applications for CompactDAQ and CompactRIO systems. Feature Highlights: Platform: CompactDAQ, CompactRIO C Series Universal Analog Input Module Provides analog input channels for voltage, current, temperature, and strain measurements in CompactDAQ or CompactRIO systems. Feature Highlights: Platform: CompactDAQ, CompactRIO Sound and Vibration Input Device for FieldDAQ Provides dynamic signal acquisition in rugged environments. FieldDAQ™ devices are dust- and water-resistant and offer TSN technology for simplified distribution. Feature Highlights: Bus: Ethernet STAND-ALONE OR COMPUTER-BASED DEVICES Stand-alone or computer-based devices either integrate with standard desktop and laptop computers or allow you to use them without the need for other modular hardware. Sound and Vibration Device Provides dynamic signal generation and acquisition in sound and vibration applications for computer-based systems. Feature Highlights: Bus: PCI, USB

Due to the unique nature of machine vision solutions, they require a different form of thinking & problem-solving to implement accurate & repeatable results. SERVICES Machine Vision Systems Home > Services > Machine Vision Systems MACHINE VISION SYSTEMS Machine vision solutions are typically used for automated inspection and process control across a wide range of industries. Our machine vision lab enables us quickly prototype proofs of concept to demonstrate the feasibility of meeting your needs through a machine vision application. MACHINE VISION SYSTEMS Service Areas Area Scan & 2D Inspection 2D Inspection subcategories ↑ Cell counting and recognition Customize your "flat" image testing needs The most common form of machine vision is 2D vision and area scan solutions. Our broad experience ensures that we know how to ask the right questions and integrate the correct solution for your needs - no matter what industry you are in or what you need to inspect. End-of-line manufacturing inspection Sub Pixel Presicion Measurement Guiding assembly Barcodes & Optical Character Recognition Microscopy 3D Inspection 3D Inspection subcategories ↑ Confirming molded part shapes 3D Machine Vision uses a laser and camera to collect the full 3D profile of an object as a shape instead converted to either an image or a point cloud. 3D data can then be analyzed using typical image analysis techniques to look for bumps, scratches, measure holes, or compute volumes. Applications include regulating the volume of a bar of soap, analyzing microstructures in a material, or finding defective molded parts. Measuring volume Scratches, cracks, or imperfections Confirming presence or absence Machine Learning - NeuralVision Machine Learning Vision subcategories ↑ Machine Vision involves teaching a machine to recognize and classify images and is now available for industrial inspection and automation. It can be extremely useful when traditional vision inspection solutions are too complicated to program, or simply not accurate or consistent. NeuralVision is a cloud-based AI software that bypasses traditional machine vision programming. NeuralVision learns by studying images to learn to classify images or detect problems.... just like humans do! Classifying organic items Recognizing defects in assemblies Hard-to-define inspections MACHINE VISION SYSTEMS Case Study Portfolio Robotic Automation Triples Sample Preparation Throughput Circaflex & NI Single-Board RIO Power Syringe Lubrication Inspection Demo Machine Vision Solution Enables Steel Surface Defect Detection Inspecting Dinner Plates Using LabVIEW & Vision Integration A Mobile Platform for Road Inspections Using LabVIEW Machine Vision Inspection of Implantable Electrode Wire to Combat Parkinson's Disease Synchronizing High-Speed Cameras to Improve Golf Performance Cyth Pairs AI Software with Robotic Arm to Sort Organic Seedlings Machine Vision System Inspects Medical Guide Wire Electrode for Surgical Safety System 1 2

As NI’s only Authorized Distributor and Certified Integration Partner, we have dedicated resources working to deliver new and exclusive benefits for academia! NI DISTRIBUTION Academic Sales & Support Home > Industry > Academic Your PARTNER for Academic INNOVATION At Cyth Systems, we are dedicated to the next generation of engineers who will build our future factories and products. As a result, we are excited to announce dedicated resources to support educators and students! Technical Pre-Sales Support Exclusive Discounts on LabVIEW & NI Products Technical / Post-Sales Support Free Training and Certifications Student Services packages, tours, and career connections New for 2025: Sign up for Cyth's "LabVIEW Renew" Package! LabVIEW License pricing and discounts only available from Cyth Systems! Usage and bundle discounts, free Technical Support, Certifications, career connections, and student perks! Renewing your licenses later in the year? Register now to reserve your package! Register Now Unparalleled Support for PROFESSORS, STUDENTS, and RESEARCHERS. LabVIEW Training & Curriculum Introductory Training Material Official LabVIEW NI Training Optional Loaner or Keeper Hardware Self-Paced Exercises and Challenges Surprise Gift upon completion Coming Soon! Academic Research Pre-Sales Platform Advice Component Selection Advice Startup Assistance (Code and Wiring) Code Review & Architecture Advice Custom Request & Solutions Student Projects and Competitions Easy-to-use professional maker kits Project Starter Advice Manufacturing & Engineering Jobs Connections Code Support & Auditing LabVIEW / NI Curriculum Packages Exclusive Pricing for HW & Licensing Technical Support Technical Support Startup Assistance with HW Purchase Code Review & Architecture Advice Custom Request & Solutions Student & Career Services Internship Opportunities Virtual Factory & Project Tours Resume & Career Advice Manufacturing & Engineering Jobs Connections Industry-leading HARDWARE and SOFTWARE in the hands of STUDENTS and PROFESSORS Entry-Level Data-Acquisition Inexpensive yet capable devices devices for taking measurements and doing simple control tasks. Industrial & Research Grade Measurement & Automation Solutions Specially crafted packages depending on your mixed use of LabVIEW. Bundle discounts for software with hardware. Real-Time Embedded Control Systems Specially crafted packages depending on your mixed use of LabVIEW. Bundle discounts for software with hardware. Specially crafted packages depending on your mixed use of LabVIEW. Bundle discounts for software with hardware. LabVIEW Startup Assistance and Grant Program for SPINOFF and INCUBATORS We recognize the differences in your specific industry segments, and we have delivered products and services to all segments of the Semiconductor Industry. Get the right tool for the job Special Offer Our Online Shop - Renew License or Select Hardware Do you already know what NI Products you need? Submit your PO below and our NI Distribution Operations team will take care of the rest for you. Submit an Order Know your products and need a quote? Upload a file, or list your products to get accurate price and lead time information. Request a Quote The only distributor selling NI products at list price. See our selection of in-stock NI products at the link below. Shop Online Product Support NI Product Selection Assistance. Talk to a NI Products expert for technical specifications, life cycle status, and system configuration. ACADEMIC Projects using LabVIEW and NI Platform For years sudents, professors, lab managers, and researhcers have used LabVIEW and the For years sudents, professors, lab managers, and researhcers have used LabVIEW and the For years sudents, professors, lab managers, and researhcers have used LabVIEW and the For years sudents, professors, lab managers, and researhcers have used LabVIEW and the For years s Building An Electron Scanning Microscope to Streamline Semiconductor Manufacturing Arbitrary AWG for Next-Generation Semiconductor Manufacturing

SystemLink equips enterprises to utilize test & measurement data for removing operational inefficiencies & uncovering actionable insights to improve performance NI SYSTEMLINK NI Authorized Distributor and System Integration Partner Home > Products > What is SystemLink Software? Connecting People, Process, and Technology SystemLink is an intelligent Systems and Data Management environment that breaks down silos in your organization—from concept to manufacturing. Designed for engineering use cases, SystemLink software combines focused applications and data services that accelerate time-to-knowledge and time-to-market by leveraging comprehensive real-time information. From engineering teams to enterprises, SystemLink software helps you achieve peak performance. Acquire data. Aspire for knowledge. Choose SystemLink Software. SystemLink Software by Product SystemLink software products deliver superior situational awareness, test and measurement data analysis, and intelligent automation. With a modular and integrated architecture, choose the products that address your team’s specific needs. SystemLink Software by Workflow SystemLink software workflows empower your engineering and manufacturing groups to accelerate the NPI process and shorten the time-to-ramp to production. With better information management, efficient root-cause analysis, standardization of processes under test, automation of repeatable and time-consuming tasks, and improved yield, manufacturers gain a competitive edge. Increase your business performance across all test processes, systems, and locations with SystemLink software. SystemLink Software by Workflow From functional test in electronics manufacturing to digital transformation in aerospace and defense, SystemLink software delivers solutions to meet your unique needs. Explore SystemLink in these areas: -Aerospace and Defense Digital Transformation -Automotive Data Management and Analysis -Electronic Functional Test

In this workshop, design, configure, & deploy your first embedded system. Learn to use NI's LabVIEW & reconfigurable I/O HW to bring your products to life. Build Your Own Embedded System Bring your products to life In this hands-on event, learn how to use LabVIEW and NI's reconfigurable I/O hardware to design, develop, and deploy your own control and monitoring systems. Upcoming events : BYOES, October 14th-17th - San Diego, CA Attendee Registration First Name Last Name Email [attributer-channel] [attributer-channeldrilldown1] Event Date & Location [attributer-channeldrilldown2] [attributer-channeldrilldown3] Save My Seat [attributer-landingpage] [attributer-landingpagegroup] Thanks for submitting! Please check your email for confirmation. Sponsored by: Who should attend this event? Engineers seeking to expand their embedded design knowledge and core LabVIEW skills for Real-Time and FPGA-based applications. Engineers looking for continuing education with NI tools from experience embedded application developers. What to expect Half-day hands-on seminar covering intermediate-to-advanced concepts associated with the RIO hardware platform and LabVIEW Real-Time and FPGA modules. Design, develop, and deploy an embedded software architecture covering I/O integration, data communication, and UI concepts Explore the products EMBEDDED CONTROL & MONITORING Case Study Portfolio CompactRIO Enables Undergraduate Power Electronics Education Robotic Automation Triples Sample Preparation Throughput Production Capacity up 350% with Automated Dispensing Hardware-Timed Automation Accelerates Gas Meter Testing Micron-Scale Inspection via Precision Vision & Motion Millisecond Control for Simulating Human Lung Behavior Precision Control System Advances Global Health Biotech Startup Accelerates Funding with Scalable Reference Design Controlling a Stepper Motor Using the RIO Platform and LabVIEW 1 2 3 4 5

Biotech, MD device testing, analytical instrumentation, and pharma discovery, we provide highly-flexible & cost-effective solutions that bring new tech to life. INDUSTRIES Life Science Home > Industries > Life Science Bringing your LIFE SCIENCES projects a new level of HEALTH The diversity of the life science field is mirrored in the wide range of applications solved by Cyth Systems. From biotechnology to medical device testing, analytical instrumentation to pharmaceutical discovery, Cyth provides highly flexible and cost effective solutions that help accelerate discovery and bring new technologies to life. LIFE SCIENCE Industry Segments We recognize the differences in your specific industry segments, and we have delivered products and services to all segments of the Life Sciences Industry. Medical Devices Cell & Genetic Research Scientific Instruments Biotechnology Pharmaceutical Scientific Research & Simulation LIFE SCIENCE INDUSTRY Project Examples Our platform for Automation, Test, and Control is a good fit for many types of projects in the Life Science Industry. The following projects were completed and deployed using our products and services. Automated Battery QA Ensures Medical Device Reliability Custom EMF Measurement Solution Doubles End-of-Line Test Throughput Production Capacity up 350% with Automated Dispensing Millisecond Control for Simulating Human Lung Behavior Precision Control System Advances Global Health Machine Vision Inspection of Implantable Electrode Wire to Combat Parkinson's Disease Proton Therapy Cancer Treatment Controlled using NI Single-Board RIO CompactRIO Revolutionizes 3D Printing Custom RFID Tracking System for Biotech Reagent Bottles using LabVIEW Keyence Laser Profilometer Used to Analyze Cutting Edge of Surgical Scalpels Control System for Ocean Remote Explorer using Single-Board RIO and LabVIEW Multi-PCBA Test Solution Delivers Broad Functional Test Coverage for FDA Compliance Human Cardiovascular Simulation Device with Circaflex, Single-Board RIO, and LabVIEW Machine Vision System Inspects Medical Guide Wire Electrode for Surgical Safety System

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Our skilled, seasoned team uses their natural talent for problem-solving to create solutions for companies in a wide range of industries all over the world. COMPANY About Cyth Systems Home > Company > About Cyth Over Two Decades of Delivering NI Hardware and Software Systems We are experts in Automated Test Equipment, Embedded Systems, Machine Vision, and Industrial Automation, and we are a System Integrator and Authorized Distributor for NI. Our unique approach combines modular hardware and software with comprehensive service expertise, ensuring custom, high-quality solutions in energy & power, life sciences, semiconductors, product manufacturing, and other markets. Our platform approach enables product-specific solutions to be applied from early-stage R&D through high-volume production. Cyth Systems' NI Integrator Profile webpage The only NI Authorized Distributor with hands-on NI Certified Experience We are NI’s Authorized Distributor for customers in the United States, Canada, and Mexico. Our expertise extends beyond distribution. We specialize in Embedded Controls and OEM Customers and collaborate as an NI System Integration Partner. From consulting on NI product selection to delivering fully integrated solutions, Cyth provides expert services to meet customer expectations. Cyth Systems' NI Distributor Profile webpage Follow us on Social Media to stay up-to-date on our NEW Job opportunities & Cyth NEWS

Data Acquisition Products Download DAQ, Industrial PXI Download DAQ, PXI, Simultaneous DAQ, PXI, High Performance DAQ, PXI, Value DAQ, Desktop PCI DAQ, USB Download DAQ, USB, Multifunction DAQ, USB, High Speed Compact DAQ (cDAQ) Family Download Compact DAQ (cDAQ) Chassis Compact DAQ (cDAQ) Controller Real-Time & Embedded CompactRIO (cRIO) Family CompactRIO (cRIO) Chassis CompactRIO (cRIO) Modules Download Single-Board RIO Download sbRIO Main Boards sbRIO I/O Modules sbRIO Accessories Download PXI Platform Download PXI Chassis PXI Controllers PXI Modules Download PXI Data Aqcuisition Download PXI, DAQ, Simultaneous PXI, DAQ, High Performance PXI, DAQ, Value PXI Oscilloscopes PXI Digital Multimeters Industrial Instrumentation Download Digital Multimeters (DMM's) Download PXI Digital Multimeters Oscilloscopes & Digitizers Download Oscilloscopes, USB Oscilloscopes, PXI Oscilloscopes, Desktop PCI Oscilloscope Accessories Digitizer, PXI, High Performance Digitizer, PXI, Value Not yet used

Cyth Systems can help you meet your quality and traceability requirements through automated test and measurement to produce zero-defect next-generation products INDUSTRIES Semiconductor Industry Home > Industries > Semiconductor Industry SPARKING improved capability in the SEMICONDUCTOR & ELECTRONICS industry The semiconductor and electronics industry have lead an explosion of innovation. The industry requires design, validation, and manufacturing of next-generation products to deliver increasingly higher quality and higher reliability than ever in the past. SEMICONDUCTOR INDUSTRY Segments We recognize the differences in your specific industry segments, and we have delivered products and services to all segments of the Semiconductor Industry. Semiconductor Equipment & Tools Microchips, Memory, and IC Fabrication Automated Stimulation & Measurement Consumer Electronics Manufacturing SEMICONDUCTOR INDUSTRY Project Examples Our platform for Automation, Test, and Control is a good fit for many types of projects in the Semiconductor Industry. The following projects were completed and deployed using our products and services. Building An Electron Scanning Microscope to Streamline Semiconductor Manufacturing Arbitrary AWG for Next-Generation Semiconductor Manufacturing

Schedule time with a NI Products expert Get support on weekdays from 9 AM to 5 PM PST: Support: +1-619-643-0738 | niorders@cyth.com Schedule time with a NI Products expert Consultation on systems and modules Custom integrated solution for control application Troubleshooting advice on Software Get support on weekdays from 9 AM to 5 PM PST: Support: +1-858-537-1960 | niorders@cyth.com Request time with an engineer today! Name Company Email How can we help? Upload File Upload supported file (Max 15MB) Submit [attributer-channel] [attributer-channeldrilldown2] [attributer-landingpage] [attributer-channeldrilldown1] [attributer-channeldrilldown3] [attributer-landingpagegroup]

The following are terms of this project, which are requirements in consideration of engaging this engineering project, independent of any terms. COMPANY Commercial Terms Home > Company > Commercial Terms Summary 1. Working with Cyth 1.1 Commercial Terms The following are terms of this project, which are requirements in consideration of engaging this engineering project, independent of any terms and conditions of a Sales Order, Purchase Order, or other Agreements. Cyth reserves the right to cancel the project and refund any unused funds if a major discovery is made which invalidates the project budget, features, or schedule. Cyth maintains a security interest and ownership of materials, fruits of labor, intellectual property, and work product that are given to the customer until all items are fully paid for. Any items not paid for remain Cyth owned property, and must be returned on demand. This term expressly supersedes common law, the terms of any Purchase Order, Sales Order, Agreements, Contracts, and Uniform Commercial Code. For the sake of clarity, it is the express intention of Cyth and the customer that all goods and services delivered will be paid for, and those not paid for will be returned on demand. Acceptance Test must be performed by client within 15 days of delivery, unless otherwise noted and approved by Cyth in writing. If Acceptance Test cannot be accommodated within a reasonable time period, the client must make any requested payments with or without the successfully completed acceptance tests. In the case of excessive project delays or if a project is put on hold, additional costs may be incurred for project restart, replacing or retraining personnel, or remembering or re-learning details of the project. Costs will be detailed and budgeted in an Engineering Change Order (ECO). Any samples, products, etc. received may be subject to destructive testing during developing and may be disposed of during/after development unless written instructions are provided with specific handling and return instructions. 1.2 Budget & Schedule Management Even after sincere efforts to carefully review requirements and authoring of the cost sheet and proposal, this document may contain errors or omissions. All budgets, statements, specifications, proposals, and plans are good-faith statements and estimates. Cyth makes no guarantee of the contents of this document, nor the deliverables or performance of the project goals without all necessary support materials and budget required to complete goals. As with any engineering project there are problems to be solved, assumptions to be checked, and some components which have been suggested but not yet verified. Cyth will make every reasonable effort to complete the project in a timely and professional manner and will report progress and budget status to the client on a regular basis. Throughout the project all specifications, design choices, and changes will be recorded in the relevant documents. 1.3 Engineering Change Orders Any change which requires modification of budget, schedule, or performance will require an Engineering Change Order (ECO). An ECO may result not only from specific change requests from a customer, but also from unforeseen issues, invalid assumptions, new discoveries, replacing components, and other changes necessary to meet the project goals. An ECO (or possible ECO’s reported in the Project Status Report) may also be used to track issues that could result in budget or schedule changes. Since some tasks may take extra time, and others may take less, some Potential ECO items may not result in an ECO. Yet if there are too many of these items, eventually an ECO may be used when hours are exhausted or more hours are needed. 1.4 Warranty Limitations In contrast with off-the-shelf commercial products, custom-designed systems and bespoke integrated devices from Cyth Systems carry a specialized warranty. All services and fabricated items provided by Cyth will be of good workmanlike quality and all materials will be in good new working order. However, there is no guarantee that the integrated systems or goods provided by Cyth, even being of workmanlike quality and in new condition, will meet all the customers stated goals and needs; systems or goods provided by Cyth might require additional budget and project work including debug, design, engineering, testing, or iteration in order to meet customer’s goals. However, any goods or services proven not to be of workmanlike quality, or having an avoidable defect, or inexcusable engineering mistake will be replaced or reworked in a manner to be determined in Cyth’s sole discretion. The warranty does not cover cases in which the system passed Acceptance Testing, yet issues arise or are discovered requiring additional design, rework, and reprogramming. No warranty or guarantee expressed or implied, including any warranty as to merchantability or fitness for any purpose, is made other than those expressly set forth above which are made in lieu of all other warranties or guarantees. Cyth Systems shall not be liable for any loss, damage, or injury, directly or indirectly arising from the use of such equipment or for consequential damages of any nature. 1.5 Component 3rd Party Manufacturers’ Warranty Terms Third-party materials and components carry a warranty provided by the component manufacturer, from the date of purchase, subject to the terms and conditions of those manufacturers. Custom-developed hardware and software components are warrantied to be free from defects in design, materials, and workmanship for a period of twelve (12) months from the date of delivery. This warranty does not extend to any equipment, component or part subjected to abnormal operating conditions, improper or incorrect maintenance, or modification. This warranty does not cover normal wear and tear, or the lifetime of wear-out components unless the lifetime, wear, or maintenance interval has been expressly called out as a design requirement. Since the system is a custom device, it can be difficult to determine faults in workmanship or materials, therefore the time needed to diagnose and repair a defect may be billable pending a root-cause analysis for each failure or occurrence. For More Information Contact Us Or Browse Store

The terms & conditions detailed in the Agreement apply to your Customer's purchase from Cyth Systems or Cyth Systems E, Inc., Seller of NI hardware & Software. COMPANY Terms & Conditions of Sale (HW & SW) Home > Company > Terms and Conditions of Sale (Hardware and Software) The terms and conditions detailed herein ("Agreement") apply to your ("Customer") purchase from Cyth Systems Inc. (or Cyth Systems E, Inc) (“Seller”) of NI hardware ("Hardware"), licenses to use NI software ("Software"), and Non-Seller Branded Products (collectively the "Product(s)"), as well as training, services, and support related to Hardware and Software ("Services"). THIS AGREEMENT SHALL APPLY UNLESS CUSTOMER AND SELLER HAVE ENTERED INTO A SEPARATE SIGNED AGREEMENT APPLICABLE TO THE PURCHASE OF THE PRODUCTS OR SERVICES. By placing an order with Seller, Customer agrees to be bound by the terms of this Agreement. Seller EXPRESSLY OBJECTS TO AND REJECTS ANY TERMS AND CONDITIONS IN CUSTOMER'S PURCHASE ORDER OR OTHER SIMILAR DOCUMENT. IF CUSTOMER DOES NOT AGREE WITH THESE TERMS, PROMPTLY NOTIFY SELLER AND RETURN THE PRODUCT UNUSED IN ITS ORIGINAL PACKAGING TO SELLER. 1. PRICES AND ORDERS. Prices are set forth in the quotation issued by Seller to Customer ("Quote"). All Quotes expire thirty (30) days from date of issuance, unless otherwise stated in the Quote. All orders are subject to acceptance at the sole discretion of Seller. Orders will be considered accepted once Seller books an order and sends Customer a sales order acknowledgement. Seller shall not be bound by changes to an order unless agreed by Seller in writing. Seller reserves the right to cancel any order if any information provided by Customer to Seller is inaccurate. Seller reserves the right to suspend or cancel any order if Customer has any outstanding payments due to Seller or is not in good standing. 2. PAYMENT AND INVOICING. Payment is due at the time the order is placed. If Customer is approved for credit, payment shall be due on the date indicated on the invoice, based on approved payment terms. Payment shall be in the currency listed on the Seller invoice. All sums not paid when due shall accrue interest daily at a per annum rate of 10%. If there are multiple units in an order, each unit will be invoiced when shipped. Nonstandard invoice processes requested by Customer may be subject to a five percent (5%) processing fee and any amounts Seller is required to pay to government authorities on behalf of customers (if required). 3. DELIVERY, TITLE and RISK OF LOSS. Title and risk of loss to Products (for Software, the media) shall pass to Customer upon shipment from Seller, its warehouses, or its affiliated companies; provided however, Customer hereby grants and Seller retains a security interest and right of possession in the Products until Customer makes payment to Seller in full. Seller is hereby authorized to file a UCC-1 Financing statement as it relates to its security interest in the products (for Software, the media). For the sake of clarity, the delivered materials will remain the property of Seller, and the Customer expressly agrees to either return the property, or provide access or surrender the materials upon demand, even if the materials have been used or installed into other equipment, they will be returned to Seller without argument, delay, or obstruction, and will not be subject to or involved in any bankruptcy proceedings, receivership, auctions, or any other means of disposal other than returned to Seller’s possession. For orders to be delivered within the same country as the Seller entity accepting the order, Seller will arrange the shipping; however, Customer is responsible for all shipping and handling fees set forth in the invoice. If Customer chooses to arrange for shipping or if the order is placed with a Seller entity outside the country of the applicable shipping destination, Customer is responsible for all shipping and handling, including fees, customs, formalities and clearance, unless otherwise indicated by Seller. Shipment dates provided by Seller are estimates only, and Seller shall have no liability for losses or claims resulting from late delivery of Products. Claims for shipment shortage shall be deemed waived unless presented to Seller in writing within forty-five (45) days of the invoice date. 4. TAXES. Prices exclude, and Customer is responsible for, all sales, use, service, value added, and like taxes ("Taxes") arising from the purchase of the Products and Services. If Customer is exempt from any Taxes, it must provide Seller with the appropriate tax exemption documentation at the time the order is placed. 5. SOFTWARE. Software is licensed pursuant to the software license agreements provided with the software or, in the absence of such license agreements, the NI Software License Agreement available at ni.com/legal at the time of order. All software is licensed, not sold, and title to the software remains with the applicable licensor(s). 6. NON-Seller BRANDED PRODUCTS. Non-Seller Branded Products that Seller resells may not be testable or repairable by Seller, and it may be necessary for Customer to contact the manufacturer or the publisher for service or any warranty claims. Seller does not warrant, has no obligation to support, and shall have no liability for Non-Seller Branded Products. The Limited Warranty and Seller Intellectual Property Liability sections of this Agreement do not apply to the sale and purchase of Non-Seller Branded Products, as Seller does not provide any warranty relating thereto "Non-Seller Branded Products" means any third-party hardware, software, or service that Seller sells, but does not carry a Seller mark. 7. SERVICES. In addition to the terms and conditions of this Agreement, Services provided by Seller are also subject to any service agreements or statements of work agreed upon in writing by the parties or, as applicable, to the Seller service terms and conditions. 8. RETURN POLICY. Subject to the requirements of this Agreement, Customer may return standard Hardware and Software within thirty (30) days of the invoice date. Seller reserves the right to charge Customer a fifteen percent (15%) restocking fee for any Products returned to Seller. No returns will be accepted after the thirty (30) day period has expired. A Return Material Authorization (RMA) number is required for Customer to return any Products. Acceptance of returns of customized Products and Non-Seller Branded Products is in the sole discretion of Seller. 9. LIMITED WARRANTY. For a period of one (1) year from the invoice date, Seller warrants that its Hardware will be free of defects in materials and workmanship that cause the Hardware to fail to substantially conform to the then applicable Seller published specifications. For a period of ninety (90) days from the invoice date, Seller warrants that the Software (i) will perform substantially in accordance with the applicable documentation provided with the Software and (ii) the Software media will, in the form received from Seller, be free from defects in materials and workmanship. Seller warrants that the Services will be performed in a good and workmanlike manner. If Seller receives notice of a defect or non-conformance during the applicable warranty period, Seller will, in its sole discretion: (i) repair or replace the affected Hardware or Software, (ii) re-perform the affected Services, or (iii) refund the fees paid for the affected Hardware, Software or Services. Repaired or replaced Hardware or Software will be warranted for the remainder of the original warranty period or ninety (90) days, whichever is longer. If Seller elects to repair or replace Hardware, Seller may use new or refurbished parts or products that are equivalent to new in performance and reliability and are at least functionally equivalent to the original part or Hardware. Customer must obtain an RMA number from Seller before returning any Hardware under warranty to Seller. Customer will pay shipping expenses to send the affected Hardware to Seller, and Seller will pay shipping expenses to return the Hardware to the Customer. If, however, Seller concludes, after examining and testing returned Hardware, that it is not covered by the Limited Warranty, Seller will notify Customer and return the Hardware at Customer's expense. Seller reserves the right to charge a fee for examining and testing Hardware not covered by the Limited Warranty. This Limited Warranty does not apply if the defect of the Hardware or Software resulted from improper or inadequate maintenance, installation, repair, or calibration (performed by a party other than Seller); unauthorized modification; improper environment; use of an improper hardware or software key; improper use or operation outside of the specifications for the Hardware or Software; improper voltages; accident, abuse, or neglect; or a hazard such as lightning, flood, or other act of nature. THE REMEDIES SET FORTH IN THIS SECTION ARE EXCLUSIVE AND THE CUSTOMER'S SOLE REMEDIES, AND SHALL APPLY EVEN IF SUCH REMEDIES FAIL OF THEIR ESSENTIAL PURPOSE. 10. NO OTHER WARRANTIES. EXCEPT AS EXPRESSLY SET FORTH IN THIS AGREEMENT, PRODUCTS AND SERVICES ARE PROVIDED "AS IS" WITHOUT WARRANTY OF ANY KIND AND Seller DISCLAIMS ALL WARRANTIES, EXPRESSED OR IMPLIED, WITH RESPECT TO THE PRODUCTS OR SERVICES, INCLUDING ANY IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, TITLE OR NON-INFRINGEMENT, AND ANY WARRANTIES THAT MAY ARISE FROM USAGE OF TRADE OR COURSE OF DEALING. SELLER DOES NOT WARRANT, GUARANTEE, OR MAKE ANY REPRESENTATIONS REGARDING THE USE OF OR THE RESULTS OF THE USE OF THE PRODUCTS OR SERVICES IN TERMS OF CORRECTNESS, ACCURACY, RELIABILITY, OR OTHERWISE. Seller DOES NOT WARRANT THAT THE OPERATION OF THE PRODUCTS WILL BE UNINTERRUPTED OR ERROR FREE. 11. WARNING AND CUSTOMER INDEMNITY. CUSTOMER UNDERSTANDS AND ACKNOWLEDGES THAT PRODUCTS AND SERVICES ARE NOT DESIGNED, MANUFACTURED, OR TESTED FOR USE IN LIFE OR SAFETY CRITICAL SYSTEMS, HAZARDOUS ENVIRONMENTS OR ANY OTHER ENVIRONMENTS REQUIRING FAIL-SAFE PERFORMANCE, INCLUDING IN THE OPERATION OF NUCLEAR FACILITIES; AIRCRAFT NAVIGATION; AIR TRAFFIC CONTROL SYSTEMS; LIFE SAVING OR LIFE SUSTAINING SYSTEMS OR SUCH OTHER MEDICAL DEVICES; OR ANY OTHER APPLICATION IN WHICH THE FAILURE OF THE PRODUCT OR SERVICE COULD LEAD TO DEATH, PERSONAL INJURY, SEVERE PROPERTY DAMAGE OR ENVIRONMENTAL HARM (COLLECTIVELY, "HIGH-RISK USES"). FURTHER, CUSTOMER MUST TAKE PRUDENT STEPS TO PROTECT AGAINST PRODUCT AND SERVICE FAILURES, INCLUDING PROVIDING BACK-UP AND SHUT-DOWN MECHANISMS. SELLER EXPRESSLY DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY OF FITNESS OF THE PRODUCTS OR SERVICES FOR HIGH- RISK USES. CUSTOMER SHALL DEFEND, INDEMNIFY, RELEASE AND HOLD Seller HARMLESS FROM ANY AND ALL CLAIMS, LOSSES, DAMAGES, ACTIONS, INCLUDING, LAWSUITS, ARBITRATIONS, AND/OR ADMINISTRATIVE ACTIONS, AND EXPENSES (INCLUDING REASONABLE ATTORNEYS' FEES) ARISING OUT OF CUSTOMER'S USE OF THE PRODUCTS AND SERVICES FOR ANY HIGH-RISK USES, INCLUDING ARISING FROM CLAIMS FOR PRODUCT LIABILITY, PERSONAL INJURY (INCLUDING DEATH) OR DAMAGE TO PROPERTY, REGARDLESS OF WHETHER SUCH CLAIMS ARE FOUNDED IN WHOLE OR IN PART UPON ALLEGED OR ACTUAL NEGLIGENCE OF SELLER. 12. SYSTEM AND APPLICATION RESPONSIBILITY AND ADDITIONAL INDEMNITY. CUSTOMER ACKNOWLEDGES THAT IT IS ULTIMATELY RESPONSIBLE FOR VERIFYING AND VALIDATING THE SUITABILITY AND RELIABILITY OF THE PRODUCTS OR SERVICES WHENEVER THE PRODUCTS OR SERVICES ARE INCORPORATED IN CUSTOMER'S SYSTEM OR APPLICATION, INCLUDING THE APPROPRIATE DESIGN, PROCESS, AND SAFETY LEVEL OF SUCH SYSTEM OR APPLICATION. FURTHER, CUSTOMER MUST TAKE PRUDENT STEPS TO PROTECT AGAINST PRODUCT AND SERVICE FAILURES WHEN PRODUCTS AND SERVICES ARE INCORPORATED IN A SYSTEM OR APPLICATION, INCLUDING PROVIDING BACK-UP AND SHUT-DOWN MECHANISMS. CUSTOMER SHALL DEFEND, INDEMNIFY, RELEASE AND HOLD Seller HARMLESS FROM ANY AND ALL CLAIMS, LOSSES, DAMAGES - ACTIONS, INCLUDING LAWSUITS, ARBITRATIONS, AND/OR ADMINISTRATIVE ACTIONS, AND EXPENSES (INCLUDING REASONABLE ATTORNEYS' FEES) ARISING OUT OF CUSTOMER'S INCORPORATION OF THE PRODUCTS OR SERVICES INTO CUSTOMER'S SYSTEM OR APPLICATION, REGARDLESS OF WHETHER SUCH CLAIMS ARE FOUNDED IN WHOLE OR IN PART UPON ALLEGED OR ACTUAL NEGLIGENCE OF SELLER. 13. INTELLECTUAL PROPERTY LIABILITY. Seller agrees to defend any third-party claim that alleges the Hardware, Software or Services infringe any U.S. patent, copyright, or trademark ("Claim"), provided that Customer notifies Seller immediately upon learning of any Claim, or any allegation that the grounds for a Claim may exist, grants Seller sole control over the defense and settlement of the Claim, and cooperates fully with Seller in preparing a defense for any Claim. Seller agrees to pay any final judgment or settlement resulting from any Claim, provided that the settlement is entered into in accordance with this Section. Seller shall not be liable for a settlement made without its prior written consent. Notwithstanding the foregoing, Seller shall have no obligation under this Section for any claim relating to or arising from (a) Customer's modifications of Hardware, Software or Services; (b) failure to use Hardware, Software or Services in accordance with the applicable documentation provided by Seller; (c) the combination, operation, or use of Hardware, Software or Services with any hardware, software or service not provided by Seller; (d) the compliance of Seller with Customer's specifications or directions, including the incorporation of any software or other materials provided by or requested by Customer; or (e) Non-Seller Branded Products. The foregoing states the Customer's sole remedy for, and the entire liability and responsibility of Seller for, infringement of any patent, trademark, or copyright or other intellectual property rights. THIS LIMITED INDEMNITY IS IN LIEU OF ANY OTHER STATUTORY OR IMPLIED WARRANTY AGAINST INFRINGEMENT. In any event, if Seller believes in its reasonable opinion the Hardware, Software, or Services may be alleged to be infringing, for the purposes of mitigating any potential damages, Seller may, at its sole discretion, (i) procure for the Customer the right to continue to use the Hardware, Software, or Services; (ii) replace them with comparable Hardware, Software or Services that are free of such infringement; or (iii) refund the fees paid by Customer, and in the event of either (ii) or (iii) Customer shall promptly return the Hardware to Seller and/or terminate the use of the Software or Services. 14. PROPRIETARY RIGHTS. Seller reserves all right, title, and interest in any intellectual property rights contained or embodied in Products, or resulting from the Services, including any custom developments created or provided by Seller under this Agreement. Nothing in this Agreement will be deemed to grant to Customer any ownership rights in or license rights to such intellectual property. 15. LIMITATION OF LIABILITY. SELLER SHALL NOT BE LIABLE FOR (I) SPECIAL, INDIRECT, INCIDENTAL, PUNITIVE, EXEMPLARY, OR CONSEQUENTIAL DAMAGES ARISING OUT OF OR IN CONNECTION WITH THIS AGREEMENT OR THE PRODUCTS OR SERVICES; OR (II) ANY DAMAGES ARISING OUT OF OR IN CONNECTION WITH: (A) PRODUCTS OR SERVICES NOT BEING AVAILABLE FOR USE, INCLUDING ANY COSTS OF OBTAINING SUBSTITUTE PRODUCTS OR SERVICES; (B) LOSS OF, CORRUPTION OF, OR LOSS OF USE OF ANY PRODUCTS, HARDWARE, SOFTWARE OR DATA; (C) LOSS OF REVENUE, PROFIT, OR BUSINESS OPPORTUNITY; (D) BUSINESS INTERRUPTION OR DOWNTIME; OR (E) INABILITY TO ACHIEVE A PARTICULAR RESULT. TO THE EXTENT PERMITTED BY APPLICABLE LAW, THE TOTAL LIABILITY OF SELLER ARISING OUT OF, OR IN CONNECTION WITH THIS AGREEMENT OR THE PRODUCTS OR SERVICES, SHALL NOT EXCEED THE AMOUNT OF THE FEES PAID BY CUSTOMER FOR THE SPECIFIC PRODUCT OR SERVICE GIVING RISE TO SUCH CLAIM. THIS SECTION: (1) APPLIES TO Seller AND ITS LICENSORS, DISTRIBUTORS, AND SUPPLIERS (INCLUDING ITS AND THEIR DIRECTORS, OFFICERS, EMPLOYEES, AND AGENTS), (2) REFLECTS AN ALLOCATION OF RISK BETWEEN Seller AND CUSTOMER IN VIEW OF THE PURCHASE PRICE OF THE PRODUCTS AND SERVICES, (3) APPLIES EVEN IF Seller HAS BEEN ADVISED OF THE POSSIBILITY OF THE DAMAGES AND REGARDLESS OF WHETHER SUCH CLAIMS ARE FOUNDED IN WHOLE OR IN PART UPON ALLEGED OR ACTUAL NEGLIGENCE OF Seller, AND (4) REGARDLESS OF WHETHER SUCH DAMAGES ARE BASED IN CONTRACT, WARRANTY, STRICT LIABILITY, NEGLIGENCE, TORT, OR OTHERWISE. TO THE EXTENT THE FOREGOING LIMITATION OF LIABILITY IS UNENFORCEABLE OR FAILS OF ITS ESSENTIAL PURPOSE, THE SOLE LIABILITY OF Seller TO CUSTOMER SHALL BE LIMITED TO FIFTY THOUSAND DOLLARS (50,000 USD). 16. FORCE MAJEURE. Seller shall not be responsible for any delay or failure to perform due to any cause beyond its reasonable control, including acts of terrorism, nature or governments; interruptions of telecommunications, power or transportation; failure of contractors or suppliers; or inability to obtain necessary labor or materials ("Force Majeure Event"). In the event of a Force Majeure Event, Seller reserves the right to cancel the applicable order. 17. EXPORT AND SANCTIONS LAWS AND COMPLIANCE. Products (which, for purposes of this Section, shall include the software and technology incorporated in or supplied with a Product and Service) purchased from Seller are subject to control under the U.S. Export Administration Regulations (15 CFR Part 730 et. seq.) administered by the U.S. Department of Commerce's Bureau of Industry and Security ("BIS") (www.bis.doc.gov ) and other applicable U.S. export control laws and sanctions regulations, including those administered by the U.S. Treasury Department's Office of Foreign Assets Control ("OFAC") (www.treas.gov/ofac). In addition, Products distributed from Seller's distribution center in Europe are subject to control under the European Union ("EU") Council Regulation No. 428/2009 and their export or intra-EU transfer may also be subject to additional licensing requirements under European Union Council Regulation No. 428/2009 and its implementing regulations. Products may not be exported or re-exported to any country where sanctions are imposed by the U.S. government (which currently includes Cuba, Iran, North Korea, Republic of Sudan and Syria but which may be modified by the U.S. government from time to time). Customer agrees it will comply with the export laws and trade sanctions of all applicable countries and will not export, re-export or transfer Products purchased from Seller without the required authorization, including an export or re- export license issued by the U.S. authorities, or to any prohibited destination or for a prohibited end-use. Products may also require export license(s) issued by the applicable authorities before being returned to Seller. The issuance of a Quote, a sales order acknowledgment, or a Return Material Authorization ("RMA") by Seller does not constitute export authorization. Customer represents and warrants it is not ineligible or otherwise restricted by U.S. or applicable law to receive Products and it will not export, re-export, or provide Products to any person or entity on OFAC's List of Specially Designated Nationals or on BIS's Denied Persons List, Entity List or Unverified List or any other applicable restricted party list. Seller reserves the right to refuse and/or cancel any order if, at any time, Seller believes that any export controls or trade sanctions laws may be violated. See ni.com/legal/export-compliance for more information and to request relevant import classification codes (e.g., HTS), export classification codes (e.g., ECCN), and other import/export data. 18. GOVERNING LAW AND FORUM. This Agreement shall be governed by the laws of the State of California, U.S.A., without regard to principles of conflicts of laws. The parties submit to the personal jurisdiction of the state and federal courts in San Diego County, California. The parties expressly agree that the provisions of the United Nations Convention on Contracts for the International Sale of Goods will not apply to this Agreement. 19. LIMITATION PERIOD. Seller SHALL NOT BE LIABLE FOR ANY CLAIM ARISING FROM AND/OR CONCERNING THIS AGREEMENT AND/OR ITS SUBJECT MATTER BROUGHT MORE THAN TWO YEARS AFTER THE OCCURRENCE CAUSING THE LOSS AND/OR DAMAGE GIVING RISE TO SUCH CLAIM (REGARDLESS OF WHETHER SUCH OCCURRENCE WAS DISCOVERABLE AT THE TIME). 20. UPDATES. Seller reserves the right to update this Agreement at any time, effective upon posting an updated version at cyth.com/legal/termsofsale; however, the terms and conditions in effect at the time of purchase shall apply to that purchase of Products or Services. 21. GENERAL TERMS. This Agreement, and any terms incorporated herein by reference, constitutes the entire Agreement between the parties with respect to the subject matter hereof and supersedes all prior understandings or agreements, whether written or oral, with respect to that subject matter. Customer acknowledges reading this Agreement, understands these terms, and agrees to be bound by them. This Agreement may not be altered, supplemented, or amended by the use of any other document unless otherwise agreed in writing by Seller. No delay or failure by Seller to exercise any right it has under this Agreement shall impair or be construed as a waiver of such right. A waiver of any provision of this Agreement by Seller must be in writing and shall not be construed as a waiver or modification of any other term hereof, or as a continuing waiver of any provision. The term "including" as used in the Agreement should be construed as "including without limitation". For the avoidance of doubt, whenever the term "purchase" is used herein with respect to Software, it shall mean the purchase of a license for Customer to use the applicable Software. If any part, term, or provision of this Agreement is held illegal, unenforceable, or in conflict with any applicable and enforceable law, the validity of the remaining portions or provisions of this Agreement shall not be affected, and the illegal, unenforceable, or conflicting part, term, or provision shall be reformed by a court of law with binding authority to the maximum extent possible to reflect the intent of this Agreement. The doctrine that any ambiguity contained in a contract shall be construed against the party whose counsel has drafted the contract is expressly waived by each of the parties with respect to this Agreement.

Cyth Systems, Inc. is the only NI Authorized Distributor and Integrator in North America with over twenty years of hands-on experience with NI Products. COMPANY Distribution Partners Home > Company > Distribution Partnership Cyth Systems is the only NI Authorized Distributor in North America with hands-on NI Products experience Submit your Order Shop our Store Talk to an Engineer First Name Last Name Email Company Upload File Upload supported file (Max 15MB) SUBMIT Thank you for submitting your PO or RFQ! Someone will contact you by email very soon to confirm your order and delivery dates Request a Quote or Submit Your Order Online Submit Purchase Orders or Request Quote entirely online in any format - Text, PDF, Word Doc, or even a screenshot. Use this form to submit your or RFQ and we will confirm pricing and delivery dates. Submit your Order

Cyth Systems, Inc. has years of experience delivering automation solutions. We offer LabVIEW & FPGA programming services, test stand design, vision, and more. SERVICES Automated Test Equipment Home > Services > Automated Test Systems Automated Test Systems BOOST your PRODUCTIVITY Automated Testing Engineering or Automated Test Equipment (ATE) provide a rapid and repeatable way to automate measurements or testing of your product. We offer product advice, training, or full system integration and turn-key ATE systems AUTOMATED TEST SYSTEMS Service Areas Automated Test Equipment for Manufacturing ATE Manufacturing subcategories ↑ Automated Test Engineering Automated Test Equipment Manufacturing Quality Control Production Test Final Test / End-of-line Test Whether integrating a system onto an existing line or creating something completely stand-alone, we can design an automated solution to suit your needs. Circuit Board Testing ATE PCBA subcategories ↑ Printed Circuit Board Assembly Test (PCBA) Circuit Board Functional Test In-Line Board Testing Bed-of-nails Testing Our engineers work closely with you to develop a fully customized test systems for circuit board assemblies, which can stimulate and measure every signal on the board to ensure proper assembly and proper function of the device under test. Measurement Automation ATE Measurement subcategories ↑ Design Verification & Validation V&V Benchtop interactive test R&D testing Design of experiments (DOE) We design partially or fully automated measurement systems that can generate signals, collect measurements, and analyze results for a variety of interactive tests and measurements. Measurement automation is most helpful for repetitive tests, or tests requirements that have a broad matrix of test conditions. Life Test & Reliability Equipment ATE Life & Reliability subcategories ↑ Life Test & Reliability Test Life Testing allows design teams to automate tests, perform actions, or collect measurement thousands or millions of times, which helps to validate your products design by simulating its entire life cycle. Highly Accelerated Life Test (HALT) goes one step further by simulating extreme stress, helping design teams can find weaknesses in a design and improve them. Shock & Vibration Test / Stress Testing Enviormental Testing HALT / HAAS Talk With an Engineer Our ATE systems are built on an unmatched PLATFORM All our Automated Test Systems are built on the PXI and DAQ platforms from National Instruments . They work with practically any 3rd party component, sensor, or device on the market, and can be automated using programming or non-programming solutions such as LabVIEW , TestStand , and FlexLogger . Industry-Defining PXI INDUSTRIAL INSTRUMENTS Industrial-Grade DATA ACQUISITION DEVICES REFERENCE DESIGNS and STARTER KITS for Projects Never start a project from scratch! Start your ATE system with our Plug-In Reference Designs and starter kits, which include the most common components, fixtures, software, and even the budget and schedule. Of course each reference is fully customizable to produce an Automated Test System to your specifications. Reference Design for ATE Systems Reference Design for Circuit Board Test Reference Design for Battery Test & Simulation Reference Design for Power Supply Test AUTOMATED TEST Project Examples Automated Battery QA Ensures Medical Device Reliability Robotic Automation Triples Sample Preparation Throughput CompactRIO Enables Automated Circuit Board Testing PCBA Functional Test and Device Verificational Test Scaled with Cyth PCBACheck Custom EMF Measurement Solution Doubles End-of-Line Test Throughput E-Bike Battery Testing and Validation Using BatteryFlex Circaflex & NI Single-Board RIO Power Syringe Lubrication Inspection Demo Hyundai Improves Production Test Time using PXI, LabVIEW, and TestStand Probing of Large-Array, Fine-Pitch Microbumps for 3D ICs 1 2 3 4 5

Functional testing involves applying operational power to a PCBA to ensure it performs its designated functions. This type requires custom-built test equipment. PCBACheck™ Bed of Nails Test Fixture Industrial Reference Design Our AUTOMATED PCBA TEST Equipment Reference Design is 90% Standardized and 10% Custom. Home > Services > Automated Test Systems > PCBACheck PCBA Functional Test Solution Businesses depend on Cyth Systems' expertise in functional test fixtures. Functional testing involves applying full operational power to a printed circuit board (PCBA) to ensure it performs its designated functions. This type of test often requires custom-built test equipment and fixtures. Cyth Systems provides support for all types of functional test strategies. Starter PXI Instruments Customize PXI Devices as Needed Pre-Designed Bed-of-Nails Customize Probes Locations Pre-Designed Interposer Board Customize Probes & Other Circuitry Software Environment Customize Sequences & Measurement Instruments Drivers Customize Measurements Top Our Solution. Bed-of-Nails Functional Tester Preconfigured Database Preconfigured PXI System Budget & Schedule Preconfigured Test Cart Preconfigured Reports Automate complex tasks faster Speak to Engineer Perform complex and rapid tasks and measurements that are impossible for human manual tests. Test multiple boards simultaneously, even share time-expensive equipment. Conduct Stress or Life Testing of boards by repeating tests hundreds or thousands of times. Bed-of-Nails Functional Tester Bed of Nails Functional Tester Predesigned fixture ready for custom modifications for any board: Customize width & depth Customize Pin Placement Customize front and rear panel Customize Interposer Board Speak to Engineer Preconfigured PXI System Preconfigured PXI System Standard PXI Modules suits 90% of applications needs as-is: Power Supply Oscilloscope Digital Multimeter Configurable Switch Matrix Add additional modules, signals, and inputs as needed to expand your application. Speak to Engineer Preconfigured Test Cart Preconfigured Test Cart Standardized Test Cart serves most applications as-is without modification! Internal Rack Mounting Customizable worksurface Bar Code Scanner or Badge Reader Power Systems included Customization not required, but... Fully customizable if necessary Speak to Engineer Preconfigured Database Preconfigured Database Standardized database Schema serves 90% of most applications as-is without modification: Speak to Engineer Store any test results, pass fail results Store images, waveforms, raw data Customization not required, but... Fully customizable if necessary Preconfigured Reports Preconfigured Reports Preconfigured Reports suits most applications as-is with CUSTOMIZATION INCLUDED Most common report fields already setup Fully customizable graphics and layout Fully customize graphs, tables, images Export to PDF already included Premade Excel or Word Templates you can customize and modify Speak to Engineer Budget & Schedule Budget & Schedule Preconfigured Budget for all included features: Most projects within 10% of standard budget and schedule Automatically adjusts for project size and features Budget INCLUDES customizations Speak to Engineer We know the ins and outs of PCB's Power supply voltage levels (VCC, VDD, etc.). Clock signals (system clock, peripheral clocks). Analog input signals (e.g., sensor inputs). Digital control signals (e.g., reset, enable signals). Serial communication inputs (UART, SPI, I2C). External trigger inputs. User interface inputs (buttons, switches). PWM (Pulse Width Modulation) signals. Temperature sensor inputs. Voltage reference inputs. Digital output signals (data lines, control lines). Analog input signals (ADC inputs). Analog output signals (DAC outputs). LED indicators. Display outputs (LCD, OLED, LED display segments). Relay control outputs. Voltage regulator outputs. Power-on indicator outputs. Current sense inputs/outputs. Power-up sequence testing. Power-down sequence testing. Voltage tolerance testing. Clock frequency and accuracy testing. Data integrity testing (checksum, CRC). Communication protocol testing (UART, SPI, I2C). Uploading Firmware or other files. Overvoltage protection testing. Undervoltage lockout testing. Logic functionality testing (gate-level/functional logic). Memory read/write testing (RAM, Flash). Sensor calibration and accuracy testing. ADC/DAC functionality and accuracy testing. Motor control functionality testing. Audio output quality testing. Display content and pixel testing. Communication protocol testing. Button/switch functionality testing. Temperature sensor accuracy testing. All these I/O's and much more. Speak to Engineer Prototype Form Why Cyth? Cyth Systems has over two decades of providing the technology and expertise you need to be successful on Automation, Measurement, and Controls projects. Our engineers will work alongside your team to design the system to meet your specifications. We develop your solutions with reduced risk, cost, and schedule. Need PCBA testing help or advice? First Name Last Name Email How can we help? [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup] Let's talk PCBA Solutions Menu

NeuralVision is a machine vision platform at the forefront of Deep Learning & Artificial Intelligence like abilities applied to the industrial inspection space. SOLUTIONS NEURALVISION Home > Solutions > NEURALVISION - AI Machine Vision Systems What is N EURAL V ISION ? NeuralVision is a machine vision platform at the forefront of Deep Learning and Artificial Intelligence like abilities applied to the industrial inspection space. For the first time companies are able to have total control of the performance of their machine vision systems and not be dependent on external vision experts to make changes or incorporate new product lines. Why N EURAL V ISION ? Traditional machine vision is highly dependent on having a controlled environment, rigid positional tolerances, and ultimately the skill of the vision programmer. It is up to engineers to come up with every algorithm required to inspect a part from measurements to color to correct locations and everything in between. But what if they miss something? What if there are parameters they don’t know matter? This has always been the struggle in the traditional space which results in massive amounts of time going into testing and troubleshooting a huge array of possibilities. Engineers need total control of part presentation, lighting, repeatability, and to simply always know what’s coming. N eural V ision TOP FEATURES NeuralVision from Cyth Systems was designed to allow a person with no machine vision experience to inspect and classify products. Machine vision systems traditionally work by having an experienced programmer choose one of many analysis algorithms to apply to an image. A programmer might use hole detection, temperature analysis, or width measurement to inspect an image and determine good or bad parts. NeuralVision applies these same operations in millions of ways behind the scenes looking for any recurring pattern or key measurements that identify a good or a bad product. The system can recognize the shape and temperature of cooked bacon, or the proper height and shape of croissants, even in cases where human eyes or programming may not be able to define a product’s key parameters. Cyth is a critical supplier for us. They’re involved in the design, building, and supporting automation tools throughout our manufacturing. -J.N., Semiconductor Equipment Manufacturer How does N EURAL V ISION work? It works the same way we learn to recognize an apple from an orange. As people see objects for the first time they unconsciously are looking for unique features, similarities, and differences between all the different objects observed. It isn’t necessary for you to know exactly what all those key features are in determining an apple, orange, or any other object. What you care about is that you are able to identify the various items as well as notice possible issues within each object. NeuralVision works in much the same way. As the system is fed images of the relevant objects and told either what unique parts are or that what it is seeing is good or bad it will apply millions of algorithms to learn to identify what is being seen. By showing the system a wide range of variation such as lighting, shadows, and environments the system will learn to understand what features are important or not important to identifying a part. An example of this is if you see an apple that is new, old, red, or green you still know that it is an apple. If NeuralVision were shown all these different scenarios and told they were all an apple it would learn to understand all these different examples and what makes an apple unique. NeuralVision puts the power in the company’s hands. Anyone with a knowledge of their product could look at collected images and begin to identify what parts are or what is good and bad. This knowledge is then processed to teach the system to think as the operator thinks and replicate their expertise. Here is where the strength of NeuralVision comes in. If a system can be taught by the best production line experts to be as reliable as they are and also never get tired, you’ve just hired the best employee ever! What's next in NEURALVISION ? Reach out to Cyth to go over your needs and specific products. We will design a vision system unique to your requirements and facilities to collect images and eventually work as your automated solution. Cyth will teach operators on the use of the system to collect and then begin identifying images. After this initial collection is done Cyth will handle the Deep Learning training of the system. As the system goes through a few cycles of learning and testing you’ll be ready to go for production. Now you have the knowledge and abilities to train more or new parts as needed!

Ruggedized datalogger design with CompactRIO & LabVIEW. Headless, flexible measurements, and data management for IIoT & field applications. < Back How to Build an Embedded Datalogger | Cyth Systems Ruggedized datalogger design with CompactRIO & LabVIEW. Headless, flexible measurements, and data management for IIoT & field applications. Previous Next

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We have developed & deployed thousands of Embedded Systems across every industry. Cyth offers powerful tools to deliver success to your Embedded project. SERVICES Embedded Control Systems Home > Services > Embedded Systems EMBEDDED Systems bring your control and monitoring systems TO LIFE An Embedded systems is a computer processor coupled with signal inputs and outputs (I/O) and software, typically used for system control or monitoring applications. With our Embedded Systems you can bring your product ideas to life by integrating components and sensors, including motors, pumps, valves, signal transducers, and much more. With our Embedded Systems you develop and deploy systems that include scientific instruments, biotech devices, factories control modules, and deployable monitoring systems. Our EMBEDDED systems provide a PLATFORM to build on Our Embedded platform consists of the CompactRIO (cRIO) and Single-Board RIO from National Instruments. Running on Intel processors, Xilinx FPGA's, and Linux Real-Time OS, and programmed with LabVIEW ... they come with robust credentials and build a platform for any embedded application with an unlimited range of connected devices and sensors. Packaged Ready-To-Use INDUSTRIAL CONTROL SYSTEMS Industrial-Grade SINGLE-BOARD COMPUTERS EMBEDDED CONTROL SYSTEM Service Areas Industrial Control Systems Embedded Industrial Control subcategories ↑ Process control & automation Equipment control systems Factory control systems Integrated robotics systems Conveyor and material handling Industrial control systems are used to operate and automate industrial processes. They include devices, systems, networks controls that can be found in factories, manufacturing or industrial settings. Industry 4.0 Embedded Control Systems Embedded Controller subcategories ↑ Industrial equipment control An embedded control system provides the control and measurement functions of an industrial or scientific device or instrument. With our Circaflex control platform, we leverage completely customizable off-the-shelf hardware that allows designers to prototype a successful design in a fraction of the time, with less cost and practically no risk. Biotech instrument control system Medical Device internal electronics Scientific instruments Monitoring Systems Embedded Monitoring Systems subcategories ↑ Condition monitoring Industrial monitoring refers to the collection and analysis of measurement data from sensors and devices related to processes, assets, and equipment. Various measurements collected over a long period of time, or at the instant of a particular event, can give you insights to improve productivity and quality. Long-term performance recording Vibration and wear Preventative maintenance Event capture OEM Solutions & Volume Manufacturing Embedded OEM & Manufacturing subcategories ↑ Design for manufacturing Whether you intend to deploy dozens or thousands of systems, our OEM design services team will work with you to accelerate your path to market and ensure you are ready for every step of the process, from design to validation, manufacturing, sustaining engineering, and life cycle management. BOM & Supply chain management Manufacturing & assembly Test and Record-Keeping EMBEDDED CONTROL & MONITORING Case Study Portfolio CompactRIO Enables Automated Circuit Board Testing Millisecond Control for Simulating Human Lung Behavior Precision Control System Advances Global Health Biotech Startup Accelerates Funding with Scalable Reference Design Circaflex & NI Single-Board RIO Power Syringe Lubrication Inspection Demo Double Decker Hybrid Powertrain Monitored Using Circaflex Embedded Controls Real-Time Defects Mapping on Integrated Circuits Using NI PXI & LabVIEW Distributed Generation-Based Smart Grid System Using NI CompactRIO & NI LabVIEW Proton Therapy Cancer Treatment Controlled using NI Single-Board RIO 1 2

Multifunction I/O products combine common I/O and counter/timer functionality into one form factor. Learn how NI can meet your requirements and simplify. NI Multifunction I/O NI Authorized Distributor and System Integration Partner Home > Products > NI Multifunction I/O Multifunction I/O Multifunction I/O products combine common I/O, including analog input and output and counter/timer functionality, into a single form factor to help reduce complexity and meet multiple system requirements. Multifunction DAQ Functionality with Common Form Factors Multifunction I/O hardware includes options for a large variety of channel combinations and form factors, including USB, PCI, and PCI Express. With this variety you can choose the hardware that can handle all the signal types you need. Reconfigurable I/O Options Reconfigurable multifunction I/O products offer advanced functionality, such as multirate sampling and individual channel triggering, because of the onboard FPGA. You can customize these models with the LabVIEW FPGA Module. PLATFORM MODULES Platform modules integrate with modular hardware platforms that allow you to combine different types of modules in a custom system that leverages shared platform features. NI offers three hardware platforms—CompactDAQ , CompactRIO , and PXI —though all platforms may not be represented in this category. PXI FlexRIO Multifunction I/O Module Supports multiple traction motor models for signal level inverter hardware-in-the-loop (HIL) applications. TestScale Analog Output Module Provides a mix of analog I/O, digital I/O, counter/timer, and triggering functionality in a single PXI module. Feature Highlights: Platform: PXI Bus: PXI, PXI Express TestScale Analog Input Module Provides combinations of analog I/O and digital I/O in a single PXI module with a user-programmable FPGA for onboard signal processing and custom system timing and synchronization. Feature Highlights: Platform: PXI Bus: PXI, PXI Express C Series Multifunction I/O Module Combines common I/O circuitry, including analog and digital I/O, into a single module for CompactRIO systems. Feature Highlights: Platform: CompactRIO PXI Multifunction I/O Bundle The PXI Multifunction I/O Bundle includes a chassis with a PXI Multifunction I/O Module to help you test electronic devices. TestScale Analog Input Module Provides analog input voltage signal measurement capabilities for electrical functional test applications. Feature Highlights: Platform: TestScale TestScale Power Module The Benchtop Measurement Bundle with Multifunction I/O Hardware includes a PXI Chassis, PXI Multifunction I/O Module, and more. TestScale Digital I/O Module Provides bidirectional digital voltage signal capabilities for electrical functional test applications. Feature Highlights: Platform: TestScale TestScale Analog Output Module Provides analog output voltage signal generation capabilities for electrical functional test applications. Feature Highlights: Platform: TestScale TestScale Backplane Features USB connectivity and includes five slots that you can use to add I/O or power modules to your TestScale system. Feature Highlights: Platform: TestScale TestScale Digital Output Module Provides digital output voltage signal generation capabilities for electrical functional test applications. Feature Highlights: Platform: TestScale STAND-ALONE OR COMPUTER-BASED DEVICES Stand-alone or computer-based devices either integrate with standard desktop and laptop computers or allow you to use them without the need for other modular hardware. Multifunction I/O Device Provides combinations of analog I/O, digital I/O, and counter/timer functionality in a single device for computer-based systems. Feature Highlights: Bus: PCI, PCI Express, USB Multifunction Reconfigurable I/O Device Controls I/O signals and provides a user-programmable FPGA for onboard signal processing and flexible system timing and synchronization. Feature Highlights: Bus: PCI Express, USB

To ensure we provide the best products & integration services to our customers, we are strategically aligned with the world’s top test & technology companies. COMPANY Technology Partners Home > Company > Technology Partners We are strategically aligned with some of the world’s top test and technology companies to bring the best technologies to our clients projects. Meanwhile, these companies depend on Partners like Cyth to integrate their products into complex applications in many industries. Their trust and certification of us makes us a trusted partner for YOU and for THEM so that together WE can bring solutions to life as a team. NI (National Instruments) Certified Integration Partner Authorized Distributor The NI Alliance Partner program certifies companies who are qualified to design systems using NI Products and ecosystems. The Alliance Partner Network is a program for third-party companies who provide businesses with complete solutions and based on NI Products. From design through integration, consulting, and training, NI Alliance Partners are uniquely equipped to solve the toughest engineering challenges. Cognex Machine Vision Partner Cognex is a world leading provider of machine vision systems. As a solution partner for Cognex smart and industrial camera lines, Cyth has a long history of assisting clients in overcoming unique applications. Ranging from barcode reading to part and defect identification, you can be sure that your needs will be met with an industry expert. Keyence Solution Partner With multiple years of experience working alongside Keyence to integrate their unique product lines, Cyth is here to support your needs to automate a solution. Whether you’re looking to do defect detection or guide assembly lines, our goal is to eliminate errors and drive down cost. Edmund Optics Vision Integration Partner As a Vision Integration Partner (VIP), Cyth has teamed up with Edmund Optics to make integrating machine vision optics, illumination, and hardware easier than ever before. With personalized onsite system integration, customers will witness the success of their vision system. Contact Cyth See our Customers

CompactDAQ systems provide a customizable solution for performing electrical & physical measurements either at their benchtop or in a distributed architecture. CompactDAQ NI Authorized Distributor and System Integration Partner Home > Products > CompacDAQ Systems What is CompactDAQ? CompactDAQ systems collect and deliver the data validation you need to meet test requirements at any distance, in any environment. These portable, customizable solutions—made of data acquisition modules that can synchronize measurements across a network—help you digitize data closer to sensors, minimizing noise and simplifying cabling in the field. Precise Sensor Measurements Pick from more than 70 high-quality C Series I/O modules with built-in sensor- or signal-specific conditioning. Mix and match to build an accurate and repeatable system that meets any measurement needs. System Scalability Expand and distribute your system with Ethernet-compatible CompactDAQ chassis to take µs-synchronized measurements across multiple chassis and in distributed setups. Compact, Rugged Design Move with ease between lab and field with CompactDAQ’s rugged features, designed to withstand operating temperatures from -40 °C to 70 °C and up to 30 g of shock. Expand to extreme environments with IP67-rated FieldDAQTM devices. Develop or Don’t Move with ease between lab and field with CompactDAQ’s rugged features, designed to withstand operating temperatures from -40 °C to 70 °C and up to 30 g of shock. Expand to extreme environments with IP67-rated FieldDAQTM devices. Why Choose CompactDAQ? CompactDAQ is a cost-effective approach to benchtop measurement. Pair sensor-specific, conditioned I/O modules with software optimized for DAQ applications. Best for High-channel-count distributed DAQ applications Benchtop test and measurement Mixed sensor measurements CompactDAQ System In a CompactDAQ system, a chassis is connected to your PC through USB or Ethernet, and then populated with one or more conditioned I/O modules for direct sensor connectivity. Controller variants are available to run a Windows or real-time OS for stand-alone operation. Components Chassis Built for accurate, conditioned measurements, you can use CompactDAQ chassis to perform mixed-measurement data acquisition all within one synchronized I/O system. CompactDAQ chassis feature USB or Ethernet connectivity and are available with different slot counts to provide the right amount of I/O for various applications. You can pair your system with the right software to customize how you acquire, analyze, present, and manage your measurement data. CompactDAQ Chassis Controller The CompactDAQ controller is a rugged, reliable, high-performance integrated controller with industry-standard certifications. It’s ideal for performing waveform acquisition and inline software analysis while logging data to onboard or removable SD memory. The controller also offers a wide array of standard connectivity and expansion options, such as USB, Ethernet, CAN/LIN, and RS232 serial. CompactDAQ Controller Modules With more than 60 C Series I/O modules for nearly any sensor type, quickly design a custom hardware setup optimized for size, cost, and performance. C Series modules are high-quality input and output modules that provide signal conditioning and analog-to-digital conversion for your CompactDAQ system. These hot-swappable modules plug directly into your chassis, making it simple to build a system tailored for your specific test requirements. CompactDAQ Modules Software From interactively capturing and exploring your data to programming a fully automated measurement system, seamless software integration lets you tailor tests to your needs. We designed CompactDAQ to work with DAQExpress™, FlexLogger™ software, and programming environments such as LabVIEW to help you meet development requirements and spend your time on what matters most. Since CompactDAQ hardware also uses the powerful NI-DAQmx driver, you can program it with the language of your choice. NI Software

Unlock your potential with NI training courses, where you'll discover proven techniques to reduce time and significantly elevate your applications' performance. NI Training Center With NI training courses, you learn recommended techniques to reduce development time and improve application performance and scalability. REGISTER FOR TRAINING The only NI Authorized Training Partner, NI Integrator, and NI Distributor in the US California NI Training Center Expand your technical skills with NI hardware and software tools Learn best practices and get real application guidance from experienced instructors Stay focused in an immersive classroom learning environment SEE UPCOMING COURSES Take advantage of learning opportunities from NI and industry experts, available in various formats—whether online, virtual, or in-person classroom settings. Investing in NI training is not just a choice; it's a strategic step toward achieving excellence in application development. Don't miss out on this opportunity to transform your skills and drive your projects to success! Investing in NI training is a powerful way to harness your full potential in application development. Unlock new opportunities and elevate your skills with this smart and secure choice for your future success. -R.J., Senior Quality Engineer, Medical Device Manufacturer Shorter learning curve Faster development Less maintenance Scheduled Virtual and Classroom Training Courses Scheduled Virtual and Classroom Training Courses Course Name Start Date End Date Time Certification Exam 9/30/2025 9/30/2025 9:00-17:00 LabVIEW Core 1 10/06/2025 10/08/2025 8:00-17:00 LabVIEW Core 2 10/09/2025 10/10/2025 8:00-17:00 10/14/2025 10/17/2025 8:00-17:00 Developing Embedded Applications Using CompactRIO Certification Exam 10/28/2025 10/28/2025 8:00-17:00 LabVIEW Core 1 11/03/2025 11/05/2025 8:00-17:00 LabVIEW Core 2 11/06/2025 11/07/2025 8:00-17:00 LabVIEW Core 3 11/12/2025 11/14/2025 8:00-17:00 Data Acquisition Using DAQmx and LabVIEW 11/17/2025 11/18/2025 8:00-17:00 Certification Exam 11/19/2025 11/19/2025 8:00-17:00 Developing Test Programs Using TestStand 12/8/2025 12/10/2025 8:00-17:00 1/26/2026 1/28/2026 8:00-17:00 LabVIEW Core 1 LabVIEW Core 2 1/29/2026 1/30/2026 8:00-17:00 LabVIEW Core 1 2/16/2026 2/18/2026 8:00-17:00 LabVIEW Core 2 2/19/2026 2/20/2026 8:00-17:00 LabVIEW Core 3 3/02/2026 3/04/2026 8:00-17:00 Data Acquisition Using NI-DAQmx and LabVIEW 3/05/2026 3/06/2026 8:00-17:00 LabVIEW Core 1 4/06/2026 4/08/2026 8:00-17:00 LabVIEW Core 2 4/09/2026 4/10/2026 8:00-17:00 LabVIEW Core 3 4/20/2026 4/22/2026 8:00-17:00 Data Acquisition Using NI-DAQmx and LabVIEW 4/23/2026 4/24/2026 8:00-17:00 LabVIEW Core 1 5/04/2026 5/06/2026 8:00-17:00 LabVIEW Core 2 5/07/2026 5/08/2026 8:00-17:00 8:00-17:00 Developing Test Programs Using TesStand 5/18/2026 5/20/2026 LabVIEW Core 1 6/08/2026 6/10/2026 8:00-17:00 8:00-17:00 LabVIEW Core 2 6/11/2026 6/12/2026 LabVIEW Core 3 6/22/2026 6/24/2026 8:00-17:00 8:00-17:00 Data Acquisition Using NI-DAQmx and LabVIEW 6/25/2026 6/26/2026 *Follow us on LinkedIn to stay in the loop on future courses. REGISTER FOR TRAINING See upcoming courses Do More with CYTH'S ENGINEERING AND DEPLOYMENT SERVICES ATP Registration Form solutions@cyth.com +1-858-537-1960 Expand your technical skills with NI hardware and software tools Learn best practices and get real application guidance from experienced instructors Stay focused in an immersive classroom learning environment Need help assessing your training options or selecting the right class for you Name Company Email Classroom Training Courses Choose an option [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup] Submit

Project Case Study National Instruments NI-TClk Technology for Timing and Synchronization of Modular Instruments Apr 10, 2025 bafda0bf-4b54-4aed-a10b-6d462f56f3b9 bafda0bf-4b54-4aed-a10b-6d462f56f3b9 Home > Case Studies > Overview Many test and measurement applications call for the timing and synchronization of multiple instruments because of the limited number of stimulus/response channels on a single instrument and/or the need for mixed-signal stimulus/response channels. For example, an oscilloscope may have up to four channels and a signal generator up to two channels. Applications ranging from mixed-signal test in the electronic industry to laser spectroscopy in the sciences require timing and synchronization (T&S) for higher-count channels and/or the need to correlate digital input and output channels with analog input and output channels. Modular Instruments Timing and Synchronization in Applications In the electronics industry, mixed-signal test is an important aspect of testing devices and system on chip (SOC) technology. With the convergence of audio, video, and data in consumer electronics and communications, the need for test of such technology from baseband to RF requires precise T&S. Mixed-signal devices, in essence, contain multiple digital and analog channels. These channels are often tested at the same time in an ATE system to minimize test time and increase throughput. Additionally, the analog channels are tested with coherent sampling instrumentation systems. Coherent sampling systems call for the synchronization of heterogeneous clocks in analog-to-digital conversion (ADC) and digital-to-analog conversion (DAC) test. This synchronization is highly desired to minimize spectral leakage in frequency-domain measurements [1]. The following LabVIEW graph illustrates the effect of noncoherent sampling vs coherent sampling. The white trace corresponds to noncoherent clocking whereby a fractional number of cycles of the analog sine wave are captured. The spectrum leakage in the FFT leads to "skirts" in the spectrum. With the same sampling rate, a coherent sampling system leads to the red trace. One of the key benefits of coherent sampling is the reduction of test times because of shorter signal acquisition times. Shorter acquisition times are attained by not having to capture extra signal cycles to which to apply a digital window for elimination of the spectral leakage. In principle, an ATE system designed to meet the flexible needs of the wide variety of devices in the marketplace should deliver instrumentation with clocks that are different but derived from a master reference clock for coherent sampling. Additionally, this system should be able to deliver arbitrary clock frequencies derived from a master reference clock. NI-TClk synchronization of the NI PXI-5421 arbitrary waveform generator and NI PXI-5122 digitizer delivers phase-coherent stimulus-response measurements with higher accuracy and shorter test times. In communications, analog and digital baseband I/Q signal generation and acquisition require phase offset accuracy and control [2]. A digital pattern generator/analyzer is synchronized with an arbitrary waveform generator and a digitizer to address digital and analog I/Q signal generation and acquisition. The accuracy and control requirements of phase and gain offset between each channel can be as low as 0.003% and 0.1%, respectively, for signals with bandwidths that approach 5 MHz in 3G W-CDMA schemes, for example. In future 4G communication schemes, such as multiple-input multiple-output (MIMO) antenna systems, requirements for multiple-channel baseband, IF, and RF signal generation and acquisition with tight synchronization will be critical. Digital beam forming, an emerging technology, is playing into multiple applications from 4G MIMO communications to radar applications in defense and aerospace industries. Digital beam forming requires multichannel phase-coherent digitizing systems with digital downconversion engines. In the semiconductor industry, functional digital test can consume up to 1000 digital pins. Typical integrated circuits (ICs) on the market can take somewhat less than 200 pins of digital I/O. In such an application, multiple digital pattern generators and analyzers are synchronized with the requisite pin-to-pin skew and jitter to address high-pin-count ICs. In consumer electronics, component digital video signal generation and acquisition may require up to five distinct signals: the three primary video signals, H-Sync, and V-Sync. With T&S, arbitrary waveform generators and digitizers can be synchronized to generate and acquire high-definition video signals respectively, with pixel rates that can approach 165 MHz. CMOS imaging sensors, a technology expected to become mainstream with the prevalence of camera phones and digital cameras, is an example of mixed-signal technology whereby an arbitrary waveform generator, digitizer, and digital pattern analyzer are synchronized for design validation and verification of the chip or chip set. In the physical sciences, high-channel-count digitizing systems are used in plasma-fusion, laser-scattering experiments, and photon/particle detection and tracking in particle and astrophysics. In these examples, high-channel-count digitizing systems are used for 2D or 3D reconstruction of temporal and spatial phenomena. Such applications call for simultaneous sampling of multiple channels, extending from a few channels to over several hundred. In medical diagnostic systems, 3D digital-imaging systems are fast replacing analog systems since the advent of cost-effective 12 and 14-bit 50 MHz ADCs. Such systems typically scale from a hundred to over a thousand channels. In nondestructive test, 3D ultrasonic imaging is realized with multichannel systems that include 50 MHz digitizers. Optical coherence tomography (OCT), a relatively new imaging method compared to ultrasonic imaging, can require several digitizer channels as well to interface to multiple photodiodes for coherent sampling. The National Instruments Platforms for Modular Instrumentation Today, National Instruments hardware platforms for modular instrumentation are PXI [3] and PCI. Both platforms are modular in nature and use the PCI bus to interface between the PC and the instrument. Introduced in 1997, PXI is an open standard with many vendors who offer a wide range of PXI modules from image acquisition to RF vector signal analyzers. PXI has been gaining rapid acceptance because of its relatively small package, portability, high throughput using the PCI bus, and lower costs, which are made possible through use of standard commercial technologies spawned by the large PC industry. Electrically, PXI extends the CompactPCI standard by adding local buses and synchronization features. For synchronized measurements, key elements built into PXI are the reference clock, the trigger bus, and the star trigger bus [3]. Trigger Bus Diagram Building Blocks for Synchronization To achieve synchronization across multiple devices, you need to examine the distribution of clocks and triggers. There are two main schemes for synchronization, but before we examine the schemes we need to define the following terms. Sample Clock, Reference Clock, Triggers, and Master and Slave Devices Sample clock is a signal that controls the timing of the analog-to-digital and digital-to-analog conversions performed by the ADC and DAC on digitizers and signal generators respectively. The sample clock is also the signal that controls the rate at which digital waveforms are acquired or generated on digital pattern generators/analyzers. The sample clock is most often a periodic signal, derived from a crystal oscillator on the device. Various crystal oscillator technologies include voltage-controlled crystal oscillators (VCXOs), temperature-controlled crystal oscillators (TCXOs), and oven-controlled crystal oscillators (OCXOs). Reference clock – Many instruments contain phase-lock loops (PLLs). A PLL can lock the frequency of its output to a reference clock at its input. In instruments, a common frequency is 10 MHz, although many instruments allow a variety of reference-clock frequencies. The output of the PLL is typically the sample clock. Using a PLL, the sample clock frequency can be locked to the reference clock frequency. Therefore the absolute frequency accuracy of the sample clock will be identical to the frequency accuracy of the reference clock. Trigger signals control data acquisition at the highest level. External events or triggers are the main methodologies for initiating an acquisition and generation. Triggers come in different forms, including analog, digital, and software. Master and Slave Devices – When creating synchronized measurement systems, you typically designate one device as a master and one or more other devices as slaves. The master device is the device that generates a signal or signals used to control all the measurement devices in the system. The slave devices receive control signals from the master device. The goal of synchronization is to generate and/or receive analog and digital signals precisely among multiple hardware devices. One class of T&S is referred to as homogeneous timing and synchronization – two identical devices with identical settings generating and or acquiring signals with a precise phase relationship between each sample clock, starting at the same instant in time. The following example illustrates homogeneous synchronization: Two digitizers acquire data at 200 MS/s with a precise phase relationship between each sample clock, triggered at the same instant in time, with identical vertical gain settings, AC/DC coupling settings, input impedance settings, DC offset settings, and analog filter settings. An important observation from the previous example is the relevance of many settings to homogenous synchronization. The delays of gain stages and analog filters on the front end of a digitizer lead to a time delay from the front end connector to the ADC, for example. Heterogeneous synchronization can imply many different scenarios. Some following examples illustrate heterogeneous synchronization: Two digitizers acquire data at 200 and 100 MS/s respectively with a precise phase relationship between each sample clock, triggered at the same time, with identical vertical gain settings, AC/DC coupling settings, input impedance settings, DC offset settings, and analog filter settings. An arbitrary waveform generator and digitizer sampling at 100 MS/s with a precise phase relationship between each sample clock and with a set time delay in start of operation, upon reception of an incoming trigger signal. A digitizer, digital pattern generator/analyzer, and arbitrary waveform generator sampling at 50, 200, and 100 MS/s, respectively with a precise phase relationship between each sample clock, and with a defined time delay in start of operation, upon reception of an incoming trigger signal. The preceding examples clearly show that heterogeneous T&S imply a wide range of possibilities to address the application needs. Separate settings on each device can lead to delays of data/signals being sampled at the same instant in time. The key is calibration of the synchronized system, which will be discussed later in this paper. Synchronization Scheme 1 – Synchronization with a Sample Clock The master device can control operation of the measurement system by exporting both trigger signals and a sample clock to the slave devices. For example, a system comprised of multiple digitizers and signal generators has a common sample clock from an appointed master device. As illustrated in Figure 3, the master sample clock directly controls ADC and DAC timing on all devices. For example, National Instruments dynamic signal analyzers such as the NI 4472 and NI 4461 (24-bit 104 kS/s and 208 kS/s respectively) are synchronized using this technique for applications in sound and vibration measurements. This scheme is the purest form of phase-coherent sampling; multiple devices are fed the same sample clock. Thus the same accuracy, drift, and jitter of the sample clock are seen by every device. The disadvantage of this scheme is that it does not address all possible phase-coherent heterogeneous clocking needs.\ Synchronization with a Sample Clock Synchronization Scheme 2 – Synchronization with a Reference Clock Synchronization can be implemented by sharing triggers and reference clocks between multiple measurement devices. In this scheme, the reference clock can be supplied by the master device if it has an onboard reference clock, or the reference clock can be supplied by a dedicated high-precision clock source. This advantage of this scheme is that with it you can derive heterogeneous sample clocks from a single reference clock to which all the sample clocks phase locked. The trade-off is that the phase-coherent sampling on each device is not as pure as the direct sample clock approach, because each device clock enters the picture, so device clock jitter must be considered. The method usually employed with this scheme to synchronize and generate sampling clocks is a PLL. Left: Synchronization with a Reference Clock, Right: High-speed sample clocks are synchronized using a PLL. Issues with Synchronization Distributing clocks and triggers to achieve high-speed synchronized devices is beset by nontrivial issues. Latencies and timing uncertainties involved in orchestrating multiple-measurement devices are significant challenges in synchronization, especially for high-speed measurement systems. These issues, often overlooked during the initial system design, limit the speed and accuracy of synchronized systems. Two main issues that arise in the distribution of clocks and triggers are skew and jitter. Sample Clock Synchronization Mixed-signal test by its nature requires different sampling rates on each instrument, because analog waveform I/O and digital waveform I/O necessitate different sampling rates. But they need to be synchronized, and more importantly data needs to be sampled on the correct sample clock edge on each instrument. When sample clocks on disparate instruments are integer multiples of the 10 MHz reference clock, all instruments will have sample clocks that are synchronous to each other – the rising edge of all sample clocks will be coincident with the 10 MHz clock edge. When sample clocks are not integer multiples, such as 25 MHz, there is no guarantee that the sample clocks are in phase, despite being phase-locked to the 10 MHz reference clock, as shown in Figure 6. Standard techniques are used to solve this problem by resetting all of the PLLs at the same time, leading to sample clocks of the same frequency being in phase, as shown in Figure 7. Even though all sample clocks are in phase at this point, the solution is still not complete. Perfect synchronization implies the data clocked from device to device corresponding to within a sample clock cycle. The key to perfect synchronization is triggering, which will be discussed later. Left: 25 MHz Sample Clocks Not Aligned, PLL Synchronization with Reset Clock Skew and Jitter The distribution of the sample clock or the reference clock requires careful planning. For example, a synchronized measurement system calls for simultaneous sampling of 20 channels at 200 MS/s. This requirement implies distributing a clock to 10 two-channel digitizers. For a sample clock skew of 1%, the skew must be under 25 ps. Such a system certainly looks very challenging. Fortunately, skew limitations can be dealt with by calibrating the skew to each measurement device; you can compensate for the skew in the sampled data. The real issue is the clock frequency . Distributing either a 200 MHz direct sample clock or a 10 MHz reference clock introduces jitter into the system. The physical properties of the distribution system play a significant role in the accuracy of the distributed clocks; if the clock paths are susceptible to high-frequency electrical noise then clock jitter becomes a significant problem. Producing a platform for distribution of high-frequency sample clocks becomes expensive in terms of the manufacture, test, and calibration. Thus synchronization through the use of lower frequency reference clocks is the preferred method in many high-frequency systems. Figure 8 is a typical VCXO PLL implemented on National Instruments SMC-based modular instruments. The loop bandwidth is kept at a minimum to reject the jitter coming from the reference clock, while the VCXO on the device has jitter less then 1 psrms. Such a system effectively realizes a low-jitter synchronized system. A very useful property of the National Instruments PLL design is the use of a phase DAC. Using a phase DAC, you can phase-align the output of the VCXO with respect to the incoming reference clock. Nominally the VCXO output is in phase with the reference clock; however, you may need to skew the VCXO output slightly to place the output out of phase by a small margin. This feature is important for aligning sample clocks on multiple devices when the reference clock fed to each device has a small skew due to propagation delays. For example, in the NI PXI-1042 PXI chassis, the distribution of 10 MHz reference clock has slot-to-slot skew of 250 ps maximum with a maximum of 1 psrms jitter. Slot-to-slot skew of 250 ps, while satisfactory for most applications, may not be adequate for very high-speed applications where phase accuracy is important. To overcome this skew, the phase DAC outputs can be adjusted to calibrate for the skew. On the NI PXI-5422, 200 MS/s arbitrary waveform generator and NI PXI-5124 200 MS/s digitizer the sample clock phase/delay adjustment is 5 ps, thus giving the user significant flexibility in synchronizing multiple devices. PLL with Phase Adjustment DAC for Flexibility in Sample Clock Delay with Respect to the Reference Clock Trigger Skew and Distribution With sample clock synchronization addressed, the other main issue is the distribution of the trigger to initiate simultaneous operation. The trigger can come from a digital event or from an analog signal that meets trigger conditions. Typically in multichannel systems, one of the devices is made the master and the rest are designated as slaves. In this scenario, the master is programmed to distribute the trigger signal to all slaves in the system including itself. Two issues that arise here are trigger delay and skew. A trigger delay from the master to all the slaves and skew between each slave device is inevitable, but this delay and skew can be measured and calibrated. The challenge in measuring the delay and skew, however, is a two-part process: Automate the measurement of the trigger delay between master and each slave and compensate for it. Ensure that the skew between slaves is small enough to ensure that the trigger is seen on the same clock edge on all devices. The distribution of the trigger signal across multiple devices requires passing a trigger signal into the clock domain of the sample clock such that the trigger is seen at the right instance in time on each device. With sample clock rates less than or equal to 100 MS/s, skew becomes a major obstacle to accurate trigger distribution. A system consisting of ten 200 MS/s devices, for example, requires a trigger being received at each device within a 5 ns window. This places a significant burden on the platform for delivering T&S beyond 100 MHz. The trigger signals must be sent in a slower clock domain than that of sample clock, or you must create a nonbused means of sending the trigger signal (such as a point-to-point connection). The costs of such a platform become prohibitive for mainstream use. Another distribution channel is needed; the trigger signal needs to be distributed reliably using a slow clock domain and transferred to the high-speed sample clock domain. A logical choice is to synchronize the trigger signal distribution with the 10 MHz reference clock. However, this cannot ensure that two boards will see the trigger assertion in the same sample clock cycle when the sample clocks are not integer multiples of the 10 MHz reference clock. To illustrate this point, assume two devices have the simple circuit [4] shown in Figure 9 for trigger transfer from the 10 MHz reference clock domain to the sample clock domain. Left: 10 MHz Reference Clock Domain to Sample Clock Domain Trigger Transfer, Right: Effect of Metastability on Triggers SMC Modular Instrumentation and NI-TClk In 2003, NI introduced the first series of PXI digitizers, arbitrary waveform generators, and digital pattern generators/analyzers based on the Synchronization and Memory Core (SMC) foundation [5]. One of the key technologies implemented on the SMC was NI-TClk (pronounced T-Clock) technology for T&S applications. NI-TClk NI has developed a method for synchronization whereby another signal-clock domain is employed to enable alignment of sample clocks and the distribution and reception of triggers. The objectives of NI-TClk technology are twofold: NI-TClk aligns the sample clocks that may not be necessarily aligned initially despite being phase locked to the 10 MHz reference clock. NI-TClk enables accurate triggering of synchronized devices. NI-TClk synchronization is flexible and wide ranging; it can address the following use cases: Extension of synchronization from a single PXI chassis to several PXI chassis to address large channel systems using the NI PXI-6653 Slot 2 system timing and control module. Homogeneous and heterogeneous synchronization – devices running at the same or different sample rates, using internal or external sample clocks. NI-TClk synchronization can be used with both Schemes 1 and 2, as described previously. Illustration of multichassis synchronization that uses the NI PXI-6653 system timing and control module whereby the 10 MHz reference clock and triggers are distributed from a master chassis to all slave chassis, with NI MXI-4 controlling all slave chassis. The purpose of NI-TClk synchronization is to have devices respond to triggers at the same time. The "same time" means on the same sample period and having very tight alignment of the sample clocks. NI-TClk synchronization is accomplished by having each device generate a trigger clock (TClk) that is derived from the sample clock. Triggers are synchronized to a TClk pulse. A device that receives a trigger from an external source or generates it internally will send the signal to all devices, including itself, on a falling edge of TClk. All devices react to the trigger on the following rising edge of TClk. The TClk frequency is much lower then the sample clock and the PXI 10 MHz reference clock to accommodate the NI PXI-1045 18-slot chassis, where the propagation delay from Slot 1 to Slot 18 may extend to several nanoseconds. If the application calls for multiple chassis where the propagation delay can be higher then normal interchassis delay, you can set the TClk frequency. The issue of "instantaneous" data acquisition comes up; if a trigger condition is met and 10 digitizers are required to be triggered, the issue of latency arises due to the synchronization of the trigger to TClk. This issue is addressed with pretrigger and posttrigger samples on the device sample memory buffer. All NI-TClk supported devices are programmed to accommodate the overhead time that arises from synchronization of the trigger to the TClk. For example, 10 digitizers are programmed to acquire 10,000 samples simultaneously. The sample rate is 200 MS/s (sample period of 5 ns) from which the derived TClk frequency is programmed to be 5 MHz (sample period of 200 ns). This implies that the delay in acquisition resulting from TClk synchronization of the trigger could be as high as 40 samples. NI-TClk supported devices are programmed to automatically pad the memory buffer for the lag between the trigger event and the start of acquisition, and the NI-TClk driver software automatically adjusts the timestamps on all digitizers to reflect the start of acquisition with respect to the trigger event. Overview of NI-TClk Operation with an Internal (PXI) Reference Clock or User-Supplied Reference Clock The devices are synchronized in the following manner. Refer to Figure 12 for the timing diagram that illustrates sample clock alignment and Figure 13 for trigger distribution and reception. Each device is programmed with a sample clock rate, and set to receive the TClk trigger. NI-TClk software automatically calculates the TClk frequency based on the sample clocks and number of devices involved, and TClks are generated on each device, derived from the sample clocks of the devices. The PXI 10 MHz reference clock (in PCI the onboard reference clock of one of the devices is used) is distributed to all devices to phase-lock the sample clocks on all devices. Each device sample clock is phase-locked to the 10 MHz reference clock but is not necessarily in phase with each other at this stage. A common clock signal called the Sync Pulse Clock is distributed through the PXI trigger bus (over the RTSI bus for PCI boards) to all devices whose frequency is similar to the reference clock frequency. Here the 10 MHz reference clock plays the role of the Sync Pulse Clock in addition to being the reference clock. A Sync Pulse is generated from one of the devices when the Sync Pulse Clock (10 MHz reference clock) is logically high through the PXI trigger bus (over the RTSI bus for PCI boards). Each device is initiated to look for the first rising edge of the Sync Pulse Clock upon receiving the Sync Pulse. When the first rising edge of the Sync Pulse Clock is detected, each device is programmed to measure the time between this edge and the first rising edge of the device TClk. The time between these two edges is measured on all devices. TClk measurements of all devices are compared to one reference TClk measurement (the NI-TClk driver software automatically selects one of the devices), and all device sample clocks and TClks are aligned automatically by adjusting the phase DAC outputs on all devices. With the sample clocks on all devices aligned, the trigger signal is distributed from the appointed master to all other devices through the TClk. The trigger signal is emitted with the falling edge of the master device TClk, and all devices are programmed to initiate generation or acquisition with the next rising edge of TClk. This signal is also distributed through the PXI trigger bus (over the RTSI bus for PCI boards). See Figure 13. Two Properties of NI-TClk Synchronization are critical to the success of the method: The distribution of the Sync Pulse is critical to NI-TClk synchronization. The Sync Pulse must arrive at each device such that each device looks for the same rising edge of the Sync Clock Pulse in making the TClk measurement. The skew cannot exceed the period of the Sync Pulse Clock. This issue is easily resolved with the Sync Pulse Clock period being 100 ns. NI-TClk synchronization can easily extend from synchronization within one chassis to several dozen, as the standard delay per foot of 50 Ω cable is of the order of 2 ns. The accuracy of the sample clock alignment is as good as the skew of the Sync Pulse Clock (reference clock). In looking at Figure 12, you can see that the reference clock received on both devices is skewed. The TClk measurements on both devices assume that the Sync Pulse Clock is aligned on both devices; the difference between the two TClk measurements is used to shift the sample clocks to align them. As will be seen in the following section, two levels of performance can be achieved with current technology; out-of-the-box performance and calibrated performance. Left: Timing Diagram of Using TClk to Align Sample Clocks, Right: Timing Diagram of Trigger Distribution Using NI-TClk Overview of NI-TClk Operation with a User-Supplied External Sample Clock In this scheme, NI-TClk synchronization will not align the sample clock on each device, because you are externally supplying the sample clock, bypassing the PLL circuitry. NI-TClk synchronization guarantees the start/stop trigger distribution such that each device starts and stops acquisition/generation on the same sample clock edge. NI-TClk does this by using the same method as mentioned above in using a derived TClk from the sample clock to distribute the trigger signals. Here, the burden of accurate sample clock alignment is placed on the sample clock you supply. To ensure the best performance, supply a low-jitter sample clock (of the order of <1 psrms) for sample rates above 100 MS/s with equal length line cables from the clock source to each device in the system. Refer to Figure 13 for an illustration of trigger distribution and reception. Each device is programmed to receive the TClk trigger and the external sample clock. NI-TClk automatically calculates the TClk frequency based on the sample clocks and number of devices involved. Then, TClk signals are generated on each device, derived from the device sample clock. The trigger signal is distributed from the appointed master to all other devices using NI-TClk; the trigger signal is emitted with the falling edge of the master TClk, and all devices are programmed to initiate generation or acquisition with the next rising edge of TClk. This signal is also distributed through the PXI trigger bus (over the RTSI bus for PCI boards). Refer to Figure 13 for an illustration. Performance of NI-TClk Technology Out-of-the-Box Performance Robust synchronization of multiple devices can be achieved by simply inserting the devices into the PXI chassis and running the devices using NI-TClk software (refer to Figure 14 for an illustration). The key software components consist of three VIs/functions that require you to set no parameters. LabVIEW Block Diagram Using NI-TClk Synchronization between Multiple FGEN Arbitrary Function Generators NI-TClk synchronization can deliver synchronized devices with skews of up to 1 ns between each device in a NI PXI-1042 chassis. The typical skews observed range from 200 to 500 ps. The channel-to-channel jitter between devices is dependent on the intrinsic system jitter of the device. For example, the NI PXI-5421 100 MS/s 16-bit AWG has a total system jitter of 2 psrms. NI-TClk synchronized PXI-5421 devices exhibit typical channel-to-channel jitter of under 5 psrms. With the NI PXI-5122 100 MS/s 14-bit digitizer, the channel-to-channel jitter is typically under 10 psrms. Left: Out-of-the-Box Performance of NI-TClk Synchronization of Two 100 MS/s Digitizers, Right: Channel-to-Channel Jitter Measurements of NI-TClk Synchronized PXI-5421 Arbitrary Waveform Generators The LabVIEW front panel in Figure 15 is a measurement of the skew between two NI PXI-5122 devices in an NI PXI-1042 chassis. The skew is approximately 523 ps in this measurement setup. Each digitizer is set to sample the same 5 MHz square waveform at 100 MS/s. The signal is split and fed into each digitizer with equal length cables. The channel-to-channel jitter is approximately 6 psrms. The statistics are compiled from 49,998 zero crossings of the square waveform. The Gaussian distribution of the histogram reflects that the jitter stems from random noise rather any source of deterministic noise sources in the system. Figure 16 is a measurement of the channel-to-channel jitter of two NI-TClk synchronized PXI-5421 arbitrary waveform generators. Each device was programmed to generate a 10 MHz square waveform at 100 MS/s. The measurement was performed on a Tektronix high-performance jitter measurement Communications Signal Analyzer (CSA) 8200 platform with the 80E04 TDR module. The histogram data in Figure 16 reflects a channel-to-channel jitter of under 3 psrms. The median of the histogram reported is not the skew between the channels; it is the delay from the trigger of the zero crossing of the square waveform to the next rising edge of the measured square waveform (i.e. one channel is used to trigger the measurement of the zero crossing of the second channel). The measurements are compiled in a histogram which reflects the channel-to-channel jitter. Calibrated NI-TClk Synchronization As mentioned previously, the typical skews can range from 200 ps to 500 ps. This skew may not be satisfactory for some applications where the phase accuracy between channels requires a higher level of performance. In this case, manual calibration is required. Manual calibration can lower skews to less than 30 ps between devices. In Figure 17, a LabVIEW front panel illustrates the skew between the NI PXI-5122 100 MS/s digitizer and the NI PXI-5124 200 MS/s digitizer. The skew was found to be of the order of 15 ps with channel-to-channel jitter of 12 psrms. The statistics are compiled from 10,000 zero crossings of the square waveform. Left: Calibrated NI-TClk Synchronization of Two Digitizers – NI PXI-5122 at 100 MS/s and an NI PXI-5124 at 200 MS/s – Typical Skew on the Order of 15 psrms with Channel-to-Channel Jitter of 12 psrms, Right: Magnified View of the Falling Edge of 10 MHz Square Waveform from Manually Calibrated NI-TClk Synchronized NI PXI-5421 Arbitrary Waveform Generators – Skew on the Order of 20 ps. The previous picture is a measurement of the skew between two manually calibrated NI-TClk synchronized PXI-5421 arbitrary waveform generators using the CSA 8200. Notice that the skew is of the order of 20 ps. The waveform generated from the two devices is a 10 MHz square waveform. Manual calibration involves the adjustment of the sample clock on each device with respect to each other using the phase adjustment DACs in the PLL circuitry (refer to Figure 8). In synchronizing two arbitrary waveform generators, for example, the synchronized outputs can be viewed on a high-speed oscilloscope and the sample clock on one AWG can be moved relative to the other, using the phase-adjustment DAC. Through this manual process, the skew between multiple arbitrary waveform generators can be minimized from hundreds of picoseconds to under 30 ps. In synchronizing two digitizers, a low-phase noise signal is fed into each digitizer with equal length line cables. The skew can be measured in software, and the sample clock of one digitizer can be adjusted relative to the other to minimize the skew. The same methods are used in synchronizing digital waveform generator/analyzers. The sample clock adjustment can be achieved with high resolution. On the 100 MS/s devices, such as the PXI-5122, PXI-5421, and PXI-6552, the sample clock delay adjustment resolution is 10 ps and can be adjusted to ±1 sample clock period of 10 ns. On the 200 MS/s devices, such as the PXI-5422 and the PXI-5124, the adjustment resolution is 5 ps and can be adjusted to ±1 sample clock period of 5 ns. Thus, the skew between devices can be manually calibrated with high accuracy.

Project Case Study IoT System for Tunnel Construction Built Using CompactRIO Mar 27, 2024 90da186a-39e7-4f79-bbb6-a5695c819c4b 90da186a-39e7-4f79-bbb6-a5695c819c4b Home > Case Studies > *As Featured on NI.com Original Authors: Masatsugu Shiraishi, (The Zenitaka Corporation) Edited by Cyth Systems Internet-of-Things system built using NI CompactRIO for increased safety and power consumption monitoring of mountain tunnel construction sites. The Challenge Building a system to better secure the safety of work crews in the construction of mountain tunnels and reduce construction site energy consumption. The Solution Developing an IoT ('Internet of Things') system using CompactRIO that actively tracks the location of workers and their construction vehicles using RFID tags. As well, using CompactRIO hardware and LabVIEW software to develop a system to actively measure and monitor construction site energy consumption to provide data logging and active energy reduction. Background Our corporation has two major business areas: architectural construction focused on structures such as government buildings, office buildings, and commercial facilities, while our civil engineering construction sector is targeted at structures such as tunnels, bridges and dams. Within these areas, there have two persistent issues in regard to the construction These issues are improving safety and reducing energy consumption. Mountain tunnels construction requires a massive amount of electricity. This is because there are many kinds of electrical equipment being used day and night, including construction machinery, construction lighting, and ventilating fan. Despite this, the amount of power consumption is generally not tightly managed and measured. In many cases, the exact amount of power consumption is only ascertained when the bill from the power company becomes available. Sometimes, corporations install demand-monitoring equipment to help curb the maximum power demanded. However, even in these cases, the devices only allow the total volume of power consumption to be ascertained, or they may issue warnings to prevent the contracted volume of power from being exceeded. In order to tackle the issue of reducing power consumption, it was first necessary to obtain an accurate breakdown of how much power was being used in each particular area. In other words, we needed to be able to visualize the amount of power being consumed. The 'TUNNEL EYE' system uses an IoT (Internet-of-Things) framework to simultaneously provide functionality for both safety management and in reducing power consumption in mountain tunnel construction. As of March 2016, Zenitaka had implemented this system at the construction work site for the Shido Tunnel on the Takamatsu Expressway. In order to tackle the challenges mentioned above, Zenitaka decided to build a system that could improve the safety of tunnel construction as well as reduce the amount of power consumed. In other words, this new system would facilitate a clear picture of which workers were working in each location at the mountain tunnel construction site, as well as which processes were being carried out at those respective locations at any given time. The system would maintain the safety of all workers while also carefully controlling the electrical equipment to reduce unnecessary power consumption. Having decided on the concept, our next concern was whether there existed any kind of robust hardware that would not break down at the construction work site, that could move freely in response to changes in the working environment, and that could accurately detect workers and vehicles using radio frequency identification (RFID). Given that this system would involve many components that were new to Zenitaka, we decided to enlist a joint development partner, as they had provided us with a highly practical proposal. Left: Control terminal built using CompactRIO, Center: Screen displaying information on workers and the onsite environment, Right: LabVIEW user interface visualizing the power consumption breakdown. This system is composed of a server located on site, such as in the office at the construction work site, and multiple control terminals with allocated IP addresses. CompactRIO worked as the control terminals, and the required functionality has been developed using LabVIEW. Each control terminal is fitted with components such as an RFID reader for detecting workers and construction vehicles entering the tunnel, a densitometer for measuring the concentration of substances such as dust and combustible gases, and a wattmeter monitoring the operational status of the construction lighting, ventilating fan, and tunnel excavating machinery. These terminals are attached to each piece of electrical equipment that will be controlled, as well as to the electrical distribution boards that are positioned every 100 m within the tunnel, and all are linked to the server via the network. Each control terminal collects data on the position of workers and vehicles within the tunnel, as well as on the concentrations of various gases, and sends this information to the server. Data received by the server is analyzed and processed, and instructions for controlling the lighting and ventilating fan are then issued to the terminals based on the data results. This mechanism correlates the various kinds of measurement data with the electrical equipment, and utilizes the IoT for intercommunication to control and automatically reduce power consumption. CompactRIO-based distributed measurement systems use CompactRIO to perform measurements and process data. In most cases, these results are only sent in a single direction: upstream to the server. However, the TUNNEL EYE system is also able to send data downstream from the server to CompactRIO. This two-way data transfer is one of the special features of the TUNNEL EYE system. By building the system in this way, we have been able to achieve improvements in safety and reduced power consumption. The respective benefits are described in further detail below. Firstly, we have improved safety by ensuring that all people entering the work site carry a portable RFID tag. This has enabled us to manage work site entry electronically. In addition, we can now determine the location of each person working on site, and record their movements within the site. This means that we can track a person's location based on their previous movements if an emergency occurs in the tunnel work site, such as a fire or cave-in. Although there have been similar other types of tunnel entry management systems in the past, the major distinguishing feature of the TUNNEL EYE system is that data on the workers can be linked to the operation of the automatic controls for the lighting and ventilating fan. In other words, the energy saving feature is linked to the safety confirmation feature and operates accordingly once confirmation of worker safety has been assured. Let us illustrate this functionality using the example of transporting excavated earth. Huge dump trucks must make return trips into the tunnel as part of this process. The TUNNEL EYE system detects he movement of these trucks and triggers the lighting to make it brighter than usual. At the same time, the speed of the ventilating fan is automatically increased to cope with the exhaust fumes from the entering truck, as well as the dust particles from the excavated earth that will be blown around by the movement of the truck. As another example, take the case of workers located at the face of the tunnel excavation while electrical equipment such as a drill jumbo is being operated. In this scenario, no vehicles are making return trips, so exhaust fumes and dust particles are less of an issue. The system automatically controls the lights to dim the brightness elsewhere in the tunnel and reduce the speed of the ventilating fan. Unnecessary power consumption can be reduced, thanks to the ability to automatically control the lighting and ventilating fan to suit any combination of various situations, such as whether workers or construction vehicles are present, the operating status of construction machinery, and the concentration of various gases. If safety in the tunnel has been confirmed, the lighting and fan may also be switched off using a tablet device. In addition, a breakdown of the volume of power used on site can now be visualized. This is an essential step towards achieving reduced energy consumption. In particular, the ability to control the ventilating fan contributes greatly to reducing energy consumption. Ordinarily, the fan would be operated continuously at maximum speeds. However, the reality is that high speeds are not required when there is minimal dust. Accordingly, the concentration of dust is measured by a densitometer and then the speed of the fan is adjusted based on these results to prevent power from being wasted unnecessarily. This is a method that has been used previously. However, there is one important difference with the TUNNEL EYE technique. Under the previous method, the tunnel face environment might already be covered in high concentrations of dust by the time dust is detected by the densitometer. This is because the densitometer is positioned approximately 50m away from the tunnel face to prevent faults that could be caused by contact with the construction machinery or by explosive blasts. By the time the dust is detected, it is already too late to start increasing the speed of the ventilating fan. In contrast, the TUNNEL EYE system detects workers and construction vehicles, measures the power consumption of each piece of equipment, and measures the concentration of substances in the air. Based on this collective information, the kind of activity being conducted within the tunnel can be recognized automatically. If the system then predicts that this activity will cause the volume of dust to increase, it can automatically configure the ventilating fan to operate at maximum speed in preparation, rather than wait until the densitometer actually detects a high concentration of dust. This achieves enhanced reliability of the continued safety of workers in comparison to previous methods. The program for this kind of control flow has been revised countless times for optimization, resulting in smooth operation and efficient energy conservation. The design and implementation of the TUNNEL EYE system was able to be completed in just two months. Following this, it was repeatedly tested and revised, and even this latter process was concluded in one month. The reason we were able to achieve the full system in the short time of just three months was largely thanks to our use of CompactRIO, which allows reconfiguring, and LabVIEW, which facilitates graphical development. Original Authors: Masatsugu Shiraishi, (The Zenitaka Corporation) Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Project Case Study Power Line Monitoring Using PowerFlex Mar 30, 2025 39114372-a563-4b4a-a548-240ff09d605d 39114372-a563-4b4a-a548-240ff09d605d Home > Case Studies > PowerFlex - Power Line Monitoring & Measurement System PowerFlex is a ready-to-use platform for energy monitoring and measurement of signals directly from the power line. Typical Applications: Continuously monitor up to 16 mains or auxiliary signals 24 x 7 x 365 Trigger Events from any input based standard or custom trigger definitions Record event data on all channels, perform calculations and measurements Store data nearly indefinitely on the device Ethernet, fiber optic, or wireless secure networking The Challenge An industrial controls provider approached us with the need for a system to provide 24/7 power grid monitoring in extreme weather conditions. The Solution Using Cyth Circaflex and NI Single-Board RIO hardware we designed a rugged monitoring system that continuously monitors the voltages across circuit breakers used in power grid applications. The Cyth Process Sub-stations are the locations in a grid where power is stepped down from high transmission voltages to levels that are safe for homes and businesses. To maintain fail safes in this process, circuit breakers are installed to prevent overcurrent or short-circuit failures. These circuit breakers must be tested at sub-stations annually according to state and federal law and this task has traditionally been performed by on-site work crews. An industrial control provider approached us with the need to mitigate the risk of work crews visiting sub-stations in person by creating a system that could monitor and test these breakers remotely. Monitoring circuit breakers remotely requires a system to run 24/7. Our engineering team began by designing hardware that would run headless while continuously monitoring live events in real-time. This hardware, the NI Single-Board RIO paired with our Circaflex control system provided the I/O capabilities required of the system. The NI sb-RIO offers a user-programmable Field Programmable Gate Array (FPGA) which when compiled acts similarly to a hard-coded, custom silicon chip. FPGAs are extremely deterministic and robust, and using the FPGA in this application ensured that all information on short-circuit events were captured. Complimenting the capabilities of the NI-sbRIO our engineering team designed the Circaflex 580, an embedded signal conditioning board. We applied signal conditioning to step down the high voltages present at the substation (50 – 150 kVs) to a signal level the sbRIO was capable of reading. When the breaker is tripped, the unit does real-time analysis of voltage waveforms using proprietary algorithms to ensure the breaker is functioning within specifications. The Circaflex and NI sb-RIO controller provides the unit with the conditioning, tracking, and data storage capabilities required to monitor the voltages present at the substation. Predesigned I/O is suitable as-is for most Energy Monitoring applications: 12 AC Voltage measurements 3 Current Transducers (CT’s) 8kV Isolation 10k Samples/sec synchronous data Customizable voltage and current ranges Powered by AC line power Unlimited Customization Options Unlimited Sensor inputs Signal Conditioning External devices or cameras Communication / Networking Customization not required, but... Fully customizable if necessary Contact Us for Engineering Support

This course teaches you how to use common design patterns to successfully implement and distribute LabVIEW applications for research, engineering, and testing environments. LabVIEW Core 2 Training Course Start Date | End Date Duration ENROLL < Back NI Course Overview The LabVIEW Core 2 Course is an extension of the LabVIEW Core 1 Course. This course teaches you how to use common design patterns to successfully implement and distribute LabVIEW applications for research, engineering, and testing environments. Topics covered include programmatically respond to user interface events, implementing parallel loops, manage configuration settings in configuration files, develop an error handling strategy for your application, and tools to create executables and installers. The LabVIEW Core 2 Course directly links LabVIEW functionality to your application needs and provides a jump-start for application development. NI Course Objectives Implement multiple parallel loops and transfer data between the loops Create an application that responds to user interface events Manage configuration settings for your application Develop an error handling strategy for your application Package and distribute LV code for reuse Identify Best Programming Practices for use in LabVIEW NI Course Details Duration: Instructor-led Classroom: Two (2) days Instructor-led Virtual: Three (3) days, five-and-a-half-hour sessions On-Demand: 4 hours (exercises as a supplement) Audience: New users and users preparing to develop applications using LabVIEW LabVIEW Core 1 Course attendees Users and technical managers evaluating LabVIEW in purchasing decisions Users pursuing the Certified LabVIEW Associate Developer certification Prerequisites: LabVIEW Core 1 Course or equivalent experience NI Products Used: If you take the course On-Demand: LabVIEW 2021 NI-DAQmx 21.0 NI PCI-6221 or NI USB-6212, BNC-2120 Simulated NI-PCI-6221 If you take the course in an instructor-led format: LabVIEW Professional Development System 2023 or later NI-DAQmx 23.0 or later USB-6212 BNC-2120 Training Materials: Virtual instructor-led training includes digital course material that is delivered through the NI Learning Center NI virtual instructor-led training is delivered through Zoom, and Amazon AppStream/LogMein access is provided to participants to perform the exercises on virtual machines equipped with the latest software Cost in Credits: On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits Public virtual or classroom course: 20 Education Services Credits or 6 Training Credits Private virtual or classroom: 140 Education Services Credits or 40 Training Credits NI Course Outline LESSON OVERVIEW TOPICS Transferring Data Use channel wires to communicate between parallel sections of code without forcing an execution order. Communicating between Parallel Loops Exploring Channel Wires Using Channel Templates Exploring Channel Wire Interactions Transferring Data Using Queues Creating an Event-Driven User Interface Create an application that responds to user interface events by using a variety of event-driven design patterns. Event-Driven Programming User Interface Event Handler Design Pattern Event-Driven State Machine Design Pattern Producer/Consumer (Events) Design Pattern Channeled Message Handler (CMH) Design Pattern Controlling Front Panel Objects Explore methods to programmatically control the front panel. VI Server Architecture Property Nodes and Control References Invoke Nodes Managing Configuration Settings Using Configuration Files Manage configuration settings with the help of a configuration file. Configuration Settings Overview Managing Configuration Settings Using a Delimited File Managing Configuration Settings Using an Initialization (INI) File Developing an Error Handling Strategy Learn how to develop an error handling strategy for your application. Error Handling Overview Exploring Error Response Exploring Event Logging Injecting Errors for Testing Packaging and Distributing LabVIEW Code Learn how to package and distribute LabVIEW code for use by other developers and end-users. Preparing Code for Distribution Build Specifications Creating and Debugging an Application (EXE) Creating a Package for Distribution Programming Practices in LabVIEW Explore recommended practices for programming to develop readable, maintainable, extensible, scalable and performant code. Recommended Coding Practices Writing Performant Code in LabVIEW Software Engineering Best Practices Identify some key principles of software engineering best practices and the benefits of implementing them when working in LabVIEW. Project Management Requirements Gathering Source Code Control Code Review and Testing Continuous Integration Enroll

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The LabVIEW Core 3 Course introduces you to structured practices to help you design, implement, document, and test LabVIEW applications.  LabVIEW Core 3 Training Course Start Date | End Date Duration ENROLL < Back NI Course Overview The LabVIEW Core 3 Course introduces you to structured practices to help you design, implement, document, and test LabVIEW applications. This course focuses on developing hierarchical applications that are scalable, readable, and maintainable. The processes and techniques covered in this course help you reduce development time and improve your application stability. By incorporating these design practices early in your development, you can avoid unnecessary application redesign, increase VI reuse, and minimize maintenance costs. NI Course Objectives Leverage the LabVIEW Style Guidelines and choose an appropriate software development process to create an application Use LabVIEW Project Libraries and Project Explorer tools to organize your application Use frameworks and message handles to create a multiloop application Create and test a custom UI and ensure usability with sufficient user documentation Leverage modular code and develop test cases to maintain large applications NI Course Details Duration: Instructor-led Classroom: Three (3) days Instructor-led Virtual: Four (4) days, five-and-a-half-hour sessions On-Demand: 6.5 hours (exercises as a supplement) Audience: LabVIEW and Developer Suite users who need to increase performance, scalability, or reuse, and to reduce application maintenance costs LabVIEW users pursuing the Certified LabVIEW Developer certification LabVIEW users who have taken the LabVIEW Core 1 and Core 2 courses Prerequisites: LabVIEW Core 1 Course and LabVIEW Core 2 Course or equivalent experience NI Products Used: If you take the course On-Demand: LabVIEW 2022 Q3 If you take the course in an instructor-led format: LabVIEW 2022 Q3 Training Materials: Virtual instructor-led training includes digital course material that is delivered through the NI Learning Center NI virtual instructor-led training is delivered through Zoom, and Amazon AppStream/LogMein access is provided to participants to perform the exercises on virtual machines equipped with the latest software Cost in Credits: On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits Public virtual or classroom course: 30 Education Services Credits or 9 Training Credits Private virtual or classroom: 210 Education Services Credits or 60 Training Credits NI Course Outline LESSON OVERVIEW TOPICS Exploring LabVIEW Style Guidelines Configure the LabVIEW environment and follow LabVIEW style guidelines to develop an application. Configuring LabVIEW Environment Using LabVIEW Style Guidelines Designing and Developing Software Applications Identify an appropriate software development process for a given project and derive a high-level flowchart that can be used to guide subsequent design and development. Exploring Principles of SMoRES from LabVIEW Perspectives Software Development Process Overview Gathering Project Requirements Task Analysis Organizing LabVIEW Project Create LabVIEW project libraries and explore LabVIEW classes to organize the code. Using Libraries in LabVIEW Project Introduction to LabVIEW Classes Using Project Explorer Tools and Techniques Use Project Explorer tools and techniques to improve the organization of project files and resolve any file conflicts that occur. Using Project Explorer Tools Resolving Project Conflicts Creating Application Architecture Design applications leveraging multi-loop architecture techniques. Generating User Events Exploring LabVIEW Frameworks Exploring Framework Data Types Architecture Testing Selecting Software Framework Leverage frameworks and message handlers to design the LabVIEW application. Queued Message Handler Delacor Queued Message Handler Channeled Message Handler Using Notifiers Exploring Actor Framework Creating User Interface Design and develop a custom user interface that meets LabVIEW style guidelines. Exploring User Interface Style Guidelines Creating User Interface Prototypes Customizing User Interface Extending User Interface Ensuring Usability of User Interface Create sufficient user documentation, as well as initialize and test the user interface to ensure the usability of the application. Customizing Window Appearance Creating User Documentation User Interface Initialization User Interface Testing Designing Modular Applications Use modular code in a large application and explore guidelines for making large applications more maintainable. Designing Modular Code Exploring Coupling and Cohesion Code Module Testing Develop test cases that can identify the largest number of errors in an application. Code Module Testing Integration Testing Enroll

Project Case Study Flare Measurement System – with LabVIEW Mar 27, 2024 7181b3c9-8e91-4d96-bdd5-8427bcc5dd7e 7181b3c9-8e91-4d96-bdd5-8427bcc5dd7e Home > Case Studies > *As Featured on NI.com Original Authors: Marcin Polaszyk, TBG-SOLUTIONS Edited by Cyth Systems Automating Steel Inspection The Challenge We aimed to create an accurate and expandable inspection system for a steel production line. The system needed to provide more efficiency and higher inspection outputs than the current method of human inspection. The Solution We used LabVIEW software and a third-party laser scanner, a linear actuator, and a wheel encoder to create an inspection system capable of continuous 3D surface mapping for accurate inspection of flare defects. The system could also store raw and flare data for future purposes. Introduction Inspecting steel for flaring is an important stage of the steel production cycle. The inability to inspect for flaring increases the probability of the final product failing quality control, which results in the waste of used steel. In the current system, an employee visually inspects a continuous stream of steel strips to identify flares and estimate their dimensions. The employee adjusts a cutting blade to remove the defect. This method can be time-consuming, and prone to human error. The customer required a software and hardware solution to automate the inspection stage and improve this process. System Overview Our system consists of a laser scanner above the production line, which acquires surface measurements of the steel strip passing beneath it. It is situated on a linear actuator so the system can adjust laser positioning and maintain identical measurement dimensions independent of the steel strip width. This makes for a more flexible system. A wheel encoder directly in contact with the production line roller triggers the acquisition, giving measurements at a configured rate and independent of conveyor speed. Left: System on the Production Line , Right: System Overview We used LabVIEW to develop the software running on the operator PC. The software uses various tools, which we explain later in this case study. It receives surface measurements from the laser scanner, buffers them, and performs analysis to determine further operation of the station. All components communicate with the PC through Ethernet. Alternative Solutions Prior to selecting LabVIEW as our software, we considered developing the solution in C as our third-party hardware could support both platforms. TBG Solutions has developed systems in both languages in the past, and we felt LabVIEW offered more benefits. We believed we could develop a better system in a shorter period of time, without sacrificing anything in return. Implementation We designed the software to execute in a set sequence: Data acquisition Analysis Additional parallel processes that act upon the results from the analysis stage Linear actuator control, data display, and data logging Main User Interface The start point of the looped execution sequence is at data acquisition. We implemented the laser using LabVIEW’s built-in tool for third-party DLLs, which streamlined the driver development. The acquisition consisted of 640 points per measurement, giving a 150 mm wide surface map. Next, we buffered the measurements in the analysis stage, where we executed a series of algorithms to examine the measured surface. These involved identifying flares, identifying new steel strips and their deviation in width, and calculating the correct laser position to ensure uniform measurements. The results of these algorithms determined further operation of the parallel processes. We implemented our design using the LabVIEW object-oriented programming (OOP) functionality, which was an ideal tool due to its ability to dynamically dispatch various instances of the same VIs and encapsulate data for each area of the execution sequence. Adding this to the other benefits, the graphical aspect of LabVIEW (Figure 5) delivered the perfect platform for swift and understandable development of a hardware abstraction layer (HAL). This benefitted the development process in two major ways: 1) It accommodated a hardware-free development process as we could easily implement simulation classes, which prevented the development from being on hold when hardware was unavailable. 2) The modular nature of the implementation made the system more expandable as it accommodated for the event of exchanging hardware, analysis, or file types. Another key LabVIEW feature that we used extensively during the development process was custom probing. We could view data in various formats, directly as the programming executed, which aided the development process as it made debugging significantly more straightforward. Operator PC Interface The 3D surface map is the core focus of the interface. The operator can use it to inspect the acquired data under any desired angle with accurate length and height measurements. We implemented the graph using the built-in 3D mesh function in LabVIEW. We found it easy to use, so we could quickly and simply implement the design. Conclusion Using LabVIEW, we produced a professional application that met our objectives. The intuitive front panel components drove a complex UI's quick and easy development that accommodated our underlying functional needs. Furthermore, the built-in tools and communication protocols sped up the process of developing the software infrastructure. This allowed us to focus on more complex system areas, making the whole development more time and cost-efficient. In addition, the previously explained benefits of OOP helped us adapt the solution for future opportunities that could involve the automation of the cutting-off defects. The solution will benefit our client in more than one way as the vast amount of data acquisition will produce quality information available for review. The customer can improve the quality of their steel and become increasingly more competitive in the British steel industry. Overall, LabVIEW has again proven to be a great platform for developing a scalable and flexible solution. TBG Solutions will most certainly continue to use LabVIEW. Original Authors: Marcin Polaszyk, TBG-SOLUTIONS Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Project Case Study Creating an Airport Runway Foreign Object Debris Detection System Based on Millimeter-Wave Radar Mar 26, 2024 72e146b6-2d01-4bf0-82cf-76abb9afcbdf 72e146b6-2d01-4bf0-82cf-76abb9afcbdf Home > Case Studies > *As Featured on NI.com Original Authors: Shunichi Futatsumori, Surveillance and Communications Department, Electronic Navigation Research Institute (ENRI) Edited by Cyth Systems Airport Runway Debris Detection The Challenge Analyzing and displaying the GB/s class radar data from high-resolution 96 GHz millimeter-wave radar front ends to detect small debris on airport runways. The Solution Using the NI PXI platform to achieve real-time radar signal processing based on the FPGA hardware clock with a high-data throughput rate and using LabVIEW code for the radar signal processing to reduce the development time by 90 percent that of the conventional programming method. Foreign Object Debris Detection on Airport Runways Demand to automatically detect foreign object debris (FOD) on the airport surface has rapidly increased in recent years. Even if such FODs are small in volume and size, these objects can damage aircraft. After the Concorde accident in 2000 at Charles de Gaulle Airport in Paris, which was caused by a small metallic plate on the runway, the detection of FODs is an important issue for airport administration. Runway downtime due to safety checks is not negligible for the efficient operation of the runway time slot. Electric Navigation Research Institute (ENRI) is the national research agency that aims to develop civil technologies for aviation surveillance and communication, air traffic safety, and efficient operation of air traffic routes. Among the various research topics for civil aviation safety technology, we are developing a millimeter-wave radar system to detect small FODs on airport runways. The millimeter-wave radar system enables high-detection performance, high-range resolution, and weather robustness compared with camera systems. However, the system also comes with many challenges, such as the development of a millimeter-wave circuit and signal processing circuit to realize the high-performance FOD detection system for the airport runway. Left: Overview of the optically connected, distributed-type 96 GHz millimeter-wave radar system with two antenna units , Right: Example of the combined radar scope obtained in the Sendai Airport field experiments Millimeter-Wave System Overview The millimeter-wave radar system consists of a beam-scanning antenna, millimeter-wave transmitting and receiving circuits, signal generation, processing circuits, and synchronize and control circuits. The R&D topics of the FOD detection system are mainly for the 96 GHz millimeter-wave front-end circuits. In addition, the receiving signal processing circuits and synchronization circuits are essential parts of the high-performance radar system. On starting the research of millimeter-wave radar signal processing and synchronization with a new technology, we faced three challenges: To confirm the progress of the research and to carry out the airport field experiments, the radar prototype system is constructed every year during the four-year R&D period. Because of this, we must construct the receiving signal processing circuits and synchronization circuits in a limited time. Our available time for development was limited to less than one month to accommodate the development schedule for the millimeter-wave circuit construction and the inspection to obtain the experimental radio license. The millimeter-wave radar system enables sub-centimeter range resolution using wide-band frequency resources. However, to realize the high resolutions in the large detection area of the airport runway, the radar system must process the huge data in a short time. For example, assuming a 5 cm range resolution, 200 m diameter coverage, and 360 degrees azimuth beam scanning in 0.036 degrees angle resolution, the amount of data is at least 1.2 GB/s (16-bit amplitude resolution) for each radar front end. We cannot analyze this amount of radar data without a hardware logic circuit, such as the FPGA or ASIC circuit. The radar signal processing circuit requires complex signal processing such as fast Fourier transform (FFT) and coherent signal integrations with trigger synchronization. Outsourcing this complicated system leads to high costs and a long development period. In addition, to implement the novel algorithm obtained by the research project, the analyzing programs must modify and add the functions by the researchers. If we use multiple programming languages such as VHDL for the FPGA circuit and C for the host computer, we are concerned about the cost to acquire the programming skills. Left: Optically-connected, distributed-type 96 GHz millimeter-wave radar systems for airport surface foreign object debris detection, Right: Runway radar system positioning. To overcome these problems, we used the NI PXI platform, the FlexRIO system, and a digitizer adapter module to develop the receiving signal processing circuits and the synchronization and control circuits. Figure 1 shows the proposed radar system is a distributed-type optically connected millimeter-wave radar system based on the radio-over-fiber (RoF) technology. The “distributed-type” means the radar system consists of a central unit inside a facility building and some antenna units near the runways. Each antenna unit covers each detection area in the runway. The transmitting frequency is between 92 GHz and 100 GHz. The radar signal transmitting source is located in the central unit. The electrical millimeter-wave transmitting signal is directly converted to the optical signal. This enables the low-loss transmission of millimeter-wave radar modulated signal by more than 10 km. In addition, the receiving signal obtained at the antenna unit also transmits to the central unit through the optical fibers. This radar architecture achieves the low-cost construction of the large-scale millimeter-wave radar system, based on the central signal generation and processing and very simple antenna units. The central signal processing is a key feature to achieving the distributed-type radar system; however, this requires a high-data throughput rate and flexible construction as described in the previous section. To solve the problem, we chose the central system construction with LabVIEW software, the NI PXI platform, and FlexRIO hardware. Figure 2 and Figure 3 show the overview of the optically-connected distributed-type 96 GHz millimeter-wave radar system and the block diagram of the radar signal processing circuit, respectively. The NI PXIe-7975R FlexRIO FPGA module has enough flip flop slices and memory resources for the FFT analysis, signal integration, and signal synchronization. In addition, the PXI Express bus can transfer the analyzed radar receiving data to the host program with up to an 8 GB/s throughput rate using the DMA FIFO. For the NI PXIe-7975R, we used the NI 5762 16-bit, 250 MS/s digitizer module. The NI 5762 has 12-channel digital I/O, which can control the beam-scanning antenna and obtain the information of antenna direction. Since this digital I/O also directly connects to the FPGA circuit, we can achieve the precise signal synchronization based on the hardware clock. Furthermore, we can also achieve the signal synchronizations between the transmitting signal source and the AD converter based on the FPGA clock with low-time jitter. Original Authors: Shunichi Futatsumori, Surveillance and Communications Department, Electronic Navigation Research Institute (ENRI) Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

The LabVIEW Core 1 Course gives you the chance to explore the LabVIEW environment and interactive analysis, dataflow programming, and common development techniques in a hands-on format. LabVIEW Core 1 Training Course Start Date | End Date Duration ENROLL < Back NI Course Overview In the LabVIEW Core 1 Course, you will explore the LabVIEW environment and interactive analysis, dataflow programming, and common development techniques in a hands-on format. In this course, you will learn how to develop data acquisition, instrument control, data-logging, and measurement analysis applications. At the end of the course, you will be able to create applications using the state machine design pattern to acquire, analyze, process, visualize, and store real-world data. NI Course Objectives Interactively acquire and analyze single-channel and multi-channel data from NI DAQ devices and non-NI instruments Create user interfaces with charts, graphs, and buttons Use programming structures, data types, and the analysis and signal processing algorithms in LabVIEW Debug and troubleshoot applications Log data to file Use best programming practices for code reuse and readability Implement a sequencer using a state machine design pattern NI Course Details Duration: Instructor-led Classroom: Three (3) days Instructor-led Virtual: Five (5) days, five-and-a-half-hour sessions On-Demand: 7.5 hours (exercises as a supplement) Audience: New users and users preparing to develop applications using LabVIEW Users and technical managers evaluating LabVIEW in purchasing decisions Users pursuing the Certified LabVIEW Associate Developer certification Prerequisites: Experience with Microsoft Windows Experience writing algorithms in the form of flowcharts or block diagrams NI Products Used: If you take the course On-Demand: LabVIEW 2021 or later NI-DAQmx 21.0 or later NI-488.2 21.0 or later NI VISA 21.0 or later USB-6212 BNC-2120 If you take the course in an instructor-led format: LabVIEW 2023 or later NI-DAQmx 23.0 or later NI-488.2 23.0 or later NI VISA 23.0 or later USB-6212 BNC-2120 Training Materials Virtual instructor-led training includes digital course material that is delivered through the NI Learning Center. NI virtual instructor-led training is delivered through Zoom, and Amazon AppStream/LogMein access is provided to participants to perform the exercises on virtual machines equipped with the latest software. Cost in Credits On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits Public virtual or classroom course: 30 Education Services Credits or 9 Training Credits Private virtual or classroom: 210 Education Services Credits or 60 Training Credits NI Course Outline Lesson Overview Topics Introduction to LabVIEW Explore LabVIEW and the common types of LabVIEW applications. Exploring LabVIEW Environment Common Types of Applications Used with LabVIEW First Measurement (NI DAQ Device) Use NI Data Acquisition (DAQ) devices to acquire data into a LabVIEW application. Overview of Hardware Connecting and Testing Your Hardware Data Validation Exploring an Existing Application Explore an existing LabVIEW project and parts of a VI. Exploring a LabVIEW Project Parts of a VI Understanding Dataflow Finding Examples in LabVIEW Creating Your First Application Build a VI that acquires, analyzes, and visualizes data from NI DAQ device as well as from a non-NI instrument. Creating a New Project and a VI Exploring LabVIEW Data Types Building an Acquire-Analyze-Visualize VI (NI DAQ) Building an Acquire-Analyze-Visualize VI (Non-NI Instrument) Exploring LabVIEW Best Practices Use various help and support materials provided by NI, explore resources, tips and tricks for using LabVIEW. Exploring Additional LabVIEW Resources LabVIEW Tips and Tricks Exploring LabVIEW Style Guidelines Debugging and Troubleshooting Explore tools for debugging and troubleshooting a VI. Troubleshooting a Broken VI Debugging Techniques Managing and Displaying Errors Executing Code Repeatedly Using Loops Explore components of LabVIEW loop structures, control the timing of a loop, and use loops to take repeated measurements. Exploring While Loops Exploring For Loops Timing a Loop Using Loops with Hardware APIs Data Feedback in Loops Working with Groups of Data in LabVIEW Work with array and waveform data types, single-channel and N-channel acquisition data. Exploring Data Groups in LabVIEW Working with Single-Channel Acquisition Data Working with N-Channel Acquisition Data Using Arrays Writing and Reading Data to File Explore basic concept of file I/O and how to access and modify file resources in LabVIEW. Writing Data to a Text File Writing Multi-Channel Data to a Text File Creating File and Folder Paths Analyzing Text File Data Comparing File Formats Bundling Mixed Data Types Use LabVIEW to bundle data of different data types and pass data throughout your code using clusters. Exploring Clusters and Their Usage Creating and Accessing Clusters Using Clusters to Plot Data Executing Code Based on a Condition Configure Case structure and execute code based on a condition. Conditional Logic Introduction Creating and Configuring Case Structures Using Conditional Logic Reusing Code Explore the benefits of reusing code and create a subVI with a properly configured connector pane, meaningful icon, documentation, and error handling. Exploring Modularity Working with Icons Configuring the Connector Pane Working with SubVIs Controlling Data Type Changes Propagate data type changes using type definitions. Exploring Type Definitions Creating and Applying Type Definitions Implementing a Sequencer Sequence the tasks in your application by using the State Machine design pattern. Exploring Sequential Programming Exploring State Programming Building State Machines Additional Scalable Design Patterns in LabVIEW First Measurement (Non-NI Instrument) Use LabVIEW to connect to non-NI instruments and validate the results. Instrument Control Overview Communicating with Instruments Types of Instrument Drivers Enroll

Project Case Study A Mobile Platform for Road Inspections Using LabVIEW Apr 1, 2024 a838e7cc-b54a-471e-a20a-ed02c4996461 a838e7cc-b54a-471e-a20a-ed02c4996461 Home > Case Studies > *As Featured on NI.com Original Authors: Willians R. Mertz Villa, HOB Consultores SA. Edited by Cyth Systems Road Inspections supported using LabVIEW software and PXI hardware. The Challenge Improving the process of surveying information to assess the degree of deterioration of the road infrastructure—which is currently performed manually and disrupts traffic during the day, has a high risk of accidents, and yields little (10 km per work crew per day)—and recording the information in formats that are not subject to manipulation and can be verified with consistent results. The Solution Developing a mobile platform with a continuously geo-referenced, real-time video system specifically designed to collect virtual images of the condition of deterioration and maintenance of the pavement and engineering structures (up to 80 km/h) efficiently and securely. Surveying Road Conditions Using the ROAS Equipment Road infrastructure helps local markets develop and provides integration with spatial economic centers to generate positive effects that influence businesses’ and households' production and consumption decisions. The lack of a route affects the standard of living and the productivity of the people in the area. Additionally, road deterioration increases operating costs, travel time, and investment. User satisfaction is reflected in the quality of the pavement. We must know when to intervene and how to measure deterioration, a process subject to methodologies of surveying information that are now performed manually, which makes results inconsistent. Application Description The road analyzer and survey (ROAS) vehicle mobile platform is oriented to technological innovation for the management and maintenance of roads. The ROAS performs automatic measurements of geo-referenced data and provides service survey information to assess service levels and surface conditions of the road using national and international standards such as ASTM Standard D6433-11 from the Roads and Parking Lots Pavement Condition Index Surveys (Figure 1). We developed a data acquisition and pre-processing system, and two software modules to generate specialized reports. Left: Road Inspection Platform Graphical User Interface, Right: Software Module for Inspection and Reporting With Images of the Pavement (MESP) The Data Acquisition and Pre-Processing System This module is composed of data acquisition hardware using the NI PXI Platform and the control module, which we developed using NI LabVIEW software and the NI LabVIEW Real-Time Module (Figure 2). The hardware synchronizes and acquires digital image data of the road and pavement, GPS, turning, and other devices. We synchronized this data with a distance measuring instrument (DMI) through a sensor encoder connected to the vehicle axis wheels. Figure 3 shows the parts of the DAQ system mounted on the mobile platform. Software Modules to Generate Specialized Reports We generate reports based on the type of information collected by the ROAS system. We could perform many inspections and operations with the route images acquired through the route surface evaluation module (MESR), which we developed using LabVIEW (Figure 4), including: Road safety Asset inventory (traffic signs, traffic lights) Current road conditions with simulations of tours through the track at different speeds Measurements of the images, such as lane width and projection GPS We can perform in-cabinet visual inspections of the condition of the paved roads, get a maintenance history, identify the type of failures and determine severity (crocodile cracking or longitudinal and transverse cracks), and perform reporting. We can do all of this through the pavement surface evaluation module (MESP), which we developed using LabVIEW (Figure 5). General Properties of the System The system includes: Data acquisition rates of up to 80 km/h Panoramic digital images of up to 120° of route Digital images of all the pavement in a lane (up to 4 m wide) Virtual measurements on images Virtual tours of tracks at different speeds and geo-positioning Large storage capacity for internal and external information Report generation and data exporting to different file formats such as Excel, Word, KML, (Google Earth, JPG, and AVI Artificial lighting using xenon strobe lights to capture images of the pavement Geo-referenced data (GPS or DGPS) DMI with an error rate less than 0.1 percent Conclusion We developed the appropriate methodology for surveying. Our system provides reliable information and consistent results with a high production rate (200 km/day) and is safe. It works on unpaved, paved, and urban roads during the day or at night. Users can adjust report generation to their own requirements. Data is verifiable, reproducible, and exportable to other platforms. The system has GPS or DGPS information and can import images from Google Maps. It also has improved information quality to input into the pavement management system, provides better and timelier intervention decisions for the road, and can integrate other sensors and/or measurement equipment into the platform. Original Authors: Willians R. Mertz Villa, HOB Consultants SA. Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Project Case Study Automated Test of RF Tire Sensors using NI USRP Software Defined Radio Mar 30, 2025 cdbb4aaa-c3ce-4872-afc2-5875a64181aa cdbb4aaa-c3ce-4872-afc2-5875a64181aa Home > Case Studies > Validation of Continental Automotive tire sensors. Project Summary Continental Automotive required the upgraded validation of a tire sensor with wireless communication capabilities at a lower cost compared to existing test systems. Solution Developing a configurable RF communication test solution using an NI RF generator and receiver card for the ISM band (315 MHz/915 MHz). This was achieved using an NI USRP-2900 card to send and receive RF signals and LabVIEW software to create a configurable and software-defined test approach. Industry Automotive Technology at-a-glance NI USRP 2900 Read More... NI LabVIEW Testing RF Communication to Tire Sensors Continental Automotive, a premium supplier of automotive solutions, manufactures various connected sensors, keys, and other equipment that operates according to different RF protocols. Amongst these communication-capable sensors are some dedicated to monitoring continuous tire pressure so that it is always possible to know what the tire pressure is and receive an alert in the event of abnormal pressure loss. As such, the Continental tire pressure monitoring system prevents frequent cause of accidents and ensures optimal safety for the driver. It also helps to reduce CO2 emissions and fuel consumption (a tire that is under-inflated by 0.3 bar leads to an over-consumption of 1.5% on average). Left: NI USRP‑2900 is a tunable RF transceiver with full-duplex operation used to test the tire sensor's RF capabilities, Right: Cross-sectional diagram of tire sensor position and functionality. The company’s quality requirements call for products to undergo many tests, which are now carried out with dedicated cards using hardware and software designed specifically for this purpose. As a result, in the event that there are changes in customer requirements or the technologies used, it is sometimes necessary to update the dedicated card’s software or begin a new hardware design. Among the most common developments are the size of the frame, the type of modulation, the throughput, data coding, or the frequency used. Such an approach is costly in terms of resources for development as well as maintenance and prohibits a standardized approach. The company, therefore, needs to find a more practical and less expensive alternative. The Advantages of Software Defined Radio In a context where hundreds of thousands of products are produced every day and where the tolerated error rate is extremely low, an application that tests equipment such as tire pressure sensors or car keys must be hardy, reliable, and fast. It is therefore necessary to develop a hardy and flexible solution that ultimately has the same reliability as the solution currently being used. This solution needs to be easy to use while remaining complete so as to be able to adapt to future changes in technologies and protocols. The advantage of SDR technology is that it usually requires only two components: A card for transmitting/receiving signal. A computer with software that can process this signal. Combining USRP-2900 and LabVIEW Equipment We have therefore used USRP-2900 from NI. It is an RF transceiver that covers the range from 70 MHz to 6 GHz with a maximum instantaneous bandwidth of 20 MHz with characteristics that are relatively well suited to our application’s requirements. With this USRP (Universal Software Radio Peripheral) device, we can not only capture RF product messages under test but also transmit them through two channels, Tx/Rx and Rx. The USRP is driven by LabVIEW software on which the main operations for processing the signal for demodulating and decoding the frames coming from the sensors are carried out. We can also use LabVIEW to create an intuitive graphical user interface. Top: LabVIEW Programming for Receiving Signal, Bottom: LabVIEW Block Diagram of Transmitted Signal Sending and Receiving RF Data Frames LabVIEW UI of RF Vector Signal LabVIEW UI of RF Vector Signal Generation and Receiver Transmission during live test of the wireless tire sensor. With the LabVIEW program, frames contained in the ISM frequency band can be sent and received. We can set the frequency, the baud rate, the modulation (ASK or FSK), and the number of bytes to be received as well as code/decode Manchester code. The content of the frames to be sent is customizable. We can send a sequence containing a wake-up frame followed by a defined number of frames containing useful information. (Figure 5) Most of the variables are configurable, which requires a configuration and initialization step when first used. After completion, the program works automatically and doesn’t require any further changes. In the event of changes in the transmission and receiving protocol, we simply have to restart the software and amend the parameters during the configuration and initialization step. Then we can use the new protocol. Conclusion The use of the USRP-2900 card and LabVIEW software was a great validation of the SDR approach for transmitting and receiving RF frames for vehicle access or tire pressure monitoring systems. Original Authors: Joram Fillol-Carlini, Continental Automotive France, Wireless Tests Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Project Case Study Inspecting Dinner Plates Using LabVIEW & Vision Integration Mar 27, 2024 aded4342-7472-43d7-82e3-d6831094cd91 aded4342-7472-43d7-82e3-d6831094cd91 Home > Case Studies > *As Featured on NI.com Original Authors: Paul L. Falkenstein, Certified LabVIEW Developer, Sciotex Edited by Cyth Systems The Challenge Providing a conveyor-based automated inspection system for visual assessment of dinnerware (plates and bowls). The Solution Using LabVIEW image acquisition and processing software to develop a system capable of visually inspecting the top and bottom finishes of more than 50 types of dinnerware plates and bowls . The Story//Process After manufacture, dinnerware including plates and bowls must be inspected for defects. There are several of these defects that must be measured during visual inspection to determine if the subject item is deemed a pass or a reject according to the manufacturer’s quality standards. Warp is defined as the variability of the plate height around its circumference. Trim defects include both "trim gouge,” where there is an indentation at one or more angular positions, and “trim bulge,” where the circumference bows out from a perfect circle. The other defect, glass adhesion, occurs when small molten glass balls adhere to the top or bottom surfaces in the region adjacent to the plate rim. The system requirements called for detecting each of the four defect types when the defect size is >250 microns (0.01 in.) for dinnerware up to 12 inches in diameter. Figure 1 shows a highly magnified view of a plate with both trim bulge and glass adhesion defects that were detected and highlighted by PQIS. The system throughput is up to 60 plates per minute and inspection should run 24 hours per day, seven days per week, with minimal downtime. Left: Conveyor-based automated vision inspection system. Right: 3D laser line scanning to produce a 3D rendering of the subject item for inspection. The plates and dinnerware are visually inspected simultaneously from the top and bottom using 3D line scanners. These laser line scanners produce a 3D rendering of the subject item for inspection which then simplifies identifying possible defects. The automated conveyor moves the plates towards the laser line scanners and assists the dinnerware as it passes fully through the laser’s viewing window. Detecting different types of defects requires different forms of visual inspection. Another form of this is transmitting light through the translucent plates which highlights defects in the glass. Illumination for imaging on the conveyors is provided by focused LED line lights angled off-axis from the cameras. Using off-axis lighting results in a dark image background outside of the plates allowing for high-edge contrasts. Adhered glass scatters the transmitted light and appears as a change in light intensity. Advanced processing of the light intensities yields a defect detection of greater than 95 percent with no human intervention. The plate warp is measured at another station on one of the conveyors. A set of red laser lines is used to create a laser line incident on the bottom surface of the inverted plate or bowl. Vertical displacements of this line are viewed in respect to a reference reading and are measured using an area scan camera. Triangulation is used to generate a point cloud model of the sample as it passes under the camera. The software corrects for lens perspective and laser alignment to produce models with 100 µm height tolerances and cross-section resolution of less than 150 µm. The two lasers can generate more than 250,000 points per second. Point clouds are analyzed to determine sample warp. Figure 3 shows a typical warp model generated by PQIS (Plate Quality Inspection System). Left: Vision inspection circling identified defect areas, Center: Real-Time 3D Model Generated for Warp Analysis . Right: Real-Time 3D Model Generated for Warp Analysis Conclusion The first generation PQIS has been operating for more than a year and the manufacturer has already seen a return on their investment because we eliminated the need to manually inspect each plate and improved product quality and yields. We recently installed the second-generation PQIS and validated its ability to detect defects with accuracy that is orders of magnitude superior to manual inspection. Developing the advanced image analysis routines employed in these systems would likely have been prohibitively expensive if we attempted to develop the software with any tools besides LabVIEW and the Vision Development Module. Original Authors: Paul L. Falkenstein, Certified LabVIEW Developer, Sciotex Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more