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Data acquisition systems measure electrical and physical phenomena like voltage, current, temperature, pressure, and sound. Learn how to build your DAQ system. Data Acquisition Systems PC-based measurement and control systems provide electrical and physical measurement capabilities for engineers who need a customizable and accurate, yet cost-effective way of conducting benchtop measurements. Home > Products > Data Acquisition Systems Data Acquisition (DAQ) Devices Data Acquisition is the process of converting real-world physical conditions such as voltage, temperature, current, or pressure into numeric form. A data acquisition system consists of a sensor, measurement device, and software. In modern practice, Data Acquisition (DAQ) has expanded to include inputs and outputs, analog and digital (discrete) signals, as well as signals collected by communication (USB, Serial) and other means. Choosing a Data Acquisition System There are many Data Acquisition platforms, types, and brands to choose from. The most flexible and widely known family of products is the National Instruments (NI) platform using LabVIEW . It's best feature is that the platform expands far beyond data acquisition into automation and control areas such as industrial instrumentation, machine vision, motion, and much more. Software makes your Data Acquisition into a useful tool Program with LabVIEW Create sophisticated applications with the software that is designed for Data Acquisition Learn about FlexLogger Collect data using a VIrtual Chart Recorder with zero programming Categories of Data Acquisition Devices and Formats Low Cost Plug & Play Data Acquisition Entry-level affordable and easy-to-use options for Data Acquisition and measurement on your desktop, laptop, or benchtop. Learn more Desktop Computer Data Acqusition (PCI) For use inside consumer Desktop or Professional Workstation computers. These devices transform typical computers into sophisticated DAQ Devices. Learn more Compact Modular DAQ (cDAQ) Rugged, reliable, compact DAQ system, with a wide variety of I/O Modules. Ideal for quickly achieving a variety of data acquisition and software analysis. Learn more Other DAQ Formats Get to know other DAQ devices and how they are designed to meet your needs in any diverse applications. Learn more Industrial Grade Data Acquisition on PXI The PXI Platform combines Data Acquisition modules with other industrial instrument modules, plus timing and triggering and more. Learn more Connectors and Accessories Entry-level affordable and easy-to-use options for Data Acquisition and measurement on your desktop, laptop, or benchtop. Learn more Data Acquisition Signals and Measurement Types Temperature Thermocouple & RTD's Most temperature measurements require specialized electronics to read correctly. Voltage and Current Input/Output Devices Controls the timing, synchronization, and data transfer between C Series I/O modules and an external host. Multifunction Mixed Signal Input/Output Devices Achieve electrical and physical measurements with a customizable, accurate, yet cost-effective way to conduct benchtop measurements. Digital (Discrete) Input/Output Devices Provide combinations of analog I/O, digital I/O, and counter/timer functionality in a single device for computer-based systems.

Events ||NI Test Forum: DC| NI Test Forum: DC NI Test Forum: DC July 30, 2025 Washington DC Join us at the NI Test Forum as we explore the future of test and measurement in an increasingly complex engineering landscape. As demands for faster, smarter, and more flexible testing grow, this forum offers a deep dive into NI’s latest hardware and software innovations designed to streamline validation workflows, reduce development time, and boost data reliability across a range of industries. Throughout the day, you'll have the chance to connect with industry experts, get hands-on with NI platforms like PXI, CompactDAQ, and mioDAQ, and see real-world demos of cutting-edge test systems in action. Topics include test automation, real-time data acquisition, and scalable solutions for Aerospace & Defense, Energy, and Semiconductor & Electronics applications—covering everything from RF testing for radar and SatCom to high-throughput semiconductor validation. Cyth Systems will be there! Ask us how our team helps accelerate automated test projects using NI tools, and we’d love to chat about how we can support your engineering goals. Register here: https://events.ni.com/profile/web/index.cfm?PKwebID=0x150576abcd&source=cyth

To ensure we provide the best products & integration services to our customers, we are strategically aligned with the world’s top test & technology companies. COMPANY Technology Partners Home > Company > Technology Partners We are strategically aligned with some of the world’s top test and technology companies to bring the best technologies to our clients projects. Meanwhile, these companies depend on Partners like Cyth to integrate their products into complex applications in many industries. Their trust and certification of us makes us a trusted partner for YOU and for THEM so that together WE can bring solutions to life as a team. NI (National Instruments) Certified Integration Partner Authorized Distributor The NI Alliance Partner program certifies companies who are qualified to design systems using NI Products and ecosystems. The Alliance Partner Network is a program for third-party companies who provide businesses with complete solutions and based on NI Products. From design through integration, consulting, and training, NI Alliance Partners are uniquely equipped to solve the toughest engineering challenges. Cognex Machine Vision Partner Cognex is a world leading provider of machine vision systems. As a solution partner for Cognex smart and industrial camera lines, Cyth has a long history of assisting clients in overcoming unique applications. Ranging from barcode reading to part and defect identification, you can be sure that your needs will be met with an industry expert. Keyence Solution Partner With multiple years of experience working alongside Keyence to integrate their unique product lines, Cyth is here to support your needs to automate a solution. Whether you’re looking to do defect detection or guide assembly lines, our goal is to eliminate errors and drive down cost. Edmund Optics Vision Integration Partner As a Vision Integration Partner (VIP), Cyth has teamed up with Edmund Optics to make integrating machine vision optics, illumination, and hardware easier than ever before. With personalized onsite system integration, customers will witness the success of their vision system. Contact Cyth See our Customers

Project Case Study Precision Motor Controls Used to Prototype an Electronics Recycling Kiosk Aug 28, 2023 36cf45c7-7f71-4ff3-9dc9-9c692b864072 36cf45c7-7f71-4ff3-9dc9-9c692b864072 Home > Case Studies > Electronics Recycling Kiosk The Challenge The parent company of an electronics recycling kiosk approached us with the need for the development of their first-generation kiosk prototype. The Solution Using precision motors, LabVIEW motor control architectures, a camera, and a custom light array we were able to develop the client’s first-generation kiosk ready for use. The Story//The Cyth Process The electronics recycling kiosk is a standalone kiosk that directs customers through a series of prompts. These are directives that use customer interaction to help determine: o The phone/device’s model – using machine vision identification software paired with a camera. o The device’s health – the customer is fed a power chord they connect. The device’s electrical consumption is tested. o The state of the screen (cracked or not) is assessed through the camera’s visual inspection. These are achieved by the kiosk accepting the phone from the customer through a trapdoor and running tests and measurements on the device. After the device inspection process is complete the customer is given the final decision as to whether they want to sell their device to the kiosk for the determined value of the device. The sale of a device to the kiosk enables old/unused phones and devices to be refurbished for resale or responsibly recycled for parts. System Order of Operations To begin, the customer prompts the kiosk by touching the screen. The kiosk opens a trap door to allow the customer to place a single phone/device into an opening. The kiosk determines the phone’s model, assesses the device’s health, and determines the state of the screen (cracked or not). The trap door then opens and gives the customer the respective power cable (Apple, micro-USB, or USB-C) to plug into the phone. The trap door then closes once again as a low-level power on, and a power consumption test is run on the phone. Lastly a camera is used to assess the health of the screen and any cracks that may be present. The kiosk then opens the trap door and prompts the user with the phone/device’s assessed value. The user is given a choice to sell their device to the kiosk or keep it. If a sale is chosen: the phone is deposited into the kiosk storage. If a sale is not chosen: the customer is prompted to take their phone/device. Technical Details The kiosk’s assessment of the phone was performed using a custom linear stage and lightbox. The linear stage tilts the platform on which the phone/device sat using a stepper motor and motor controller. The customer’s device is side-lit using high-power light-emitting diodes (LEDs). This illuminates the device’s screen and enables a camera with machine vision algorithms to assess the screen’s health and determine the phone/device model. The cable feeder uses a programmed stepper drive to deliver the correct power cable to the customer. It feeds the cable and draws it back into a holding slot when required. The cable feeder was designed to be modular so that upon the cables wearing out they could be easily serviced. All motor control software was programmed using LabVIEW to correctly fulfill the kiosk user experience. Technical Specifications 2 x Applied Motion Stepper Motor & Stepper Drive 1 x Applied Motion Linear Actuator 1 x NI CompactDAQ-9174 Chassis 1 x Dell Inspiron Industrial PC 1 x Basler 5MP, 17fps, Area Scan, Color Camera 1 x Edmund Optics 16mm, 300-2000mm Primary WD, HP Series Fixed Focal Length Lens 1 x Custom Light Fixture (Polypropylene Sheet) 1 x Lighting Control Relay 1 x LED Light Cluster 1 x High-Power Compact Projector 1 x MES 2 wire Door lock Actuator (Trapdoor Lock) Talk to an Expert Cyth Engineer to learn more

The NI sbRIO features a real-time processor running the NI Linux Real-Time operating system, ensuring deterministic performance for embedded applications. < Back What is Single-Board RIO (sbRIO)? Previous Next

As NI’s only Authorized Distributor & Systems Integration Partner, we are excited to announce that we have dedicated resources to support educators & students Exclusive Academic offers for LabVIEW and NI Products Renew your LabVIEW licenses to access campus-wide discounts, support, and special student opportunities only available from Cyth Systems Get Limited Time Offer As NI’s only Authorized Distributor and Certified Integration Partner, we have dedicated resources working to deliver new and exclusive benefits for academia! Check out the special offers below and sign up now to unlock exclusive benefits! Others Exclusive Academic Offers NEW Cyth Exclusive 2025 LabVIEW Bundle Discounts Free Official LabVIEW Training Included LabVIEW Project Code Assistance Career Services, Factory, and Project Tours Experienced Tech Support Included with Licenses & Hardware Discounts Hardware Bundles for Classroom & Research Projects "Working with Marty... wonderful!" "Working with Marty through the transition to distribution has been wonderful!" M.L., Buyer, Sunnyvale, CA Aircraft Manufacturer, DoD Prime Contactor Oct 2023 Sign up today to receive Cyth's Exclusive "LabVIEW Renew" Bundle Pricing. Reserve Now! NEW LabVIEW License pricing and discounts only available from Cyth Systems! We analyze your license usage and provide exclusive NEW pricing bundles and discounts, plus Technical Support and benefits for Students and Professors. Renewing your licenses later in the year? Sign up now to reserve your pricing!!! Academic Offers Web Form Sign Up today to lock in EXCLUSIVE Special Pricing Analyze your LabVIEW License needs & usage. Lock-in Bundle Discounts. Receive Tech Support with purchases. Other Exciting offers available only from Cyth Systems Cyth's LabVIEW Starter Kit - Curriculum, Intro, and self-paced challenges for learners (COMING SOON). Code Architecture & Mentoring. Student Virtual tours of factories using LabVIEW. Walk-thru of real active LabVIEW industrial projects. Grant Programs for startups and spinoffs. Let us hear your voice! You have a voice and an industry professional in your corner! Let us hear your ideas, wishes, concerns, or complaints. We can be your direct advocate to NI. How can we help? Get Limited Time Offer Register your interest today to reserve your special pricing. Let us know if you want us to reach out! First Name Last Name Email [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup] How can we help you? Get Started

The LabVIEW Core 3 Course introduces you to structured practices to help you design, implement, document, and test LabVIEW applications.  LabVIEW Core 3 Training Course Start Date | End Date Duration ENROLL < Back NI Course Overview The LabVIEW Core 3 Course introduces you to structured practices to help you design, implement, document, and test LabVIEW applications. This course focuses on developing hierarchical applications that are scalable, readable, and maintainable. The processes and techniques covered in this course help you reduce development time and improve your application stability. By incorporating these design practices early in your development, you can avoid unnecessary application redesign, increase VI reuse, and minimize maintenance costs. NI Course Objectives Leverage the LabVIEW Style Guidelines and choose an appropriate software development process to create an application Use LabVIEW Project Libraries and Project Explorer tools to organize your application Use frameworks and message handles to create a multiloop application Create and test a custom UI and ensure usability with sufficient user documentation Leverage modular code and develop test cases to maintain large applications NI Course Details Duration: Instructor-led Classroom: Three (3) days Instructor-led Virtual: Four (4) days, five-and-a-half-hour sessions On-Demand: 6.5 hours (exercises as a supplement) Audience: LabVIEW and Developer Suite users who need to increase performance, scalability, or reuse, and to reduce application maintenance costs LabVIEW users pursuing the Certified LabVIEW Developer certification LabVIEW users who have taken the LabVIEW Core 1 and Core 2 courses Prerequisites: LabVIEW Core 1 Course and LabVIEW Core 2 Course or equivalent experience NI Products Used: If you take the course On-Demand: LabVIEW 2022 Q3 If you take the course in an instructor-led format: LabVIEW 2022 Q3 Training Materials: Virtual instructor-led training includes digital course material that is delivered through the NI Learning Center NI virtual instructor-led training is delivered through Zoom, and Amazon AppStream/LogMein access is provided to participants to perform the exercises on virtual machines equipped with the latest software Cost in Credits: On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits Public virtual or classroom course: 30 Education Services Credits or 9 Training Credits Private virtual or classroom: 210 Education Services Credits or 60 Training Credits NI Course Outline LESSON OVERVIEW TOPICS Exploring LabVIEW Style Guidelines Configure the LabVIEW environment and follow LabVIEW style guidelines to develop an application. Configuring LabVIEW Environment Using LabVIEW Style Guidelines Designing and Developing Software Applications Identify an appropriate software development process for a given project and derive a high-level flowchart that can be used to guide subsequent design and development. Exploring Principles of SMoRES from LabVIEW Perspectives Software Development Process Overview Gathering Project Requirements Task Analysis Organizing LabVIEW Project Create LabVIEW project libraries and explore LabVIEW classes to organize the code. Using Libraries in LabVIEW Project Introduction to LabVIEW Classes Using Project Explorer Tools and Techniques Use Project Explorer tools and techniques to improve the organization of project files and resolve any file conflicts that occur. Using Project Explorer Tools Resolving Project Conflicts Creating Application Architecture Design applications leveraging multi-loop architecture techniques. Generating User Events Exploring LabVIEW Frameworks Exploring Framework Data Types Architecture Testing Selecting Software Framework Leverage frameworks and message handlers to design the LabVIEW application. Queued Message Handler Delacor Queued Message Handler Channeled Message Handler Using Notifiers Exploring Actor Framework Creating User Interface Design and develop a custom user interface that meets LabVIEW style guidelines. Exploring User Interface Style Guidelines Creating User Interface Prototypes Customizing User Interface Extending User Interface Ensuring Usability of User Interface Create sufficient user documentation, as well as initialize and test the user interface to ensure the usability of the application. Customizing Window Appearance Creating User Documentation User Interface Initialization User Interface Testing Designing Modular Applications Use modular code in a large application and explore guidelines for making large applications more maintainable. Designing Modular Code Exploring Coupling and Cohesion Code Module Testing Develop test cases that can identify the largest number of errors in an application. Code Module Testing Integration Testing Enroll

Home Compact DAQ (cDAQ) Chassis Data Acquisition Products Download DAQ, Industrial PXI Download DAQ, PXI, Simultaneous DAQ, PXI, High Performance DAQ, PXI, Value DAQ, Desktop PCI DAQ, USB Download DAQ, USB, Multifunction DAQ, USB, High Speed DAQ, USB, mioDAQ Compact DAQ (cDAQ) Family Download Compact DAQ (cDAQ) Chassis Compact DAQ (cDAQ) Modules Real-Time & Embedded Download CompactRIO (cRIO) Family CompactRIO (cRIO) Chassis CompactRIO (cRIO) Modules Download Single-Board RIO Download sbRIO Main Boards sbRIO Mezzanine Boards sbRIO Accessories PXI Platform Download PXI Chassis PXI Controllers PXI Modules Download PXI Data Acquisition Download PXI, DAQ, Simultaneous PXI, DAQ, High Performance PXI, DAQ, Value PXI Oscilloscopes PXI Digital Multimeters Industrial Instrumentation Download Digital Multimeters (DMM's) Download DMM, PXI Oscilloscopes & Digitizers Download Oscilloscopes, USB Oscilloscopes, PXI Oscilloscopes, Desktop PCI Oscilloscope Accessories Digitizer, PXI, High Performance Digitizer, PXI, Simultaneous Compact DAQ (cDAQ) Chassis CompactDAQ (cDAQ) chassis provide the structural framework for connecting modules, allowing for customization and expansion based on the needs of the application.

In this workshop, design, configure, & deploy your first embedded system. Learn to use NI's LabVIEW & reconfigurable I/O HW to bring your products to life. Build Your Own Embedded System Bring your products to life In this hands-on event, learn how to use LabVIEW and NI's reconfigurable I/O hardware to design, develop, and deploy your own control and monitoring systems. Upcoming events : BYOES, October 14th-17th - San Diego, CA Attendee Registration First Name Last Name Email [attributer-channel] [attributer-channeldrilldown1] Event Date & Location [attributer-channeldrilldown2] [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup] Save My Seat Thanks for submitting! Please check your email for confirmation. Who should attend this event? Engineers seeking to expand their embedded design knowledge and core LabVIEW skills for Real-Time and FPGA-based applications. Engineers looking for continuing education with NI tools from experience embedded application developers. What to expect Half-day hands-on seminar covering intermediate-to-advanced concepts associated with the RIO hardware platform and LabVIEW Real-Time and FPGA modules. Design, develop, and deploy an embedded software architecture covering I/O integration, data communication, and UI concepts Sponsored by: Explore the products EMBEDDED CONTROL & MONITORING Case Study Portfolio sbRIO-Based Turbine Monitoring Enables Remote Support CompactRIO Enables Undergraduate Power Electronics Education Robotic Automation Triples Sample Preparation Throughput Production Capacity up 350% with Automated Dispensing Hardware-Timed Automation Accelerates Gas Meter Testing Micron-Scale Inspection via Precision Vision & Motion Millisecond Control for Simulating Human Lung Behavior Precision Control System Advances Global Health Biotech Startup Accelerates Funding with Scalable Reference Design 1 2 3 4 5

Home Compact DAQ (cDAQ) Family Data Acquisition Products Download DAQ, Industrial PXI Download DAQ, PXI, Simultaneous DAQ, PXI, High Performance DAQ, PXI, Value DAQ, Desktop PCI DAQ, USB Download DAQ, USB, Multifunction DAQ, USB, High Speed DAQ, USB, mioDAQ Compact DAQ (cDAQ) Family Download Compact DAQ (cDAQ) Chassis Compact DAQ (cDAQ) Modules Real-Time & Embedded Download CompactRIO (cRIO) Family CompactRIO (cRIO) Chassis CompactRIO (cRIO) Modules Download Single-Board RIO Download sbRIO Main Boards sbRIO Mezzanine Boards sbRIO Accessories PXI Platform Download PXI Chassis PXI Controllers PXI Modules Download PXI Data Acquisition Download PXI, DAQ, Simultaneous PXI, DAQ, High Performance PXI, DAQ, Value PXI Oscilloscopes PXI Digital Multimeters Industrial Instrumentation Download Digital Multimeters (DMM's) Download DMM, PXI Oscilloscopes & Digitizers Download Oscilloscopes, USB Oscilloscopes, PXI Oscilloscopes, Desktop PCI Oscilloscope Accessories Digitizer, PXI, High Performance Digitizer, PXI, Simultaneous Compact DAQ (cDAQ) Family CompactDAQ (cDAQ) systems are modular and highly customizable, providing flexibility to connect a wide range of sensor modules for any data acquisition need. Compact DAQ (cDAQ) Chassis CompactDAQ (cDAQ) chassis provide the structural framework for connecting modules, allowing for customization and expansion based on the needs of the application. Compact DAQ (cDAQ) Modules CompactDAQ (cDAQ) modules are the functional units that perform the data acquisition, offering a range of options including analog input, output, and digital communication.

Project Case Study Highly Dynamic Steering Test Bench with NI VeriStand, LabVIEW & PXI Mar 26, 2024 94f245af-d062-46d9-bca5-16c7c568abb8 94f245af-d062-46d9-bca5-16c7c568abb8 Home > Case Studies > *As Featured on NI.com Original Authors: Marc Scherer, ITK Engineering AG Edited by Cyth Systems Mechanical structure of the steering test bench from ITK. The Challenge The requirements for testing steering systems have increased enormously. Along with mechanical tests, highly dynamic tests of electrical steering systems on test benches are now common and are increasingly being performed under realistic conditions. Additional requirements result from the use of active test objects with their own actuators, whose behavior is strongly influenced by the contained ECU. The Solution ITK Engineering AG (ITK) has delivered a highly dynamic steering test bench for realistic testing to an Asian automobile manufacturer. It features full automation based on National Instruments (NI) PXI, VeriStand and TACware®, ITK’s software for test bench automation, developed with LabVIEW and LabVIEW Real-Time. Left: Overview of the utilized software functions of VeriStand, Right: Data from high dynamics test. A Highly Dynamic Test Bench for Testing Electric Power Steering Systems To minimize costly road tests with test vehicles, test benches must enable realistic testing. For one of their customers, ITK therefore developed a highly dynamic test bench for electric power steering systems that enables haptic tests in addition to automated and simulation-based test sequences. To create realistic test conditions, the same physical quantities are applied to the steering system on the test bench as would occur during test runs with the system installed in a test vehicle. A hydraulic load actuator generates forces or assumes positions that act on the steering system and are equivalent to real street loads. Target force values, for example recorded during previous test drives, can be reproduced on the test bench and controlled dynamically over a range up to 25 kN. To enable realistic testing and fulfill stringent requirements for dynamics and precision, highly effective technologies such as synchronized hydraulic cylinders and mechanical structures with optimized vibration characteristics are used. Furthermore, automated steering wheel angles and torques are regulated by a steering machine. If necessary, steering motions can also be performed manually with a steering wheel (“Driver-in-theLoop”). This allows haptics and subjective driving feel to be evaluated directly on the test bench. (Figure 1) Test Bench Automation Due to the high requirements for performance and real-time capability, ITK chose the powerful NI PXIe-8135 system as the run-time platform for test bench automation. Communication with the actuators and sensors of the test bench was implemented with the versatile multifunction NI X Series PXIe-6363 data acquisition modules and NI Industrial Communications for EtherCAT. NI VeriStand provides the basic software environment for real-time based tests in the test bench automation. With its integrated functions for test sequence definition and execution using the NI Stimulus Profile Editor, integration of simulation models and capability for user customization of the GUI during operation, VeriStand hit the right buttons with the developers. VeriStand’s open architecture was a key factor in the selection process. This allowed additional LabVIEW elements and functions to be integrated and extended in the VeriStand workspace (user interface). Also, functions needed in the real-time system could be added with LabVIEW Real-Time in the form of an asynchronous custom device. Precise Control for Realistic Testing The quality of test bench feedback control is crucial for realistic testing. In addition to the highest possible control accuracy, target values must be regulated quickly and efficiently. Furthermore, it must be possible to adjust test bench feedback control design, for example for different steering system variants, flexibly and with low user effort. The main sources of the high control system requirements for the steering test bench are the interaction between angle feedback control (steering machine) and force feedback control (load actuator) and various non-linear effects, such as stiction and mechanical play. The negative influence of angle feedback control on force feedback control is amplified by the active power assist of the steering system under test. Combined with increased dynamic characteristics of the control loop, this can easily lead to instability. Suitable feedback control algorithms with optimal parameters, minimal signal latencies and 20 kHz control sampling rates provide effective compensation for disturbances, cross-coupling and non-linearities, as well as extremely high stability. Figure 3 shows a test run with angle and force control under highly dynamic conditions. In this case the control target values came from measurements in a real vehicle, but they can also be calculated online using a simulation model. In that test mode the test bench would be “in-the-Loop”, which means in the same control loop as the steering system and a vehicle model. To ensure test bench feedback control performance even with new steering variants or with altered control loop transfer characteristics, test bench operators can automatically redesign the feedback controller, including controller parameters, on the test bench without any need for expert knowledge. This significantly reduces setup times. This methodology is provided by ITK’s in-house developed automation solution TACware®. After just nine months of development time, ITK delivered a turnkey custom test bench for highly dynamic, realistic testing of electric power steerings. It is built on the combination of NI PXI, VeriStand and the TACware® software, which is based on LabVIEW and LabVIEW Real-Time. Along with basic tests such as manual target value setting and automated test sequences, steering system testing “in-the-Loop” and “Driver in-the-Loop” are equally possible. In addition, the integrated methodology for automated feedback controller design and parametrization significantly reduces setup times for changing test object variants or modification of constraints. Original Authors: Marc Scherer, ITK Engineering AG Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Project Case Study Pacemaker Validation System Using LabVIEW and PXI Mar 27, 2024 5a4f6cc5-6d58-46f1-a9c3-15f188a45002 5a4f6cc5-6d58-46f1-a9c3-15f188a45002 Home > Case Studies > *As Featured on NI.com Original Authors: Park Jong-Dea, System Integration Dept. Ltd. INNOTEMS Edited by Cyth Systems Pacemaker Validation System The Challenge To develop a high-precision test of pacemakers post manufacture to ensure their reliability before they are given to patients. The Solution Using the NI PXI hardware platform and LabVIEW software we were able to simulate input and outputs signals to automated the validation of pacemakers. Pacemaker When the beating of the heart is abnormal (for example too slow) or irregular, a device can keep the heart rate normal through periodic electrical stimulation. Different types of pacemakers include body catering, body embedded, or inductive. A pacemaker is composed of a heart rate generator and an electrode lead. The heart rate generator may contain the electronic circuit and the battery to control the electrical stimulation at regular intervals. The electrode lead is an electric signal generated in the pacemaker that passes to the heart. The Configuration of the Pacemaker Simulator System Through simulating biological input signals to the pacemaker using our control software, one can monitor the output signals the pacemaker gives. This shows the functionality of the pacemaker and if it reacts correctly according to each signal it is given. which outputs a biological signal analog output channel, and measures a feedback signal analog input channel. Arrhythmia—The rhythm of the heart rate is irregular status. Bradycardia—The heart rate is beating slower than normal. Tachycardia—The heart rate is beating faster than normal. Left: Pacemaker Test Configuration, Right: NI PXI hardware used to perform validation test. The Configuration of the Pacemaker Test System Display the electrocardiogram that occurs in the heart. Pacing threshold, refractory period, heart rate, and coordinated pacing can set the escape interval and impedance. Data logging so that data can be stored on any heartbeat. This feature has been added. And selecting the type of pacemaker like AAI, VVI, and DDD is possible. AAI: Paces and senses in the atrial. VVI: Paces and senses in the ventricle. A sensed beat inhibits the pacing stimulus (demand pacing). DDD: Paces and senses in both chambers. A sensed beat in the ventricle inhibits both the ventricular and atrial pacing stimulus and triggers a ventricular pacing stimulus after a programmed AV interval. Pacemaker Function Tests Inspection of the pacemaker. Except for lead and electrode, inspection items are processed by the Pacemaker Performance Evaluation Manual. Inspection items Amplitude, pulse, length, rate, interval of pulse Sensitivity Input impedance Detection refractory period, beating refractory period The software configuration of the pacemaker test system was built with TestStand, and each test sequence was constructed by function. Detailed unit test software was written with LabVIEW, and inspection items and the inspection method were carried out according to standards such as IEC 62304 and ISO 14971. Original Authors: Park Jong-Dea, System Integration Dept. Ltd. INNOTEMS Edited by Cyth Systems

Project Case Study High-Voltage Dielectric Test System for Magnetic Couplers with CompactRIO Sep 17, 2024 739c8cee-049b-43dc-9a1e-693fb79ecc04 739c8cee-049b-43dc-9a1e-693fb79ecc04 Home > Case Studies > *As Featured on NI.com Original Authors: Flavio Floriani, INTEK S.p.A. Laboratory, Sector Manager Edited by Cyth Systems High voltage simultaneous test of 50 magnetic couplers using CompactRIO. The Challenge INTEK needed to invent and build a fully automatic measurement system that could test up to 50 magnetic couplers simultaneously while they are subjected to a high voltage (up to 8 kV rms) and placed in a 150 °C oven. The system also needed to record the mean time to fail and monitor the overvoltages generated when a device breaks. The Solution INTEK used the CompactRIO platform with FPGA technology and LabVIEW to develop a system with four functional levels. The system combines the power of NI hardware with the flexibility of LabVIEW. The use of a magnetic coupler, or the device under test (DUT), is similar to that of an optocoupler. It must guarantee the insulation between two points at different potentials to satisfy the security standard (SOT-24 package). A test required in the reference standard is to estimate the mean time to fail (MTTF) by applying a 50 Hz sinusoidal high voltage and record the time to breakdown. Once a consistent number of data is collected using a statistical technique, we can parametrize a Weibull distribution and predict lifetime. When a failure occurs, the DUT looks like a short circuit (an internal discharge path shorts the two points), and when the DUT is in normal condition it looks like a small capacitor. Magnetic Couplers (Credit: https://www.magnetictech.com/magnetic-couplings/ ) Right: Magnetic Coupler Test LabVIEW User Interface After three years of study on how to manage the AC high voltage (up to 8 kV rms) on these small DUTs (simpler 15-position equipment have run continuously for two years and collected a lot of data), we can focus on the main issues emerging from these kind of tests: - How to cut the current that flows through a DUT when it fails, without generating an extra voltage (which could damage all the other DUTs) - How to use low voltage components to have small equipment dimensions and save on cost - How to manage wiring efficiently and safely merge high-voltage circuits with low-voltage circuits Combining the result of these studies with NI technologies, we have developed a system architecture that includes a cRIO-9035 controller and two NI-9205 analog input modules to read the current in each of the 50 circuits and read the high voltage. We acquired the current by reading voltage drop on shunt resistors and acquire the voltage by reading the output of a customized high-voltage divider developed specifically for this application. The system also includes two NI-9476 digital output modules to command the 50 relays that cut off the current when a breakdown occurs. We also used an NI-9217 RTD module to acquire the temperature inside the oven through a PT100. We developed a four-level software architecture using LabVIEW. An FPGA runs the part of code that detects the fault current and commands the cut-off relay. Because we need speed and determinism, the FPGA is perfect for this application. With some optimization, we finally read the RMS fault current (calculated on 60 ms perdiod) and ensured the fault clearing in less than 100 ms. It is important to clear the fault quickly because the current damages the DUT and the customer needs to analyse them after the test to study and improve the technology. We developed a kind of scope with a pre-trigger function and ran it in a parallel loop. Every 100 ms, the scope controls the insantaneous maximum voltage value and eventually records and saves the waveform if the threshold alarm is exceeded. We can easily edit all the scope parameters such as pre-trigger time, sample rate, and more in the front panel. We used DMA and FIFO structures to have high speed and share data in the project. We also monitored the oven temperature with a lower sample rate in another parallel loop and compared with an alarm threshold. Every time a DUT fails, the FPGA VI changes the state of a shared variable in the project and the VI detects it running on the real-time enviroment. By using the real-time features, we could easily create a VI that automatically acquires the time to fail and saves it directly on a file on the CompactRIO system. This makes it easy to download that file during or at the end of the test and have all the required information. The real-time VI is an auto-running executable on the system and has no user interface, which ensures stability. We created another VI inside the project and converted it to an EXE file. This VI can be run on any PC connected to the same LAN network to control the state of the whole system (alarms, state of DUT, overvoltages, temperature, and more). The technicians can easily monitor the test status every day or when needed (a test session can go on for longer than two months). It can be used also during the debug operations. We also created a VI with the channel status only and converted it to a web page. The customer can connect directly to the system and know the status of the DUT, but cannot interfere with the apparatus settings. Original Authors: Flavio Floriani, INTEK S.p.A. Laboratory, Sector Manager Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Project Case Study Arbitrary AWG for Next-Generation Semiconductor Manufacturing Dec 8, 2025 12f87aab-9779-4c05-a4da-bbcae627b605 12f87aab-9779-4c05-a4da-bbcae627b605 Home > Case Studies > Semiconductor equipment manufacturer achieved next-generation etching capabilities through advanced waveform generation and control built with NI PXI and LabVIEW FPGA. Custom Advanced Arbitrary Waveform Generator (AWG) Project Summary Semiconductor equipment manufacturer achieved next-generation etching capabilities through advanced waveform generation and control built with NI PXI and LabVIEW FPGA. System Features & Components High-speed arbitrary waveform generation with complex waveform capabilities enabled the generation of waveforms with 1,000+ samples per millisecond (>1MS/s) Highly-synchronized waveform control and oscilloscope measurements for coordination of digitized signal measurement Streamlined vacuum chamber integration for semiconductor wafer processing applications Outcomes Next-generation semiconductor chip manufacturing enabled through high-precision waveform control Widespread customer adoption in every major silicon wafer fabrication site in the world Sustainable innovation enabled by robust and flexible system architecture built on NI PXI and LabVIEW FPGA Technology at-a-glance PXIe-1071 Chassis NI PXI-5441 Arbitrary Waveform Generator PXIe-5105 Oscilloscope PXIe-8822 Embedded Controller PXI-7852R FPGA Module LabVIEW FPGA Silicon Wafer Etching Almost every single modern electronic device contains at least one semiconductor chip. Smartphones, TVs, washing machines and cars depend on the precise and complex control of electrical signals that semiconductors provide. Silicon wafers are a foundational material from which many semiconductor technologies are made. Part of the semiconductor manufacturing process includes etching microscopic, 3D patterns onto these silicon wafers to form electronic devices like transistors, capacitors and interconnects that are critical for the function of the manufactured microchip. The level of precision with which these electronic components are etched into the silicon directly impact the performance of the microchip, making the uniformity and accuracy of these etched features critical at the nanometer scale. Complex Waveform Requirements A major semiconductor equipment manufacturer was facing significant limitations with their equipment’s ability to support the manufacture of next generation chips. Their semiconductor manufacturing tools were deployed into many silicon wafer fabrication sites and their manufacturing customers were continuously coming up against the limitations of their systems, putting their market position and market share at risk. They needed to upgrade the simple signal generators in their current solution to waveform generators capable of delivering the complex waveforms necessary to precisely-control the microscopic piezo coils central to their unique etching process. To maintain and expand their customer base, they required a solution capable of: Precision Control : Their equipment needed to drive microscopic piezo coils at rates of 2,000-100,000 times per second, requiring advanced control capabilities with arbitrary waveform programming and thousands of sample points per period. Complex Waveform Requirements: Simple waveforms like sine, square and triangular signals were not sufficient for controlling the complex etching operations their customers required; they needed the capability to customize every single point within the waveforms controlling their piezo coils. High-Speed Synchronization: The waveform generator required tight coupling with oscilloscope measurements to synchronize digitized signal acquisition Global Deployment: The solution needed to integrate seamlessly with semiconductor manufacturing equipment deployed worldwide Customized Advanced AWG The global semiconductor equipment manufacturer approached Cyth Systems for help improving their etching capabilities. Cyth’s expertise developing complex, highly-synchronized control systems and custom waveform generator solutions enabled them to rapidly iterate on the customer’s existing solution to provide high-performance waveform generation, measurement, and control. The development process of the Arbitrary Waveform Generator (AWG) included three iterations: 1st generation: Replicate simple, existing waveform generation capabilities on NI PXI platform 2nd generation: Synchronize AWG pulses with oscilloscope measurements to ensure accurate digital signal data acquisition 3rd generation: Further refine synchronization between waveform pulses and oscilloscope measurements to enable the driving of piezo coils in the upper frequency ranges (up to 100,000 times per second) Left: 2nd Generation Arbitrary Waveform Generator, Right: 1st Waveform Generator. The AWG system was built to perform sophisticated waveform analysis, generation, and control without operator intervention: Collected waveforms, measured their length and characteristic shape Determined the optimal number of points required to accurately describe each waveform Set appropriate sampling rates based on waveform complexity Calculated the precise number of points needed to achieve target sample rates The equipment manufacturer required 1,000+ samples per millisecond (>1MS/s) to accurately characterize the waveforms to be generated; the samples were then upscaled to 200MS/s to ensure smooth signal quality as the waveform is output. Learn about LabVIEW FPGA Programming The waveform generator was tightly coupled with an NI PXI oscilloscope in a closed-loop approach to enable real-time system optimization. The synchronization in the measurements of digitized signals ensured precise timing coordination between waveform output and measurement feedback. Graphs comparing the outputs of a simple waveform generator vs. an arbitrary waveform generator Leveraging the NI PXI platform with LabVIEW FPGA software, Cyth created a sophisticated Arbitrary Waveform Generator (AWG) capable of supporting next-generation semiconductor equipment with dramatically improved high-speed and high-sample rate waveform control. For the semiconductor equipment manufacturer, the greatest differentiators of the NI platform were: Measurement integration: Synchronized waveform generation and oscilloscope measurement in a single platform Firmware flexibility: LabVIEW-based algorithms enable rapid parameter adjustments and optimization Hardware reliability: NI PXI platform provides industrial-grade reliability for 24/7 manufacturing operations Compact footprint: 4-slot PXI chassis delivers advanced capabilities in space-efficient design System PXI Card Specifications Use PXIe-1071 Chassis 4-Slot Chassis PXI Chassis NI PXI-5441 43 MHz, 100 MS/s AWG, 16-Bit, Onboard Signal Processing Arbitrary Waveform Generator PXIe-5105 60 MHz, 8-Channel, 12-Bit PXI Oscilloscope High Speed & High Sample Rate Waveform Measurement PXIe-8822 Embedded Controller – FPGA-Based I/O, 2.4 GHz Quad-Core Processor PXI Controller Data Logging & Control PXI-7852R Virtex-5 LX50 FPGA, 750 kS/s Data Logging & Control Sustainable Innovation The Arbitrary Waveform Generator delivered transformative capabilities that positioned the equipment manufacturer for next-generation semiconductor manufacturing leadership. The most impactful system performance improvements were: Advanced waveform control: Transition from simple signal generation to arbitrary waveform programming with thousands of sample points per period Synchronized measurement: Tight integration between waveform generation and oscilloscope measurement for closed-loop optimization Scalable sampling rates: Flexible sampling from >1 MS/s for analysis up to 200 MS/s for output generation The overall system improvements enabled the customer to deliver: Global deployment capability: System integrated successfully across every major silicon wafer fabrication site worldwide Next-generation semiconductor manufacturing capabilities: Advanced waveform control capabilities support production of cutting-edge semiconductor devices Future-ready platform: Modular PXI architecture enables flexibility for continued system evolution and capability expansion The new, advanced capabilities fundamentally strengthened the semiconductor equipment manufacturer’s position as a leader in their space. The transition from simple signal generation to sophisticated arbitrary waveform generation and control enabled their equipment to meet the high precision requirements of next-generation semiconductor chip manufacturing. These modernized etching systems became a critical enabler for the semiconductor industry's continued advancement toward smaller, faster, and more efficient devices. These systems were built for sustainable innovation. The proven software architecture and modular NI PXI I/O enable continuous capability enhancement as semiconductor manufacturing requirements continue to evolve. Let's Talk

Cyth Systems, Inc. has years of experience delivering automation solutions. We offer LabVIEW & FPGA programming services, test stand design, vision, and more. SERVICES Automated Test Equipment Home > Services > Automated Test Systems Automated Test Systems BOOST your PRODUCTIVITY Automated Testing Engineering or Automated Test Equipment (ATE) provide a rapid and repeatable way to automate measurements or testing of your product. We offer product advice, training, or full system integration and turn-key ATE systems AUTOMATED TEST SYSTEMS Service Areas Automated Test Equipment for Manufacturing ATE Manufacturing subcategories ↑ Automated Test Engineering Automated Test Equipment Manufacturing Quality Control Production Test Final Test / End-of-line Test Whether integrating a system onto an existing line or creating something completely stand-alone, we can design an automated solution to suit your needs. Circuit Board Testing ATE PCBA subcategories ↑ Printed Circuit Board Assembly Test (PCBA) Circuit Board Functional Test In-Line Board Testing Bed-of-nails Testing Our engineers work closely with you to develop a fully customized test systems for circuit board assemblies, which can stimulate and measure every signal on the board to ensure proper assembly and proper function of the device under test. Measurement Automation ATE Measurement subcategories ↑ Design Verification & Validation V&V Benchtop interactive test R&D testing Design of experiments (DOE) We design partially or fully automated measurement systems that can generate signals, collect measurements, and analyze results for a variety of interactive tests and measurements. Measurement automation is most helpful for repetitive tests, or tests requirements that have a broad matrix of test conditions. Life Test & Reliability Equipment ATE Life & Reliability subcategories ↑ Life Test & Reliability Test Life Testing allows design teams to automate tests, perform actions, or collect measurement thousands or millions of times, which helps to validate your products design by simulating its entire life cycle. Highly Accelerated Life Test (HALT) goes one step further by simulating extreme stress, helping design teams can find weaknesses in a design and improve them. Shock & Vibration Test / Stress Testing Enviormental Testing HALT / HAAS Talk With an Engineer Our ATE systems are built on an unmatched PLATFORM All our Automated Test Systems are built on the PXI and DAQ platforms from National Instruments . They work with practically any 3rd party component, sensor, or device on the market, and can be automated using programming or non-programming solutions such as LabVIEW , TestStand , and FlexLogger . Industry-Defining PXI INDUSTRIAL INSTRUMENTS Industrial-Grade DATA ACQUISITION DEVICES REFERENCE DESIGNS and STARTER KITS for Projects Never start a project from scratch! Start your ATE system with our Plug-In Reference Designs and starter kits, which include the most common components, fixtures, software, and even the budget and schedule. Of course each reference is fully customizable to produce an Automated Test System to your specifications. Reference Design for ATE Systems Reference Design for Circuit Board Test Reference Design for Battery Test & Simulation Reference Design for Power Supply Test AUTOMATED TEST Project Examples Automated Battery QA Ensures Medical Device Reliability Robotic Automation Triples Sample Preparation Throughput CompactRIO Enables Automated Circuit Board Testing PCBA Functional Test and Device Verificational Test Scaled with Cyth PCBACheck Custom EMF Measurement Solution Doubles End-of-Line Test Throughput E-Bike Battery Testing and Validation Using BatteryFlex Circaflex & NI Single-Board RIO Power Syringe Lubrication Inspection Demo Hyundai Improves Production Test Time using PXI, LabVIEW, and TestStand Probing of Large-Array, Fine-Pitch Microbumps for 3D ICs 1 2 3 4 5

The NI CompactDAQ Chassis controls the timing, synchronization, and data transfer between NI C Series I/O modules and an external host. NI CompactDAQ Chassis NI Authorized Distributor and System Integration Partner Home > Products > CompacDAQ Chassis CompactDAQ Chassis CompactDAQ chassis control the timing, synchronization, and data transfer between C Series I/O modules and an external host. They feature USB, Ethernet, or WiFi connectivity and come in different slot counts for the right amount of I/O. Create customizable and cost-effective solutions for accurate benchtop measurements The CompactDAQ Chassis offers a rugged, flexible foundation for a CompactDAQ system. You can use multiple CompactDAQ chassis as part of a distributed measurement system and choose between time- and signal-based synchronization techniques. High- Accuracy, TSN-Enabled Measurements The CompactDAQ Chassis offers time sensitive networking, or TSN, which provides low-latency, deterministic communication on standard Ethernet. Hardware You Can Deploy in Harsh Environments The chassis’ rugged form factor—with an extended operating temperature range of -40 °C to 70 °C, 50 g shock, and 5 g vibration ratings—helps you deploy closer to your measurement and reduce the length of noise-prone sensor wires. CompactDAQ Voltage Measurement Bundle The CompactDAQ Voltage Measurement Bundle includes a chassis with a C Series Voltage Input Module with up to 32 channels for voltage measurements. CompactDAQ Temperature Measurement Bundle The CompactDAQ Temperature Measurement Bundle includes a chassis with the C Series Temperature Input Module with up to 32 channels for temperature measurement. CompactDAQ Sound and Vibration Measurement Bundle The CompactDAQ Sound and Vibration Measurement Bundle includes the C Series Sound and Vibration Input Module and a CompactDAQ Chassis. NI CompactDAQ Chassis Controls the timing, synchronization, and data transfer between NI C Series I/O modules and an external host. Feature Highlights: Platform: CompactDAQ

Battery Test and Battery Simulation platform for manufacturers of portable consumer, medical, and industrial electronics devices. BatteryFlex™ Battery Testing and Analysis Platform for Consumer, Life Science, and Industrial Markets Home > Solutions > BatteryFlex A FASTER, more EFFICIENT, and FLEXIBLE way to test device batteries. BatteryFlex is a platform for evaluation and characterization of a wide range of battery cells and battery packs used in electronic devices and small electronics. BatteryFlex relies on instrumentation in a PXI chassis platform, which allows for the addition of unlimited input or output signals, controls, or measurements. Combined with user-made sequence scripts and playback of real-world simulated load scenarios, the capabilities of BatteryFlex are defined by you. Evaluate and analyze battery performance Compare fitness for use of different batteries Generate or verify battery datasheet contents Playback charge/discharge/usage scenarios Long-Term or Accelerated Life Test Automated Stress Screening and Quality Test Extended Measurements (Optical, Temperature, etc.) Any other application defined by User Script Download BatteryFlex Datasheet STANDARD FEATURES STANDARD INSTRUMENTS STANDARD MEASUREMENT & TEST ACTIVITY STANDARD FEATURES High-Resolution, High-Speed Measurements PXI Platform Playback and Record Load Scenarios Data Logging, Analysis, and Storage Output to any format report or datasheet Thermal Monitoring and Measurement Safety Interlocks and shutdown 4-Quadrant SMU (±60V, ±3A, 100fA Meas) 7.5 Digit Multimeter (±3A, 1.8MS/s) Thermocouple or RTD Measurement Serial, CAN, I2C, SPI communication PXI Modular Architecture provides unlimited instruments, channels, and 3rd party devices available. Open Circuit Voltage (OCV), State of Charge Charge Discharge Scenarios and Load Simulation Power Cycle Test (PCT) Capacity (Static, Script, Pattern/Pulse) Leakage (FCT) High-Frequency EIS (2MHz) DC Internal Resistance (DCIR) AC Internal Resistance (ACIR) SPECIFICATIONS OPTIONAL FEATURES Digital Multimeter (NI PXIe-4081) Accuracy 7 1/2 Digits Voltage ± 1000 V Current ± 3 A Speed 1.8 MS/s Source Measurement (NI PXIe-4139) Number of SMU Channels 1 Voltage Range ± 60 V Current Range DC ± 3 A Pulsed Current Range ± 10 A Current Sensitivity 100 fA to 1µA Max DC Source Power 40 W Max DC Sink Power 40 W Settling Time (Current) <200 µs to <1100 ms Maximum AC Voltage 7.07 V RMS Maximum AC Current 7.07 mA RMS Chassis (NI PXIe-1092) Peripheral Slots 10 (7 Hybrid) Speed 24 GB/s DC output ± 12 V Module cooling Forced air Slot cooling capacity 82 W Thermal Chamber Integration 2D Color Machine Vision and IR Thermal Imaging Additional batteries and packs tested in batch or parallel test mode Customizable User Interface Why Cyth? Cyth Systems has over two decades of providing the technology and expertise you need to be successful on Automation, Measurement, and Controls projects. Our engineers will work alongside your team to design the system to meet your specifications. We develop your solutions with reduced risk, cost, and schedule. Need Battery Testing help or advice? First Name Last Name Email How can we help? [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup] Let's talk

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Packaged controllers are rugged, stand-alone systems with software, processing, and I/O for measuring, control, and monitoring. Build your system with NI. NI Packaged Controllers Hardware Products NI Authorized Distributor and System Integration Partner Home > Products > Packaged Controllers Packaged Controllers Packaged controllers are high-performance, rugged, stand-alone systems that combine customizable software with powerful processing and I/O for any measurement, control, or monitoring application. Packaged Controllers for Real-Time Systems The CompactRIO and Industrial Controller are packaged controllers designed to help you create real-time, stand-alone applications. Both products feature a user-programmable FPGA that you can program using the LabVIEW FPGA Module. Rugged and Industrial Options for Harsh Conditions Packaged controllers include options that are intended for use in hazardous environments. The Industrial Controller is particularly recommended for use in extreme conditions. PLATFORM MODULES AND CONTROLLERS Platform modules integrate with modular hardware platforms that allow you to combine different types of modules in a custom system that leverages shared platform features. NI offers three hardware platforms—CompactDAQ , CompactRIO , and PXI —though all platforms may not be represented in this category. Expansion Module for CompactRIO Expands the processor I/O from an NI controller to meet additional application requirements. Platform: CompactRIO Bus: Ethernet, USB-C CompactDAQ Controller Expands the processor I/O from an NI controller to meet additional application requirements. Platform: CompactRIO Bus: Ethernet, USB-C CompactRIO Controller Combines a processor running NI Linux Real-Time, a programmable FPGA, and modular I/O with vision, motion, and display capabilities. Feature Highlights: Platform: CompactRIO

Project Case Study Extending Plasma Lifespan for Fusion Science Using CompactRIO System With FPGA Mar 27, 2024 1fe8ed10-ef8c-44f6-90f3-96b9f23c0242 1fe8ed10-ef8c-44f6-90f3-96b9f23c0242 Home > Case Studies > *As Featured on NI.com Original Authors: Shuji Kamio, National Institute for Fusion Science, Department of Helical Plasma Research Edited by Cyth Systems The Large Helical Device, instrumental for plasma research, is controlled using NI CompactRIO hardware programmed in FPGA. The Challenge Sustaining confinement of a high-performance plasma at more than 10 million °F and 10 trillion/cc, which requires extremely complex processing during the experiment. The Solution Developing a steady-state plasma control system using CompactRIO with FPGA to sustain high-performance plasma an extended period of time. One of the most critical issues for the realization of the fusion reactor is sustaining high-performance plasma at a steady state and for a long duration. To achieve a steady-state fusion reactor, we must demonstrate the confinement of high-performance plasma and examine such physics as plasma-material interaction. However, high-temperature plasma has not yet been sustained longer than several minutes. Thus, we need to research and analyze the plasma behavior and the fusion reactor when the plasma is confined for a long duration. Figure 1 and Figure 2 show our experimental device, the Large Helical Device (LHD). Figure 1 provides an external view of the LHD and the numerous heating devices on it. Figure 2 shows one part of the inside of the LHD vessel. Inside the vessel, a plasma at a temperature of more than 10 million ˚F (20 million ˚C) is generated and sustained as a long-duration plasma. One of the important missions of the LHD is to sustain the high-temperature plasma at a steady-state. To sustain the plasma for a long period of time, we need to continuously supply plasma heating and gas fueling as required. When we supply less gas fuel, the plasma becomes thinner and vanishes. When we supply too much gas, the plasma vanishes either by cooling or by thickening. Heating plays an important role here. If the heating is not strong enough, the plasma becomes cold and vanishes. Maintaining the health of the devices while sustaining high-power heating (at megawatt levels) requires sophisticated heating technology. We collect and then measure data for the purpose of calculating solutions for gas fueling and heating power requirements. We need this procedure for feedback control and to sustain the ideal condition. For this, we must develop an integrated system we can use to control the plasma parameters. This type of complex control for the steady-state plasma is also important for the future fusion reactor. Left: Schematic View of the System Configuration, Right: Main Control Room and RF Heating Room for the LHD. The challenges for the success of a steady-state operation are stabilization of the plasma parameters and stabilization of the injection heating power. To stabilize plasma parameters, various observed information such as plasma density, temperature, and optical emission are important for feedback to the constant parameters. Using these parameters, we need the quantities of the gas fueling and the heating power to decide the next quantities for gas fueling and heating power. However, heating power control is difficult because it is greater than thousands of household microwave ovens. The voltage of the transmission lines exceeds 30,000 V, and accidental power reflection causes the transmitter to breakdown or the cooling water to leak onto the antenna head. These types of accidents sometimes cause terrible damage to the heating devices. Thus, in the past, we required two or three operators for complex monitoring and response. Our experiment on the LHD is a large science project. We cannot stop or delay the experimental schedule even when the system or the device encounters difficulties. We must replace the system immediately after a problem occurs. In that sense, FPGA suits this system because we can easily modify and copy with high reliability and performance. Stabilizing the plasma parameters and stabilizing the injection heating power are distinct challenges, which are also linked to each other. Therefore, we developed an integrated system using CompactRIO with FPGA. This empowered us to complete the complex operation, which includes the data collection, calculation, and control signal output, at high speed. Also, in our experiment we have two control rooms and many experiment operators in each room. The LabVIEW system we developed enables the operators to control the devices from both rooms. The GUI of the LabVIEW program makes operation intuitive. This system is very useful for inputting the target plasma parameters and for discussing strategies and approaches during the experiment. Thus, we could reduce the number of people involved in the operation, which means that responses to problems become quicker and more accurate. Furthermore, the operator can engage in another task during the experiment. The system also helps prevent unexpected equipment damage. This system’s fast interlocks prevented a critical accident on the heating devices. By developing this advanced control system, researchers can discuss with other experiment participants the plasma operation and related issues during the experiment, as seen in Figure 3. As a result of the CompactRIO system with FPGA, we have sustained high-performance plasma for more than 48 minutes at more than 10 million ˚F and 10 trillion/cc in an experiment that required extremely complex processing. This temperature is higher than the temperature on the surface of the sun. This total heating power of 3.4 GJ exceeded by more than three times the world record of 1.0 GJ set more than a decade ago. Original Authors: Shuji Kamio, National Institute for Fusion Science, Department of Helical Plasma Research Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

This guide explains the basics of load measurements and how different sensor specifications influence load cell performance in your application. < Back Measuring Load Key Sensor Fundamental Guide | Cyth Systems Sensor Fundamentals Previous Next

Cyth Systems supports and stocks National Instruments products and platforms. We work with engineers and buyers to design systems and fulfill and verify orders. Get the NI products you need without missing a beat Technical guidance and operational proficiency that your whole team can trust. The only NI Authorized Distributor with certified System Integration experience Get my Quote Supply chain proficiency Shipping and receiving team member NI LabVIEW+ Do more with NI's suite of test, measurement, and analytics software PXI chassis and modules Choose from a variety of device options, including best-in-class PXI modular instrumentation Supply chain proficiency Shipping and receiving team member 1/6 Browse Products Trouble getting the right test and automation products at the best price on time? Where quality and price meet Get quality products at optimal prices with flexibility for volume orders Guided product selection Get the information you need to select the right products and accessories for the job Vendor approval in hours, not days Approved vendor setup made simple with prepared company information and forms Future-proof your system Access up-to-date life cycle data to avoid costly redesigns Personalized order tracking Avoid the supply chain black box with updated lead time and shipping information Startup assistance Put your purchase to work with free startup assistance and engineering support Choose from a wide variety of NI devices and software tools to get your job done To play, press and hold the enter key. To stop, release the enter key. Explore NI Hardware Explore NI Software Buyers rely on Cyth everyday to fullfill their orders with reliability and care. Provide order details in an format Guaranteed list pricing (no markups) No hidden handling fees Simplified vendor approval process Get my Quote "Working with Marty was wonderful! He followed up promptly and eliminated my concerns about lead times" M.L., Buyer, Sunnyvale, CA Aircraft Manufacturer Engineers trust Cyth as a technically competent vendor of NI products Technical guidance on product selection from trained engineers Recommendations on accessories and system components Free startup assistance Ongoing technical support Schedule a Consultation "Josh helped me find a better system configuration for my project... and provided reference code to get my software design going in the right direction." P.B., Test Engineers, Industrial Electronics company Order Service Request a Quote or Submit Your Order Here Submit any format or file PDF, Excel, text, screenshot First Name Last Name Company Email [attributer-channel] [attributer-channeldrilldown1] How can we help? [attributer-channeldrilldown3] [attributer-landingpagegroup] Upload your order Upload File Upload supported file (Max 15MB) [attributer-channeldrilldown2] [attributer-landingpage] Submit

Project Case Study Automated Test System uses PXI to Validate Irrigation Control Panels Mar 27, 2024 f9d5d436-3df7-46dd-bbc4-79c5b354d7b3 f9d5d436-3df7-46dd-bbc4-79c5b354d7b3 Home > Case Studies > i Left. Irrigation control panel test enclosure. Right. Two DUTs are being loaded into the test enclosure. The Challenge A designer and manufacturer of irrigation systems approached us with the need for a system to test and validate the control panel and outdoor sensor of their residential sprinklers. The Solution Using hardware and software to create a full turnkey solution for automated testing, we were able to help improve the client’s quality control process and the efficiency of their final product testing. Figure 2. Left. Outdoor precipitation sensor. Right. Indoor control panel. The Story//The Cyth Process A global provider of irrigation products approached us with the need for a system to perform validation testing of their residential sprinkler system control panel and outdoor sensor. Their product was a two-part system that worked in tandem to automate the control of one’s sprinkler system. The outdoor sensor was designed to measure rainfall and temperate and relay this information to an indoor control panel. The indoor control panel then decided from the transmitted information and the scheduled presets the customer chose whether to irrigate one’s landscape. The two communicated using radio frequencies (RF) which increased the product’s ease of use, as the outdoor sensor was mounted on one’s roof and communicated wirelessly with the control panel located in the interior of one’s home. The product testing of the outdoor sensor and indoor control panel required testing the functionality of the two-part system. Our engineering team recognized this required testing the control panel’s physical buttons, the device’s interior software, the segmented LCD screen, and the RF signal transmitter (outdoor sensor) and RF signal receiver (indoor control panel). Figure 3. The NI PXI chassis and I/O cards contained in the test enclosure. Our engineering team began by building a test fixture centered around a PXI hardware chassis, several I/O cards, and NI TestStand software that controlled and monitored all aspects of the device testing. The wide range of the PXI designated card slots provided the ability to acquire the wide range of high-speed I/O required. NI TestStand provided our team with the ability to program and automate the procedural sequence of the fixture’s testing. Control Panel Feature Test Method Button Membrane Switches NI PXI 4110, Mechanical Plungers Device Power Consumption NI PXI – 6514, Industrial Digital I/O Card with DBL Voltage Cable Segmented LCD Screen Camera with Ethernet Comm RF Signal Analyzer NI PXI 5661, VSA – Vector Signal Analyzer (inbound signal) using Digital Signal Attenuator RF Signal Generator NI PXI 5661, VSG – Vector Signal Generator Test Fixture Procedure Indoor Control Panel The automated test enclosure is opened by the operator. Two units are slotted into the provided nests. The operator wires the units to the fixture, and the enclosure's cover is closed. The system automatically powers up the units, measures current, and validates RF data from the RF signal analyzer. The system then presses the button membranes 1 – 4 of the control panel and uses a camera to inspect the relayed output of each button on the LCD screen. All the test data is read by TestStand and the PXI hardware and stored to the PC's memory. The operator opens the enclosure cover, removes the tested units, and repeats. Outdoor Sensor The automated enclosure is opened by the operator. Two units are slotted into the provided nests. The operator wires the units to the fixture, and the enclosure cover is closed. The system automatically powers up the units, measures current, and validates RF data from the RF signal generator. The system downloads firmware to the outdoor rainfall sensor and validates the temperature data to the measured value. All the test data is read by TestStand and the PXI hardware and stored to the PC's memory. The operator opens the enclosure cover, removes the tested units, and repeats. Figure 4. Two irrigation control panel DUTs are electronically wired and awaiting test. Delivering the Outcome Overall, our engineering team was able to deliver a full turnkey solution for the automated testing of our client’s sprinkler system. Both the outdoor sensor and indoor control panel were tested using the same automated test fixture. This was achieved through our engineering team integrating NI TestStand software, NI PXI hardware, and an industrial PC control system to be able to execute defined testing sequences and monitor the responses in real-time. The flexible I/O modules enabled us to control several different devices from mechanical plungers to an ethernet camera to test the various features of the sprinkler system (buttons, software, a segmented LCD screen, and the RF signal analyzer). We were able to provide the client with a system that accelerated their quality control process through the in-depth testing of 300+ units a day. The operational bulletproofing of the test fixture has ensured the product validation and optimal function of our client’s sprinkler system in preparation for their use across homes nationwide. 40+ irrigation control panels awaiting validation testing. Technical Specifications 1 x Optical Sensor – Photodetector 1 x Cable USB - Serial TTL Converter 1 x Ethernet Camera Plungers 1 x Airflow Control Valve w/ Exhaust Muffler 1 x Solenoid Control Valve 1 x Compact Extruded Aluminum Air Cylinder 1 x Magnetically Actuated Switch Talk to an Expert Cyth Engineer to learn more

Project Case Study Custom RFID Tracking System for Biotech Reagent Bottles using LabVIEW Mar 27, 2024 4db5fcee-3ff7-4ce9-bd9a-8ce4c83737b7 4db5fcee-3ff7-4ce9-bd9a-8ce4c83737b7 Home > Case Studies > RFID scanning conveyor system. The Challenge A medical diagnostics research and manufacturing company approached us with the need for a system to scan radio frequency identification (RFID) tags on their products and efficiently log their product inventory. The Solution Using a programmatically controlled conveyor, LabVIEW software, and RFID sensors we built the customer a turnkey solution that automated the scanning and data collection of their product inventory. The Story//The Cyth Process Radio Frequency Identification (RFID) uses frequencies to communicate and read emitted signals from a microchip. RFID tags automate data collection reducing human-operator error as unlike a barcode they don’t require a line of sight to be scanned. A product containing an RFID tag will be scanned no matter its orientation as long as the tag passes within the scanner’s read field. Our team purchased a Dorner 5 ft. configurable length conveyor that best matched our customer’s needs featuring a Lenze AC Tech verifiable frequency drive (VFD) that allowed the conveyor’s speed to be programmatically controlled. Rails and brackets were added to the conveyor for positioning the customer’s product to help ensure optimal scanning. Sick RFH6xx RFID antennas were integrated into the conveyor with a 9.5-inch reading field. LabVIEW was used to program the RFID antennas to log scanned “tag ID” signals into a CSV file, which was then uploaded directly into the customer inventory database via ethernet. Left: Three RFID scanner systems are under manufacture at Cyth. Right: The Sick RFH630 RFID antennas that are featured in the system. System Order of Operations: The operator begins by turning on the conveyor using the menu option on the LabVIEW user interface. Once the operational light is green, the operator places the customer product on the conveyor. A guard rail positions the product along the conveyor so that all are within the read field of the RFID antennas. As the product passes RFID antennas, the product “ID tags” are acquired, read, and written into a CSV file, which is then uploaded directly into the customer inventory database via ethernet. Products that are detected to have passed on the conveyor without a successful scan due to faulty RFID tags are flagged by a proximity sensor. After the desired scans are complete the operator turns the system off using the LabVIEW user interface. Delivering the Outcome Using multiple Sick RFH630 RFID antennas, a programmable conveyor, and LabVIEW software architectures our engineering team was able to build the customer a turnkey solution that automated the scanning and data collection of their product inventory. This has increased the throughput and minimized the potential for human error in our customer’s inventory scanning and documentation process. The customer ordered multiple units we were able to manufacture and deliver through to factory acceptance testing at their location. The project hardware and software were completed within 10 weeks and within the client’s budget and timeline requirements. The system's LabVIEW user interface. Technical Specifications 3 x Dorner 2200 Configurable Conveyor 8 x Sick RFH630 and Antenna, and Antenna Cabling 8 x Sick Proximity Sensors 3 x Asus Touchscreen Monitors 4 x Industrial PC and Mount 4 x Traffic Light 4 x Handheld RFID Scanner 4 x E-stops 4 x keyboards and Mounting 3 x Slotted Wire Mount 3 x Fiberglass Mounting Enclosure Talk to an Expert Cyth Engineer to learn more

Project Case Study PXI Platform Enables the Automated Test of BOSCH AdBlue Pump Mar 27, 2024 f54b506c-8d1f-4695-820c-354eb5daafee f54b506c-8d1f-4695-820c-354eb5daafee Home > Case Studies > *As Featured on NI.com Original Authors: Jiří Kubíček, Robert Bosch Edited by Cyth Systems Diesel motor pump The Challenge Creating an automated test station to verify AdBlue diesel motor pump modules in a hydraulic test method. The Solution Using the NI PXI platform and NI LabVIEW software platform to develop a testing station that can acquire, process, and package data while communicating with other third-party components in the process of quality control testing. Robert Bosch České Budějovice is focused on developing and manufacturing components for passenger cars for many established automotive manufacturers. One of these manufactured components, the AdBlue pump (Figure 1), is a diesel exhaust fluid standardized as ISO 22241. Car manufacturers use diesel exhaust fluid to limit the NOx concentration in diesel exhaust emissions. This helps them keep limits of the European norm Euro IV and higher. The pump must inject the AdBlue liquid under the pressure of 4,5-8,5 bar to the exhaust pipe close to the catalytic converter. Every manufactured pump goes through multiple pressure tests before being shipped to the customer. When we started looking for a solution for automated testing, we already had a PLC that controlled the I/O valves and communicated with our manufacturing execution system (MES). Based on a positive experience on another project, we decided to use NI PXI hardware and NI software to build our test system. The main advantages of the NI PXI platform include a robust industrial form factor, the ability to add new modules to modify the measurement, and simple programming. One reason we chose the NI platform is high-speed acquisition (10 kS/s or higher), which we could not do with the current PLC system. Left: Test station fixture featuring NI PXI hardware, and NI LabVIEW and TestStand software. Right: LabVIEW user-interface. System Architecture As mentioned, we used the PLC to control the valves and pumps. It acts as a master that sends a request to the PXI system. This request contains information about what type of test should be carried out and some configuration parameters. The PXI then carries out the test and sends back the measured data and test result that is saved into a database. Figure 2 shows the system architecture. The PXI system contains a built-in controller and two additional PXI-6281 multifunction modules. One module handles PWM generation and the other one indirectly measures the current using a shunt resistor. During the test, we need to measure the pressure in the outlet of the AdBlue pump and control the I/O valves using PWM. Once the tester gets a TCP message from the PLC with test configuration information, it can start the test sequence. As the pump does not have a dedicated pressure sensor, we must use an indirect method of pressure measurement. The indirect method uses measurement of the current that flows through the winding of the main magnet. On this current curve, we can identify two inflection points (Figure 3). The first one is caused by the valve starting to open. The second one is caused by the valve reaching the final position. From these inflection points, we can calculate the level of pressure in the pump and compare it with required values. We originally wrote the calculation of pressure from the current curve using The MathWorks, Inc. MATLAB® software. We wanted to use the code we had, so we used a structure in LabVIEW called MathScript Node. We used this to import the current .m files and call them from LabVIEW on a station with no MATLAB installed. When we started code development, we were coding everything in LabVIEW. With support from local NI representatives, we discovered an easier means of test management with TestStand software. We attended some NI trainings to learn how to use the tools. We managed to create an architecture that contains a user interface, test execution framework, and test modules dedicated for each step of the test. We chose TestStand as the test execution framework because it saves time during the development phase. We do not need to develop the parts of the test framework that are the same for every test, such as test steps execution, logging, and reporting. We can easily configure these features in TestStand. It is also beneficial for standardization because the test framework is the same for every test. Test Stations in the Manufacturing Area Currently, we have 12 testers running on the production line. However, we are planning a tester for a new generation of the pump that will be more complicated. This test requires communication with a pressure sensor through the SENT protocol, which is a robust serial communication protocol commonly used for lower-cost sensors in the automotive industry. With the need to test both the messages sent and the physical layer of SENT communication, we are evaluating PXI as the main test controller that could also read the data from the SENT sensors and make the test of the physical layer of the SENT communication. Using the NI PXI platform saved us time on development of the test framework and empowered us to build a reconfigurable test station. We gained valuable experience during the first PXI tester that we can use in future projects. Original Authors: Jiří Kubíček, Robert Bosch Edited by Cyth Systems

Project Case Study Double Decker Hybrid Powertrain Monitored Using Circaflex Embedded Controls Mar 30, 2025 29c38610-c1e9-4565-bd8c-690fc4c6cecb 29c38610-c1e9-4565-bd8c-690fc4c6cecb Home > Case Studies > Vantage Power's Hybrid Double Decker Bus featuring Cyth’s Hybrid Management System (HMS). The Challenge Retrofitting the drive trains of double-decker buses to increase the fuel efficiency of London’s public transportation. The Solution Using Cyth’s embedded control system Circaflex paired with the NI RIO SOM, we designed a communication and monitoring system to improve hybrid buses’ regenerative braking and efficiency. The Cyth Story Vantage Power’s diesel hybrid drive train technology was retrofitted onto the existing double-decker buses of London’s public transportation fleet. Cyth’s embedded control platform, Circaflex, provides scalability for our customer’s I/O requirements as the hybrid monitoring system (HMS) communicates with a diesel and hybrid motor controller and the vehicle’s brake system. Packaged into our HMS was the NI RIO SOM which provides highly deterministic and safety-critical functions. The quick processing of inputs such as the driver's gas & brake pedals, and diesel engine power vs. hybrid engine power levels are accounted for in high-speed repeating calculations. The Hybrid Monitoring System (HMS) is programmed in LabVIEW software to ensure the benefits of a real-time processor and a user-programmable FPGA. Left: The HMS’s rugged weather-proof and vibration-proof enclosure. Center: The Circaflex provides scalable I/O for the HMU’s communication and monitoring requirements. Right: Input and output connectors located in the enclosure exterior, for example, 4 CAN bus connectors for high-speed data communication. The system architecture of the Vantage Power hybrid powertrain and Cyth HMS system. Delivering the Outcome Overall, Vantage Power’s double-decker hybrid powertrain system incorporated Circaflex and NI sbRIO SOM boards for a 40% greater fuel efficiency across all vehicles retrofitted amongst the London fleet. Our Circaflex HMS system provides the communication and monitoring capabilities required of a hybrid drive train. The large number of subcomponents working together in the hybrid power train such as the hybrid battery and motor, diesel engine, regenerative braking system, generator, driver inputs, etc. show the value of a control system with scalable I/O as well as high-speed data acquisition. The NI hardware and software platform enables a deterministic system for the repetitive calculations of the bus's critical functions further improving the functionality and passenger safety of London’s hybrid fleet. Technical Specifications 1 x Circaflex 315 1 x Mezzanine Board 1 x NI sbRIO-9651SOM 1 x Custom Weather-proof Enclosure Circaflex Modules 1 x Inertial Measurement Module 1 x GPS Module Qty 1 x 16 ch 24V Industrial Digital Input Modules (Sinking & Sourcing) Qty 1 x 16 ch 24V Industrial Digital Output Modules (Sinking & Sourcing) Qty 1 x 8ch Analog Voltage Input Module, 100kS/s. 16-bit Qty 1 x 8ch Analog Current Input Module, 100kS/s, 16-bit Qty 1 x 8ch Analog Voltage Output Module, 100kS/s, 16-bit Qty 1 x Strain Gauge 1 x K-Type Thermocouple I/O Connectors 4 x CANbus 2 x Input DOS 1 x Industrial Digital Input 2 x Analog Input Talk to an Expert Cyth Engineer to learn more

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Functional testing involves applying operational power to a PCBA to ensure it performs its designated functions. This type requires custom-built test equipment. PCBACheck™ PCBA Test Fixture Industrial Reference Design Our AUTOMATED PCBA Bed of Nails Test Fixture Equipment Reference Design is 90% Standardized and 10% Custom. Home > Services > Automated Test Systems > PCBACheck PCBA Functional Test Solution Businesses depend on Cyth Systems' expertise in functional test fixtures. Functional testing involves applying full operational power to a printed circuit board (PCBA) to ensure it performs its designated functions. This type of test often requires custom-built test equipment and fixtures. Cyth Systems provides support for all types of functional test strategies. Starter PXI Instruments Customize PXI Devices as Needed Pre-Designed Bed-of-Nails Customize Probes Locations Pre-Designed Interposer Board Customize Probes & Other Circuitry Software Environment Customize Sequences & Measurement Instruments Drivers Customize Measurements Top PCBA Bed of Nails Test Fixture Solution. Bed-of-Nails Functional Tester Preconfigured Database Preconfigured PXI System Budget & Schedule Preconfigured Test Cart Preconfigured Reports Automate complex tasks faster Speak to Engineer Perform complex and rapid tasks and measurements that are impossible for human manual tests. Test multiple boards simultaneously, even share time-expensive equipment. Conduct Stress or Life Testing of boards by repeating tests hundreds or thousands of times. Bed-of-Nails Functional Tester PCBA Bed of Nails Functional Tester Predesigned fixture ready for custom modifications for any board: Customize width & depth Customize Pin Placement Customize front and rear panel Customize Interposer Board Speak to Engineer Preconfigured PXI System Preconfigured PXI System Standard PXI Modules suits 90% of applications needs as-is: Power Supply Oscilloscope Digital Multimeter Configurable Switch Matrix Add additional modules, signals, and inputs as needed to expand your application. Speak to Engineer Preconfigured Test Cart Preconfigured Test Cart Standardized Test Cart serves most applications as-is without modification! Internal Rack Mounting Customizable worksurface Bar Code Scanner or Badge Reader Power Systems included Customization not required, but... fully customizable if necessary Speak to Engineer Preconfigured Database Preconfigured Database Standardized database Schema serves 90% of most applications as-is without modification: Speak to Engineer Store any test results, pass fail results Store images, waveforms, raw data Customization not required, but... Fully customizable if necessary Preconfigured Reports Preconfigured Reports Preconfigured Reports suits most applications as-is with CUSTOMIZATION INCLUDED Most common report fields already setup Fully customizable graphics and layout Fully customize graphs, tables, images Export to PDF already included Premade Excel or Word Templates you can customize and modify Speak to Engineer Budget & Schedule Budget & Schedule Preconfigured Budget for all included features: Most projects within 10% of standard budget and schedule Automatically adjusts for project size and features Budget INCLUDES customizations Speak to Engineer We know the ins and outs of PCB's Power supply voltage levels (VCC, VDD, etc.). Clock signals (system clock, peripheral clocks). Analog input signals (e.g., sensor inputs). Digital control signals (e.g., reset, enable signals). Serial communication inputs (UART, SPI, I2C). External trigger inputs. User interface inputs (buttons, switches). PWM (Pulse Width Modulation) signals. Temperature sensor inputs. Voltage reference inputs. Digital output signals (data lines, control lines). Analog input signals (ADC inputs). Analog output signals (DAC outputs). LED indicators. Display outputs (LCD, OLED, LED display segments). Relay control outputs. Voltage regulator outputs. Power-on indicator outputs. Current sense inputs/outputs. Power-up sequence testing. Power-down sequence testing. Voltage tolerance testing. Clock frequency and accuracy testing. Data integrity testing (checksum, CRC). Communication protocol testing (UART, SPI, I2C). Uploading Firmware or other files. Overvoltage protection testing. Undervoltage lockout testing. Logic functionality testing (gate-level/functional logic). Memory read/write testing (RAM, Flash). Sensor calibration and accuracy testing. ADC/DAC functionality and accuracy testing. Motor control functionality testing. Audio output quality testing. Display content and pixel testing. Communication protocol testing. Button/switch functionality testing. Temperature sensor accuracy testing. All these I/O's and much more. Speak to Engineer Prototype Form Why Cyth? Cyth Systems has over two decades of providing the technology and expertise you need to be successful on Automation, Measurement, and Controls projects. Our engineers will work alongside your team to design the system to meet your specifications. We develop your solutions with reduced risk, cost, and schedule. Need PCBA testing help or advice? First Name Last Name Email How can we help? [attributer-channel] [attributer-channeldrilldown1] [attributer-channeldrilldown2] [attributer-channeldrilldown3] [attributer-landingpage] [attributer-landingpagegroup] Let's talk PCBA Solutions Menu

Project Case Study Developing a Quantum Waveform Synthesizer with LabVIEW and CompactRIO Aug 28, 2023 a4f54a64-429d-426d-890a-7f36e1a6693e a4f54a64-429d-426d-890a-7f36e1a6693e Home > Case Studies > *As Featured on NI.com Original Authors: Johnathon Williams, National Physical Laboratory Edited by Cyth Systems Digital multi-meter readout The Challenge Developing a high-precision quantum waveform synthesizer to use in the characterization of analog-to-digital converters (ADCs) that is reliable and maintains high accuracy during repetitive testing through direct traceability to the Josephson quantum voltage. The Solution Using NI LabVIEW software and NI CompactRIO hardware to develop a low-jitter system for high-frequency data transfer and control of the bespoke synthesizer hardware. LabVIEW simplified the production of a fully integrated system, serial peripheral interface (SPI) communications, and an intuitive user interface, which enabled operators to configure the synthesizing process and required reference voltages. National Physical laboratory The National Physical Laboratory (NPL) is the United Kingdom’s national measurement institute. NPL is a world-leading center of excellence in developing and applying the most accurate measurement standards, science, and technology available. For more than a century, NPL has developed and maintained the nation’s primary measurement standards. These standards underpin an infrastructure of traceability throughout the UK and the world that ensures the accuracy and consistency of measurement. Based in southwest London and employing more than 500 scientists, the NPL facility is internationally regarded as one of the most extensive and sophisticated measurement science facilities. CompactRIO and the Serial Optical Interface Board Figure 3. CompactRIO and the Serial Optical Interface Board Electrical Standards For more than 20 years, the electrical standards of voltage, current, and resistance have been based on highly reproducible quantum effects. For example, the Josephson effect relates voltage to frequency and is now used in measurement laboratories worldwide to provide the highest accuracy voltage measurements currently possible. NPL has achieved its level of quality research by designing bespoke hardware and software that interfaces with delicate quantum devices. These prototype systems form the basis of future measurement infrastructure at NPL and are regularly used by other laboratories. However, to carry out our research in a timely and competitive manner, we need to develop solutions using as many commercially available tools and systems as possible, and we need to ensure these systems can be easily maintained and supported into the future. Quantum Waveform Synthesizer Our application is a waveform synthesizer with direct traceability to the Josephson quantum voltage reference. Digital electrical measurement is now the method of choice in the instrumentation sector since signal processing is much easier to realize in digital circuits than in analog filters. The performance of the ADCs is crucial to the success of digital instruments, and our synthesizer is designed to generate waveforms with high spectral purity and a high level of amplitude stability. These reference waveforms are used to characterize ADCs represented by the device under test (DUT) in Figure 2. Schematic Diagram of the Synthesizer Design Figure 2. Schematic Diagram of the Synthesizer Design The synthesizer is based on a digital-to-analog converter (DAC) with 20-bit resolution and linearity. The output of the DAC is passed through an anti-imaging, multipole lowpass filter. The output of the filter is compared with the Josephson quantum voltage reference by measuring a voltage difference using an amplifier with a gain of 100 and an 18-bit ADC. A waveform is typically sampled 100 times per period to generate a 1 kHz reference sine wave (Figure 3). For ADC characterization, a sampling frequency of 100 kHz is required on the ADC. The DAC is similarly updated at 100 kHz. An oscilloscope trace of two ADC samples. Figure 3. Oscilloscope Trace Showing the Voltage Difference Waveform with a Zoom-In on Two ADC Sample. Background Information on Our Chosen Technical Solution Our first synthesizer design used an FPGA along with a microprocessor to load data into the DAC and to read data from the ADC. This system delivered a sampling frequency of 5 kHz, which was determined by the speed of the microprocessor. This limited the synthesizer to applications at power line frequencies. An upgrade of this approach to a higher sampling frequency would have needed a complete redesign of the FPGA code. Therefore, we required the following levels of functionality from our system: A logic system based on an FPGA for fast data transfer to the DAC and from the ADC together with low-timing jitter. A real-time OS for the control loop, which stabilizes the synthesizer output against the Josephson reference. An Ethernet connection to a PC running LabVIEW for the user interface and data storage. This was comfortably achieved using CompactRIO-embedded hardware. Aside from providing the graphical user interface and data logging, LabVIEW simplified the sharing of data between the three architectural layers described above. That, along with the short development times, meant that LabVIEW was a real advantage to us. Our Experience with CompactRIO Our application required a high level of electrical isolation, so we chose to use optical fiber connections (Figure 3) between the CompactRIO hardware and the synthesizer. Each sample of the waveform consisted of three 8-bit data packets, enabling a data rate across this serial link of 2.4 MHz for a sampling frequency of 100 kHz. Two NI 9402 high-speed digital I/O modules were used to provide the digital I/O for the CompactRIO hardware. Three lines were used to implement the SPI interface to the DAC and the ADC. The built-in FPGA on the CompactRIO system continuously updated the DAC with data from memory and read data from the ADC to memory over the serial links. In addition, a timing signal was generated to synchronize the Josephson quantum voltage reference so that it was phase-locked to the synthesizer. The CompactRIO real-time processor transferred data to and from the memory and analyzed the ADC readings, which represented the difference between the synthesized voltage and the quantum reference. An algorithm on the real-time processor calculated corrections to the DAC values to adjust the synthesized voltage and stabilize it against the reference voltage. The real-time processor also averaged the data from the ADC before transferring it to the PC over Ethernet at a lower data rate. Software written in LabVIEW on the host PC provided the user interface for the whole measurement system including the configuration of the Josephson quantum voltage reference; choice of the amplitude, frequency, and number of samples in the synthesized waveform; and presentation of the data from the ADC. Original Authors: Johnathon Williams, National Physical Laboratory Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Project Case Study Distributed Generation-Based Smart Grid System Using NI CompactRIO & NI LabVIEW Mar 27, 2024 84b975a0-789b-4d4a-9b2b-17bda55aced7 84b975a0-789b-4d4a-9b2b-17bda55aced7 Home > Case Studies > *As Featured on NI.com Original Authors: Alekhya Datta, The Energy and Resources Institute (TERI) Edited by Cyth Systems Distributed Generation-Based Smart Grid System The Challenge Enhancing energy security and energy access, particularly in emerging economies with depleting energy resources, and generating power effectively and intelligently, which is equally important at the national level in India. The Solution Developing the first-of-its-kind smart mini grid (SMG) system in India, driven by state-of-the-art power electronics devices and controlled through ultra-fast digital technology based on NI CompactRIO hardware and NI LabVIEW system design software, which ensures a higher degree of flexibility, reliability, efficiency, and safety for the complete power system. Left: Complete Single Line Diagram of an SMG System, Center: NI cRIO-9022 and C Series Modules Used in the SMG System, Right: LabVIEW source code of SMG Dashboard. To cope with utility changes and challenges, many utility companies in India are planning to implement smart grid technology. An SMG system is a subset of a smart electric grid and is generally defined as an intelligent electricity distribution network operating at or below 11 kV and providing electricity to a community. It is supplied by a diverse range of distributed energy resources (DERs), including small, conventional generators such as diesel generators combined with a range of renewable generators such as hydro, wind turbine, biomass, and solar photovoltaic. SMGs can either be connected to the conventional utility grid or be isolated and provide electricity to a localized load only. An SMG is an application of digital information and communication technology (ICT) and uses advanced sensing, communication, and control technologies to optimize electrical power generation, delivery, and ultimately its end use within the domain of microgrids. An SMG provides dynamic communication and balancing of the electrical network, thus minimizing losses and increasing the stability of the grid. Benefits of an SMG The benefits of an SMG include the following: Fostering demand-side management and demand-side response Reducing power outages and increasing the reliability, efficiency, and safety of the grid Reducing the carbon footprint and minimizing fossil fuel consumption Providing better autonomy to customers to manage their electricity needs Initiative Taken by TERI on SMG Systems Under the auspices of the Asia Pacific Partnership program, TERI submitted a proposal to the Ministry of New and Renewable Energy, and the Commonwealth Scientific and Industrial Research Organization submitted a proposal to the Commonwealth of Australia Department of Environment, Water, Heritage and The Arts to obtain funding to develop and demonstrate distributed generation-based SMG systems and control techniques that could be applicable to Indian sites and facilitate the deployment of SMGs in India. To optimize the multiple generating resources and the varying loads to be served, TERI designed and developed the SMG system in one of its research facilities at TERI Retreat in Haryana, India. Unique Features of the TERI SMG Model The unique features of the TERI SMG model include the following: Integrated multiple DERs to ensure maximum utilization of renewable energy sources Performing resource and load profiling, controlling, and forecasting Centralized control (intelligent dispatch controller) for resource optimization and demand management Initiated load prioritization—total loads were classified into critical, essential, and nonessential loads Integrated, high-speed, FPGA-based digital communication using LabVIEW system design software for acquiring data and sending and receiving controls Completing real-time data acquisition and monitoring of several electrical, weather, and physical parameters through installed sensors Minimizing outages and fast responses to network disturbances through automatic connect/disconnect of system components The TERI SMG system also integrated the following DERs: 10.5 kWP solar photovoltaic (crystalline silicon-based solar module) systems installed on the roof of the north block of the TERI Retreat 2 kWP solar photovoltaic (crystalline silicon-based solar module) systems installed on the roof of the Biomass Gasifier building 1 kWP thin-film-based solar photovoltaic system on the roof of the south block of the TERI Retreat 3.3 kW wind turbine generator (WTG) 100 kW biomass gasifier (woody) system in the Biomass Gasifier building Battery bank of 48 V, 600 Ah for energy storage Diesel generators and a utility grid The TERI Retreat is a residential, multifacility complex equipped with modern facilities including conference halls, official and residential premises, laboratories, and sports grounds. The electricity demand of the complex varies widely depending on the season, occupancy level of the residential premises, the number of conferences being held, and several other factors. Original Authors: Alekhya Datta, The Energy and Resources Institute (TERI) Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Project Case Study Oil Well Fracture Pump Monitoring Using LabVIEW & NI Technology Mar 27, 2024 7162271e-1536-4161-9a3f-ff95325ed205 7162271e-1536-4161-9a3f-ff95325ed205 Home > Case Studies > *As Featured on NI.com Original Authors: Robert Stewart, CEO, Lime Instruments, LLC Edited by Cyth Systems Lime Instruments hydraulic fracturing pump controls. The Challenge Building an advanced monitoring system that can survive being mounted directly to an oil well servicing pump in a rugged environment while performing advanced analysis on sensor data. The Solution Using NI CompactRIO and NI Single-Board RIO hardware along with NI LabVIEW software to design a pump monitoring system that monitors the operating parameters of a reciprocating pump used in well-servicing applications. Our goal is to package with the best off-the-shelf control hardware available and to package it in such a way that it withstands the harshest environments commonly found in the oil field. We feel that NI hardware and LabVIEW software provide the optimal solution for our application, and we have made them the backbone of our entire control system. While our prototype monitoring system is built using CompactRIO, since CompactRIO and NI Single-Board RIO have the same hardware architecture, we can switch easily between the two form factors without any major coding changes. Other hardware solutions we considered were not able to provide the high-speed I/O and analysis to catch the momentary pressure spikes and vibration indications of these oil well service fracturing pumps. The field-programmable gate array (FPGA) and ability to perform fast Fourier transform (FFT) analysis on the data make CompactRIO, NI Single-Board RIO, and LabVIEW a perfect solution for this application. Using CompactRIO and LabVIEW the Lime Instruments synchronized distributed control system generates the pressure required for fracking. Oil Well Monitoring System Our oil well monitoring system is designed to monitor the performance of vital pump components during operation. Our preliminary product is focused on monitoring high-pressure fracturing pumps in well-stimulation applications. Each fracturing unit has a high-horsepower diesel engine and transmission mated to a triplex or quintaplex pump. Both the engine and the transmission come equipped with an electronic interface that monitors critical functions and provides diagnostic information as the unit is running. The engine and transmission output the data they monitor via an SAE J1939 communication protocol to the CompactRIO controller. Currently, pumps in this industry do not contain more than a couple of discrete sensors that monitor their critical operating parameters. Typically, discharge pressure, RPM, lube oil pressure, and lube oil temperature are monitored. Each of these parameters is measured with an individual sensor and signal cable that goes back to the main control console. The goal of our product is to monitor these functions as well as several others and transmit that data back to the main control console via the same SAE J1939 controller area network (CAN) protocol. Our system needs to look for data characteristics outside the normal operating envelope and failure conditions. With this real-time information, operators can determine if they should continue or discontinue operation based on real performance indications from the pump. Ultimately, this system critically reduces the number of pump failures as well as overall pump maintenance costs. Rugged Deployment with CompactRIO and LabVIEW For what we do, there is not a more capable hardware package than CompactRIO. We also like that we can develop software in LabVIEW faster than most other programming environments. LabVIEW has made the software development side much quicker than our past experiences in C-based programming. What most C programmers take two years to do, we can accomplish in a couple of months. We can use that time savings to get to market quicker and capitalize on our competitors’ lag time. We are using the LabVIEW software platform to program the real-time processor, FPGA, and I/O with the CompactRIO system and interface to control and monitor every aspect of the well-servicing and stimulation equipment commonly found in our industry. We believe that the modular I/O and the rugged CompactRIO system are perfect because they can handle the shock and vibration and wide-ranging temperatures experienced while mounted to a mobile piece of equipment that is dragged up and down oil field roads around the world. The openness of LabVIEW and National Instruments hardware make it easy to interface to a variety of sensors, software, and protocols such as the following: Sensors – Pressure transducers, magnetic pickup sensors, digital encoders, temperature sensors, nuclear densitometers, magnetic flow meters, Correollis flow meters, and so on Software – Coiled-tubing fatigue, wellbore-simulation software Operating systems – Windows XP Embedded, Windows CE, Linux® Industry-specific protocols – SAE J1939, J1587, J1708; Modbus; Ethernet, 802.11; PROFIBUS Customized Deployment With NI Single-Board RIO Because of the small form factor and the low cost of NI Single-Board RIO, we see great value in using this hardware to provide a customized solution to our customers. With both CompactRIO and NI Single-Board RIO, we are able to offer the ability to create different form factors and price points for our monitoring systems. Fortunately, the transition from CompactRIO to NI Single-Board RIO is a very quick and seamless process because of the standard NI reconfigurable I/O (RIO) hardware architecture and LabVIEW. NI Single-Board RIO has the same hardware architecture as CompactRIO, so we are able to reuse our LabVIEW code in our NI Single-Board RIO hardware without any major coding changes. Original Authors: Robert Stewart, CEO, Lime Instruments, LLC Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

Leveraging the LabVIEW, PXI, & CompactRIO platforms, we can solve extremely complex industrial automation challenges & deliver successful projects. SERVICES Industrial Automation Equipment Home > Services > Industrial Automation INDUSTRIAL AUTOMATION EQUIPMENT Industrial automation involves integrating Data Acquisition and control logic with various third-party components, devices, and sensors. Bringing together this broad mix of technologies, and integrating them into a final solution requires Mechanical, Electrical, and Software Engineers, and a common technology platform to ensure all system components work cohesively. Leveraging the LabVIEW , PXI , and CompactRIO , platforms we can solve extremely complex industrial automation challenges and deliver success for our customers that could not otherwise be achieved. INDUSTRIAL AUTOMATION EQUIPMENT Service Areas Automated Assembly Automated Assembly subcategories ↑ Part Handling We are often given a challenge to help automate the assembly of a product, or to provide assistance to a technician to improve or control assembly. Typically we integrate equipment to apply pressure, torque, or to automate cutting, gluing, or grinding. With the help of our measurement and control automation platforms, we provide the control signals and measurement feedback to automate product assembly. Laser or Ultrasonic Welding Pressing or Positioning of parts Product Treatment & Handling Product Treatment & Handling subcategories ↑ Cutting or timming Spraying or Dispensing Polishing and Grinding Much of manufacturing requires highly repetitive movements. By automating manufacturing processes, such as the treatment of a product, material, or parts, we can ensure that your manufacturing processes are optimized for quality and throughput. Verification and Measurement Verification & Measurement subcategories ↑ Measurement and Sensor Data Collection Measurement and verification of mechanical components during and after automated assembly or treatment helps to ensure the proper positioning, dimensions, or angles of manufactured parts. Our team can help you define and select the appropriate measurements, data, images, or guide users through the process of verifying a product is manufactured properly. Weighing, Dimensioning Vision Inspection, Defect Detection Counting & Classifying Motion and Robotics Motion and Robotics subcategories ↑ Steppers, Servos Much of the work of automation is making things move. We need to make fast movements, precision movements, intelligent movements, or grip and manipulate parts like a human hand. Rotary or Linear motion 6-Axis Robots or SCARA Pneumatics and Grippers INDUSTRIAL AUTOMATION Case Study Portfolio CompactRIO Enables Automated Circuit Board Testing PCBA Functional Test and Device Verificational Test Scaled with Cyth PCBACheck Hyundai Improves Production Test Time using PXI, LabVIEW, and TestStand Real-Time Defects Mapping on Integrated Circuits Using NI PXI & LabVIEW Hydraulic Control System for Automotive Component Shaping Automated QR Code Printer & Verifier Enables Inventory Tracking Nucor Refines Steel Recycling Using NI Hardware & LabVIEW CompactRIO Revolutionizes 3D Printing Cyth Pairs AI Software with Robotic Arm to Sort Organic Seedlings 1 2

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Events ||NI Connect 2024| NI Connect 2024 NI Connect 2024 May 20, 2024 Austin, TX NI Connect 2024 was National Instruments' annual event for engineers and industry leaders, focused on test and data analytics . It featured technical sessions, keynotes, and networking opportunities to explore the latest innovations in test and measurement. The event, held in Austin, Texas , aimed to help businesses improve performance and gain a competitive edge. NI Connect 2024 included: Keynotes: Discussions on the future of test and measurement and the role of AI in intelligent testing. Technical Sessions: Presentations on optimizing test data, modernizing labs, and digital transformation. Networking: Opportunities to connect with peers and share ideas. Demos: Showcasing new NI products and solutions, including the Battery Production Tester.

Project Case Study Lockheed Martin’s NI Software-Based Test System Saves Millions Aug 15, 2023 161beb0d-c1e0-46ad-a61f-80b02827798c 161beb0d-c1e0-46ad-a61f-80b02827798c Home > Case Studies > *As Featured on NI.com Original Authors: Robert Dixon, Lockheed Martin STS Edited by Cyth Systems The LM-CORE™ Lockheed Martin automated test system uses NI TestStand software to provide open software architectures. The Challenge Delivering a test system for use in applications from manufacturing to environmental stress screening to depot testing on the more than 3,000 planned Joint Strike Fighter aircraft. The Solution Creating a test system to deliver integrated support for avionics test systems by using NI TestStand and LabWindows™/CVI for the core test management and ANSI-C test development environments. In 2001 Lockheed Martin was awarded the largest aircraft contract in history. The Joint Strike Fighter (JSF)/F-35 contract, valued at approximately $200 billion, provides the cornerstone of future defense capability for the United States and its allied partners. A crucial part of the JSF contract is delivering a test system for use in applications from manufacturing to environmental stress screening to depot testing on the more than 3,000 planned JSF aircraft. To meet this challenge, Lockheed Martin Simulation, Training & Support (LM STS) developed the LM-STAR test system to deliver integrated support for avionics test systems. Designed to rapidly develop test solutions and support customers’ exact needs in a cost-effective and timely manner, the LM-STAR system uses NI TestStand and LabWindows/CVI software for the core test management and ANSI-C test development environments. Lockheed Martin, the manufacturer of the F-35A Lightning II, uses NI TestStand software for the sequencing backbone of their automated test. Open Software Architecture Ensures Rapid Development In the LM-STAR system, an open software architecture based largely on NI TestStand and LabWindows/CVI supports the seamless transition of test systems from the factory to the field. The LM-STAR solution provides a common test system for all avionics suppliers participating in the JSF Harmonization Plan. Essential for a project of the magnitude of the JSF program, the JSF Harmonization Plan allows multiple suppliers, including BAE Systems, Northrop Grumman, Rockwell Collins, and Raytheon, to simultaneously develop test program sets (TPS) using NI TestStand and LabWindows/CVI for the JSF/F-35. The advanced, open software architecture in the LM-STAR system ensures the rapid development and deployment of mission critical test systems while minimizing long-term maintenance efforts. Test Software Adaptability Enables Multiple Test Configurations Using the standard features provided by the NI TestStand commercial, off-the-shelf (COTS) test management environment, LM STS test engineers built a common test architecture to facilitate the rapid delivery of configurable test solutions. The key LM-STAR features use many core NI TestStand components, such as the flexible module adapters for calling tests developed in any test development environment and the NI TestStand process model for separating the core system functionality from the individual tests. The LabWindows/CVI development environment also contributed to the rapid configuration of LM-STAR-based test systems by providing industry-leading instrument connectivity and driver support through a proven ANSI C-based development language and a compiler optimized for test Future Technology Insertion Prevents Obsolescence The modular test architecture of the LM-STAR system protects mission-critical test systems from obsolescence by using NI TestStand and LabWindows/CVI to ease the insertion of future technologies. One example is new NI TestStand support for calling ATLAS TPSs directly from NI TestStand. This technology is important for supporting legacy avionics test systems through a common test architecture capable of hosting both legacy and future test development environments. Specifically, the new ATLAS interface for NI TestStand 3.0 features the ability to browse and select ATLAS TPS files, specify parameters, and perform remote control. Run-time features include full compliance of TPS Server state transitions, such as attaching, loading, and detaching; parameter reading and writing; global locking; handling of manual TPS intervention; and the ability to pause and terminate sequence execution. Avionics test system developers are also closely watching the development of the newly defined XML-based Automatic Test Markup Language (ATML) standard for describing test procedures and test results in XML. The open software architecture in the LM-STAR system will significantly ease the adoption of this data schema for avionics test systems. In fact, NI has already demonstrated that the current NI TestStand XML features can generate results in the new Test Results XML schema in accordance with the draft ATML specifications. Standardized Approach Yields Significant Cost Savings The innovative LM-STAR approach to standardized test system development based on COTS software has yielded many cost-saving benefits for LM STS, harmonization suppliers, and the U.S. government. LM STS estimates their standardized LM-STAR approach to the JSF/F-35 program has already saved the U.S. government millions of dollars and has the potential to save hundreds of millions more over the life of the program. Original Authors: Robert Dixon, Lockheed Martin STS Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

This guide provides an overview of basic strain concepts, explains how strain gages operate, and assists in selecting the appropriate configuration type. < Back Measuring Strain Key Fundamentals Guide | Cyth Systems Sensor Fundamentals Previous Next

The LabVIEW Core 1 Course gives you the chance to explore the LabVIEW environment and interactive analysis, dataflow programming, and common development techniques in a hands-on format. LabVIEW Core 1 Training Course Start Date | End Date Duration ENROLL < Back NI Course Overview In the LabVIEW Core 1 Course, you will explore the LabVIEW environment and interactive analysis, dataflow programming, and common development techniques in a hands-on format. In this course, you will learn how to develop data acquisition, instrument control, data-logging, and measurement analysis applications. At the end of the course, you will be able to create applications using the state machine design pattern to acquire, analyze, process, visualize, and store real-world data. NI Course Objectives Interactively acquire and analyze single-channel and multi-channel data from NI DAQ devices and non-NI instruments Create user interfaces with charts, graphs, and buttons Use programming structures, data types, and the analysis and signal processing algorithms in LabVIEW Debug and troubleshoot applications Log data to file Use best programming practices for code reuse and readability Implement a sequencer using a state machine design pattern NI Course Details Duration: Instructor-led Classroom: Three (3) days Instructor-led Virtual: Five (5) days, five-and-a-half-hour sessions On-Demand: 7.5 hours (exercises as a supplement) Audience: New users and users preparing to develop applications using LabVIEW Users and technical managers evaluating LabVIEW in purchasing decisions Users pursuing the Certified LabVIEW Associate Developer certification Prerequisites: Experience with Microsoft Windows Experience writing algorithms in the form of flowcharts or block diagrams NI Products Used: If you take the course On-Demand: LabVIEW 2021 or later NI-DAQmx 21.0 or later NI-488.2 21.0 or later NI VISA 21.0 or later USB-6212 BNC-2120 If you take the course in an instructor-led format: LabVIEW 2023 or later NI-DAQmx 23.0 or later NI-488.2 23.0 or later NI VISA 23.0 or later USB-6212 BNC-2120 Training Materials Virtual instructor-led training includes digital course material that is delivered through the NI Learning Center. NI virtual instructor-led training is delivered through Zoom, and Amazon AppStream/LogMein access is provided to participants to perform the exercises on virtual machines equipped with the latest software. Cost in Credits On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits Public virtual or classroom course: 30 Education Services Credits or 9 Training Credits Private virtual or classroom: 210 Education Services Credits or 60 Training Credits NI Course Outline LESSON OVERVIEW TOPICS Introduction to LabVIEW Explore LabVIEW and the common types of LabVIEW applications. Exploring LabVIEW Environment Common Types of Applications Used with LabVIEW First Measurement (NI DAQ Device) Use NI Data Acquisition (DAQ) devices to acquire data into a LabVIEW application. Overview of Hardware Connecting and Testing Your Hardware Data Validation Exploring an Existing Application Explore an existing LabVIEW project and parts of a VI. Exploring a LabVIEW Project Parts of a VI Understanding Dataflow Finding Examples in LabVIEW Creating Your First Application Build a VI that acquires, analyzes, and visualizes data from NI DAQ device as well as from a non-NI instrument. Creating a New Project and a VI Exploring LabVIEW Data Types Building an Acquire-Analyze-Visualize VI (NI DAQ) Building an Acquire-Analyze-Visualize VI (Non-NI Instrument) Exploring LabVIEW Best Practices Use various help and support materials provided by NI, explore resources, tips and tricks for using LabVIEW. Exploring Additional LabVIEW Resources LabVIEW Tips and Tricks Exploring LabVIEW Style Guidelines Debugging and Troubleshooting Explore tools for debugging and troubleshooting a VI. Troubleshooting a Broken VI Debugging Techniques Managing and Displaying Errors Executing Code Repeatedly Using Loops Explore components of LabVIEW loop structures, control the timing of a loop, and use loops to take repeated measurements. Exploring While Loops Exploring For Loops Timing a Loop Using Loops with Hardware APIs Data Feedback in Loops Working with Groups of Data in LabVIEW Work with array and waveform data types, single-channel and N-channel acquisition data. Exploring Data Groups in LabVIEW Working with Single-Channel Acquisition Data Working with N-Channel Acquisition Data Using Arrays Writing and Reading Data to File Explore basic concept of file I/O and how to access and modify file resources in LabVIEW. Writing Data to a Text File Writing Multi-Channel Data to a Text File Creating File and Folder Paths Analyzing Text File Data Comparing File Formats Bundling Mixed Data Types Use LabVIEW to bundle data of different data types and pass data throughout your code using clusters. Exploring Clusters and Their Usage Creating and Accessing Clusters Using Clusters to Plot Data Executing Code Based on a Condition Configure Case structure and execute code based on a condition. Conditional Logic Introduction Creating and Configuring Case Structures Using Conditional Logic Reusing Code Explore the benefits of reusing code and create a subVI with a properly configured connector pane, meaningful icon, documentation, and error handling. Exploring Modularity Working with Icons Configuring the Connector Pane Working with SubVIs Controlling Data Type Changes Propagate data type changes using type definitions. Exploring Type Definitions Creating and Applying Type Definitions Implementing a Sequencer Sequence the tasks in your application by using the State Machine design pattern. Exploring Sequential Programming Exploring State Programming Building State Machines Additional Scalable Design Patterns in LabVIEW First Measurement (Non-NI Instrument) Use LabVIEW to connect to non-NI instruments and validate the results. Instrument Control Overview Communicating with Instruments Types of Instrument Drivers Enroll

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Project Case Study Circaflex & NI Single-Board RIO Power Syringe Lubrication Inspection Demo Mar 30, 2025 a4665763-e344-4fc2-9ab8-42a7dff6a034 a4665763-e344-4fc2-9ab8-42a7dff6a034 Home > Case Studies > Circaflex and NI Single-Board RIO control the syringe lubrication inspection demonstration. The Challenge A pharmaceutical test and validation company approached us, requiring a tradeshow demonstration capable of showcasing their test and measurement process for the inspection of silicon lubricant utilized in self-administering syringes. The Syringe Lubrication Inspection Solution We paired the NI Single-Board 9651 (sbRIO) SOM with our Circaflex embedded control board to showcase the control and monitoring of a machine vision solution that captures images of Syringe Lubrication Inspection for improved and measured quality assurance. The Story EpiPens are devices used to administer medication to an individual experiencing a severe allergic reaction, also known as anaphylaxis. Blocking the body’s response to an allergen, the importance of the EpiPen administering itself correctly in critical situations could not be higher. The product’s success depends on its ability to administer a predetermined drug dosage every time. Our clients ensure that this occurs through the test and measurement of the silicon lubrication located in the interior of the self-administering syringes. Their system captures images (using cameras) of syringes individually used for inspection and analysis to meet strict FDA medical standards and detect defective syringes along their line. They asked us to create a fully capable demonstration system that they could use to showcase their processes. Cyth's Circaflex embedded control board is used to control inputs and outputs (pulse and steps) of the demonstration's LabVIEW motor control architectures. The Process An operator places a syringe in the rotating holder, located in the system housing. The system's gripper holds the syringe in a vertical position while the first stepper motor rotates the syringe at a predefined rate. A custom LED array casts and reflects light from the syringe towards a camera. The light reflected off the syringe is then gathered by our camera to recreate a two-dimensional image of the lubrication located in the syringe’s interior. A programmable logic controller (PLC) strobes the lighting in tandem with the camera’s capture sequence. Use of Circaflex and the sbRIO’s deterministic nature enabled the synchronization of the camera and lighting together for a predefined exposure time ensuring consistent lighting and improved camera imaging consistency. Using software to stitch together a high-definition image, we can accurately quantify the coating of the syringe’s interior lubricant. All of this is controlled and synchronized using the NI sbRIO 9651 SOM and the Cyth Circaflex platform. The LabVIEW motor control architectures measuring inputs and outputs (pulse and steps) are controlled by the pairing of the NI Single-Board 9651(sbRIO) SOM with our Circaflex embedded control board for high-speed data acquisition and measurement. The system's enclosure houses the stepper motors, camera, and hardware required to image the syringe. Delivering the Outcome Throughout the project Power Syringe Lubrication Inspection, our sales and engineering teams collaborated closely with the client to ensure their timeline and project requirements. We were able to provide the client with a high-quality inspection system with additional tradeshow demonstration features that fulfilled their needs and met their budgetary requirements. This included the system’s ability to scan and render a 2D image of a syringe’s interior lubricant for comparison and analysis and to give this data readout live using their test and measurement software. Our improved system and high-quality inspection processes now ensures the ability of our customer to showcase their improved silicon lubricant inspection technology. Technical Specifications 2 x Applied Motion NEMA 17 Integrated Drive + Motor with Encoder 1 x Applied Motion NEMA 23 Integrated Drive + Motor with Encoder 1 x 20 - Megapixel CMOS Global Shutter Camera 1 x Telecentric, HP Illuminator (beam diameter 60 mm), White 1 x RC Series LED Strobe Controller 1 x NI sbRIO-9651 SOM (System on Module) 1 x Circaflex 315

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Project Case Study Improving Scalability of a Satellite Receiver Using PXI Hardware Mar 26, 2024 9d3a8fc0-e15f-4c08-b108-6f04cec24e80 9d3a8fc0-e15f-4c08-b108-6f04cec24e80 Home > Case Studies > *As Featured on NI.com Original Authors: Smruti Ranjan Panigrahi, Indian Space Research Organization Edited by Cyth Systems Improving scalability of a satellite receiver using PXI hardware. The Challenge The Indian Space Research Organization (ISRO) has increased its number of launches. This has created a need to develop scalable and portable testers that we can customize for upcoming projects and move to different test facilities for flight package evaluation in different conditions. The Solution We used modular instruments based on PXI and the LabVIEW graphical programming environment to create a modular software-defined compact tester that we could easily take to several facilities. We can also easily upgrade for new functionality through software while increasing the overall throughput. Background ISRO’s UR Rao Satellite Centre (URSC) is the lead center for building satellites and developing associated satellite technologies that are used in communications, navigation, metrology, remote sensing, space science, and interplanetary explorations. As the pace of innovation in space technology has increased, the requirement of placing more functionality into a single package has resulted in increased complexity for test systems. We need test platforms that can keep pace with this innovation. Our Existing Approach Came With Challenges The telemetry, tracking, and command (TTC) system of a communication spacecraft configuration ensures appropriate RF link establishment between the ground station and the spacecraft throughout the transfer and on-orbit operations. The system’s C-band receiver, connected with an antenna and feed network, receives and demodulates the command signal uplinked from the ground station and demodulates the tone-ranging information. For the complete characterization of C-band receiver packages of the TTC chain, we had automated test equipment (ATE) that included traditional RF instruments communicating through the GPIB bus, such as a spectrum analyzer, network analyzer, audio analyzer, and signal generator, along with power supplies and multimeters. These instruments are large, expensive, and designed to perform one or more specific tasks defined by the manufacturer. The Satellite TTC Receiver built using PXIe-8880, vector signal generator (VSA), signal receiver, and data acquisition cards. The complexity of the device under test (DUT) changes based on new requirements to accommodate more and more features, which forces us to redesign the ATE and adds cost. Further, the test and evaluation of flight packages are done in different environmental conditions such as thermovaccum, vibration, and EMI/EMC. This calls for moving and setting up the entire test system at different environmental test facilities in different locations. Frequently moving the huge ATE rack to different test places is difficult, time-consuming, and increases the chance of errors due to physical damage. PXI Helped Us Overcome These Challenges We needed ATE that was portable and scalable without compromising on test speed, repeatability, and measurement accuracy. We implemented a virtual instrument (VI)-based system that addresses these challenges using customizable software and modular instruments to create user-defined measurements. It involves less hardware, which results in less space and cost. Its modularity makes the test system flexible and scalable. With our previous ATE, we used two separate generators with a power combiner to generate an FM-modulated carrier along with an unmodulated carrier for checking the performance of the DUT under different adjacent carrier frequencies. In the new PXI -based approach, we can use a single wide-bandwidth vector signal generator because we can program it to generate a combination of various signals in adjacent channels. In our previous ATE, we used an audio analyser and an oscilloscope with interface circuitry to check thezdemodulated baseband signal quality from the DUT and monitor and analyze the response from the DUT. We can replace both instruments with a single high-accuracy PXI dynamic signal analyzer with a 24-bit resolution front-end A/D converter, specifically designed for baseband analysis applications such as signal purity and integrity by calculating signal-to-noise ratio (SNR) and monitoring the waveform. We could also integrate multiple DMMs inside the same PXI system, which we used for package raw bus voltage and current monitoring, status monitoring, and resistance measurements. PXI Vector Signal Generator Flow Chart & System Architecture The VIs for the ATE meet the performance and accuracy requirements of all the functionality tests and are ahead of the traditional test system in terms of speed, cost, compact size, and portability. Apart from instrumentation, we are utilizing other benefits of PXI/PXI Express solutions in this system. We used LabVIEW , which is well known for its intuitive and user-friendly features, to write the test system software. During the test, we continuously monitor and log the input power of the DUT so we can make immediate decisions based on extreme conditions. We also must acquire, analyze, and display different outputs of the DUT in near real-time so we can automatically address test failures and observations. We must also indicate the test pass/fail condition and automatically generate and publish a report. Features of the New Test System Data analysis and presentation: Based on the specific test and test condition, we acquire and analyze a large amount of data to evaluate the DUT performance such as package power checks, threshold of ranging and telecommand outputs, mod-off and carrier-off noise, signal-to-noise ratio, total harmonic distortion, image rejection tests, and adjacent channel rejection tests. We automatically store the same on the hard disc under a corresponding project-specific folder. On completion of each test, the system generates a test-specific report. On completion of the final test, the system generates a final consolidated test report. Safety features: The system identifies a connected package before powering and providing RF stimuli. We can program over-voltage protection and over-current protection for the power supply, and the program will not go further unless these features are set. This is over and above the standard safety features of an ATE such as emergency shutdown. System performance: The realized VI-based ATE meets all requirements without compromising accuracy and includes additional features such as flexibility, scalability, portability, and better throughput. We were using the ATE to characterize the performance of the C-band receivers. We compared the performance between VI-based ATE and traditional instrumentation ATE, which is shown in the table below: Improving Portability, Scalability, and Test Throughput A specialized task team internally at URSC thoroughly evaluated the ATE we developed. Subsequent to the clearance obtained from the task team, we used the same ATE to test and evaluate C-band receivers. The onboard packages were successfully evaluated and cleared for further AIT activities. The modular architecture and software-definedanalyzer environment of the VI-based automation in testing onboard receiver packages delivers rapid test system development/upgrade as they are flexible and scalable to meet new requirements. Original Authors: Smruti Ranjan Panigrahi, Indian Space Research Organization Edited by Cyth Systems Talk to an Expert Cyth Engineer to learn more

This course teaches you how to use common design patterns to successfully implement and distribute LabVIEW applications for research, engineering, and testing environments. LabVIEW Core 2 Training Course Start Date | End Date Duration ENROLL < Back NI Course Overview The LabVIEW Core 2 Course is an extension of the LabVIEW Core 1 Course. This course teaches you how to use common design patterns to successfully implement and distribute LabVIEW applications for research, engineering, and testing environments. Topics covered include programmatically respond to user interface events, implementing parallel loops, manage configuration settings in configuration files, develop an error handling strategy for your application, and tools to create executables and installers. The LabVIEW Core 2 Course directly links LabVIEW functionality to your application needs and provides a jump-start for application development. NI Course Objectives Implement multiple parallel loops and transfer data between the loops Create an application that responds to user interface events Manage configuration settings for your application Develop an error handling strategy for your application Package and distribute LV code for reuse Identify Best Programming Practices for use in LabVIEW NI Course Details Duration: Instructor-led Classroom: Two (2) days Instructor-led Virtual: Three (3) days, five-and-a-half-hour sessions On-Demand: 4 hours (exercises as a supplement) Audience: New users and users preparing to develop applications using LabVIEW LabVIEW Core 1 Course attendees Users and technical managers evaluating LabVIEW in purchasing decisions Users pursuing the Certified LabVIEW Associate Developer certification Prerequisites: LabVIEW Core 1 Course or equivalent experience NI Products Used: If you take the course On-Demand: LabVIEW 2021 NI-DAQmx 21.0 NI PCI-6221 or NI USB-6212, BNC-2120 Simulated NI-PCI-6221 If you take the course in an instructor-led format: LabVIEW Professional Development System 2023 or later NI-DAQmx 23.0 or later USB-6212 BNC-2120 Training Materials: Virtual instructor-led training includes digital course material that is delivered through the NI Learning Center NI virtual instructor-led training is delivered through Zoom, and Amazon AppStream/LogMein access is provided to participants to perform the exercises on virtual machines equipped with the latest software Cost in Credits: On-Demand: Included with software subscription and enterprise agreements, or 5 Education Services Credits, or 2 Training Credits Public virtual or classroom course: 20 Education Services Credits or 6 Training Credits Private virtual or classroom: 140 Education Services Credits or 40 Training Credits NI Course Outline LESSON OVERVIEW TOPICS Transferring Data Use channel wires to communicate between parallel sections of code without forcing an execution order. Communicating between Parallel Loops Exploring Channel Wires Using Channel Templates Exploring Channel Wire Interactions Transferring Data Using Queues Creating an Event-Driven User Interface Create an application that responds to user interface events by using a variety of event-driven design patterns. Event-Driven Programming User Interface Event Handler Design Pattern Event-Driven State Machine Design Pattern Producer/Consumer (Events) Design Pattern Channeled Message Handler (CMH) Design Pattern Controlling Front Panel Objects Explore methods to programmatically control the front panel. VI Server Architecture Property Nodes and Control References Invoke Nodes Managing Configuration Settings Using Configuration Files Manage configuration settings with the help of a configuration file. Configuration Settings Overview Managing Configuration Settings Using a Delimited File Managing Configuration Settings Using an Initialization (INI) File Developing an Error Handling Strategy Learn how to develop an error handling strategy for your application. Error Handling Overview Exploring Error Response Exploring Event Logging Injecting Errors for Testing Packaging and Distributing LabVIEW Code Learn how to package and distribute LabVIEW code for use by other developers and end-users. Preparing Code for Distribution Build Specifications Creating and Debugging an Application (EXE) Creating a Package for Distribution Programming Practices in LabVIEW Explore recommended practices for programming to develop readable, maintainable, extensible, scalable and performant code. Recommended Coding Practices Writing Performant Code in LabVIEW Software Engineering Best Practices Identify some key principles of software engineering best practices and the benefits of implementing them when working in LabVIEW. Project Management Requirements Gathering Source Code Control Code Review and Testing Continuous Integration Enroll

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Project Case Study How CompactRIO Compares to a PLC Sep 17, 2024 e79a57af-b589-4f34-bcd9-3ba03d395ace e79a57af-b589-4f34-bcd9-3ba03d395ace Home > Case Studies > Programmable Logic Controller Introduction In the world of industrial automation and control systems, the choice between different hardware platforms can be a critical decision. Programmable Logic Controllers (PLCs) have long been the workhorse of the industry, but newer technologies like CompactRIO (cRIO) and Programmable Automation Controllers (PAC's) have been gaining ground. In this article, we will explore the differences between CompactRIO and PLC systems to help you make an informed decision for your industrial automation needs. Before we delve into the comparison, it's essential to understand what CompactRIO and PLC systems are and their primary functions. CompactRIO Platform Programmable Logic Controller (PLC) PLC's are specialized industrial computers designed for controlling industrial processes and machinery. They execute control functions based on logic and timing, making them well-suited for applications requiring real-time control and reliability. PLC's are programmed using ladder logic or other programming languages specifically designed for automation. PCL's have been controlling industry and processes for over 50 years, but are limited on their speed and processing power. Programmable Automation Controllers Programmable Automation Controllers (PACs) are advanced industrial control systems that combine the real-time capabilities of PLC's with the computational power and flexibility of PCs. PACs are characterized by their ability to handle complex control tasks, high-speed data processing, and custom algorithms, making them ideal for applications where standard PLC's might fall short. PACs provide a versatile platform for designing and implementing sophisticated control strategies and seamlessly integrating with a wide range of sensors and devices. Whether it's complex automation, data-intensive processing, or demanding industrial environments, PACs offer a powerful and adaptable solution for modern control and automation systems. CompactRIO CompactRIO is a PAC hardware platform developed by National Instruments that combines a real-time microprocessor, a Real-Time Linux OS, and Field-Programmable Gate Array (FPGA) technology. This platform is known for its flexibility and is often used for applications requiring high-speed data acquisition, complex signal processing, and integration with other systems. CompactRIO systems can be programmed using LabVIEW which makes Data Acquisition (DAQ) and computational algorithms very easy for engineers. CompactRIO Systems Comparison Factors Now, let's compare CompactRIO and PLC systems across various factors to help you make an informed choice: Performance Comparison PLC's are well-known for their reliable real-time capabilities, making them suitable for many industrial applications. CompactRIO, is also a deterministic and reliable real-time controller, but with a PC microprocessor (like an Intel Core Processor) offering significant processing power and flexibility. Furthermore, the cRIO includes an FPGA, which can be programmed with algorithms and logic that execute on a MHz clock iteration, meaning it can make closed loop inputs and outputs literally in nanoseconds. This makes cRIO an excellent choice for applications requiring high-speed data processing and advanced algorithms. Flexibility CompactRIO is highly flexible due to its FPGA, which not only allows you to implement custom signal processing and control algorithms, but also enables Reconfigurable I/O (RIO) which refers to the ability to swap modules and modify the I/O of the system without programming. Programming Environment PLC's typically use ladder logic or Structured Text, while CompactRIO systems are programmed using LabVIEW or other programming languages. LabVIEW comes with hundreds of engineering and mathematical algorithms and code libraries, which makes industrial and control system applications powerful with minimal programming. The result can be a fast, complex, and powerful software application that can do much more than a PLC. Connectivity Both CompactRIO and PLC systems offer a wide range of communication options. However, the cRIO's microprocessor can be particularly advantageous when integrating with industrial devices and standard networks. A CompactRIO can interact with databases, send emails, or write files to a hard-drive or a network. It can also communicate with third-party instrumentation or external devices using serial (like RS232/422/488), ethernet, or other protocols. Yet cRIO is also designed to work with industrial buses such as Modbus, Fieldbus, EtherCAT, DeviceNET, and more. Lastly, with the additional of bespoke modules and interfaces, it can handle custom communication protocols like Fiber Optic or ISM band radio. Size CompactRIO systems are compact, as the name suggests, in comparison to a computer or other larger device with similar computing power. Yet they are about the same size and shape as a PLC. Both come in various sizes, and with varying number of module slots, but larger ones can be bulkier. Cost PLC's are generally considered very cost-effective for simple control applications. CompactRIO, with its advanced processing capabilities, tends to be pricier and are generally better suited for complex control tasks where the cost can more easily be justified by the results. Additionally, cRIO can potentially save costs in the long run by reducing the need for additional hardware or complex workarounds. Conclusion In the CompactRIO vs. PLC debate, there's no one-size-fits-all answer. Your choice should depend on the specific requirements of your application. If you need real-time control, reliability, and simplicity, a PLC may be the right choice. However, if your application demands high-performance data processing, custom algorithms, and advanced connectivity, CompactRIO can provide the necessary flexibility and power. Both CompactRIO and PLC's have their strengths and weaknesses, and the right choice will depend on your unique industrial automation needs. CompactRIO Control Products NI CompactRIO Systems

Leveraging our experience across many industries, we can bring your project a depth & breadth of design proficiency into applications we’ve never done before. SERVICES Engineering Consulting Home > Services > Engineering Consulting Would it help you to borrow our EXPERT ENGINEERS ? Leveraging our experience in Automation, Control, and Machine Vision across many industries, we can bring your project a depth and breadth of design proficiency into applications you've never done before, or in ways you might not have considered.   Bring us your tricky projects and challenges – we love to join your design team and can offer ideas, technologies, and questions that just might make a project into a reality. Test or Automation Systems Design ATE Systems Automation Systems Reverse Engineering Systems Updating Old Systems Let's Talk About ATE Software Consulting Startup Assistance Project Architecture Code Audits Let's Talk About Software Repair & Troubleshooting Machine down investigations Machine performance audits Debugging Assistance Let's Do Some Research LabVIEW & NI Consulting NI Hardware PXI Configurations CompactRIO Configurations Single-Board RIO Design NI Software LabVIEW TestStand InstrumentStudio Let's Talk About LabVIEW Every CONSULTING PROJECT becomes a great STORY “Our OpEx team asked five companies to consider our challenge – we needed a machine for testing for hospital intravenous tubing, but we do millions of units per day, with 200 assemblers, and we found movement of parts to the test equipment to be an insurmountable challenge. Each team gave us two presentations over the next 6 weeks. Some of the best plans had 30 systems the size of a fridge, or 10 systems the size of an SUV, using overhead conveyors and required hiring 200 more people. All of them used off-the-shelf designs for leak detection. But Cyth’s idea flipped the entire concept: a small custom leak test instrument installed directly on the assemblers table. Small and inexpensive, we could build 1000 of them, and best of all - the parts do not have to be transported around the factory. Cyth then unveiled a working prototype! The demonstration worked right there on the conference room table. We dismissed all the other candidates that day and set up a demo with the executive team.” -J.R. Sr. OpEx Project Manager, Medical Device Manufacturer Our Engineering Consulting PROCESS Schedule Consultation To start, a Cyth Engineer and Architect will meet with you at NO CHARGE to do requirements gathering and review ideas under a Confidential Disclosure Agreement. Engineering brainstorm We will meet internally to review requirements, brainstorm ideas, verify product specs, and check pricing to meet your needs. Design review We present ideas and products that can meet your needs, and we can iterate until all the requirements are met. Let's Schedule a Consultation ENGINEERING CONSULTING Portfolio Automated Battery QA Ensures Medical Device Reliability CompactRIO Enables Undergraduate Power Electronics Education Robotic Automation Triples Sample Preparation Throughput CompactRIO Enables Automated Circuit Board Testing PCBA Functional Test and Device Verificational Test Scaled with Cyth PCBACheck Custom EMF Measurement Solution Doubles End-of-Line Test Throughput Production Capacity up 350% with Automated Dispensing Hardware-Timed Automation Accelerates Gas Meter Testing Micron-Scale Inspection via Precision Vision & Motion 1 2 3 4 5