NIWeek 2010: Aug. 3-5, 2010 | Austin, TX

August 3, 2010

August 3-5, 2010 - Austin Convention Center, Austin, Texas 

National Instruments is hosting NIWeek, the industry's premier event on graphical system design that attracts more than 3,000 of the world's brightest engineers, educators, and scientists. NIWeek 2010, the company's 16th annual customer and technology conference, opens August 3 at the Austin Convention Center in Austin, Texas, for three days of interactive technical sessions, targeted summits, hands-on workshops, and exhibitions on the latest developments for design, control, automation, manufacturing, and test. The conference also features keynote presentations and demonstrations that highlight how engineers and scientists can use NI graphical system design to test, measure, and fix inefficient products and processes to improve everyday life.


Benefits of Attending NIWeek 2010

  • Learn about the latest developments for design, control, automation, manufacturing, and test in more than 200 technical sessions led by industry experts.

  • Network with engineers, scientists, NI developers, and academic and industry leaders.

  • Explore the latest technologies and see product demonstrations at more than 200 booths including product pavilions and partner presentations.

Attendees Buzz about NIWeek

Here is what attendees said about last year's event.

"Good training. Good knowledge. Good networking."

Bruce Stedwell, Ford Motor Company


"This is the best technical experience an engineer can take each year."

Oscar Rodas, Universidad Galileo


"NIWeek was a fantastic experience and the exposure to the new technologies and best practices presented by so many professionals was an extraordinary opportunity."

Dan Nightingale, Corning Incorporated


"NIWeek was an excellent networking opportunity. I was able to meet and share ideas with experts in LabVIEW and other NI technologies."

Brian Hall, Medtronic


Experience Graphical System Design at NIWeek 2010
NIWeek 2010, the world's leading graphical system design conference and exhibition, brings together the engineering, academic, and industrial communities for three full days of interactive technical sessions, exhibitions, and workshops on the latest technologies for control design, measurement, automation, manufacturing, and test. Discover how graphical system design empowers the development of more efficient applications to measure and fix the world around us.


Join key decision makers, developers, and visionaries to learn about trends and advancements in the measurement and automation world. NIWeek is the ultimate learning environment, connecting both our novice and expert users for three days of interactive technical sessions, hands-on workshops, case study presentations, and panel discussions on the latest advancements in design, control, automation, manufacturing, and test. The event also is the perfect opportunity for attendees to network with leading engineers and scientists share best practices and example code with fellow developers, and exchange information with National Instruments product managers.


At NIWeek 2010 you can:

  • Network with more than 3,000 engineers, scientists, educators, and NI developers

  • Choose from 200 advanced technical presentations, hands-on workshops, case studies, and panel discussions

  • Learn about creating advanced test, control, and design solutions in daily keynotes

  • Improve your National Instruments LabVIEW knowledge

  • Connect to the NI LabVIEW community



  • Discover new products and solutions in more than 200 exhibitor booths and pavilions

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