NI Tech Forum: Rochester, NY | September 2026

Hands-On Sessions, Live Demos & Expert Insights on the Latest in NI Test & Measurement

Start Date:

September 16, 2026 at 8:00:00 AM

End Date:

September 16, 2026 at 4:00:00 PM

Hyatt Regency Rochester | 125 E Main St, Rochester, NY 14604

As engineering demands evolve, testing needs to be faster, more accurate, and adaptable to complex workflows. This forum provides an in-depth look at how NI’s latest solutions in hardware and software can streamline and optimize testing processes across various application areas. Attendees will explore advanced validation techniques that reduce development time, boost throughput, and improve data reliability—all critical for meeting today’s stringent testing requirements. Come join us for any portion of the day and engage with sessions that align with your interests to make the most of your time.

NI Tech Forum is NI's hands-on technical event series — designed to help engineering teams stay ahead of the curve on test automation, data acquisition, and system design. The Rochester edition brings together NI experts, industry practitioners, and Cyth Systems engineers for a day of sessions you can actually use.

From AI-powered test tools and scalable PXI systems to RF solutions for aerospace and defense, the agenda covers the platforms and techniques shaping the next generation of test infrastructure.

Join us for the full day or drop-in to see demos and network with engineering peers.

WHAT TO EXPECT

8:00 – 9:00 AM - Arrival & Event Registration

9:00 – 9:10 AM - Welcome & Kickoff

9:10 – 10:00 AM - AI-Powered Automated Test and Measurement

10:00 – 10:40 AM - What's New in NI Hardware and Software

10:40 – 11:20 AM - Accelerate Automated Test for Electronics with PXI and the NI LabVIEW+ Suite

10:40 – 12:15 PM - Hands-On Session Room

11:20 – 11:30 AM - Break

11:30 – 12:15 PM - From Sensing to Action: Scalable Measurement and Control

12:15 – 2:00 PM - Lunch & Live Demos

2:00 – 3:00 PM - Test Earlier, Smarter, and Faster with Hardware-in-the-Loop

2:00 – 3:00 PM - Scalable System Test Solutions for the Modern EMSO Challenges

2:00 – 4:00 PM - Hands-On Session Room

3:00 – 4:00 PM - Modern RF Systems Enabled by the NI USRP SDR Portfolio

3:00 – 4:00 PM - Accelerating EO/IR Test and Validation with NI PXI and AEDIS

Session Topics

AI-Powered Automated Test and Measurement

AI is changing how engineers develop, test, and analyze — but not all AI tools are built with engineering workflows in mind. This session introduces Nigel AI Advisor, NI's AI assistant purpose-built for test applications. Learn how Nigel helps you learn faster, develop faster, and get better data insights, all while keeping an engineer in the loop and your IP secure.

What's New in NI Hardware and Software

Get a comprehensive look at NI's latest hardware and software releases, and a sneak peek at the future direction of NI's test ecosystem — including LabVIEW, InstrumentStudio, TestStand, and FlexLogger.

Accelerate Automated Test for Electronics with PXI and the NI LabVIEW+ Suite

Speed, accuracy, and scalability — this session explores how the PXI platform and NI's software suite can increase test throughput, shorten development cycles, and cut costs. Learn how PXI integrates with InstrumentStudio, LabVIEW, and TestStand to streamline validation and production testing from day one.

From Sensing to Action: Scalable Measurement and Control

NI's modular hardware and flexible software workflows make it possible to start simple and scale fast. This session covers how teams can move from basic automation to real-time decision-making without retooling their entire infrastructure. Includes live demos and open Q&A.

Test Earlier, Smarter, and Faster with Hardware-in-the-Loop

Rising code complexity and limited prototype availability are slowing validation cycles across embedded systems development. This session covers how Hardware-in-the-Loop (HIL) testing enables real-time simulation — so teams can catch system issues earlier, iterate faster, and reduce risk before hardware is even available.

Scalable System Test Solutions for the Modern EMSO Challenges

Modern defense systems must integrate RF sensing, communications, and self-protection into a single, testable architecture. This session addresses today's EMSO testing challenges and covers NI's latest capabilities for scaling validation in complex, RF-dense environments.

Modern RF Systems Enabled by the NI USRP SDR Portfolio

The NI USRP software-defined radio family provides a flexible foundation for RF prototyping, development, and deployment. This session reviews recent portfolio developments and explores how organizations are using SDR to tackle emerging requirements in wireless communications, spectrum monitoring, sensing, and RF/DSP-intensive applications.

Accelerating EO/IR Test and Validation with NI PXI and AEDIS

Testing advanced electro-optical and infrared systems demands high-performance instrumentation and scalable test architectures. This session highlights practical techniques for accelerating EO/IR validation using NI PXI and ViewPoint AEDIS hardware — from test architecture design to real-world coverage improvements.

Hands-On Session Room

Get hands-on time with NI hardware and software in a guided lab environment. Two stations available:

PXI Station: Work directly with NI PXI hardware and software. Use InstrumentStudio, LabVIEW, and TestStand to interact with hardware, build language-agnostic code modules, and schedule and debug automated tests.
cDAQ Station: Work directly with NI CompactDAQ. Learn how to take measurements, trigger signals, and log data to disk for post-analysis.

(Hands-on room runs 10:40 AM – 12:15 PM and 2:00 – 4:00 PM)*

For full session overviews and event details, visit the event page on ni.com