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Project Case Study Nucor Refines Steel Recycling Using NI Hardware & LabVIEW Aug 29, 2023 0d667412-79ba-41a3-9b9b-5fe006c801c7 0d667412-79ba-41a3-9b9b-5fe006c801c7 Home > Case Studies > *As Featured on NI.com Original Author: Dave Brandt, Nucor Corp Edited by Cyth Systems Steel recycling facility The Challenge Developing an automation system for a steel recycling facility that reduces the amount of energy consumed to comply with statewide energy regulations while improving the safety and efficiency of the plant. The Solution Using National Instruments CompactRIO and the NI LabVIEW graphical programming environment to develop plant automation solutions to accurately measure the amount of energy required to recycle steel and improve facility safety. Two out of every three pounds of steel is produced from previously used steel, making it the most recycled material in North America. Recycling steel consumes between 60 and 74 percent less energy than producing new steel from raw materials, which is equivalent to the amount of energy needed to power 18 million homes for one year. Improving Steel Recycling Steel companies are constantly refining their recycling operations to make the process more efficient and environmentally friendly. At Nucor, we place a high value on being stewards of our environmental resources, and to that end we have become the largest recycler of steel in North America. In 2005, we purchased the Marion Steel Company in Marion, Ohio, which gave us a location central to nearly 60 percent of the steel consumption in the United States. To maintain our high facility standards with this acquisition we immediately recognized the need to implement a facility automation system to improve the efficiency and safety of the plant. Top: NI cRIO-9063 Bottom: NI cRIO-9038 Reducing Energy Consumption with NI Software and Hardware At the Marion facility, we manufacture a full line of rebar, sign supports, delineators, and cable barrier systems using recycled steel. During the steel recycling process scrap metal is heated in an electric arc furnace (EAF) and, depending on the type of steel being produced, a combination of elements is added to the viscous steel to create the appropriate steel alloy. This process requires large amounts of energy that vary significantly depending on the amount of scrap placed in the furnace. When we purchased the Marion facility, operators relied on estimates to determine the amount of steel placed in the furnace, causing the metal to be overheated oftentimes. This results in an unsatisfactory end product that must be recycled again, which costs the company time, money, and energy. Steel furnace To reduce the number of reheats, we developed a low-cost scale and weighing system using LabVIEW and NI CompactRIO controllers that accurately calculated the amount of steel in each burn. Knowing the exact amount of scrap metal placed in the furnace allowed us to precisely calculate the amount of electricity required to heat the furnace. Prior to implementing this scale system, our steel measuring was hit or miss. We did not have a method of tracking the number of reheats prior to the implementation of the new system, however out of the more than 6,000 batches in 2007 after deploying the new system we only performed 10 reheats, which was far less than in 2006. Eliminating Flicker with LabVIEW and NI CompactRIO One risk involved in drawing the large amount of electricity required to heat the furnace for recycling is causing flicker on the power grid. Not only did we receive monetary penalties for using too much electricity, but the power grid flicker was an inconvenience to Marion residents. To reduce electricity consumption, we developed an online reactor in series with the furnace using the LabVIEW FPGA module and the CompactRIO platform that measures the amount of energy drawn from the power grid. If the furnace approaches the prescribed limit, the system can quickly change control methods to reduce the amount of power being drawn. Improving Facility Safety with LabVIEW One of our core values at Nucor is employee safety, thus another goal of our facility improvements was to make the Marion location a safer place to work. We determined we needed to upgrade the method for turning the EAF on and off. Before renovating the system, an operator had to manually pull the on/off switch, which made him or her vulnerable to injury if the fuse were to blow. A cRIO and an HMI were used to create a remote power switch that does not put operators in potentially dangerous situations. The Benefits of Factory Automation Using NI hardware and software, we developed a variety of automation systems that have greatly reduced the electricity we use and eliminated potential safety issues at our Marion, Ohio facility. The ability to have one platform handling all of our communication protocols (Ethernet, serial, Modbus, and EtherCAT), PID control loops, and sequencing algorithms saved us time and money. With LabVIEW’s graphical system design, we were able to further simplify our development by parallelizing all of our communication and control loops, which lead to increased system performance in addition to readable and maintainable code. Original Author: Dave Brandt, Nucor Corp Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Home DAQ, USB Data Acquisition Products Download DAQ, Industrial PXI Download DAQ, PXI, Simultaneous DAQ, PXI, High Performance DAQ, PXI, Value DAQ, Desktop PCI DAQ, USB Download DAQ, USB, Multifunction DAQ, USB, High Speed DAQ, USB, mioDAQ Compact DAQ (cDAQ) Family Download Compact DAQ (cDAQ) Chassis Compact DAQ (cDAQ) Modules Real-Time & Embedded Download CompactRIO (cRIO) Family CompactRIO (cRIO) Chassis CompactRIO (cRIO) Modules Download Single-Board RIO Download sbRIO Main Boards sbRIO Mezzanine Boards sbRIO Accessories PXI Platform Download PXI Chassis PXI Controllers PXI Modules Download PXI Data Acquisition Download PXI, DAQ, Simultaneous PXI, DAQ, High Performance PXI, DAQ, Value PXI Oscilloscopes PXI Digital Multimeters Industrial Instrumentation Download Digital Multimeters (DMM's) Download DMM, PXI Oscilloscopes & Digitizers Download Oscilloscopes, USB Oscilloscopes, PXI Oscilloscopes, Desktop PCI Oscilloscope Accessories Digitizer, PXI, High Performance Digitizer, PXI, Simultaneous DAQ, USB USB DAQ devices are portable, easy to set up, and ideal for small to medium-scale applications. They offer versatility and convenience for engineers and researchers working in the field. DAQ, USB, Multifunction mioDAQ USB modules offer multiple input and output channels, making them a cost-effective and compact solution for data acquisition in education or small-scale research. DAQ, USB, High Speed High-Speed USB DAQ devices provide fast data transfer rates, ideal for applications that require real-time processing or large datasets. DAQ, USB, mioDAQ Multifunction USB DAQ devices combine analog, digital, and counter/timer functions in one unit, offering a flexible solution for general-purpose data acquisition tasks.

Home DAQ, PXI, Simultaneous Data Acquisition Products Download DAQ, Industrial PXI Download DAQ, PXI, Simultaneous DAQ, PXI, High Performance DAQ, PXI, Value DAQ, Desktop PCI DAQ, USB Download DAQ, USB, Multifunction DAQ, USB, High Speed DAQ, USB, mioDAQ Compact DAQ (cDAQ) Family Download Compact DAQ (cDAQ) Chassis Compact DAQ (cDAQ) Modules Real-Time & Embedded Download CompactRIO (cRIO) Family CompactRIO (cRIO) Chassis CompactRIO (cRIO) Modules Download Single-Board RIO Download sbRIO Main Boards sbRIO Mezzanine Boards sbRIO Accessories PXI Platform Download PXI Chassis PXI Controllers PXI Modules Download PXI Data Acquisition Download PXI, DAQ, Simultaneous PXI, DAQ, High Performance PXI, DAQ, Value PXI Oscilloscopes PXI Digital Multimeters Industrial Instrumentation Download Digital Multimeters (DMM's) Download DMM, PXI Oscilloscopes & Digitizers Download Oscilloscopes, USB Oscilloscopes, PXI Oscilloscopes, Desktop PCI Oscilloscope Accessories Digitizer, PXI, High Performance Digitizer, PXI, Simultaneous DAQ, PXI, Simultaneous Simultaneous PXI DAQ modules capture multiple signals at once, ensuring synchronized data acquisition across all channels. They are ideal for applications that require time-sensitive measurements.

NI source measure units are high-precision, high-accuracy DC instruments that can both source and simultaneously measure voltage and current. NI Source Measure Units and LCR Meters NI Authorized Distributor and System Integration Partner Home > Products > Source Measure Units and LCR Meters Source Measure Units and LCR Meters Source Measure Units are high-precision, high-accuracy DC instruments that can both source and simultaneously measure voltage and current. Additionally, LCR Meters can measure the inductance, capacitance, and resistance (LCR) of electronic equipment. PLATFORM MODULES Platform modules integrate with modular hardware platforms that allow you to combine different types of modules in a custom system that leverages shared platform features. NI offers three hardware platforms—CompactDAQ , CompactRIO , and PXI —though all platforms may not be represented in this category. PXI LCR Meter Bundle The PXI LCR Meter Bundle includes a chassis with a PXI LCR Meter to help you test electronic equipment. PXI LCR Meter PXI Source Measure Unit Provides precise voltage or current sourcing and measurement capabilities for PXI systems. Feature Highlights: Platform: PXI Bus: PXI, PXI Express PXI SMU Bundle The PXI SMU Bundle includes a chassis with a PXI Source Measure Unit (SMU) with up to 40 W of DC power. Provides functionality to help you measure and test the inductance, capacitance, and resistance (LCR) of electronic equipment. Feature Highlights: Platform: PXI Bus: PXI Express

Functional testing involves applying operational power to a PCBA to ensure it performs its designated functions. This type requires custom-built test equipment. PCBACheck™ Printed Circuit Board Assembly Tester Industrial Reference Design Our AUTOMATED PCBA TEST Equipment Reference Design is 90% Standardized and 10% Custom. Home > Services > Automated Test Systems > PCBACheck PCBA Functional Test Solution Businesses depend on Cyth Systems' expertise in functional test fixtures. Functional testing involves applying full operational power to a printed circuit board (PCBA) to ensure it performs its designated functions. This type of test often requires custom-built test equipment and fixtures. Cyth Systems provides support for all types of functional test strategies. Starter PXI Instruments Customize PXI Devices as Needed Pre-Designed Bed-of-Nails Customize Probes Locations Pre-Designed Interposer Board Customize Probes & Other Circuitry Software Environment Customize Sequences & Measurement Instruments Drivers Customize Measurements Top Our Solution. Bed-of-Nails Functional Tester Preconfigured Database Preconfigured PXI System Budget & Schedule Preconfigured Test Cart Preconfigured Reports Automate complex tasks faster Speak to Engineer Perform complex and rapid tasks and measurements that are impossible for human manual tests. Test multiple boards simultaneously, even share time-expensive equipment. Conduct Stress or Life Testing of boards by repeating tests hundreds or thousands of times. Bed-of-Nails Functional Tester Bed of Nails Functional Tester Predesigned fixture ready for custom modifications for any board: Customize width & depth Customize Pin Placement Customize front and rear panel Customize Interposer Board Speak to Engineer Preconfigured PXI System Preconfigured PXI System Standard PXI Modules suits 90% of applications needs as-is: Power Supply Oscilloscope Digital Multimeter Configurable Switch Matrix Add additional modules, signals, and inputs as needed to expand your application. Speak to Engineer Preconfigured Test Cart Preconfigured Test Cart Standardized Test Cart serves most applications as-is without modification! Internal Rack Mounting Customizable worksurface Bar Code Scanner or Badge Reader Power Systems included Customization not required, but... Fully customizable if necessary Speak to Engineer Preconfigured Database Preconfigured Database Standardized database Schema serves 90% of most applications as-is without modification: Speak to Engineer Store any test results, pass fail results Store images, waveforms, raw data Customization not required, but... Fully customizable if necessary Preconfigured Reports Preconfigured Reports Preconfigured Reports suits most applications as-is with CUSTOMIZATION INCLUDED Most common report fields already setup Fully customizable graphics and layout Fully customize graphs, tables, images Export to PDF already included Premade Excel or Word Templates you can customize and modify Speak to Engineer Budget & Schedule Budget & Schedule Preconfigured Budget for all included features: Most projects within 10% of standard budget and schedule Automatically adjusts for project size and features Budget INCLUDES customizations Speak to Engineer We know the ins and outs of PCB's Power supply voltage levels (VCC, VDD, etc.). Clock signals (system clock, peripheral clocks). Analog input signals (e.g., sensor inputs). Digital control signals (e.g., reset, enable signals). Serial communication inputs (UART, SPI, I2C). External trigger inputs. User interface inputs (buttons, switches). PWM (Pulse Width Modulation) signals. Temperature sensor inputs. Voltage reference inputs. Digital output signals (data lines, control lines). Analog input signals (ADC inputs). Analog output signals (DAC outputs). LED indicators. Display outputs (LCD, OLED, LED display segments). Relay control outputs. Voltage regulator outputs. Power-on indicator outputs. Current sense inputs/outputs. Power-up sequence testing. Power-down sequence testing. Voltage tolerance testing. Clock frequency and accuracy testing. Data integrity testing (checksum, CRC). Communication protocol testing (UART, SPI, I2C). Uploading Firmware or other files. Overvoltage protection testing. Undervoltage lockout testing. Logic functionality testing (gate-level/functional logic). Memory read/write testing (RAM, Flash). Sensor calibration and accuracy testing. ADC/DAC functionality and accuracy testing. Motor control functionality testing. Audio output quality testing. Display content and pixel testing. Communication protocol testing. Button/switch functionality testing. Temperature sensor accuracy testing. All these I/O's and much more. Speak to Engineer Prototype Form Why Cyth? Cyth Systems has over two decades of providing the technology and expertise you need to be successful on Automation, Measurement, and Controls projects. Our engineers will work alongside your team to design the system to meet your specifications. We develop your solutions with reduced risk, cost, and schedule. Need PCBA testing help or advice? First Name Last Name Email How can we help? [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup] Let's talk PCBA Solutions Menu

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Project Case Study Multichannel Frequency Synthesizer ATE System Mar 30, 2025 de384137-45c6-4755-9d8d-4b89614191f9 de384137-45c6-4755-9d8d-4b89614191f9 Home > Case Studies > National Instrument automated test fixture featuring PXI hardware. The Challenge Design, develop, and deploy a flexible and precise automated test equipment (ATE) system for a 6-channel tunable and a 4-channel fixed-frequency synthesizer. The Solution Using the LabVIEW graphical system design environment with NI RF hardware to develop a flexible and high-speed ATE system that uses the latest technology and saves time and money. Technology NI PXIe-6537 module for 2-channel TTL pulse generator NI PXIe-5162 4-channel oscilloscope NI PXIe-2543 module PXI-2596 module NI PXIe-5652 signal generator to test path calibration NI PXIe-5450 signal generator for DUT reference frequency (75 MHz) PXI-5691 amplifier for splitter loss compensation USB-5680 power meter NI PXIe-5663 vector signal analyzer (external LO mode) with QuickSyn Multichannel Frequency Synthesizer ATE System Problem Background and Solution Our customer designs and manufactures high-performance RF signal sources using frequency synthesis techniques for generating an output frequency, which support a wide range of commercial and industrial RF applications. The customer’s device under test (DUT) superficial testing includes 10 measurements at three frequencies (the start, middle, and end frequency of the synthesizer’s tunable bandwidth). This requires 5–8 hours of time from a professional engineer. The DUT also supports pulse modulation through two input TTL channels. Individual test design, manual assembly, system calibration, and reporting are the most time-consuming procedures for DUT engineers. Our company has developed a 12-channel frequency synthesizer ATE system with testing capabilities from 10 MHz to 6.6 GHz. List of measurements includes: Output signal frequency range Maximum frequency deviation from nominal value Output power Frequency setting time Amplitude modulation depth Amplitude-frequency response (flatness) in tunable bandwidth Delay instability of an output RF pulse versus input synchronization pulse Rising\falling edge delays of an RF pulse versus input IF pulse rising\falling edges Radio pulse rise and fall time RF pulse amplitude flatness Radio pulse amplitude instabilities generated in .5 s phase noise, offsets from the carrier 1 kHz, 5 MHz Output signal amplitude noise Spurious emissions, harmonics, and subharmonic The customer’s synthesizer phase noise was sufficiently low at 120 dB c\Hz in 800 MHz. With our current configuration, users can achieve residual FM specifications, low nonharmonic, and excellent SSB phase noise up to -135 db c\Hz (800 MHz, 10 kHz offset). Conclusion It took our team 4.5 months to organize the project, design the ATE system architecture, develop, program, and install the system at the customer site. Using our ATE system, the customer can decrease the testing time by up to 30X and measure 25 parameters for 10-channel and 400 frequency steps (10 MHz to 6.6 GHz). Original Authors: Davit Zargaryan, 10X Engineering LLC Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

This guide explains the basics of load measurements and how different sensor specifications influence load cell performance in your application. < Back Measuring Load Key Sensor Fundamental Guide | Cyth Systems Sensor Fundamentals Previous Next

At Cyth Systems we empower Life Science innovators to rapidly design, prototype, and test advanced systems, bringing life-saving technologies to market faster. Product Engineering & Test Solutions for Life Sciences Explore Our Life Sciences Portfolio As an experienced machine builder and test equipment provider, we help Life Science innovators design systems, develop prototypes and software, and test products so that they can deliver their life-saving technologies sooner. Scientific & Medical Instrumentation Evolve your ideas to lab-ready products. Whether you're developing next-generation diagnostic platforms, analytical instruments, or specialized research equipment, our solutions expedite time-to-productization while meeting demanding technical and regulatory requirements. Learn More Bioprocess & Therapeutics Optimize bioprocess IP and equipment development with a ready-to-use, customizable platform capable of supporting your entire development cycle, from upstream process design to downstream recipe refinement. Learn More Manufacturing Automation & Test Maximize production efficiency, product quality, while minimizing cost of ownership. From automation tooling to test fixtures, we help you scale operations while maintaining the precision required in regulated enviroments. Learn More Solutions for Life Sciences Bioprocess Reference Design Explore our ready-to-use, customizable platform for developing lab and industrial bioprocess applications, built for sensor integration, control automation, and data capture. Learn More Battery Test & Simulation BatteryFlex is a platform for evaluation and characterization of a wide range of battery cells and modules for applications where quality and regulatory compliance are non-negotiable. Learn More PCBA Functional Test Platform Our automated PCBA functional test platform provides instrumentation, fixturing, and software that can be customized to your test requirements. Learn More Related Case Studies Bioprocess Biotech startup accelerates funding with scalable reference design for control and automation. Learn More Microfluidics Biopharmaceutical machine builder exceeds production yield and quality metrics using Cyth and NI platform technology. Learn More Interested in designing with us? Enter to win a free consultation and proof of concept build First Name Last Name Email How can we help you? [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-landingpage] [attributer-channeldrilldown3] [attributer-landingpagegroup] Get Started Join the NI Technology Accelerator Program (NI TAP) Accelerate your innovation journey with the NI Technology Accelerator Program (NI TAP). NI TAP offers access to discounted hardware and software, and expert support to help you bring your products to market faster. Apply

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Project Case Study Developing a Quantum Waveform Synthesizer with LabVIEW and CompactRIO Aug 28, 2023 a4f54a64-429d-426d-890a-7f36e1a6693e a4f54a64-429d-426d-890a-7f36e1a6693e Home > Case Studies > *As Featured on NI.com Original Authors: Johnathon Williams, National Physical Laboratory Edited by Cyth Systems Digital multi-meter readout The Challenge Developing a high-precision quantum waveform synthesizer to use in the characterization of analog-to-digital converters (ADCs) that is reliable and maintains high accuracy during repetitive testing through direct traceability to the Josephson quantum voltage. The Solution Using NI LabVIEW software and NI CompactRIO hardware to develop a low-jitter system for high-frequency data transfer and control of the bespoke synthesizer hardware. LabVIEW simplified the production of a fully integrated system, serial peripheral interface (SPI) communications, and an intuitive user interface, which enabled operators to configure the synthesizing process and required reference voltages. National Physical laboratory The National Physical Laboratory (NPL) is the United Kingdom’s national measurement institute. NPL is a world-leading center of excellence in developing and applying the most accurate measurement standards, science, and technology available. For more than a century, NPL has developed and maintained the nation’s primary measurement standards. These standards underpin an infrastructure of traceability throughout the UK and the world that ensures the accuracy and consistency of measurement. Based in southwest London and employing more than 500 scientists, the NPL facility is internationally regarded as one of the most extensive and sophisticated measurement science facilities. CompactRIO and the Serial Optical Interface Board Figure 3. CompactRIO and the Serial Optical Interface Board Electrical Standards For more than 20 years, the electrical standards of voltage, current, and resistance have been based on highly reproducible quantum effects. For example, the Josephson effect relates voltage to frequency and is now used in measurement laboratories worldwide to provide the highest accuracy voltage measurements currently possible. NPL has achieved its level of quality research by designing bespoke hardware and software that interfaces with delicate quantum devices. These prototype systems form the basis of future measurement infrastructure at NPL and are regularly used by other laboratories. However, to carry out our research in a timely and competitive manner, we need to develop solutions using as many commercially available tools and systems as possible, and we need to ensure these systems can be easily maintained and supported into the future. Quantum Waveform Synthesizer Our application is a waveform synthesizer with direct traceability to the Josephson quantum voltage reference. Digital electrical measurement is now the method of choice in the instrumentation sector since signal processing is much easier to realize in digital circuits than in analog filters. The performance of the ADCs is crucial to the success of digital instruments, and our synthesizer is designed to generate waveforms with high spectral purity and a high level of amplitude stability. These reference waveforms are used to characterize ADCs represented by the device under test (DUT) in Figure 2. Schematic Diagram of the Synthesizer Design Figure 2. Schematic Diagram of the Synthesizer Design The synthesizer is based on a digital-to-analog converter (DAC) with 20-bit resolution and linearity. The output of the DAC is passed through an anti-imaging, multipole lowpass filter. The output of the filter is compared with the Josephson quantum voltage reference by measuring a voltage difference using an amplifier with a gain of 100 and an 18-bit ADC. A waveform is typically sampled 100 times per period to generate a 1 kHz reference sine wave (Figure 3). For ADC characterization, a sampling frequency of 100 kHz is required on the ADC. The DAC is similarly updated at 100 kHz. An oscilloscope trace of two ADC samples. Figure 3. Oscilloscope Trace Showing the Voltage Difference Waveform with a Zoom-In on Two ADC Sample. Background Information on Our Chosen Technical Solution Our first synthesizer design used an FPGA along with a microprocessor to load data into the DAC and to read data from the ADC. This system delivered a sampling frequency of 5 kHz, which was determined by the speed of the microprocessor. This limited the synthesizer to applications at power line frequencies. An upgrade of this approach to a higher sampling frequency would have needed a complete redesign of the FPGA code. Therefore, we required the following levels of functionality from our system: A logic system based on an FPGA for fast data transfer to the DAC and from the ADC together with low-timing jitter. A real-time OS for the control loop, which stabilizes the synthesizer output against the Josephson reference. An Ethernet connection to a PC running LabVIEW for the user interface and data storage. This was comfortably achieved using CompactRIO-embedded hardware. Aside from providing the graphical user interface and data logging, LabVIEW simplified the sharing of data between the three architectural layers described above. That, along with the short development times, meant that LabVIEW was a real advantage to us. Our Experience with CompactRIO Our application required a high level of electrical isolation, so we chose to use optical fiber connections (Figure 3) between the CompactRIO hardware and the synthesizer. Each sample of the waveform consisted of three 8-bit data packets, enabling a data rate across this serial link of 2.4 MHz for a sampling frequency of 100 kHz. Two NI 9402 high-speed digital I/O modules were used to provide the digital I/O for the CompactRIO hardware. Three lines were used to implement the SPI interface to the DAC and the ADC. The built-in FPGA on the CompactRIO system continuously updated the DAC with data from memory and read data from the ADC to memory over the serial links. In addition, a timing signal was generated to synchronize the Josephson quantum voltage reference so that it was phase-locked to the synthesizer. The CompactRIO real-time processor transferred data to and from the memory and analyzed the ADC readings, which represented the difference between the synthesized voltage and the quantum reference. An algorithm on the real-time processor calculated corrections to the DAC values to adjust the synthesized voltage and stabilize it against the reference voltage. The real-time processor also averaged the data from the ADC before transferring it to the PC over Ethernet at a lower data rate. Software written in LabVIEW on the host PC provided the user interface for the whole measurement system including the configuration of the Josephson quantum voltage reference; choice of the amplitude, frequency, and number of samples in the synthesized waveform; and presentation of the data from the ADC. Original Authors: Johnathon Williams, National Physical Laboratory Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

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Events ||NI Test Forum: DC| NI Test Forum: DC NI Test Forum: DC July 30, 2025 Washington DC Join us at the NI Test Forum as we explore the future of test and measurement in an increasingly complex engineering landscape. As demands for faster, smarter, and more flexible testing grow, this forum offers a deep dive into NI’s latest hardware and software innovations designed to streamline validation workflows, reduce development time, and boost data reliability across a range of industries. Throughout the day, you'll have the chance to connect with industry experts, get hands-on with NI platforms like PXI, CompactDAQ, and mioDAQ, and see real-world demos of cutting-edge test systems in action. Topics include test automation, real-time data acquisition, and scalable solutions for Aerospace & Defense, Energy, and Semiconductor & Electronics applications—covering everything from RF testing for radar and SatCom to high-throughput semiconductor validation. Cyth Systems will be there! Ask us how our team helps accelerate automated test projects using NI tools, and we’d love to chat about how we can support your engineering goals. Register here: https://events.ni.com/profile/web/index.cfm?PKwebID=0x150576abcd&source=cyth

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Home Source Measure Unit Data Acquisition Products Download DAQ, Industrial PXI Download DAQ, PXI, Simultaneous DAQ, PXI, High Performance DAQ, PXI, Value DAQ, Desktop PCI DAQ, USB Download DAQ, USB, Multifunction DAQ, USB, High Speed DAQ, USB, mioDAQ Compact DAQ (cDAQ) Family Download Compact DAQ (cDAQ) Chassis Compact DAQ (cDAQ) Modules Real-Time & Embedded Download CompactRIO (cRIO) Family CompactRIO (cRIO) Chassis CompactRIO (cRIO) Modules Download Single-Board RIO Download sbRIO Main Boards sbRIO Mezzanine Boards sbRIO Accessories PXI Platform Download PXI Chassis PXI Controllers PXI Modules Download PXI Data Acquisition Download PXI, DAQ, Simultaneous PXI, DAQ, High Performance PXI, DAQ, Value PXI Oscilloscopes PXI Digital Multimeters Industrial Instrumentation Download Digital Multimeters (DMM's) Download DMM, PXI Oscilloscopes & Digitizers Download Oscilloscopes, USB Oscilloscopes, PXI Oscilloscopes, Desktop PCI Oscilloscope Accessories Digitizer, PXI, High Performance Digitizer, PXI, Simultaneous Source Measure Unit Source-measure units (SMUs) combine precise voltage and current sourcing with measurement capabilities, ideal for characterizing semiconductors and other components.

Functional testing involves applying operational power to a PCBA to ensure it performs its designated functions. This type requires custom-built test equipment. PCBACheck™ PCB Functional Testing Industrial Reference Design Our AUTOMATED PCBA TEST Equipment Reference Design is 90% Standardized and 10% Custom. Home > Services > Automated Test Systems > PCBACheck PCBA Functional Test Solution Businesses depend on Cyth Systems' expertise in functional test fixtures. Functional testing involves applying full operational power to a printed circuit board (PCBA) to ensure it performs its designated functions. This type of test often requires custom-built test equipment and fixtures. Cyth Systems provides support for all types of functional test strategies. Starter PXI Instruments Customize PXI Devices as Needed Pre-Designed Bed-of-Nails Customize Probes Locations Pre-Designed Interposer Board Customize Probes & Other Circuitry Software Environment Customize Sequences & Measurement Instruments Drivers Customize Measurements Top PCB Functional Testing Solution. Bed-of-Nails Functional Tester Preconfigured Database Preconfigured PXI System Budget & Schedule Preconfigured Test Cart Preconfigured Reports Automate complex tasks faster Speak to Engineer Perform complex and rapid tasks and measurements that are impossible for human manual tests. Test multiple boards simultaneously, even share time-expensive equipment. Conduct Stress or Life Testing of boards by repeating tests hundreds or thousands of times. Bed-of-Nails Functional Tester Bed of Nails Functional Tester Predesigned fixture ready for custom modifications for any board: Customize width & depth Customize Pin Placement Customize front and rear panel Customize Interposer Board Speak to Engineer Preconfigured PXI System Preconfigured PXI System Standard PXI Modules suits 90% of applications needs as-is: Power Supply Oscilloscope Digital Multimeter Configurable Switch Matrix Add additional modules, signals, and inputs as needed to expand your application. Speak to Engineer Preconfigured Test Cart Preconfigured Test Cart Standardized Test Cart serves most applications as-is without modification! Internal Rack Mounting Customizable worksurface Bar Code Scanner or Badge Reader Power Systems included Customization not required, but... fully customizable if necessary Speak to Engineer Preconfigured Database Preconfigured Database Standardized database Schema serves 90% of most applications as-is without modification: Speak to Engineer Store any test results, pass fail results Store images, waveforms, raw data Customization not required, but... Fully customizable if necessary Preconfigured Reports Preconfigured Reports Preconfigured Reports suits most applications as-is with CUSTOMIZATION INCLUDED Most common report fields already setup Fully customizable graphics and layout Fully customize graphs, tables, images Export to PDF already included Premade Excel or Word Templates you can customize and modify Speak to Engineer Budget & Schedule Budget & Schedule Preconfigured Budget for all included features: Most projects within 10% of standard budget and schedule Automatically adjusts for project size and features Budget INCLUDES customizations Speak to Engineer We know the ins and outs of PCB's Power supply voltage levels (VCC, VDD, etc.). Clock signals (system clock, peripheral clocks). Analog input signals (e.g., sensor inputs). Digital control signals (e.g., reset, enable signals). Serial communication inputs (UART, SPI, I2C). External trigger inputs. User interface inputs (buttons, switches). PWM (Pulse Width Modulation) signals. Temperature sensor inputs. Voltage reference inputs. Digital output signals (data lines, control lines). Analog input signals (ADC inputs). Analog output signals (DAC outputs). LED indicators. Display outputs (LCD, OLED, LED display segments). Relay control outputs. Voltage regulator outputs. Power-on indicator outputs. Current sense inputs/outputs. Power-up sequence testing. Power-down sequence testing. Voltage tolerance testing. Clock frequency and accuracy testing. Data integrity testing (checksum, CRC). Communication protocol testing (UART, SPI, I2C). Uploading Firmware or other files. Overvoltage protection testing. Undervoltage lockout testing. Logic functionality testing (gate-level/functional logic). Memory read/write testing (RAM, Flash). Sensor calibration and accuracy testing. ADC/DAC functionality and accuracy testing. Motor control functionality testing. Audio output quality testing. Display content and pixel testing. Communication protocol testing. Button/switch functionality testing. Temperature sensor accuracy testing. All these I/O's and much more. Speak to Engineer Prototype Form Why Cyth? Cyth Systems has over two decades of providing the technology and expertise you need to be successful on Automation, Measurement, and Controls projects. Our engineers will work alongside your team to design the system to meet your specifications. We develop your solutions with reduced risk, cost, and schedule. Need PCBA testing help or advice? First Name Last Name Email How can we help? [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup] Let's talk PCBA Solutions Menu

Project Case Study New End-of-Line Test Bench for Hybrid Inverters Using NI Hardware Mar 27, 2024 6c7b5559-c6d1-4cda-8f4a-fab96afca9ad 6c7b5559-c6d1-4cda-8f4a-fab96afca9ad Home > Case Studies > Be*As Featured on NI.com Original Authors: Alessandro Andreoli, Loccioni Edited by Cyth Systems End-of-Line Test Bench The Challenge Creating a test bench for the end-of-line test of Magneti Marelli inverters for the new LaFerrari car hybrid application. The Solution Using the NI platform, including NI PXI hardware, NI LabVIEW system design software, and NI TestStand test management software, to standardize testing the inverter unit. Development History Magneti Marelli required developed a new automotive hybrid inverter to be installed in the new LaFerrari car. They approached us regarding an automated testing solution. The test fixture needed to test inverter functionality and stand-alone subcomponents of the inverter. We started an R&D project in collaboration with Magneti Marelli and the University of Naples Federico II to define the test specifications for the new inverter. One University of Naples engineering student worked on the project for six months and used it as a starting point for his final thesis. The biggest task in this phase was to identify how to manage and test electric components that work with high voltages (600 V) and high current levels (800 A). Left: Communication Connection, Right: Inverter Connection End-of-Line Test Bench for a Hybrid Inverter To completely test the inverter, we worked with Magneti Marelli to divide the test into the following main parts: Unit under test (UUT) communications test—The bench powers the inverter CPU and verifies that the correct communication is occurring with the UUT. In this phase, some preliminary tests are performed, too. Communication with the UUT is facilitated using the controller area network (CAN) bus. Inverter functional test—We connect the inverter to a high-voltage battery simulation (450 V) to analyze the output on the U, V, and W components. We connect the U, V, and W outputs of the inverter to an inductive load that simulates the motor connected to the UUT in normal conditions. This test also confirms that the UUT internal current measuring devices work as expected under different conditions. Overvoltage inverter functional test—We increase the UUT’s high-voltage (HV) battery input to verify that at 475 V, the UUT generates a fault. Undervoltage inverter functional test—We decrease the HV battery input of the UUT to verify that at 230 V, the UUT generates a fault. DC/DC functional test—We verify that the UUT can convert the DC voltage as required. We connect the inverter HV input to 450 V and we check that the DC output voltage levels are within the specified limits. In this test, we also verify the buck-boost converter functions. Overvoltage DC/DC test—We increase the HV input of the UUT to verify that at 475 V, the UUT generates a fault. Undervoltage DC/DC functional test—We decrease the HV input of the UUT to verify that at 230 V, the UUT generates a fault. Test Bench System Configuration and AutoCAD Rendering For the main PC, we equipped a standard industrial PC with an MXI bus extension that helps the user remotely control a PXI chassis and installed the following items: NI PXI-2567 64-channel External Relay Driver Modules NI PXI-6704 Analog Output Modules NI PXI-6143 Simultaneous Sampling Multifunction DAQ module CAN Interface Communication Protocol NI PXI-GPIB GPIB controller NI PXI-8430 8-port serial interface NI PXI-7841R Multifunction RIO module Test Station We mounted the UUT on a specific pallet that helps the user mechanically adapt the bench to the different kinds of inverters produced. The pallets powered the transportation of the UUT between the end-of-line bench and the other test stations in the customer production line. Software Configuration We developed all the software internally to manage the bench described above and have better coding and more reliable software. Our software department divided the software into different modules. The main modules we developed were the automation module and the test module. To develop the inverter machine software, we started with a previous version of a Loccioni software solution that was used to test the electronic control units (ECUs) and infotainment products. The automation module automated the management of the bench. This software comprised a user interface and a software PLC that managed all the activities of the bench. Submodules that managed different tasks such as user identification, alarm management, and utilities composed the software PLC. We used LabVIEW to write all the modules. The test module created and executed the different steps necessary for a complete test sequence. To give the customer the most flexibility to create different sequences, our software department used NI TestStand as the test sequencer. We customized the NI TestStand environment by adding a step that allowed for the control of specific instruments. Each instrument had its own steps that were not connected with the others, which helped us to achieve better code reliability and maintainability and to preserve the concept of modularity in the development of the custom step type. We also developed some high-level steps that contained more single commands to optimize the test cycle time. We used TCP/IP sockets for the internal communication between the automation module and the test module because it was easy to maintain a separation between the different software modules. Using NI TestStand as the test sequencer helped us easily expand the software for additional test stations. Original Authors: Alessandro Andreoli, Loccioni Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Home Counters / Timers / Clock Gen. Data Acquisition Products Download DAQ, Industrial PXI Download DAQ, PXI, Simultaneous DAQ, PXI, High Performance DAQ, PXI, Value DAQ, Desktop PCI DAQ, USB Download DAQ, USB, Multifunction DAQ, USB, High Speed DAQ, USB, mioDAQ Compact DAQ (cDAQ) Family Download Compact DAQ (cDAQ) Chassis Compact DAQ (cDAQ) Modules Real-Time & Embedded Download CompactRIO (cRIO) Family CompactRIO (cRIO) Chassis CompactRIO (cRIO) Modules Download Single-Board RIO Download sbRIO Main Boards sbRIO Mezzanine Boards sbRIO Accessories PXI Platform Download PXI Chassis PXI Controllers PXI Modules Download PXI Data Acquisition Download PXI, DAQ, Simultaneous PXI, DAQ, High Performance PXI, DAQ, Value PXI Oscilloscopes PXI Digital Multimeters Industrial Instrumentation Download Digital Multimeters (DMM's) Download DMM, PXI Oscilloscopes & Digitizers Download Oscilloscopes, USB Oscilloscopes, PXI Oscilloscopes, Desktop PCI Oscilloscope Accessories Digitizer, PXI, High Performance Digitizer, PXI, Simultaneous Counters / Timers / Clock Gen. Counters, timers, and clock generation modules offer precise timing and control for digital signals, essential for synchronizing and managing complex systems.

CompactRIO systems provide processing capabilities, sensor-specific I/O, & software for Industrial Internet of Things (IIoT), monitoring, & control applications CompactRIO NI Authorized Distributor and System Integration Partner Home > Products > CompactRIO What is CompactRIO? CompactRIO systems provide high-performance processing capabilities, sensor-specific conditioned I/O, and a closely integrated software toolchain that make them ideal for Industrial Internet of Things, monitoring, and control applications. The real-time processor offers reliable, predictable behavior, while the FPGA excels at smaller tasks that require high-speed logic and precise timing. Why Choose CompactRIO? CompactRIO hardware provides an industrial control and monitoring solution using sensor- or protocol-specific, conditioned I/O modules with real-time capabilities. Best for Real-time processing needs Industrial monitoring and control applications Deployed & Rugged Environments CompactRIO Chassis The CompactRIO chassis is the center of the integrated system architecture. It is directly connected to the I/O for high-performance access to the I/O circuitry of each module and timing, triggering, and synchronization. Because each module is connected directly to the FPGA rather than through a bus, you experience almost no control latency for system response compared to other controller architectures. Shop cRIO Chassis CompactRIO Modules I/O modules contain isolation, conversion circuitry, signal conditioning, and built-in connectivity for direct connection to industrial sensors/actuators. By offering a variety of wiring options and integrating the connector junction box into the modules, the CompactRIO system significantly reduces space requirements and field-wiring costs. You can choose from more than 70 NI C Series I/O modules for CompactRIO to connect to almost any sensor or actuator. Shop cRIO cModules Programming CompactRIO with LabVIEW Overcome traditional architecture programming challenges with LabVIEW for writing powerful Real-Time applications and LabVIEW FPGA for writing and compiling FPGA Code. With this combination, you can develop your system faster by programming both the processor and FPGA with a single, intuitive software toolchain. Focus on solving problems, not low-level programming tasks, with integrated user-friendly software that reduces risk, enhances productivity, and eliminates the need to create and maintain I/O drivers, OS configuration, and other middleware. Available CompactRIO models How CompactRIO Compares to a PLC Introduction In the world of industrial automation and control systems, the choice between different hardware platforms can be a critical...

Home Real-Time & Embedded Data Acquisition Products Download DAQ, Industrial PXI Download DAQ, PXI, Simultaneous DAQ, PXI, High Performance DAQ, PXI, Value DAQ, Desktop PCI DAQ, USB Download DAQ, USB, Multifunction DAQ, USB, High Speed DAQ, USB, mioDAQ Compact DAQ (cDAQ) Family Download Compact DAQ (cDAQ) Chassis Compact DAQ (cDAQ) Modules Real-Time & Embedded Download CompactRIO (cRIO) Family CompactRIO (cRIO) Chassis CompactRIO (cRIO) Modules Download Single-Board RIO Download sbRIO Main Boards sbRIO Mezzanine Boards sbRIO Accessories PXI Platform Download PXI Chassis PXI Controllers PXI Modules Download PXI Data Acquisition Download PXI, DAQ, Simultaneous PXI, DAQ, High Performance PXI, DAQ, Value PXI Oscilloscopes PXI Digital Multimeters Industrial Instrumentation Download Digital Multimeters (DMM's) Download DMM, PXI Oscilloscopes & Digitizers Download Oscilloscopes, USB Oscilloscopes, PXI Oscilloscopes, Desktop PCI Oscilloscope Accessories Digitizer, PXI, High Performance Digitizer, PXI, Simultaneous Real-Time & Embedded Real-time and embedded control systems enable engineers to develop responsive and deterministic systems for critical applications. This category includes CompactRIO and Single-Board RIO systems, built for rugged environments. CompactRIO (cRIO) Family CompactRIO (cRIO) systems provide real-time, embedded control and monitoring, offering rugged design and modular I/O options, ideal for industrial automation and complex embedded systems. Single-Board RIO Single-Board RIO (sbRIO) systems provide an all-in-one embedded solution for control and monitoring, with a flexible architecture ideal for OEM applications.

Functional testing involves applying operational power to a PCBA to ensure it performs its designated functions. This type requires custom-built test equipment. PCBACheck™ Printed Circuit Board Test Equipment Industrial Reference Design Our AUTOMATED PCBA TEST Equipment Reference Design is 90% Standardized and 10% Custom. Home > Services > Automated Test Systems > PCBACheck PCBA Functional Test Solution Businesses depend on Cyth Systems' expertise in functional test fixtures. Functional testing involves applying full operational power to a printed circuit board (PCBA) to ensure it performs its designated functions. This type of test often requires custom-built test equipment and fixtures. Cyth Systems provides support for all types of functional test strategies. Starter PXI Instruments Customize PXI Devices as Needed Pre-Designed Bed-of-Nails Customize Probes Locations Pre-Designed Interposer Board Customize Probes & Other Circuitry Software Environment Customize Sequences & Measurement Instruments Drivers Customize Measurements Top PCB Test Equipment Solution. Bed-of-Nails Functional Tester Preconfigured Database Preconfigured PXI System Budget & Schedule Preconfigured Test Cart Preconfigured Reports Automate complex tasks faster Speak to Engineer Perform complex and rapid tasks and measurements that are impossible for human manual tests. Test multiple boards simultaneously, even share time-expensive equipment. Conduct Stress or Life Testing of boards by repeating tests hundreds or thousands of times. Bed-of-Nails Functional Tester PCBA Bed of Nails Functional Tester Predesigned fixture ready for custom modifications for any board: Customize width & depth Customize Pin Placement Customize front and rear panel Customize Interposer Board Speak to Engineer Preconfigured PXI System Preconfigured PXI System Standard PXI Modules suits 90% of applications needs as-is: Power Supply Oscilloscope Digital Multimeter Configurable Switch Matrix Add additional modules, signals, and inputs as needed to expand your application. Speak to Engineer Preconfigured Test Cart Preconfigured Test Cart Standardized Test Cart serves most applications as-is without modification! Internal Rack Mounting Customizable worksurface Bar Code Scanner or Badge Reader Power Systems included Customization not required, but... fully customizable if necessary Speak to Engineer Preconfigured Database Preconfigured Database Standardized database Schema serves 90% of most applications as-is without modification: Speak to Engineer Store any test results, pass fail results Store images, waveforms, raw data Customization not required, but... Fully customizable if necessary Preconfigured Reports Preconfigured Reports Preconfigured Reports suits most applications as-is with CUSTOMIZATION INCLUDED Most common report fields already setup Fully customizable graphics and layout Fully customize graphs, tables, images Export to PDF already included Premade Excel or Word Templates you can customize and modify Speak to Engineer Budget & Schedule Budget & Schedule Preconfigured Budget for all included features: Most projects within 10% of standard budget and schedule Automatically adjusts for project size and features Budget INCLUDES customizations Speak to Engineer We know the ins and outs of PCB's Power supply voltage levels (VCC, VDD, etc.). Clock signals (system clock, peripheral clocks). Analog input signals (e.g., sensor inputs). Digital control signals (e.g., reset, enable signals). Serial communication inputs (UART, SPI, I2C). External trigger inputs. User interface inputs (buttons, switches). PWM (Pulse Width Modulation) signals. Temperature sensor inputs. Voltage reference inputs. Digital output signals (data lines, control lines). Analog input signals (ADC inputs). Analog output signals (DAC outputs). LED indicators. Display outputs (LCD, OLED, LED display segments). Relay control outputs. Voltage regulator outputs. Power-on indicator outputs. Current sense inputs/outputs. Power-up sequence testing. Power-down sequence testing. Voltage tolerance testing. Clock frequency and accuracy testing. Data integrity testing (checksum, CRC). Communication protocol testing (UART, SPI, I2C). Uploading Firmware or other files. Overvoltage protection testing. Undervoltage lockout testing. Logic functionality testing (gate-level/functional logic). Memory read/write testing (RAM, Flash). Sensor calibration and accuracy testing. ADC/DAC functionality and accuracy testing. Motor control functionality testing. Audio output quality testing. Display content and pixel testing. Communication protocol testing. Button/switch functionality testing. Temperature sensor accuracy testing. All these I/O's and much more. Speak to Engineer Prototype Form Why Cyth? Cyth Systems has over two decades of providing the technology and expertise you need to be successful on Automation, Measurement, and Controls projects. Our engineers will work alongside your team to design the system to meet your specifications. We develop your solutions with reduced risk, cost, and schedule. Need PCBA testing help or advice? First Name Last Name Email How can we help? [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup] Let's talk PCBA Solutions Menu

PXI systems provide modular instruments and other I/O that feature specialized synchronization and key software features for test and measurement applications. PXI Platform NI Authorized Distributor and System Integration Partner Home > Product Categories > PXI Platform What is PXI? NI PXI systems provide high-performance modular instruments and other I/O modules that feature specialized synchronization and key software features for test and measurement applications from device validation to automated production test. NI is the PXI industry leader, with the broadest array of best-in-class products and services on the market. Shop PXI Systems Industry-Standard NI led the creation of the PXI standards body to create an open standard, so you can augment your NI system with specialty modules from up to 60 other vendors. High-Performance NI PXI hardware utilizes the latest technology, incorporating powerful multicore processors, FPGAs, and other technology to increase measurement range and performance. Scalable PXI’s architecture makes it possible to synchronize measurements across multiple modules or multiple chassis, so you can add to your systems as requirements change. Accurate PXI offers some of the highest frequency and accuracy specifications, so you can ensure your test systems deliver the production test results you need. PXI Chassis The chassis—the PXI system backbone—is comparable to a desktop PC’s mechanical enclosure and motherboard. It provides power, cooling, and a communication bus to the system, and supports multiple instrumentation modules within the same enclosure. PXI uses commercial PC-based PCI and PCI Express bus technology while combining rugged CompactPCI modular packaging, as well as key timing and synchronization features. Chassis range in size from four to 18 slots to fit the needs of any application, whether you require a portable, benchtop, rack-mount, or embedded system. Shop PXI Chassis PXI Controller PXI controllers are either integrated or remote. Integrated controllers contain everything you need to run your PXI system without an external PC, while remote controllers let you control your PXI system from desktops, laptops, or server computers. Shop PXI Controller PXI Modules NI offers more than 600 PXI modules that acquire data, trigger and synchronize devices, generate and route signals, and make a variety of measurements ranging from DC to mmWave. Also, the PXI portfolio includes modular instruments—such as oscilloscopes and digital multimeters—that can replace traditional box instruments and with which you can integrate PXI switches in a variety of topologies. Because PXI is an open industry standard, nearly 1,500 products are available from more than 70 different instrument vendors. Shop PXI Modules

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Project Case Study Railway Lab Test Benches Based on NI Hardware & LabVIEW Mar 27, 2024 d62ec4e2-5adb-4063-b03f-b43d4f328760 d62ec4e2-5adb-4063-b03f-b43d4f328760 Home > Case Studies > *As Featured on NI.com Original Authors: Eduardo Elizalde, CETEST S.L. Edited by Cyth Systems Railway Lab Test Benches The Challenge Developing acquisition and control solutions for a railway rolling stock integral laboratory. The Solution Using the NI LabVIEW Real-Time Module, the NI LabVIEW FPGA Module, and NI CompactRIO, NI Single-Board RIO, and NI PXI hardware to create a custom acquisition and control solution to meet our test requirements. CETEST S.L. is a fully accredited independent test laboratory that offers services for design verification and homologation of systems and components. We focus on the railway rolling stock (vehicles and components) field, for which our company is recognized for throughout Europe. Due to the variety of test scenarios required by the sector, we develop, both internally and in collaboration with other companies, specific testing systems with advanced mechatronics solutions. Among other activities, we conduct structural integrity, fatigue resistance, performance, and durability tests on laboratory components. Additionally, we measure noise, vibration, and perform field dynamic behavior tests. In recent years, our customers’ testing needs have increased along with the need for new test benches and new acquisition and control equipment. Due to the versatility of National Instruments products, we performed many of these updates using NI architectures. Left: Railway Axle Boxes Performance Test Bench, Center: Particular load Application Hydraulic System Control Screen, Test Bench 3D Rendering. Big Structure Test We have a specific test bench for the structural integrity test of big structures. This bench can test structures up to 35 m long with different load combinations, simulating both exceptional and service loads. A pneumatic line used for applying vertical loads (values up to 100 tons) is managed with an interface based on LabVIEW (see Figure 1). The rest of the load hypotheses (different height compressions or traction) are applied by hydraulic actuators, up to 400 tons. These tests monitor displacement and load readings of 20 actuators, as well as all signals coming from the hydraulic and pneumatic systems. With the aim of creating a versatile test bench, we defined different control loops. Therefore, the system can control actuators independently or combined, both in displacement and in load. Moreover, the user can manually control the test bench, if required. Integrity and Fatigue-Resistance Test To check the integrity and fatigue resistance of a structure, we use strain gages and displacement sensor measurements in different points of the structure, which requires a multichannel acquisition system. For this purpose, we customized two NI PXIe-8108 embedded controller acquisition systems by combining an NI PXIe-4330 simultaneous bridge input module with an NI PXI-6225 multifunction M Series module. When used independently, each system can contain up to 18 cards. Nevertheless, if more channels are needed, the user can implement communication between both systems. With the aim of adapting the system to test needs, we developed configuration, visualization, and acquisition software using the LabVIEW Real-Time and LabVIEW FPGA modules. High-Static or Quasistatic Load Testing The variety of tests under load conditions on other kinds of structures and components makes it impossible to establish a standard configuration. For cases with high-static or quasistatic loads, we have 700 bar hydraulic systems and actuators. We can control these both in load and displacement. To perform these applications, we programmed an NI cRIO-9076 real-time processor with an FPGA-based system to remotely control user-defined load sequences. Additionally, the system can measure, evaluate, and acquire signals from sensors. Testing Rolling Stock Rotating Elements To test specific rolling stock rotating elements (such as gearboxes and bearings), we developed acquisition and control systems based on NI products. Two examples include a test bench under variable rotation speed and torque for gearboxes in a four-square configuration and two functional performance tests for railway axle boxes. The aim of these test benches is to study different working order variables and temperatures, and grease and oil distribution. Gearbox Test Bench With Load Application In the gearbox test bench with load application, we can test gearboxes with up to 1 MW power by controlling a 350-kW engine. We can achieve speeds of up to 6,000 rpm and torque of up to 10 kN per m. Test bench control with the NI PXI-8102 embedded controller offers user-defined torque and speed cycles. Additionally, the system can measure, evaluate, and acquire signals coming from sensors (torque, speed, and temperature) and variator parameters. Railway Bearing Axleboxes With railway-bearing axle box test benches, we can create user-defined axial load and speed cycles. Additionally, the system can measure, evaluate, and acquire signals coming from sensors (load cells, speed, and temperature) and variatior parameters. In this case, the control of one of the test benches is based on an NI cRIO-9022 embedded real-time controller and the other on an NI PXI-8102 embedded controller. Rotational Resistance Static Characterization As a final example of our capacities, we own a test bench for rotational resistance static characterization of the bogie-car body joint. This resistance measurement is a key issue for contrasting theoretical models as well as for curve circulation security analysis. The control, based on an NI sbRIO-9631 embedded control and acquisition device, manages a 210-bar hydraulic system, sets alarms, and limits and generates waveforms for the relative rotation speed control. Moreover, the system can acquire displacement and torque sensor signals. Original Authors: Eduardo Elizalde, CETEST S.L. Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

The LabVIEW Core 3 Course introduces you to structured practices to help you design, implement, document, and test LabVIEW applications.  LabVIEW Core 3 Training Course Start Date | End Date Duration ENROLL < Back NI Course Overview The LabVIEW Core 3 Course introduces you to structured practices to help you design, implement, document, and test LabVIEW applications. This course focuses on developing hierarchical applications that are scalable, readable, and maintainable. The processes and techniques covered in this course help you reduce development time and improve your application stability. By incorporating these design practices early in your development, you can avoid unnecessary application redesign, increase VI reuse, and minimize maintenance costs. NI Course Objectives Leverage the LabVIEW Style Guidelines and choose an appropriate software development process to create an application Use LabVIEW Project Libraries and Project Explorer tools to organize your application Use frameworks and message handles to create a multiloop application Create and test a custom UI and ensure usability with sufficient user documentation Leverage modular code and develop test cases to maintain large applications NI Course Details Duration: Instructor-led Classroom: Three (3) days Instructor-led Virtual: Four (4) days, five-and-a-half-hour sessions On-Demand: 6.5 hours (exercises as a supplement) Audience: LabVIEW and Developer Suite users who need to increase performance, scalability, or reuse, and to reduce application maintenance costs LabVIEW users pursuing the Certified LabVIEW Developer certification LabVIEW users who have taken the LabVIEW Core 1 and Core 2 courses Prerequisites: LabVIEW Core 1 Course and LabVIEW Core 2 Course or equivalent experience NI Products Used: If you take the course On-Demand: LabVIEW 2022 Q3 If you take the course in an instructor-led format: LabVIEW 2022 Q3 Training Materials: Virtual instructor-led training includes digital course material that is delivered through the NI Learning Center NI virtual instructor-led training is delivered through Zoom, and Amazon AppStream/LogMein access is provided to participants to perform the exercises on virtual machines equipped with the latest software Cost in Credits: On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits Public virtual or classroom course: 30 Education Services Credits or 9 Training Credits Private virtual or classroom: 210 Education Services Credits or 60 Training Credits NI Course Outline LESSON OVERVIEW TOPICS Exploring LabVIEW Style Guidelines Configure the LabVIEW environment and follow LabVIEW style guidelines to develop an application. Configuring LabVIEW Environment Using LabVIEW Style Guidelines Designing and Developing Software Applications Identify an appropriate software development process for a given project and derive a high-level flowchart that can be used to guide subsequent design and development. Exploring Principles of SMoRES from LabVIEW Perspectives Software Development Process Overview Gathering Project Requirements Task Analysis Organizing LabVIEW Project Create LabVIEW project libraries and explore LabVIEW classes to organize the code. Using Libraries in LabVIEW Project Introduction to LabVIEW Classes Using Project Explorer Tools and Techniques Use Project Explorer tools and techniques to improve the organization of project files and resolve any file conflicts that occur. Using Project Explorer Tools Resolving Project Conflicts Creating Application Architecture Design applications leveraging multi-loop architecture techniques. Generating User Events Exploring LabVIEW Frameworks Exploring Framework Data Types Architecture Testing Selecting Software Framework Leverage frameworks and message handlers to design the LabVIEW application. Queued Message Handler Delacor Queued Message Handler Channeled Message Handler Using Notifiers Exploring Actor Framework Creating User Interface Design and develop a custom user interface that meets LabVIEW style guidelines. Exploring User Interface Style Guidelines Creating User Interface Prototypes Customizing User Interface Extending User Interface Ensuring Usability of User Interface Create sufficient user documentation, as well as initialize and test the user interface to ensure the usability of the application. Customizing Window Appearance Creating User Documentation User Interface Initialization User Interface Testing Designing Modular Applications Use modular code in a large application and explore guidelines for making large applications more maintainable. Designing Modular Code Exploring Coupling and Cohesion Code Module Testing Develop test cases that can identify the largest number of errors in an application. Code Module Testing Integration Testing Enroll

Genuine human support for your project or equipment. Talk with an engineering expert today. We reply weekdays from 9 AM to 5 PM PST: Or call +1-858-537-1960 Home > Company > Contact Us Genuine HUMAN support for your project or equipment. Explain your project requirements Evaluate feasibility Get project development assistance How can we help? — Submit any questions or feedback you have related to product orders or for product advice and support. We'll connect you with an Engineer to review needs and project scope, consult on equipment, hardware, technology and software. If you need development help, ask about our custom design and programming services. We reply weekdays from 9am-5pm PST — or contact us directly at +1-858-537-1960 or solutions@cyth.com . First Name Last Name Email Company Message Submit [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup]

Data Acquisition Products Download DAQ, Industrial PXI Download DAQ, PXI, Simultaneous DAQ, PXI, High Performance DAQ, PXI, Value DAQ, Desktop PCI DAQ, USB Download DAQ, USB, Multifunction DAQ, USB, High Speed Compact DAQ (cDAQ) Family Download Compact DAQ (cDAQ) Chassis Compact DAQ (cDAQ) Controller Real-Time & Embedded CompactRIO (cRIO) Family CompactRIO (cRIO) Chassis CompactRIO (cRIO) Modules Download Single-Board RIO Download sbRIO Main Boards sbRIO I/O Modules sbRIO Accessories Download PXI Platform Download PXI Chassis PXI Controllers PXI Modules Download PXI Data Aqcuisition Download PXI, DAQ, Simultaneous PXI, DAQ, High Performance PXI, DAQ, Value PXI Oscilloscopes PXI Digital Multimeters Industrial Instrumentation Download Digital Multimeters (DMM's) Download PXI Digital Multimeters Oscilloscopes & Digitizers Download Oscilloscopes, USB Oscilloscopes, PXI Oscilloscopes, Desktop PCI Oscilloscope Accessories Digitizer, PXI, High Performance Digitizer, PXI, Value Not yet used

News |National Instruments Discontinues Several Product Families for 2023 | Numerous obscure and older product families have announced Last-Time-Buy (LTB) | National Instruments Discontinues Several Product Families for 2023 National Instruments Discontinues Several Product Families for 2023 Numerous obscure and older product families have announced Last-Time-Buy (LTB) Mar 17, 2023 Cyth Operations NI is discontinuing several legacy product lines. We understand that this is a large change to the overall product portfolio. In order to ease the difficultly of this change we have provided a list of model numbers that are being discontinued along with a suggested model number as a replacement. Migrating existing applications to the new product may require some considerations to be made, including moving to a new platform such as PXI or CompactDAQ. Accessories that accompany the discontinued products have not been listed because many of the necessary accessories can be found in replacement product documentation. If you have any questions on migrating products, contact technical support at ni.com/support Product Lines Discontinued Camera/optics resell products FieldDAQ M Series MIO (NI 62xx) devices Powertrain Control products VirtualBench Product line optimization C Series Modules cRIO-9032/37 4/8-slot WiFi CompactRIO controller cDAQ-913x and NI-9157 cRIO MXIe chassis NI 9469 synchronization module NI 9852 2-port CAN module Selected low-volume general-purpose I/O modules (see table for details) Other DAQ (besides M Series MIO) PCI-6723 AO FlexRIO/R Series NI 5732/33/42 digitizer FAMs NI 5781 baseband transceiver FAM NI 6581/85/87 SE/LVDS digital FAM sPCI-7811R Virtex-II, PCIe-7821R/22R/58R Kintex-7, USB-7855R Kintex-7 R Series NI 7932 Kintex-7 standalone controller (7931/35 are NOT being EOL’d) PXI-7951/52/53/54, PXIe-7961/62/65/66 Virtex-5 FlexRIO baseboards Modular Instruments Arbs: PXI-5412/21/22 legacy arbs Oscilliscopes/Digitizers: PXIe-5185/86 high speed devices Timing & Sync: Astronics PXIe-3352 rubidium ref source with GPS, PXI-6650 reference module DSA: PXI/PCI-4461, PCI-4462, PXI-4465 Precision DC: PXI-4130 SMU, PXI-4022 guard and current amp- PXI Chassis and Controllers Chassis: PXIe-1085 with Hungary Country of Origin (Penang COO PXIe-1085s are NOT being EOL’d) Controllers: PXIe-8880 embedded, RMC-8354 rack mount, and PCIe-8362 MXI- RF TestPhase Matrix QuickSyn Synthesizer (all variants) Software Defined Radio USRP-2920/22/30/32/40/42/43/50/52/53 WBX-40/120, CBX-40/120, and SBX-40/120 UBX-160 low power (the more popular UBX-160 is NOT being EOL’d) 785151-01 ISC-1782 SMART CAMERA (NI LINUX REAL-TIME, 2MP, COLOR) N/A 785152-01 ISC-1783 SMART CAMERA (WIN10 IOT, 5MP, MONOCHROME) N/A 785153-01 ISC-1783 SMART CAMERA (NI LINUX REAL-TIME, 5MP, MONOCHROME) N/A 785154-01 ISC-1783 SMART CAMERA (WIN10 IOT, 5MP, COLOR) N/A 785155-01 ISC-1783 SMART CAMERA (NI LINUX REAL-TIME, 5MP, COLOR) N/A 785830-01 STARTER KIT FOR ISC-178X SMART CAMERAS N/A 785830-02 STARTER KIT FOR ISC-178X SMART CAMERAS N/A 785900-01 BASLER ACE, ACA1920-155UM, 1920 X 1200, 155 FPS, MONOCHROME N/A 785901-01 BASLER ACE, ACA1920-155UC, 1920 X 1200, 155 FPS, COLOR N/A 785902-01 BASLER ACE, ACA1920-40GM, 1920 X 1200, 40 FPS, MONOCHROME N/A 785903-01 BASLER ACE, ACA1920-40GC, 1920 X 1200, 40 FPS, COLOR N/A 785906-01 BASLER ACE, ACA2440-75UM, 2448X2048, 75 FPS, MONOCHROME N/A 785907-01 BASLER ACE, ACA2440-75UC, 2448X2048, 75 FPS, COLOR N/A 785908-01 BASLER ACE, ACA2040-120UM, 2048X1536, 120 FPS, MONOCHROME N/A 785909-01 BASLER ACE, ACA2040-120UC, 2048X1536, 120 FPS, COLOR N/A 785910-01 BASLER ACE, ACA2440-20GM, 2448X2048, 20 FPS, MONOCHROME N/A 785911-01 BASLER ACE, ACA2440-20GC, 2448X2048, 20 FPS, COLOR N/A 785914-01 BASLER ACE, ACA2040-35GM, 2048X1536, 35 FPS, MONOCHROME N/A 785915-01 BASLER ACE, ACA2040-35GC, 2048X1536, 35 FPS, COLOR N/A 787058-01 BASLER ACE, ACA720-290GC, GIGE, 0.3 MP, 290 FPS, COLOR N/A 787059-01 BASLER ACE, ACA1440-73GC, GIGE, 1.6 MP, 73 FPS, COLOR N/A 787060-01 BASLER ACE, ACA3088-16GC, GIGE, 6 MP, 16 FPS, COLOR N/A 787061-01 BASLER ACE, ACA4096-11GC, GIGE, 9 MP, 11 FPS, COLOR N/A 787062-01 BASLER ACE, ACA4024-8GC, GIGE, 12 MP, 8 FPS, COLOR N/A 787063-01 BASLER ACE, ACA720-290GM, GIGE, 0.3 MP, 290 FPS, MONOCHROME N/A 787064-01 BASLER ACE, ACA1440-73GM, GIGE, 1.6 MP, 73 FPS, MONOCHROME N/A 787065-01 BASLER ACE, ACA3088-16GM, GIGE, 6 MP, 16 FPS, MONOCHROME N/A 787066-01 BASLER ACE, ACA4096-11GM, GIGE, 9 MP, 11 FPS, MONOCHROME N/A 787067-01 BASLER ACE, ACA4024-8GM, GIGE, 12 MP, 8 FPS, MONOCHROME N/A 787068-01 BASLER ACE, ACA720-520UC, USB, 0.3 MP, 520 FPS, COLOR N/A

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NI switches facilitate signal routing between instruments and devices or units under test (DUTs and UUTs). NI Switches NI Authorized Distributor and System Integration Partner Home > Products > Switches Switches Switches facilitate signal routing between instruments and devices or units under test (DUTs and UUTs). Use these products to conduct general functional tests, semiconductor parametric tests, radar tests, high-power fault insertion, and more. PLATFORM MODULES Platform modules integrate with modular hardware platforms that allow you to combine different types of modules in a custom system that leverages shared platform features. NI offers three hardware platforms—CompactDAQ , CompactRIO , and PXI —though all platforms may not be represented in this category. PXI Matrix Switch Module Connect any input to any output to simplify wiring in automated test systems. Feature Highlights: Platform: PXI Bus: PXI, PXI Express PXI Multiplexer Switch Module Connect multiple inputs to a single output, or multiple outputs to a single input, to simplify wiring in automated test systems. Feature Highlights: Platform: PXI Bus: PXI, PXI Express PXI Relay Module Connect or disconnect individual relays to simplify wiring in automated test systems. Feature Highlights: Platform: PXI Bus: PXI, PXI Express PXI RF Matrix Switch Module Connect any input to any output to simplify wiring in automated test systems. Platform: PXI Bus: PXI, PXI Express PXI Transfer Switch Module Switches loads between two sources at frequencies up to 40 GHz. Feature Highlights: Platform: PXI Bus: PXI, PXI Express PXI Relay Driver Module Controls external relays using an internal power source or external power source. Feature Highlights: Platform: PXI Bus: PXI PXI RF Multiplexer Switch Module Connect multiple inputs to a single output, or multiple outputs to a single input, to simplify wiring in automated test systems. Feature Highlights: Platform: PXI Bus: PXI, PXI Express PXI RF Relay Module Routes RF or microwave signals or inserts and removes components in a signal path. Feature Highlights: Platform: PXI Bus: PXI, PXI Express PXI Signal Insertion Switch Module Simulates open, pin-to-pin, short-to-battery, and short-to-ground faults for hardware-in-the-loop (HIL) and electronic reliability testing. Feature Highlights: Platform: PXI Bus: PXI, PXI Express PXI Programmable Resistor Module Replicates the behavior of resistance‐based devices by controlling a series of relays that varies resistance across each I/O connector channel. Feature Highlights: Platform: PXI Bus: PXI, PXI Express PXI Carrier Module for SwitchBlock Holds up to six Matrix Modules for SwitchBlock that you can use to create large matrices with more than 8,000 crosspoints in a single PXI chassis. Feature Highlights: Platform: PXI Bus: PXI Matrix Module for SwitchBlock Connect any input to any output with a switching matrix to simplify wiring in automated test systems. Feature Highlights: Bus: Switchblock

In this course you will explore the fundamentals of data acquisition using sensors, NI data acquisition hardware, and LabVIEW. Data Acquisition Using NI-DAQmx and LabVIEW Training Course Start Date | End Date Duration ENROLL < Back NI Course Overview Data Acquisition Using NI-DAQmx and LabVIEW Data Acquisition Using NI-DAQmx and LabVIEW Course Overview In the Data Acquisition Using NI-DAQmx and LabVIEW Course, you will explore the fundamentals of data acquisition using sensors, NI data acquisition hardware, and LabVIEW. The first part of this class teaches the basics of hardware selection, including resolution and sample rate, and the foundation of sensor connectivity, including grounding and wiring configurations. The second part of this class focuses on using the NI-DAQmx driver to measure, generate, and synchronize data acquisition tasks. You will learn about programming finite and continuous acquisitions, as well as best practices in hardware/software timing, triggering, and logging. In this class, you will get hands-on experience configuring and programming NI data acquisition hardware using NI-DAQmx and LabVIEW. NI Course Objectives Develop integrated, high-performance data acquisition systems that produce accurate measurements Acquire data from sensors, such as thermocouples and strain gages, using NI data acquisition hardware Apply advanced understanding of LabVIEW and the NI-DAQmx API to create applications Eliminate measurement errors due to aliasing and incorrect signal grounding Initiate measurements using hardware and software triggering Acquire and generate single-point and buffered analog waveforms Acquire and generate digital signals Use signal conditioning to improve the quality of acquired signals Synchronize multiple data acquisition operations and devices NI Course Details Duration Instructor-led Classroom: Two (2) days Instructor-led Virtual: Three (3) days, five-and-a-half-hour sessions On-Demand: 4.5 hours (exercises as a supplement) Audience Developers using LabVIEW with NI data acquisition hardware to create data acquisition applications Users familiar with the DAQ Assistant or basic NI-DAQmx code that want to expand their programming capabilities Users new to PC-based data acquisition and signal conditioning Prerequisites LabVIEW Core 1 LabVIEW Core 2 NI Products Used: If you take the course On-Demand: -NI DAQmx 2022 Q3 -LabVIEW 2022 If you take the course in an instructor-led format: -LabVIEW -NI-DAQmx -CompactDAQ Chassis -C Series analog input, analog output, and digital I/O modules Training Materials Virtual instructor-led training includes digital course material that is delivered through the NI Learning Center. NI virtual instructor-led training is delivered through Zoom, and Amazon AppStream/LogMein access is provided to participants to perform the exercises on virtual machines equipped with the latest software. Costs in Credits On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits Public virtual or classroom course: 20 Education Services Credits or 6 Training Credits Private virtual or classroom: 140 Education Services Credits or 40 Training Credits NI Course Outline LESSON OVERVIEW TOPICS Measuring Analog Input Select and connect to the hardware, configure the DAQmx task appropriately, and validate an analog signal. Simulating the Hardware Selecting the Right Hardware Considering Signal Conditioning Connecting the Signal Validating the Measurement Measuring Current Generating Analog Output Select and connect to the hardware, configure the DAQmx task appropriately, and validate an analog signal. Selecting the Hardware Connecting the Signal Validating the Signal Generating Current Generating and Reading Digital Signal Select and connect to hardware, configure the DAQmx task appropriately, and validate a digital signal. Selecting the Hardware Exploring Signal Conditioning Connecting the Signal Validating the Signal Exploring Counter Signals Choosing a Signal to Explore Choose a specific signal and configure the DAQmx task, including any special signal conditioning needs. Measuring Temperature Measuring Sound, Vibration, and Acceleration (IEPE Measurements) Measuring Strain, Force, and Pressure (Bridge-Based Measurements) Measuring Position with Encoders (Counter Input) Measuring Edges, Frequency, Pulse Width, and Duty Cycle Generating a Pulse Train Programming with the NI-DAQmx API Use NI-DAQmx API in LabVIEW to automate data communication between a DAQ device and a computer. DAQmx Code Structure Overview Reading and Writing Finite Amount of Data Communicating Data Continuously Programming Multiple Channels Examine various methods for multi-channel task creation and their applications. Communicating with Multiple Channels Creating Multidevice Tasks Using Multiple Lines of a DAQmx Code in a Single VI Triggering on a Specific Condition Acquire data on a specific condition and explore how to use hardware sources as triggers. Triggering Overview Types of Hardware Triggers Sources of Hardware Triggers Exploring Advanced Timing and Synchronization Methods Use an appropriate method for synchronizing multiple DAQ tasks. Synchronization Overview Synchronizing a Single Device with a Shared Trigger Identifying Limitations of Shared Trigger Synchronization Synchronizing Multiple Device Synchronizing Specific Hardware Series Logging Measurement Data to Disk Log data to a TDMS file to store and analyze post-acquisition. TDMS File Overview Logging Data with the DAQmx API Organizing the TDMS Data Viewing the TDMS Data Exploring System Considerations Explore additional aspects of building a data acquisition system. Exploring System Considerations for Hardware Determining the Accuracy of a System Exploring Bus and Computer Considerations Where to Start the DAQ Application Enroll

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Functional testing involves applying operational power to a PCBA to ensure it performs its designated functions. This type requires custom-built test equipment. PCBACheck™ Printed Circuit Board Assembly Test Fixture Industrial Reference Design Our AUTOMATED Printed Circuit Board Assembly Test Fixture Equipment Reference Design is 90% Standardized and 10% Custom. Home > Services > Automated Test Systems > PCBACheck PCBA Functional Test Solution Businesses depend on Cyth Systems' expertise in functional test fixtures. Functional testing involves applying full operational power to a printed circuit board (PCBA) to ensure it performs its designated functions. This type of test often requires custom-built test equipment and fixtures. Cyth Systems provides support for all types of functional test strategies. Starter PXI Instruments Customize PXI Devices as Needed Pre-Designed Bed-of-Nails Customize Probes Locations Pre-Designed Interposer Board Customize Probes & Other Circuitry Software Environment Customize Sequences & Measurement Instruments Drivers Customize Measurements Top Our Printed Circuit Board Assembly Testing Solution. Bed-of-Nails Functional Tester Preconfigured Database Preconfigured PXI System Budget & Schedule Preconfigured Test Cart Preconfigured Reports Automate complex tasks faster Speak to Engineer Perform complex and rapid tasks and measurements that are impossible for human manual tests. Test multiple boards simultaneously, even share time-expensive equipment. Conduct Stress or Life Testing of boards by repeating tests hundreds or thousands of times. Bed-of-Nails Functional Tester PCBA Bed of Nails Functional Tester Predesigned fixture ready for custom modifications for any board: Customize width & depth Customize Pin Placement Customize front and rear panel Customize Interposer Board Speak to Engineer Preconfigured PXI System Preconfigured PXI System Standard PXI Modules suits 90% of applications needs as-is: Power Supply Oscilloscope Digital Multimeter Configurable Switch Matrix Add additional modules, signals, and inputs as needed to expand your application. Speak to Engineer Preconfigured Test Cart Preconfigured Test Cart Standardized Test Cart serves most applications as-is without modification! Internal Rack Mounting Customizable worksurface Bar Code Scanner or Badge Reader Power Systems included Customization not required, but... fully customizable if necessary Speak to Engineer Preconfigured Database Preconfigured Database Standardized database Schema serves 90% of most applications as-is without modification: Speak to Engineer Store any test results, pass fail results Store images, waveforms, raw data Customization not required, but... Fully customizable if necessary Preconfigured Reports Preconfigured Reports Preconfigured Reports suits most applications as-is with CUSTOMIZATION INCLUDED Most common report fields already setup Fully customizable graphics and layout Fully customize graphs, tables, images Export to PDF already included Premade Excel or Word Templates you can customize and modify Speak to Engineer Budget & Schedule Budget & Schedule Preconfigured Budget for all included features: Most projects within 10% of standard budget and schedule Automatically adjusts for project size and features Budget INCLUDES customizations Speak to Engineer We know the ins and outs of PCB's Power supply voltage levels (VCC, VDD, etc.). Clock signals (system clock, peripheral clocks). Analog input signals (e.g., sensor inputs). Digital control signals (e.g., reset, enable signals). Serial communication inputs (UART, SPI, I2C). External trigger inputs. User interface inputs (buttons, switches). PWM (Pulse Width Modulation) signals. Temperature sensor inputs. Voltage reference inputs. Digital output signals (data lines, control lines). Analog input signals (ADC inputs). Analog output signals (DAC outputs). LED indicators. Display outputs (LCD, OLED, LED display segments). Relay control outputs. Voltage regulator outputs. Power-on indicator outputs. Current sense inputs/outputs. Power-up sequence testing. Power-down sequence testing. Voltage tolerance testing. Clock frequency and accuracy testing. Data integrity testing (checksum, CRC). Communication protocol testing (UART, SPI, I2C). Uploading Firmware or other files. Overvoltage protection testing. Undervoltage lockout testing. Logic functionality testing (gate-level/functional logic). Memory read/write testing (RAM, Flash). Sensor calibration and accuracy testing. ADC/DAC functionality and accuracy testing. Motor control functionality testing. Audio output quality testing. Display content and pixel testing. Communication protocol testing. Button/switch functionality testing. Temperature sensor accuracy testing. All these I/O's and much more. Speak to Engineer Prototype Form Why Cyth? Cyth Systems has over two decades of providing the technology and expertise you need to be successful on Automation, Measurement, and Controls projects. Our engineers will work alongside your team to design the system to meet your specifications. We develop your solutions with reduced risk, cost, and schedule. Need PCBA testing help or advice? First Name Last Name Email How can we help? [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup] Let's talk PCBA Solutions Menu

Project Case Study Identifying Noise Sources on In-Flight Aircraft with LabVIEW & PXI Mar 27, 2024 08963015-630e-457a-b96f-192656dbfc91 08963015-630e-457a-b96f-192656dbfc91 Home > Case Studies > *As Featured on NI.com Original Authors: Dr. Kenichiro Nagai, Japan Aerospace Exploration Agency (JAXA) Edited by Cyth Systems A private jet undergoing takeoff The Challenge Developing a measurement system to identify noise sources on in-flight aircraft. The Solution Building an application based on NI LabVIEW software that uses NI PXI hardware to acquire data from a phased microphone array on a runway. Investigating Noise Sources on Passenger Aircraft To develop quieter passenger aircraft, we must identify all noise sources to improve our understanding of the noise generation mechanisms. While designing an aircraft, we can predict noise levels through numerical analysis and model tests. However, the properties and characteristics of actual aircraft noise can only be obtained by actual flight tests. Noise source localization through acoustic beamforming is a powerful tool to accomplish this. Beamforming is a method of mapping noise sources using a phased array of microphones and displaying their amplitude. Although we at JAXA have developed and improved this technique through both wind tunnel tests and flight tests using small-scale model airplanes, we haven’t applied this technique to actual aircraft in flight. In recent years, we acquired a small Mitsubishi MU-300 Diamond business jet. We set up a phased microphone array on a runway and began conducting noise source localization measurements to verify our current technology and to determine areas of improvement. Phased Microphone Array Measurements The phased array consists of many microphones distributed over a large diameter. Using the slight time lag for the sound waves emitted from the noise sources to arrive at each microphone, we can estimate the location and strength of each noise source. In this test, we designed the phased array to distinguish between two separated 1 kHz tones in 4 m distance on an aircraft flying at 120 m altitude. We designed an array consisting of 99 microphones arranged over a circular area with a 30 m diameter. Left: Phased array of line scan cameras installed on the runway. Right: Phased microphone array installed on the runway. In-flight noise source localization tests must include the state of the jet engine; acoustic measurements; and the aircraft’s position, altitude, and speed while it flies over the phased array. We also record meteorological data such as wind direction and speed, temperature, and humidity, since the noise generated from the aircraft is attenuated by the atmosphere before reaching the microphones on the ground. A key feature of our system is the simultaneous measurement of flight parameters with acoustics. We accomplish this using two line-scanning cameras placed with the phased array on the ground. These two cameras are directed upright and are staggered both in flight direction and in lateral direction, as shown in Figure 1. The cameras capture synchronized images of the passing aircraft, providing us 3D information that allows us to analyze the flight speed and flight altitude of the aircraft. The noise localization process is simultaneously executed with the acquired acoustic data on another computer. This data is combined together shortly after the aircraft flies over the phased array and is visualized as noise source maps overlapping the aircraft image. Visualized noise sources Figure 2. Visualized noise sources for 1,000 Hz and 2,000 Hz on the aircraft in a landing configuration (flaps down, landing gear down, engine idling, altitude 60 m, flight speed 60 m/s, level flight). Measurement System We chose an NI PXI system with a variety of modules to meet our requirements for a compact system. Our system contains an embedded controller and an NI 8260, a 4-drive, in-chassis, high-speed data storage module. LabVIEW, the NI Vision Development Module, and the NI Sound and Vibration Measurement Suite provided an effective tool for developing our solution. The system provided quick setup, data logging, real-time monitoring, and data review. We mounted it on a mobile platform for portability. The NI PXI-4498 dynamic signal acquisition (DSA) modules provide power to the microphones via integrated electronic piezoelectric (IEPE) conditioning and simultaneously acquire high-resolution data from them. Since each module can handle up to 16 channels, the seven modules can simultaneously sample 112 channels with room for expansion. The NI PXI-1428 image acquisition modules allow line-scan digital imaging from line-scan cameras. These acquired images are processed automatically by the application we developed using the NI Vision Development Module. In addition, the NI PXI-6682H timing and synchronization module provides synchronization via GPS to timestamp the data and coordinate with avionics onboard the aircraft and on the ground. NI PXIe-1095 We conducted flight tests November 16–18, 2010, at Taiki Aerospace Research Field in Hokkaido Prefecture. While the MU-300 business jet executed a series of repeated approaches and climbs to simulate takeoff and landing at various flight altitudes and speeds, we took measurements simultaneously on the ground and in the aircraft. Figure 6 shows the typical results of noise localization maps for 1,000 Hz and 2,000 Hz on the aircraft in a landing configuration. At 1,000 Hz, we confirmed noise sources with higher amplitudes (shown in red) near the main landing gear, outside edge of the flaps, and the engine nozzle. At 2,000 Hz, we observed noise sources near the engine nozzle, main landing gear, and nose landing gear, but no longer at the outside edge of the flaps. Through this test, we demonstrated the technology to localize multiple noise sources on an in-flight aircraft. We are continuing to improve our technology to locate noise sources more accurately and to enable a more detailed evaluation of noise source properties such as noise spectra. Original Authors: Dr. Kenichiro Nagai, Japan Aerospace Exploration Agency (JAXA) Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

This course teaches you how to use common design patterns to successfully implement and distribute LabVIEW applications for research, engineering, and testing environments. LabVIEW Core 2 Training Course Start Date | End Date Duration ENROLL < Back NI Course Overview The LabVIEW Core 2 Course is an extension of the LabVIEW Core 1 Course. This course teaches you how to use common design patterns to successfully implement and distribute LabVIEW applications for research, engineering, and testing environments. Topics covered include programmatically respond to user interface events, implementing parallel loops, manage configuration settings in configuration files, develop an error handling strategy for your application, and tools to create executables and installers. The LabVIEW Core 2 Course directly links LabVIEW functionality to your application needs and provides a jump-start for application development. NI Course Objectives Implement multiple parallel loops and transfer data between the loops Create an application that responds to user interface events Manage configuration settings for your application Develop an error handling strategy for your application Package and distribute LV code for reuse Identify Best Programming Practices for use in LabVIEW NI Course Details Duration: Instructor-led Classroom: Two (2) days Instructor-led Virtual: Three (3) days, five-and-a-half-hour sessions On-Demand: 4 hours (exercises as a supplement) Audience: New users and users preparing to develop applications using LabVIEW LabVIEW Core 1 Course attendees Users and technical managers evaluating LabVIEW in purchasing decisions Users pursuing the Certified LabVIEW Associate Developer certification Prerequisites: LabVIEW Core 1 Course or equivalent experience NI Products Used: If you take the course On-Demand: LabVIEW 2021 NI-DAQmx 21.0 NI PCI-6221 or NI USB-6212, BNC-2120 Simulated NI-PCI-6221 If you take the course in an instructor-led format: LabVIEW Professional Development System 2023 or later NI-DAQmx 23.0 or later USB-6212 BNC-2120 Training Materials: Virtual instructor-led training includes digital course material that is delivered through the NI Learning Center NI virtual instructor-led training is delivered through Zoom, and Amazon AppStream/LogMein access is provided to participants to perform the exercises on virtual machines equipped with the latest software Cost in Credits: On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits Public virtual or classroom course: 20 Education Services Credits or 6 Training Credits Private virtual or classroom: 140 Education Services Credits or 40 Training Credits NI Course Outline LESSON OVERVIEW TOPICS Transferring Data Use channel wires to communicate between parallel sections of code without forcing an execution order. Communicating between Parallel Loops Exploring Channel Wires Using Channel Templates Exploring Channel Wire Interactions Transferring Data Using Queues Creating an Event-Driven User Interface Create an application that responds to user interface events by using a variety of event-driven design patterns. Event-Driven Programming User Interface Event Handler Design Pattern Event-Driven State Machine Design Pattern Producer/Consumer (Events) Design Pattern Channeled Message Handler (CMH) Design Pattern Controlling Front Panel Objects Explore methods to programmatically control the front panel. VI Server Architecture Property Nodes and Control References Invoke Nodes Managing Configuration Settings Using Configuration Files Manage configuration settings with the help of a configuration file. Configuration Settings Overview Managing Configuration Settings Using a Delimited File Managing Configuration Settings Using an Initialization (INI) File Developing an Error Handling Strategy Learn how to develop an error handling strategy for your application. Error Handling Overview Exploring Error Response Exploring Event Logging Injecting Errors for Testing Packaging and Distributing LabVIEW Code Learn how to package and distribute LabVIEW code for use by other developers and end-users. Preparing Code for Distribution Build Specifications Creating and Debugging an Application (EXE) Creating a Package for Distribution Programming Practices in LabVIEW Explore recommended practices for programming to develop readable, maintainable, extensible, scalable and performant code. Recommended Coding Practices Writing Performant Code in LabVIEW Software Engineering Best Practices Identify some key principles of software engineering best practices and the benefits of implementing them when working in LabVIEW. Project Management Requirements Gathering Source Code Control Code Review and Testing Continuous Integration Enroll

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This course teaches you how to use common design patterns to successfully implement and distribute LabVIEW applications for research, engineering, and testing environments. LabVIEW Core 2 Training Course Start Date | End Date Duration ENROLL < Back NI Course Overview The LabVIEW Core 2 Course is an extension of the LabVIEW Core 1 Course. This course teaches you how to use common design patterns to successfully implement and distribute LabVIEW applications for research, engineering, and testing environments. Topics covered include programmatically respond to user interface events, implementing parallel loops, manage configuration settings in configuration files, develop an error handling strategy for your application, and tools to create executables and installers. The LabVIEW Core 2 Course directly links LabVIEW functionality to your application needs and provides a jump-start for application development. NI Course Objectives Implement multiple parallel loops and transfer data between the loops Create an application that responds to user interface events Manage configuration settings for your application Develop an error handling strategy for your application Package and distribute LV code for reuse Identify Best Programming Practices for use in LabVIEW NI Course Details Duration: Instructor-led Classroom: Two (2) days Instructor-led Virtual: Three (3) days, five-and-a-half-hour sessions On-Demand: 4 hours (exercises as a supplement) Audience: New users and users preparing to develop applications using LabVIEW LabVIEW Core 1 Course attendees Users and technical managers evaluating LabVIEW in purchasing decisions Users pursuing the Certified LabVIEW Associate Developer certification Prerequisites: LabVIEW Core 1 Course or equivalent experience NI Products Used: If you take the course On-Demand: LabVIEW 2021 NI-DAQmx 21.0 NI PCI-6221 or NI USB-6212, BNC-2120 Simulated NI-PCI-6221 If you take the course in an instructor-led format: LabVIEW Professional Development System 2023 or later NI-DAQmx 23.0 or later USB-6212 BNC-2120 Training Materials: Virtual instructor-led training includes digital course material that is delivered through the NI Learning Center NI virtual instructor-led training is delivered through Zoom, and Amazon AppStream/LogMein access is provided to participants to perform the exercises on virtual machines equipped with the latest software Cost in Credits: On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits Public virtual or classroom course: 20 Education Services Credits or 6 Training Credits Private virtual or classroom: 140 Education Services Credits or 40 Training Credits NI Course Outline LESSON OVERVIEW TOPICS Transferring Data Use channel wires to communicate between parallel sections of code without forcing an execution order. Communicating between Parallel Loops Exploring Channel Wires Using Channel Templates Exploring Channel Wire Interactions Transferring Data Using Queues Creating an Event-Driven User Interface Create an application that responds to user interface events by using a variety of event-driven design patterns. Event-Driven Programming User Interface Event Handler Design Pattern Event-Driven State Machine Design Pattern Producer/Consumer (Events) Design Pattern Channeled Message Handler (CMH) Design Pattern Controlling Front Panel Objects Explore methods to programmatically control the front panel. VI Server Architecture Property Nodes and Control References Invoke Nodes Managing Configuration Settings Using Configuration Files Manage configuration settings with the help of a configuration file. Configuration Settings Overview Managing Configuration Settings Using a Delimited File Managing Configuration Settings Using an Initialization (INI) File Developing an Error Handling Strategy Learn how to develop an error handling strategy for your application. Error Handling Overview Exploring Error Response Exploring Event Logging Injecting Errors for Testing Packaging and Distributing LabVIEW Code Learn how to package and distribute LabVIEW code for use by other developers and end-users. Preparing Code for Distribution Build Specifications Creating and Debugging an Application (EXE) Creating a Package for Distribution Programming Practices in LabVIEW Explore recommended practices for programming to develop readable, maintainable, extensible, scalable and performant code. Recommended Coding Practices Writing Performant Code in LabVIEW Software Engineering Best Practices Identify some key principles of software engineering best practices and the benefits of implementing them when working in LabVIEW. Project Management Requirements Gathering Source Code Control Code Review and Testing Continuous Integration Enroll

The LabVIEW Core 3 Course introduces you to structured practices to help you design, implement, document, and test LabVIEW applications.  LabVIEW Core 3 Training Course Start Date | End Date Duration ENROLL < Back NI Course Overview The LabVIEW Core 3 Course introduces you to structured practices to help you design, implement, document, and test LabVIEW applications. This course focuses on developing hierarchical applications that are scalable, readable, and maintainable. The processes and techniques covered in this course help you reduce development time and improve your application stability. By incorporating these design practices early in your development, you can avoid unnecessary application redesign, increase VI reuse, and minimize maintenance costs. NI Course Objectives Leverage the LabVIEW Style Guidelines and choose an appropriate software development process to create an application Use LabVIEW Project Libraries and Project Explorer tools to organize your application Use frameworks and message handles to create a multiloop application Create and test a custom UI and ensure usability with sufficient user documentation Leverage modular code and develop test cases to maintain large applications NI Course Details Duration: Instructor-led Classroom: Three (3) days Instructor-led Virtual: Four (4) days, five-and-a-half-hour sessions On-Demand: 6.5 hours (exercises as a supplement) Audience: LabVIEW and Developer Suite users who need to increase performance, scalability, or reuse, and to reduce application maintenance costs LabVIEW users pursuing the Certified LabVIEW Developer certification LabVIEW users who have taken the LabVIEW Core 1 and Core 2 courses Prerequisites: LabVIEW Core 1 Course and LabVIEW Core 2 Course or equivalent experience NI Products Used: If you take the course On-Demand: LabVIEW 2022 Q3 If you take the course in an instructor-led format: LabVIEW 2022 Q3 Training Materials: Virtual instructor-led training includes digital course material that is delivered through the NI Learning Center NI virtual instructor-led training is delivered through Zoom, and Amazon AppStream/LogMein access is provided to participants to perform the exercises on virtual machines equipped with the latest software Cost in Credits: On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits Public virtual or classroom course: 30 Education Services Credits or 9 Training Credits Private virtual or classroom: 210 Education Services Credits or 60 Training Credits NI Course Outline LESSON OVERVIEW TOPICS Exploring LabVIEW Style Guidelines Configure the LabVIEW environment and follow LabVIEW style guidelines to develop an application. Configuring LabVIEW Environment Using LabVIEW Style Guidelines Designing and Developing Software Applications Identify an appropriate software development process for a given project and derive a high-level flowchart that can be used to guide subsequent design and development. Exploring Principles of SMoRES from LabVIEW Perspectives Software Development Process Overview Gathering Project Requirements Task Analysis Organizing LabVIEW Project Create LabVIEW project libraries and explore LabVIEW classes to organize the code. Using Libraries in LabVIEW Project Introduction to LabVIEW Classes Using Project Explorer Tools and Techniques Use Project Explorer tools and techniques to improve the organization of project files and resolve any file conflicts that occur. Using Project Explorer Tools Resolving Project Conflicts Creating Application Architecture Design applications leveraging multi-loop architecture techniques. Generating User Events Exploring LabVIEW Frameworks Exploring Framework Data Types Architecture Testing Selecting Software Framework Leverage frameworks and message handlers to design the LabVIEW application. Queued Message Handler Delacor Queued Message Handler Channeled Message Handler Using Notifiers Exploring Actor Framework Creating User Interface Design and develop a custom user interface that meets LabVIEW style guidelines. Exploring User Interface Style Guidelines Creating User Interface Prototypes Customizing User Interface Extending User Interface Ensuring Usability of User Interface Create sufficient user documentation, as well as initialize and test the user interface to ensure the usability of the application. Customizing Window Appearance Creating User Documentation User Interface Initialization User Interface Testing Designing Modular Applications Use modular code in a large application and explore guidelines for making large applications more maintainable. Designing Modular Code Exploring Coupling and Cohesion Code Module Testing Develop test cases that can identify the largest number of errors in an application. Code Module Testing Integration Testing Enroll

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Events ||Anaheim Electronics & Manufacturing Show 2023| Anaheim Electronics & Manufacturing Show 2023 Anaheim Electronics & Manufacturing Show 2023 September 27, 2023 Anaheim Convention Center 800 W Katella Ave, Anaheim, CA 92802 The Anaheim Electronics & Manufacturing Show (AEMS) 2023 was a two-day trade show held in Anaheim, California, on September 27-28. It served as a design and manufacturing show specifically for the electronics, medical, and biotechnology industries. AEMS offered a platform for exhibitors to showcase their products and services, and attendees to participate in educational seminars and networking opportunities.

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PXI controllers provide in-chassis computing for PXI systems. Choose embedded options to run your system without a PC or remote to run it from an external PC. NI PXI CONTROLLERS NI Authorized Distributor and System Integration Partner Home > Products > PXI Controllers PXI Controllers PXI controllers are either embedded or remote. Embedded controllers contain everything you need to run your PXI system without an external PC, while remote controllers let you manage your PXI system from desktops, laptops, or server computers. The Latest Controller Technology NI’s embedded PXI controllers provide a compact, in-chassis computer for your PXI system. These high-performance controllers include the latest integrated CPUs, hard drive, memory, Ethernet, video, serial, USB, and peripherals connectivity. System Expansion with PXI Remote Control Hardware NI’s PXI remote control solutions enhance PXI systems while enabling chassis management through desktop PCs, rack-mount controllers, or other PXI systems. Remote controller options include high-speed data throughput, long-distance cabling, and host form factors. PXI Controller Provides a high-performance, compact embedded computer solution for PXI, CompactPCI, and PXI Express systems. Feature Highlights: Platform: PXI Bus: PXI, PXI Express PXI Remote Control Module Controls PXI and PXI Express systems from your PC or laptop computer through a software transparent link. Feature Highlights: Platform: PXI Bus: PXI, PXI Express External Controller for PXI Controls PXI or PXI Express systems over a MXI interface from a rack-mount form factor.

Project Case Study CompactRIO Revolutionizes 3D Printing Mar 30, 2025 00cfe628-a456-485c-aaa4-19812f4f959b 00cfe628-a456-485c-aaa4-19812f4f959b Home > Case Studies > A 3D-Printed Craniomaxillofacial Implant and Model of Facial Reconstruction Surgery The Challenge Industrial laser-based 3D printing processes have been around for many years, but the industry must tackle many challenges such as production throughput, quality assurance, and manufacturing repeatability before 3D printing can become a robust, standardized manufacturing technology. The Solution Materialise developed the Materialise Control Platform (MCP), powered by CompactRIO and LabVIEW, as a ready-to-start software-driven, embedded controller platform specifically for laser-based 3D printing applications. Researchers and engineers can build and improve additive manufacturing processes that are ready for industrial use to support innovation, research, and new applications in the market. Materialize additive manufacturing and 3D printing facility, Leuven, Belgium. (Credit: Materialise). Revolutionizing the World of 3D Printing and Additive Manufacturing Materialise’s open and flexible platforms help companies in industries such as healthcare, automotive, aerospace, art and design, and consumer goods to build innovative 3D printing applications that make the world a better and healthier place. Examples include customized implants that have helped people out of their wheelchairs, hearing aids that have enhanced social lives, or the improved designs of the cars we drive and the planes we fly in. Titanium Aerospace Part with 63% weight reduction. Challenges That Prevent More Broad-Based Adoption of Additive Manufacturing Traditional machines operate on preformed material geometries (bars, blocks, sheet metal plates, and more), but additive manufacturing starts from pulverized material (powder) or liquid material (resins). This means that in contrast with traditional manufacturing, additive manufacturing not only shapes the geometry of end products, but also defines the material properties. Therefore, manufacturers use laser optical systems. The power and geometrical accuracy of these systems shifts as time progresses. Furthermore, like in welding, the process is susceptible to corrosion. This requires complete and total control of both the laser power, beam position, process atmosphere, and machine temperature throughout the entire build, and for some materials also before and after the build (controlled heat-up and cool-down phases). Also, the more an additive manufacturing machine is used, the quicker its internal processes deteriorate. Users mitigate this with preventive maintenance and recalibration—time-consuming tasks with a rather long machine standstill as a consequence. When using additive manufacturing, users may calibrate the machine before a certain number of builds. A complete calibration easily consumes half a day of work by a skilled technician for a build that might take only a couple of days. With machines that drift so quickly and have advanced complex processes, the industry is somewhat skeptical about an emerging and revolutionizing technology like additive manufacturing. Typically, users demand outstanding quality, high production throughput, and repeatability to trust this manufacturing approach to handle those elements that generate revenue for them. We might gradually overcome challenges like throughput and increasing production capacity. With repeatability still a challenge, this could lead to accelerated production costs and more waste. However, all of this is still not as important as a potential quality issue, which directly impacts customer relationships. Users can benefit from the Materialise Control Platform to innovate and overcome these hurdles one by one. They can tackle and reduce the typical calibration downtimes and implement an automatic process and quality monitoring and control. Users can also achieve closed-loop rates that have never been achieved before and produce more repeatable parts with higher quality, at higher volume, and at lower cost. NI-9030 CompactRIO Chassis Using the CompactRIO Platform We selected the CompactRIO platform as the foundation for our solution becuase it offers an extendable FPGA-based hardware platform with a vast selection of I/O. We extended the platform with a scan head and laser interfaces. We developed and added both XY2-100 and SL2-100 scan head communication protocols as C Series interface cards. Specifically, the cRIO-9030 controllers offered great advantages while running Linux Real-Time. We could port our current C developers and many of the already existing libraries to the CompactRIO system. The CompactRIO FPGA is crucial for data analysis and interconnecting the I/O in the additive manufacturing machine. The overall process runs at 100 kHz, a 100X improvement over traditional 3D printing machines. This loop speed is hard to keep up with using regular processors. Our own scan head modules rely on another FPGA that processes the laser and scan head signals. Every MCP-based additive manufacturing machine runs at least two processors and two FPGAs, all interconnected in the Materialise Control Platform (MCP). The modularity and openness of the CompactRIO platform is scalable for our customers. Not everybody needs two or more scan heads or numerous I/O channels. When customers need more than eight modules, they can use an NI-9149 chassis to add another eight modules in the configuration. The high-end cRIO-9030 products include Gigabit Ethernet, IP, and USB camera support, an in-demand feature for high-end additive manufacturing machines for machine inspection. Users can monitor and intervene during the build process and reduce the high costs attached to non-destructive, post-build tests. The additive manufacturing industry is global, so we needed to certify the MCP for sales worldwide. Having developed custom C Series modules, we validated and tested these modules ourselves, but saved significant time on all CompactRIO components due to the available global certification standards like CE, FCC, UL, and more. Original Authors: Stijn Schacht, Materialise Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Cyth Systems supports & stocks National Instruments products & platforms. We work with engineers to and buyers to design systems, and fullfil and verify orders. Discover the benefits of ordering from the ONLY NI Distributor that uses NI Products every day! Quotes & Orders I Need Help "Working with Marty through the transition to distribution has been wonderful!" M.L., Buyer, Sunnyvale, CA Aircraft Manufacturer, DoD Prime Contactor Oct 2023 Marty, Applications Engineer Benefits of ordering from Cyth Others Products In Stock Yes No Price Markups 10%-30% Markup No Handling Fees $200-$300 Experienced & Certified Product Advice No Free Tech Support with Orders No Free Project Startup Assistance No Stock Customization & Reservations No Yes Yes Yes Yes Yes Yes Yes NI Distribution I Web Form Option 1. Concierge Order Service! No sign-in or setup is required. Submit any format or file: PDF, Excel, text, or even a screenshot and we will do the rest! Upload a Purchase Order or Request For Quote in any format - PDF, Word Document, Excel, even a screenshot or a Text. We'll process your quote or order and confirm by email. First Name Last Name Company Email [attributer-channel] [attributer-channeldrilldown1] How can we help? [attributer-channeldrilldown3] [attributer-landingpagegroup] Upload your order Upload File Upload supported file (Max 15MB) [attributer-channeldrilldown2] [attributer-landingpage] Submit Option 2. Self-Service Quotes and Orders Build a cart in our online store to see pricing and inventory status. Search Part Numbers or SKU Verify Price and Check Stock Add to Cart Then you can Save or Export your cart Complete purchase with PO Purchase Online or by PO Looking for Support? Presales Support - ensures you select the right hardware for your application Startup Assistance - gets your new hardware up and running Debug & Code Audits - confirms your application runs correctly Get Support We have the experience you need. Book a time with an engineer for support. Meet with Support Integration Assistance Have a project in mind? Speak to an applications engineer for getting your project off the ground. Meet with Engineer

Project Case Study Lockheed Martin’s NI Software-Based Test System Saves Millions Aug 15, 2023 161beb0d-c1e0-46ad-a61f-80b02827798c 161beb0d-c1e0-46ad-a61f-80b02827798c Home > Case Studies > *As Featured on NI.com Original Authors: Robert Dixon, Lockheed Martin STS Edited by Cyth Systems The LM-CORE™ Lockheed Martin automated test system uses NI TestStand software to provide open software architectures. The Challenge Delivering a test system for use in applications from manufacturing to environmental stress screening to depot testing on the more than 3,000 planned Joint Strike Fighter aircraft. The Solution Creating a test system to deliver integrated support for avionics test systems by using NI TestStand and LabWindows™/CVI for the core test management and ANSI-C test development environments. In 2001 Lockheed Martin was awarded the largest aircraft contract in history. The Joint Strike Fighter (JSF)/F-35 contract, valued at approximately $200 billion, provides the cornerstone of future defense capability for the United States and its allied partners. A crucial part of the JSF contract is delivering a test system for use in applications from manufacturing to environmental stress screening to depot testing on the more than 3,000 planned JSF aircraft. To meet this challenge, Lockheed Martin Simulation, Training & Support (LM STS) developed the LM-STAR test system to deliver integrated support for avionics test systems. Designed to rapidly develop test solutions and support customers’ exact needs in a cost-effective and timely manner, the LM-STAR system uses NI TestStand and LabWindows/CVI software for the core test management and ANSI-C test development environments. Lockheed Martin, the manufacturer of the F-35A Lightning II, uses NI TestStand software for the sequencing backbone of their automated test. Open Software Architecture Ensures Rapid Development In the LM-STAR system, an open software architecture based largely on NI TestStand and LabWindows/CVI supports the seamless transition of test systems from the factory to the field. The LM-STAR solution provides a common test system for all avionics suppliers participating in the JSF Harmonization Plan. Essential for a project of the magnitude of the JSF program, the JSF Harmonization Plan allows multiple suppliers, including BAE Systems, Northrop Grumman, Rockwell Collins, and Raytheon, to simultaneously develop test program sets (TPS) using NI TestStand and LabWindows/CVI for the JSF/F-35. The advanced, open software architecture in the LM-STAR system ensures the rapid development and deployment of mission critical test systems while minimizing long-term maintenance efforts. Test Software Adaptability Enables Multiple Test Configurations Using the standard features provided by the NI TestStand commercial, off-the-shelf (COTS) test management environment, LM STS test engineers built a common test architecture to facilitate the rapid delivery of configurable test solutions. The key LM-STAR features use many core NI TestStand components, such as the flexible module adapters for calling tests developed in any test development environment and the NI TestStand process model for separating the core system functionality from the individual tests. The LabWindows/CVI development environment also contributed to the rapid configuration of LM-STAR-based test systems by providing industry-leading instrument connectivity and driver support through a proven ANSI C-based development language and a compiler optimized for test Future Technology Insertion Prevents Obsolescence The modular test architecture of the LM-STAR system protects mission-critical test systems from obsolescence by using NI TestStand and LabWindows/CVI to ease the insertion of future technologies. One example is new NI TestStand support for calling ATLAS TPSs directly from NI TestStand. This technology is important for supporting legacy avionics test systems through a common test architecture capable of hosting both legacy and future test development environments. Specifically, the new ATLAS interface for NI TestStand 3.0 features the ability to browse and select ATLAS TPS files, specify parameters, and perform remote control. Run-time features include full compliance of TPS Server state transitions, such as attaching, loading, and detaching; parameter reading and writing; global locking; handling of manual TPS intervention; and the ability to pause and terminate sequence execution. Avionics test system developers are also closely watching the development of the newly defined XML-based Automatic Test Markup Language (ATML) standard for describing test procedures and test results in XML. The open software architecture in the LM-STAR system will significantly ease the adoption of this data schema for avionics test systems. In fact, NI has already demonstrated that the current NI TestStand XML features can generate results in the new Test Results XML schema in accordance with the draft ATML specifications. Standardized Approach Yields Significant Cost Savings The innovative LM-STAR approach to standardized test system development based on COTS software has yielded many cost-saving benefits for LM STS, harmonization suppliers, and the U.S. government. LM STS estimates their standardized LM-STAR approach to the JSF/F-35 program has already saved the U.S. government millions of dollars and has the potential to save hundreds of millions more over the life of the program. Original Authors: Robert Dixon, Lockheed Martin STS Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Project Case Study Automated Test of Touch Device Force Sensors Using CompactDAQ Mar 27, 2024 b5e70db1-ff87-4332-a42a-5e2d6eb030ac b5e70db1-ff87-4332-a42a-5e2d6eb030ac Home > Case Studies > *As Featured on NI.com Original Authors: Timothy Wiles, Peratech Edited by Cyth Systems Automated Test of Touch Device Force Sensors The Challenge Force sensing solutions help device makers create more natural, intuitive, and immersive user experiences for those using their kits. Measuring and utilizing the analog, non-linear output from force sensors is entirely different than integrating capacitive sensing or traditional buttons, so having the tools to make force sensing solution design and high-quality mass production as straightforward and reliable as current technologies is vital. The Solution Peratech used CompactDAQ hardware and LabVIEW software to develop a pioneering, data-driven testing system that assures customers that purchased sensors meet required specifications and will perform as expected. Application Different force sensing technologies have been around for decades, but Apple’s decision to incorporate force touch into the iPhone, Apple Watch, and the latest MacBook has raised its profile. Smartphones and trackpads are merely the tip of the iceberg. Force-sensing technology can now improve our interactions with a range of devices, from household appliances to medical and industrial equipment. The NI CompactDAQ platform provides the data acquisition needs for force testing of device touch sensors. How Force Touch Sensors Transform Our Interactions With Everyday Machines In addition to displays, phone and tablet makers can add interaction opportunities by incorporating force sensors into other parts of their devices, such as volume controls and power/home buttons. Some manufacturers are adding an area of force sensitivity to the sides or rear of devices to create additional interaction methods that do not involve your fingers obscuring parts of the display. A basic example of the improvements force sensing makes possible is that you do not have to repeatedly lift your finger from the button to get the button to advance repeated times, which is especially valuable for one-handed volume control. Left Integrating appropriate force sensors into laptops and notebooks enables a more intuitive user experience. Right: A complete force-resistance curve shows how a sensor will perform at different levels of force. Personal computer manufacturers are exploring how to build force sensors into other parts of the hardware, including keyboards. Imagine a light press on the arrow keys moving your cursor along letter by letter, while a harder press jumps through a word at a time. Now, a deliberate, intuitive level of pressure, not an arbitrary measure of time, determines the difference in the two actions from the same button. Force sensors can replace mechanical switches in many applications where analogue control can provide a more intuitive experience, for example variable speed power tools or automotive controls. Their ultrathin design and high durability can increase life and reduce the total cost of ownership over traditional switch systems. Essential Characteristics of Force Touch Sensors As these applications show, the uses for force sensors are many and varied, but all share common requirements: The sensor must be fit for purpose and the specification must directly and accurately correlate to desired performance, otherwise there is a danger of accurately measuring something that has no bearing on actual product performance. There is little value in knowing a sensor can offer variances of no more than 10 g at forces of 1 kg if the greatest force it faces is 100 g. Performance must be predictable and reliable. You need absolute confidence that each and every sensor can perform as expected, every time you use it in your product. This high level of assuredness is particularly important in safety-critical roles, in which the sensor output must be accurate to a specified variance throughout the usable force range. The sensors need to be able to be produced in volume, while still providing the quality assurance outlined. This requires accurate testing that is also simple to perform, fast, and scalable. All of this needs to be embodied in a cost-effective piece of test equipment. Next-Generation Sensor Testing: Delivering High Customer Confidence We had worked with NI tools in other roles, specifically with LabVIEW and FPGA. Errors that occurred during development were often made by the user. The ease of use of NI technologies, such as the seamless integration of LabVIEW with NI DAQ hardware, helped us achieve a faster development time and rapid prototyping. Both of these points benefitted us as we needed to develop a reliable test system quickly. Combining best-in-class testing hardware and software from NI with a bespoke data infrastructure that uses cloud and business intelligence/analytics tools, we designed and implemented a secure automated testing and monitoring system that can be used in any facility manufacturing its sensors. The system tests every single sensor that rolls off a production line, using NI hardware and LabVIEW. The process subjects each sensor to a wide range of forces in less than five seconds, collecting up to 50,000 data points per second to produce a complete force-resistance curve. We can ensure sensor quality and reliably demonstrate to a customer how its sensors will perform across the applicable force range for each specific application. Data-Driven Decisions Data from the tests is distilled down and securely stored in the cloud, where it can be analysed from anywhere in the world. This helps us identify and resolve problems in minutes instead of days, which provides instant and continuous assurance of quality levels. For customers, this rigorous factory testing can reduce or even eradicate the need for their own testing to find a suitable sensor, and dramatically cut end-product testing time. Should unforeseen product issues arise, the system features product traceability, enabling high-speed forensics and problem solving. As a result, our product assurance and traceability solutions reduce risk and uncertainty, and help get a product from concept to mass production quicker, with higher quality at lower cost. Conclusion The rapid prototyping and development capability of CompactDAQ and LabVIEW helped us create a system that relentlessly tests sensors before they are released into the market. We used NI tools to develop an automated and scalable test approach that ensures every single sensor it produces is tested against a range of forces that apply exactly to a customer’s product application needs. The testing system can quickly be modified to test new product designs, without the need for complex, low-level coding, resulting in the setup for testing new sensors taking days rather than months. The impacts of using NI tools include: improved testing time and cost deep insight into sensor performance the ability of device manufacturers to specify sensor type, giving them the confidence that every sensor module they purchase can perform as they need it to Original Authors: Timothy Wiles, Peratech Edited by Cyth Systems

Project Case Study Multi-PCBA Test Solution Delivers Broad Functional Test Coverage for FDA Compliance Aug 8, 2025 6af0a826-9ad4-4818-8bda-7c4a34188d02 6af0a826-9ad4-4818-8bda-7c4a34188d02 Home > Case Studies > A medical device manufacturer required a complete functional test solution consolidating their product verification test phase and quality control process for their FDA-compliant product. Project Summary Cyth developed a unified test platform using PXI, LabVIEW, and TestStand spanning test plans, fixturing, and a common automation architecture for six PCBAs used in patient monitoring devices. System Features & Components PXI instrumentation mapped to multi-DUT test coverage Custom fixturing for 6 constituent PCBAs, including bed-of-nails connectivity to test points RF environmental enclosure for wireless test Measurement software (LabVIEW) and test automation executive (TestStand) with common architecture for efficient reuse across devices-under-test (DUTs) Outcomes Minimized capital costs through instrumentation configurations shared across devices-under-test Reduced engineering development and maintenance effort with common measuremeent code and test automation software Successfully achieved schedule milestones for factory acceptance testing (FAT) Technology at-a-glance PXIe Chassis: PXIe-1078 Data acquisition: PXI-6229 Sensors and signal conditioning: pressure transducer, digital signal attenuator, programmable DC loads Power: PXIe-4112 and PXIe 4113 programmable power supplies Switching: PXI-2564 SPST relay module and PXI-2534 matrix switch Serial communication: PXI-8432 RS232 interface module Environmental: RF Faraday enclosure Test automation software: LabVIEW and TestStand Enabling Responsive Patient Care Vital signs monitoring equipment is the quiet workhorse of patient care. These systems take critical physiological measurements, such as temperature, respiratory rate, blood oxygenation, and blood pressure to provide clinicians with quantifiable data to assess patient health status and automatically detect changes that may indicate emergencies requiring active intervention. Like many medical devices and hospital equipment, modern vital signs monitors have evolved from simple measurement devices to sophisticated digital systems capable of continuous monitoring, wireless data transmission, and integration with electronic health records (EHRs), enabling more responsive patient care and improved clinical outcomes. While these products have become more intelligent and automated, the need for rigorous testing across design and production phases continues to grow. Enhanced Visibility & Monitoring The product incorporates four vital measurements across two distinct measurement subsystems: Cuff attached to the patient’s arm – measures systolic and diastolic blood pressure Pulse oximeter clipped to the patient’s finger – measures oxygen levels, heart rate, and temperature These subsystems are physically connected back to a processing and display unit. The system is also capable of transmitting patient readings wirelessly and securley to local devices, such as a nurse’s tablet, for enhanced visibility and monitoring. Patient's vital signs monitored automatically Comprehensive Test Coverage The engineering team responsible for testing the product faced several core challenges: Finding a test solution that would provide comprehensive test coverage for six individual PCBAs and final assembly verificcation RF testing for wirless connecitivty in a controlled, interference-free environment Reproducible and reliable test data for FDA approvel and ongoing compliance requirements They were looking for outside help from an engineering firm experienced with PCBA and final assembly functional test, ranging from fixture design, instrumentation selection and connecivity, to test software development. Designing a Unified Test Platform After engaging with the client on the product's test requirements, budget, and timeline, our engineering team started by mapping the intended test coverage to instrumentation capable of performing the measurements. We then recognized an opportunity to optimize footprint and overall hardware utilization by consolidating the various DUTs into three bed-of-nails fixtures and two test enclosures. This allowed us to refine the hardware BOM, lowering overall cost spread across the DUTs. Explore Cyth PCBA Expertise Instrumentation Selection: PXIe Chassis: PXIe-1078 Data acquisition: PXI-6229 Power: PXIe-4112 and PXIe-4113 programmable power supplies Switching: PXI-2564 SPST relay module and PXI-2534 matrix switch Serial communication: PXI-8432 RS232 interface module NI PXI instrumentation including: PXIe-1078 chassis, programmable power supplies, serial communications interface and switching After finalizing the instrumentation BOM, our team planned out the signal routing diagram, including strategic switching, from the PXI modules' channels all the way to the DUTs' test points, as accessed through cabling and the fixtures' pogo pins. Throughout this process, we leveraged our PCBACheck reference design for advanced starting points on fixture CAD, layout, and sub-components. In effect, this versatile test fixture design allowed for multiple DUTs to be tested simultaneously, increasing the throughput and efficiency of the system without requiring additional instrumentation. The circuit board positioning in the test fixtures. Environmental RF Test One of the more complex challenges involved validating the product's wireless interface. To do so, we needed to create a controlled environment free of RF noise and interference, opting to design in an RF Faraday enclosure to create such an environment. We developed a comprehensive test protocol that exercised the wireless PCBA across multiple power modes using a 3-bit control signal. Through a digital signal attenuator, we measured transmission power and signal quality across the ISM Band (Industrial, Scientific, and Medical), specifically at 838 MHz and 916 MHz frequencies. This test methodology supported the project requirements of: Validating signal strength at various Tx/Rx distances Verifying proper power mode transitions Documenting signal quality metrics for regulatory compliance Test Software & Regulatory Compliance: Our engineering team developed the test software in conjunction with the hardware design and build aspects of the project. Using our PCBACheck software framework, we developed individual test modules in LabVIEW using a hardware abstraction layer in the form of driver APIs and pre-existing measurement expertise. From there, we incorporated those discrete, reusable code modules into multiple TestStand sequences capable of executing the test plan for each individual DUT. TestStand, and the PCBACheck automation framework for functional test provides the following benefits: Learn about TestStand Test sequence development – graphical sequence editor for code module integration and validation against test requirements Test execution – flexible process models and multi-threaded resource management Data access – customizable operator interfaces, report generation, and database connectivity Implementing a unified test automation framework across the DUTs helped with code reuse, debugging, and test data repeatability. Having reliable, consistently formatted test data helped our client with their Factory Acceptance Test (FAT) phase and lowered the effort to collect and report on compliance metrics for the FDA, avoiding many hidden costs and unpredictable headaches. Golden PCBA sample loaded into bed-of-nails-fixture during FAT Full Turnkey Test Coverage Overall, the Cyth team delivered a complete turnkey solution of two PCBA functional test enclosures and a final assembly test for our client's patient monitoring product within schedule and budget. The unified test platform provided a versatile fixture design and intelligent instrumentation routing, helping control capital equipment costs. The test automation software provided full test coverage for the various individual DUTs, making test data easily accessible and repeatable. In effect, this solution helped our client spin up their factory test capabilities sooner than an in-house approach, clearing the product's path to market and easing downstream quality control efforts. Let's Talk